| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 05/25/1993 | US5214374 Dual level test fixture |
| 05/25/1993 | US5213676 Integrated circuits |
| 05/19/1993 | CN1020803C Probe for measuring negative offset of under ground pipe-line cathode protection protential and measuring method |
| 05/13/1993 | WO1993009443A1 Switch probe |
| 05/13/1993 | DE4136752A1 Electrical characteristic measuring appts. for testing single power transistor - holds transistor in high accuracy device with clamp connection for contacts and movable contact part |
| 05/12/1993 | EP0541139A2 Method of and device for the measurement of an electric signal in an electronic component |
| 05/12/1993 | EP0531428A4 Test fixture alignment system |
| 05/12/1993 | EP0489052B1 Device for the operational electrical testing of wired areas, especially printed circuit boards |
| 05/12/1993 | CN2132989Y Anti-move complementary contact |
| 05/11/1993 | US5210800 Optical sensor and method for producing the same |
| 05/11/1993 | US5210485 Probe for wafer burn-in test system |
| 05/05/1993 | CN2132184Y Multitester probes with combined multiple ends |
| 05/05/1993 | CN2132183Y Multitester probes with wires automatically drawn by in small wallet |
| 05/05/1993 | CN1071790A Magnetic permeance device and electric machinery thereof |
| 05/04/1993 | US5208529 Electric device contact assembly |
| 05/04/1993 | US5207887 Semi-additive circuitry with raised features using formed mandrels |
| 05/04/1993 | US5207585 Thin interface pellicle for dense arrays of electrical interconnects |
| 05/04/1993 | US5207584 Electrical interconnect contact system |
| 05/04/1993 | CA1317385C2 Probe for testing printed circuit boards |
| 04/29/1993 | DE4135046A1 Coated electrode for sensor for detection of dielectric properties - is used with fluid, gas-form and/or pourable media and comprises outer and inner conductors forming capacitor enclosed in e.g. dielectric plastic layer |
| 04/28/1993 | EP0538432A1 Device for producing an electric circuit, especially for a measuring probe, and a measuring probe. |
| 04/27/1993 | US5206712 Building block approach to microwave modules |
| 04/27/1993 | US5206585 Methods for testing integrated circuit devices |
| 04/27/1993 | US5205742 High density grid array test socket |
| 04/27/1993 | US5205741 Connector assembly for testing integrated circuit packages |
| 04/21/1993 | EP0538010A2 Semiconductor package, a holder, a method of production and testing for the same |
| 04/20/1993 | US5204616 In-circuit test fixture for leaded packages |
| 04/20/1993 | US5204614 Broad-band microwave power sensor using diodes above their resonant frequency |
| 04/20/1993 | US5204613 Balanced radio frequency power sensor |
| 04/20/1993 | US5203401 Wet micro-channel wafer chuck and cooling method |
| 04/15/1993 | DE4233968A1 Electromagnetic coil assembly mounting for instrument panel - has fixed pivot shaft for armature with central locking screw for securing all stationary components to fixed panel stud |
| 04/14/1993 | EP0333711B1 Current detection device having an extended frequency range of response |
| 04/14/1993 | CN2129930Y Contact head for test probe or test pen |
| 04/13/1993 | US5202623 Laser-activated plasma chamber for non-contact testing |
| 04/13/1993 | US5202622 Adapter and test fixture for an integrated circuit device package |
| 04/06/1993 | US5200695 Contact probe |
| 04/06/1993 | US5200694 Head assembly for printed circuit board test fixture |
| 04/01/1993 | WO1993006496A1 Method for producing an accessory for use in the testing of semiconductor devices |
| 03/31/1993 | EP0534826A1 Device for in situ ultra-high frequency broadband testing |
| 03/31/1993 | EP0318549B1 Test meters |
| 03/30/1993 | US5198756 Test fixture wiring integrity verification device |
| 03/30/1993 | US5198755 Probe apparatus |
| 03/30/1993 | US5198754 Testing apparatus for high frequency integrated circuit chip |
| 03/30/1993 | US5198753 Integrated circuit test fixture and method |
| 03/30/1993 | US5198752 Electric probing-test machine having a cooling system |
| 03/24/1993 | EP0533470A1 Socket for IC devices |
| 03/24/1993 | EP0532926A1 Electrical circuit with resilient gasket support for raised connection features |
| 03/24/1993 | EP0532925A1 Rigid-flex circuits with raised features as IC test probes |
| 03/24/1993 | CN2128740Y Light source apparatus for direct-current galvanometer |
| 03/23/1993 | US5196980 Low impedance, high voltage protection circuit |
| 03/23/1993 | US5196789 Coaxial spring contact probe |
| 03/23/1993 | US5196785 Tape automated bonding test apparatus for thermal, mechanical and electrical coupling |
| 03/23/1993 | US5196783 Vent for electricity metering device |
| 03/23/1993 | CA1315012C Product carrier with extended port interface |
