| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 04/14/1994 | DE4234461A1 Test adaptor esp. for gas-insulated medium-voltage switchgear - has recessed insulating sleeve fitted replaceably into hollowed end of tubular polymeric plug with coaxial conductor |
| 04/12/1994 | US5302891 For testing a semiconductor device in die form |
| 04/12/1994 | CA1328481C Test head with improved shielding |
| 04/06/1994 | EP0590221A1 Current measuring structure for testing integrated circuits |
| 04/06/1994 | EP0589935A1 Inspection of a dynamo-electric machine in a gap between stator and rotor. |
| 04/05/1994 | US5300917 Junction box having integrally formed shunt |
| 04/05/1994 | US5300885 Field probe for measuring vector components of an electromagnetic field |
| 04/05/1994 | US5300881 For testing of printed circuit boards |
| 03/31/1994 | DE4232404A1 Testing integrated circuit chip on substrate - involves temporarily sticking substrate carrying chip onto adaptor during testing |
| 03/30/1994 | EP0589593A2 Electro-optic sampling |
| 03/30/1994 | EP0589518A1 Appliance for hyperfrequent calibration |
| 03/23/1994 | EP0588512A1 Method of and apparatus for scanning the surface of a workpiece |
| 03/23/1994 | CN1084279A High voltage megohm meter with delay short circuit protection |
| 03/22/1994 | US5296804 Air core gauge fixed voltage signal and variable pulse width modulation signal interchanged control system therefor |
| 03/22/1994 | US5295853 Mechanism for removably mounting dut board on test head |
| 03/22/1994 | US5295841 Supportable contact and chip carrier socket for use with an assembly/disassembly tool |
| 03/16/1994 | EP0587418A2 Electro-optic probe |
| 03/16/1994 | EP0587337A1 Debondable metallic bonding method |
| 03/09/1994 | EP0586202A2 Voltage measuring apparatus |
| 03/09/1994 | EP0586182A2 Radial planar current detection device having an extended frequency range of response |
| 03/09/1994 | EP0585656A2 Clamp-on current measuring probe |
| 03/08/1994 | US5293516 Multiprobe apparatus |
| 03/08/1994 | US5293131 Capacitive probe for bore measurement |
| 03/08/1994 | US5293122 Signal probe with remote control function |
| 03/01/1994 | US5291129 Contact probe |
| 03/01/1994 | US5291124 Tester for high voltage measuring apparatus |
| 03/01/1994 | US5290193 High density grid array test socket |
| 03/01/1994 | US5290192 Chip carrier socket |
| 02/22/1994 | US5289117 Translator module |
| 02/17/1994 | WO1994004015A1 Adapter for an automatic inspection device of printed circuit boards |
| 02/16/1994 | EP0583097A1 Double ended hermaphroditic signal node module |
| 02/10/1994 | DE4226069A1 Adaptereinrichtung für eine automatische Prüfvorrichtung zum Prüfen von Schaltungsplatinen Adapter device for an automatic test apparatus for testing of circuit boards |
| 02/09/1994 | EP0582072A1 Temperature compensated voltage regulator having beta compensation |
| 02/09/1994 | CN2155591Y Automatic tester |
| 02/09/1994 | CN2155571Y Universal testing clamp for low-resistance testers |
| 02/08/1994 | US5285149 Method for loading an adapter for a device for testing printed circuit boards |
| 02/03/1994 | DE4224444A1 Test plug for checking electrical and mechanical connection of spring contact to current rail - uses cable connection aperture in spring contact for contacting test pin to current rail |
| 02/01/1994 | US5283605 Device for testing contacting and/or wiring of sockets on a circuit board |
| 02/01/1994 | US5283518 Method for the control of ground bounce below an internal ground plane in a short-wire board test fixture |
| 01/27/1994 | DE4224186A1 Electrical connection device esp. for measurement equipment - has small contact parts including stem of measurement spike aligned for entry into bore in pin of plug connector |
| 01/26/1994 | EP0580446A1 Electric field measuring apparatus |
| 01/25/1994 | US5282111 Thermal transfer plate and integrated circuit chip or other electrical component assemblies including such plate |
| 01/19/1994 | EP0276280B1 Method for remotely detecting an electric field |
| 01/19/1994 | EP0274529B1 Liquid crystal display |
| 01/19/1994 | CN2153805Y Minisize signal measuring probe |
| 01/18/1994 | US5280254 Connector assembly |
| 01/18/1994 | US5280236 IC test instrument |
| 01/12/1994 | EP0578375A2 Adjustable strap implemented return line for a probe station |
| 01/11/1994 | US5278508 Diagnostic apparatus displaying engine operating characteristics in the parameters in which the characteristics are measured |
| 01/05/1994 | EP0577333A1 Temporary connections for fast electrical access to electronic devices |
| 01/04/1994 | US5276395 Bed-of-pins test fixture |
| 12/28/1993 | USRE34491 Contact array assembly for a computer-controlled printed circuit board testing apparatus |
