Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
01/1999
01/12/1999US5859539 For testing multiple semiconductor devices
01/12/1999US5859538 Method and apparatus for connecting a ball grid array device to a test instrument to facilitate the monitoring of individual signals or the interruption of individual signals or both
01/07/1999WO1999000844A2 Sockets for semiconductor devices with spring contact elements
01/07/1999EP0889329A1 Electricity meter comprising a system for excess voltage protection
01/07/1999DE19730516A1 Leiterplattenprüfvorrichtung A circuit board
01/07/1999DE19728251A1 High frequency detector, e.g. for transmission mode of radio device
01/06/1999CN2303299Y Housing's door of kilowatt-hour meter
01/01/1999CA2242141A1 Electricity meter with overvoltage protection system
12/1998
12/30/1998WO1998045674A3 Probe tile and platform for large area wafer probing
12/30/1998EP0886894A2 Contact carriers (tiles) for populating larger substrates with spring contacts
12/30/1998CN1203367A IC testing apparatus
12/29/1998US5854559 Method and apparatus for testing microwave devices and circuits in a controlled environment
12/29/1998US5854558 Test board for testing a semiconductor device and method of testing the semiconductor device
12/29/1998US5854085 Multi-layer tab tape having distinct signal, power and ground planes, semiconductor device assembly employing same, apparatus for and method of assembling same
12/29/1998US5852871 Method of making raised contacts on electronic components
12/29/1998CA2024243C Circuit status indicator having liquid crystal display
12/23/1998WO1998058267A1 Toroidal core current transformer with integrated measuring shunt
12/23/1998WO1998058266A1 Probe card
12/23/1998EP0866975A4 Electro-optic voltage sensor
12/23/1998EP0826152A4 Method and apparatus for testing semiconductor dice
12/23/1998CN2301730Y Watthour meter viewing instrument
12/23/1998CN2301729Y Transparent watthour meter cover
12/23/1998CN2301728Y Pole watthour meter mounting bracket
12/23/1998CN1202730A Chip scale carrier
12/22/1998CA2044745C Electrostatic shielded probe
12/16/1998EP0884596A2 Circuit board misalignment detection apparatus and method
12/16/1998EP0884557A2 Conductive micro-probe and memory device
12/16/1998EP0883815A1 Apparatus for measuring a.c. current in a cable
12/16/1998EP0817973B1 Interface apparatus for automatic test equipment
12/16/1998EP0813804B1 Communications and measurement apparatus
12/16/1998CN1041253C Probe-type test handler, IC test method using the same and IC components
12/15/1998US5850148 Vertical probe card apparatus with macro-tension module having notched-shaped needle for self-balancing contact
12/15/1998US5850147 Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
12/15/1998US5850146 Probe apparatus for electrical inspection of printed circuit board assembly
12/15/1998US5849633 Electrically conductive projections and semiconductor processing method of forming same
12/15/1998US5848685 Photolithographically patterned spring contact
12/15/1998US5848465 Method for fabrication of probe
12/10/1998DE19825275A1 Test station for investigating semiconducting test element
12/10/1998DE19825274A1 Test station for semiconducting component testing
12/09/1998EP0882237A2 Laser-induced metallic plasma for con-contact inspection
12/09/1998EP0799424B1 Method and apparatus for semiconductor die testing
12/08/1998US5847572 Partly replaceable device for testing a multi-contact integrated circuit chip package
12/08/1998US5847571 Membrane probing of circuits
12/08/1998US5847569 Electrical contact probe for sampling high frequency electrical signals
12/03/1998WO1998054586A1 Broadband impedance matching probe
12/03/1998DE19823729A1 Semiconductor wafer contact pin position determination method
12/03/1998DE19722872A1 Circuit measuring electrode current from e.g. electrically-heated zirconium di:oxide exhaust gas sensor
12/02/1998EP0561765B1 Novel method of making, testing and test device for integrated circuits
12/01/1998US5844421 Probe control method for leveling probe pins for a probe test sequence