| 03/18/1993 | WO1993005402A1 Electrical test probe |
| 03/18/1993 | DE4231185A1 Test electrode unit for printed circuit tester - has insulating substrate with test electrode element mounted on side, cross-shaped standard grids with electrodes formed on them, and connecting material |
| 03/17/1993 | EP0532345A1 Multimeter having a clamp-on ammeter and an oscilloscope display |
| 03/17/1993 | EP0531428A1 Test fixture alignment system. |
| 03/11/1993 | DE4129983A1 Producing plug contact connection between crossed-coil indicator instrument and flexible circuit board - providing cylindrical thickenings in housing wall with through holes holding bolt pins forming plug-in pins |
| 03/10/1993 | EP0289618B1 Electric resistor equipped with thin film conductor and power detector |
| 03/09/1993 | US5192908 Semiconductor device testing apparatus with positioning mechanism |
| 03/09/1993 | US5192907 Electronic module handling device for an automatic test apparatus |
| 03/09/1993 | US5192414 Electrode probe for use in aqueous environments of high temperature and high radiation |
| 03/09/1993 | US5191708 Manufacturing method of a probe head for semiconductor LSI inspection apparatus |
| 03/04/1993 | WO1993004512A1 Modular pad array interface |
| 03/03/1993 | EP0529578A2 Semi-additive circuitry with raised features using formed mandrels |
| 03/03/1993 | EP0529577A2 Electrical test probe having shaped contacts |
| 03/02/1993 | US5191280 Electrical contact test probe |
| 02/24/1993 | EP0528608A2 Connector assembly for testing integrated circuit packages |
| 02/23/1993 | US5189364 Contact probe |
| 02/23/1993 | US5189363 Integrated circuit testing system having a cantilevered contact lead probe pattern mounted on a flexible tape for interconnecting an integrated circuit to a tester |
| 02/18/1993 | DE4126727A1 HF electromagnetic radiation protection system - has solar powered indicator system which indicates when radiation exceeds critical levels stored in data memory in addition to conventional metallised textile protective suit |
| 02/17/1993 | EP0527617A2 Broad-band microwave power sensor using diodes above their resonant frequency |
| 02/17/1993 | EP0527566A1 Enhanced grounding system for short-wire lengthed fixture |
| 02/16/1993 | US5187443 Microwave test fixtures for determining the dielectric properties of a material |
| 02/16/1993 | US5187432 Environmental stress screening process |
| 02/16/1993 | US5187431 Universal multicontact connection between an ews probe card and a test card of a "test-on-wafer" station |
| 02/16/1993 | US5187020 Compliant contact pad |
| 02/16/1993 | US5186648 Insulated wire contact clamp |
| 02/10/1993 | EP0526996A2 Test head manipulator |
| 02/10/1993 | EP0526922A2 Modular board test system having wireless receiver |
| 02/03/1993 | EP0526132A2 Electrical contact test probe |
| 02/02/1993 | US5184065 Twist lock probe tip |
| 02/02/1993 | CA1313426C Adapter for electronic testing equipment for circuit boards and similar |
| 01/26/1993 | US5182515 Detector for magnetism using a resistance element |
| 01/26/1993 | US5182421 Printed wiring board with test pattern for through holes |
| 01/26/1993 | CA1313223C Electro-optic measurements of voltage waveforms on electrical conductors |
| 01/21/1993 | DE4223658A1 Test appts. for semiconductor chips with relatively many connectors - uses tape automated bonding band with adhesive surface for connecting lines to test card and dendritically grown metal test points |
| 01/20/1993 | EP0523237A1 Indicator |
| 01/19/1993 | US5180977 Membrane probe contact bump compliancy system |
| 01/19/1993 | US5180976 Integrated circuit carrier having built-in circuit verification |
| 01/19/1993 | US5180974 Semiconductor testing and shipping system |
| 01/19/1993 | US5180972 Housing including biasing springs extending between clamp arms for cable mounted power line monitoring device |
| 01/13/1993 | EP0522572A1 Method and device for measuring a semiconductor element with bumps, and method and device for manufacturing a semiconductor device |
| 01/13/1993 | CA2073119A1 Method and device for measuring a semiconductor element with bumps, and method and device for manufacturing a semiconductor device |
| 01/07/1993 | WO1993000592A1 Inspection of a dynamo-electric machine in a gap between stator and rotor |
| 01/07/1993 | DE4122434A1 Circuit for protecting pressure sensor against excess voltage - has bridge circuit with four resistors, located via temp.-dependent resistor between supply voltage and earth |
| 01/05/1993 | US5177439 Probe card for testing unencapsulated semiconductor devices |
| 01/05/1993 | US5177438 Low resistance probe for semiconductor |
| 01/05/1993 | US5177436 Contactor for testing integrated circuit chips mounted in molded carrier rings |