| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 06/18/1996 | US5528158 Probe card changer system and method |
| 06/18/1996 | US5528157 Integrated circuit package for burn-in and testing of an integrated circuit die |
| 06/18/1996 | US5528135 Sheet ceramic package having electrically independent products units |
| 06/18/1996 | US5527189 Socket for multi-lead integrated circuit packages |
| 06/13/1996 | WO1996018109A2 An integrated resistor for sensing electrical parameters |
| 06/12/1996 | EP0716417A2 Information processing apparatus provided with mechanism for controlling position of probe |
| 06/12/1996 | EP0674768A4 Die carrier and test socket for leadless semiconductor die. |
| 06/11/1996 | US5525912 Probing equipment and a probing method |
| 06/11/1996 | US5525911 Vertical probe tester card with coaxial probes |
| 06/11/1996 | US5525910 Method for trimming wide bandwidth electronic circuits |
| 06/11/1996 | US5525812 Retractable pin dual in-line package test clip |
| 06/06/1996 | WO1996017378A1 Electrical contact structures from flexible wire |
| 06/06/1996 | CA2163835A1 Solenoid type voltage, polarity and continuity tester |
| 06/05/1996 | EP0715491A2 Packaging system for electronic test and measurement instruments |
| 06/05/1996 | EP0715175A2 Method and apparatus for testing an integrated circuit |
| 06/04/1996 | US5523697 Testing apparatus for engaging electrically conductive test pads on a semiconductor substrate having integrated circuitry for operability testing thereof |
| 06/04/1996 | US5523696 Method and apparatus for testing integrated circuit chips |
| 06/04/1996 | US5523695 Universal test socket for exposing the active surface of an integrated circuit in a die-down package |
| 06/04/1996 | US5523678 Contact mechanism for transportation comprising suction unit equipped with floating mechanism |
| 06/04/1996 | US5523586 Burn-in socket used in a burn-in test for semiconductor chips |
| 06/03/1996 | CA2163676A1 Method and apparatus for testing an integrated circuit using controlled wirebonding and wirebonding removal |
| 05/30/1996 | WO1996016440A1 Interconnection elements for microelectronic components |
| 05/30/1996 | WO1996016338A1 Method and device for testing of electronic components |
| 05/30/1996 | WO1996016337A1 A measuring line for a coaxial conductor for determining energy throughflow and standing wave ratios |
| 05/30/1996 | DE4441347A1 Adaptor appts. for testing printed circuit boards |
| 05/29/1996 | EP0713589A1 Voice trouble-shooting system for computer-controlled machines |
| 05/28/1996 | US5521523 Probe card assembly and method of manufacturing probe card assembly |
| 05/28/1996 | US5521522 Probe apparatus for testing multiple integrated circuit dies |
| 05/28/1996 | US5521521 Testing contactor for small-size semiconductor devices |
| 05/28/1996 | US5521520 Method and apparatus for checking parts to be measured using a belt-like connection member |
| 05/28/1996 | US5521519 Spring probe with piloted and headed contact and method of tip formation |
| 05/28/1996 | US5521518 For testing integrated circuits of a wafer |
| 05/24/1996 | CA2163290A1 Packaging system for electronic test and measurement instruments |
| 05/23/1996 | WO1996015551A1 Mounting electronic components to a circuit board |
| 05/23/1996 | WO1996015459A1 Mounting spring elements on semiconductor devices, and wafer-level testing methodology |
| 05/23/1996 | WO1996015458A1 Probe card assembly and kit, and methods of using same |
| 05/22/1996 | EP0713220A1 A voltage reference circuit |
| 05/22/1996 | EP0713166A1 A voltage reference circuit |
| 05/22/1996 | CN2227838Y Multifunctional universal meter with combined tools |
| 05/21/1996 | US5519332 Carrier for testing an unpackaged semiconductor die |
| 05/21/1996 | US5519331 Removable biasing board for automated testing of integrated circuits |
| 05/17/1996 | WO1996014660A1 Method for fabricating a self-limiting silicon based interconnect for testing bare semiconductor dice |
| 05/17/1996 | WO1996014659A1 Method for forming contact pins for semiconductor dice and interconnects |
| 05/15/1996 | DE4447538A1 Meßwertverstärker (Strom-Spannungswandler) zur Erfassung kleiner, transienter Ströme Measuring amplifier (current-voltage converter) to detect small, transient currents |
| 05/15/1996 | DE19512947C1 Contacting device for HF and LF measurements on multi-pair, symmetrical data cables |
| 05/14/1996 | US5517154 Split-path linear isolation circuit apparatus and method |