12/01/1998US5844419 Method for testing semiconductor packages using decoupling capacitors to reduce noise
12/01/1998US5844418 Carrier having interchangeable substrate used for testing of semiconductor dies
12/01/1998US5844414 Method and a system for moving a measuring means above a test object
12/01/1998US5844288 Photoconductive element and method for measuring high frequency signals
12/01/1998US5843844 Probe sheet and method of manufacturing the same
11/1998
11/26/1998WO1998053331A1 Probe head assembly
11/26/1998WO1998053330A2 Test head structure for integrated circuit tester
11/25/1998EP0880311A1 Electromagnetic field shielding device
11/25/1998EP0879420A1 Improved charge rate electrometer
11/25/1998EP0784799B1 Bus for sensitive analog signals
11/25/1998CN2298520Y Positive and negative degree counter meter gear wheel set changement
11/25/1998CN1199861A Capacitive transformer in metal all-closed gas insulating high voltage system
11/24/1998US5841292 Automated test pin loading apparatus
11/24/1998US5841291 For providing power and ground potentials
11/24/1998US5841272 Frequency-insensitive current sensor
11/24/1998US5839810 Display gauge
11/19/1998WO1998052250A1 Socket for positioning an integrated circuit chip on a flexible connector sheet
11/19/1998WO1998052218A1 Connector and probing system
11/19/1998WO1998051998A1 Measuring system
11/19/1998DE19720196A1 Messwerk Measuring equipment
11/18/1998CN2297734Y Knife-clamping type line measuring terminal
11/18/1998CN1199466A Device for and method of inspecting liquid crystal display panel and method of mfg. liquid crystal display panel
11/17/1998US5838162 Test apparatus and method for testing integrated circuit modules having visual display
11/17/1998US5838161 Semiconductor interconnect having test structures for evaluating electrical characteristics of the interconnect
11/17/1998US5838160 Integral rigid chip test probe
11/17/1998US5838159 Chip carrier to allow electron beam probing and FIB modifications
11/17/1998CA2124484C Electrostatic voltmeter
11/12/1998WO1998050954A1 Stacked semiconductor devices, particularly memory chips
11/12/1998WO1998050953A1 Electronic component having resilient contact elements at areas remote from corresponding terminals
11/11/1998EP0877259A2 Apparatus for testing an electric circuit board comprising contact points and conductor lines
11/11/1998EP0876619A1 Machine for the electric test of printed circuits with adjustable position of the sound needles
11/11/1998EP0859686A4 Fabricating interconnects and tips using sacrificial substrates
11/11/1998EP0679128B1 An apparatus forming a junction box comprising a shunt busbar disposed therein
11/11/1998CN1198817A Semiconductor device testing apparatus
11/11/1998CN1198533A Apparatus and method for testing non-componented printed circuit boards
11/10/1998US5835997 Wafer shielding chamber for probe station
11/10/1998US5834952 Open-loop current mode biasing scheme for MR head
11/10/1998US5834945 High speed temporary package and interconnect for testing semiconductor dice and method of fabrication
11/10/1998US5834944 Safety interlock system for a wafer prober testing device
11/10/1998US5834939 Hand-held ignition voltage tester
11/10/1998US5834935 Electronic instrument
11/10/1998US5834931 RF current sensor
11/10/1998US5834929 Test probe guide device
11/10/1998US5834824 Use of conductive particles in a nonconductive body as an integrated circuit antifuse
11/10/1998US5833479 Surface mount test point enabling hands-free diagnostic testing of electronical circuits
11/10/1998US5832601 Method of making temporary connections between electronic components
11/05/1998WO1998049569A1 Manipulator with expanded range of motion
11/05/1998WO1998049526A1 Cable tray assembly for testing device
11/05/1998DE19718478A1 Test probe for oscilloscope high impedance probes
11/05/1998DE19717951A1 Contact test arrangement, e.g. for testing integrated circuits
11/05/1998DE19716945A1 Test adaptor for electrical circuit board
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