| 12/28/1993 | US5274336 For acquiring a digital electrical signal from a source conductor |
| 12/28/1993 | US5273441 SMA burn-in socket |
| 12/28/1993 | US5273438 Canted coil spring array and method for producing the same |
| 12/23/1993 | WO1993026059A1 Millimeter wave beam deflector |
| 12/23/1993 | DE4236086C1 Low-ohmic electrical measuring resistance - uses two symmetrical terminals with stepped facing edges providing seating for inserted resistance element |
| 12/22/1993 | CN2150563Y Double-slide linear-analog given device |
| 12/21/1993 | US5272768 Blank strip font compression method and device, and resulting stored, decompressible font |
| 12/21/1993 | US5272433 Polarmetric electric field sensor with electro-optical crystal cut disposed to measure electric field direction |
| 12/15/1993 | EP0574149A1 Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
| 12/15/1993 | EP0574120A1 Signal probe apparatus |
| 12/15/1993 | EP0574076A1 Probe for sampling electrical signals |
| 12/14/1993 | US5270660 Electrostatic voltmeter employing high voltage integrated circuit devices |
| 12/14/1993 | US5270641 For testing of circuits of a printed circuit board |
| 12/14/1993 | US5270543 Electronic probe and method for its manufacture |
| 12/09/1993 | WO1993024844A1 Capacitive probe type circuit board with shielded connector |
| 12/08/1993 | EP0572736A1 IC test clip with flexible contacts |
| 12/08/1993 | CN1023032C Digital wire searcher |
| 12/07/1993 | US5268636 MMIC package and interconnect test fixture |
| 12/02/1993 | DE4242585C1 Measuring probe for ohmic surface and volume resistivity - uses replaceable contact pins fitted in two rows to surface of insulating plate |
| 12/01/1993 | EP0572311A1 Resistive current sensor |
| 12/01/1993 | EP0572180A1 Wafer probe station having auxiliary chucks |
| 11/30/1993 | US5267336 Electro-optical sensor for detecting electric fields |
| 11/30/1993 | US5266903 Shielded connector for making electrical connections to a circuit board in the form of a capacitive probe |
| 11/30/1993 | US5266895 Probe with contact portion including Au and Cu alloy |
| 11/30/1993 | US5266885 Generator of reference voltage that varies with temperature having given thermal drift and linear function of the supply voltage |
| 11/30/1993 | US5266059 Generic rotatable connector assembly for testing integrated circuit packages |
| 11/25/1993 | WO1993023757A1 High-speed, high-impedance external photoconductive-type sampling probe/pulser |
| 11/24/1993 | EP0570840A2 Sensor for testing integrated circuits |
| 11/24/1993 | CN2147538Y Domestic plug type inserting electric voltage meter |
| 11/23/1993 | US5264788 Adjustable strap implemented return line for a probe station |
| 11/23/1993 | US5264787 Device for testing an electrical circuit element |
| 11/18/1993 | EP0570148A2 Electrostatic voltmeter employing high voltage integrated circuit devices |
| 11/18/1993 | DE4241863C1 Plug contactor module for testing vehicle cable trees terminated with plugs - has sprung contact pins which, when plug is inserted in housing, are pressed against contact pieces of plug and retained |
| 11/18/1993 | DE4216262A1 HF measurement equipment connector for instrument sensing head cable - has hybrid circuit board for mounting frequency characteristic compensation circuit in parallel with series LCR resonant circuits tuned to higher frequency band than compensation circuit. |
| 11/02/1993 | US5258705 Active matrix substrate inspecting device |
| 11/02/1993 | US5258703 Temperature compensated voltage regulator having beta compensation |
| 10/28/1993 | DE4231704C1 Mfg. needle for dynamic signal measurements in integrated circuit chip - covering metallic needle point by insulation layer and outer metal layer apart from extreme needle end |
| 10/27/1993 | EP0566805A1 Measuring probe for ignition circuit |
| 10/26/1993 | US5257167 Silhouette illuminated vehicle display apparatus |
| 10/26/1993 | US5257166 Configurable electronic circuit board adapter therefor, and designing method of electronic circuit using the same board |
| 10/21/1993 | DE4212837A1 Adaptor for circuit board test appts. - has needle carrier plate with needle contact elements fixed in axially adjusted positions |
| 10/14/1993 | WO1993020675A1 Integrated circuit test socket |
| 10/14/1993 | WO1993020453A1 Pcb test socket |
| 10/12/1993 | US5252916 Pneumatic test fixture with springless test probes |
| 10/12/1993 | CA1323067C Electric wire clip |
| 10/06/1993 | EP0563234A1 Testing clip and circuit board contacting method. |
| 09/29/1993 | EP0561984A1 Assembly for connecting a test device to an object to be tested |
| 09/29/1993 | EP0561765A1 Novel method of making, testing and test device for integrated circuits |