| 05/14/1996 | US5517126 For measuring electrical characteristics of an object to be tested |
| 05/14/1996 | US5517125 Reusable die carrier for burn-in and burn-in process |
| 05/14/1996 | US5517036 Tape carrier, and test apparatus for the same |
| 05/09/1996 | WO1996013967A1 Programmable high density electronic testing device |
| 05/09/1996 | WO1996013728A1 Probe structure |
| 05/09/1996 | WO1996013714A1 Current/voltage transformer for the detection of the electron current in a scanning tunnelling-electron microscope |
| 05/09/1996 | DE4439758A1 Test pin for test adaptor to check printed circuit and wiring boards |
| 05/07/1996 | US5515001 Current-measuring operational amplifier circuits |
| 05/02/1996 | DE4438960A1 Current-voltage converter to determine tunnel current of a scanning tunnel microscope |
| 05/01/1996 | EP0709686A2 Apparatus for measuring an RF parameter |
| 05/01/1996 | EP0709685A1 Electrical measuring apparatus with battery compartment with access protection |
| 05/01/1996 | EP0708926A1 Adapter with solid body |
| 05/01/1996 | CN1121649A Contacting system for electrical devices |
| 04/30/1996 | US5513079 Mass termination of signals from electronic systems to devices under test |
| 04/30/1996 | US5512840 Electrical test clips for slotted and Phillips screw heads |
| 04/30/1996 | US5512839 Test probe for electrical measuring instruments, particularly for voltmeters |
| 04/30/1996 | US5512838 Probe with reduced input capacitance |
| 04/30/1996 | US5512831 Method and apparatus for testing electrochemical energy conversion devices |
| 04/30/1996 | US5512397 Stepper scanner discretionary lithography and common mask discretionary lithography for integrated circuits |
| 04/30/1996 | US5511304 Machine for loading test probes |
| 04/24/1996 | EP0708584A1 Socket for electrical device |
| 04/24/1996 | EP0708338A2 Probe card for high temperature application |
| 04/24/1996 | EP0707743A1 Lead frame including an inductor or other such magnetic component |
| 04/24/1996 | EP0667962B1 Printed circuit board testing device with foil adapter |
| 04/23/1996 | US5510723 Diced semiconductor device handler |
| 04/23/1996 | US5510722 Test fixture for printed circuit boards |
| 04/23/1996 | US5510721 Method and adjustment for known good die testing using resilient conductive straps |
| 04/23/1996 | US5509203 Method for manufacturing a sheet formed connector for inspection of an integrated circuit |
| 04/19/1996 | CA2160740A1 Socket for electronic device |
| 04/18/1996 | WO1996011411A1 Bus for sensitive analog signals |
| 04/18/1996 | DE19537358A1 Integrated circuit holding and transport support |
| 04/18/1996 | CA2201623A1 Bus for sensitive analog signals |
| 04/17/1996 | EP0707215A2 Separate transmission of data and energy for a measuring instrument |
| 04/17/1996 | EP0707214A2 Multiport membrane probe for full-wafer testing |
| 04/16/1996 | US5508630 Probe having a power detector for use with microwave or millimeter wave device |
| 04/16/1996 | US5508629 Method and apparatus for inspecting integrated circuit probe cards |
| 04/16/1996 | US5508628 Automated closure test socket |
| 04/16/1996 | US5508627 Photon assisted sub-tunneling electrical probe, probe tip, and probing method |
| 04/16/1996 | US5507652 Wedge connector for integrated circuits |
| 04/13/1996 | CA2160295A1 Alternating current detector |
| 04/10/1996 | EP0705438A1 Measurement amplifier |
| 04/10/1996 | CN2224424Y Intelligent detecting and recording instrument for power parameter |
| 04/09/1996 | US5506515 High-frequency probe tip assembly |
| 04/09/1996 | US5506513 Microwave circuit test fixture |
| 04/09/1996 | US5506512 Transfer apparatus having an elevator and prober using the same |
| 04/09/1996 | US5506510 Circuit probing apparatus |
| 04/09/1996 | US5506499 Multiple probing of an auxilary test pad which allows for reliable bonding to a primary bonding pad |
| 04/02/1996 | US5504436 Socket apparatus for member testing |
| 04/02/1996 | US5504435 Testing contactor for small-size semiconductor devices |
| 04/02/1996 | US5502965 Device for generating operating states characterized by differences in height in mechanical actuators |
| 03/28/1996 | DE19515154A1 Sensing head measurement handling device for integrated circuit testing |
| 03/27/1996 | EP0702797A1 Integrated circuit probing apparatus including a capacitor bypass structure |
| 03/27/1996 | CN1119277A Method and apparatus for sensing an input current with a bridge circuit |
| 03/26/1996 | US5502398 Semiconductor device burn-in apparatus |