Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
08/1998
08/27/1998WO1998037426A2 Probe plate for a test fixture
08/27/1998DE19807913A1 Test probe for measuring instrument
08/27/1998DE19745646A1 Transport device for multiple semiconductor tester
08/26/1998EP0860702A2 Structure of contact end in contact probe
08/26/1998EP0860101A1 Method for producing contact pads on pattern boards and adapter board for testing pattern boards
08/26/1998EP0859686A1 Fabricating interconnects and tips using sacrificial substrates
08/26/1998CN1191500A Ribbon-like core interconnection elements
08/25/1998US5798655 Contact probe unit including needle members urged by a resilient material block
08/25/1998US5798654 For testing a printed circuit board
08/25/1998US5798652 Method of batch testing surface mount devices using a substrate edge connector
08/25/1998US5798565 For integrating diced integrated circuits
08/20/1998DE19801269A1 Electrical circuit testing probe
08/19/1998EP0858726A1 Electrical connector
08/19/1998CN1191019A Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus
08/18/1998US5796264 Apparatus for manufacturing known good semiconductor dice
08/13/1998WO1998035238A1 Probe card and system for testing wafers
08/12/1998EP0834243A4 Photolithographically patterned spring contact
08/11/1998US5793220 Fixture for testing and prepping light-emitting diodes
08/11/1998US5793219 Testing of semiconductor integrated circuits
08/11/1998US5793117 Semiconductor device and method of fabricating the same
08/11/1998US5791934 Probeless fixture for adapter card testing
08/11/1998US5791913 Display panel inspection socket
08/06/1998CA2228538A1 Polarity testing probe and led cartridge assembly
08/05/1998EP0856740A1 PCB testing system
08/04/1998US5790355 Electric appliance
08/04/1998US5789912 High frequency switch and method of testing H-F apparatus
08/04/1998US5789911 Polarity testing probe and LED cartridge assembly
08/04/1998US5789804 Contact agency interposed between IC and IC receptacle
08/04/1998US5788526 Integrated circuit test socket having compliant lid and mechanical advantage latch
08/04/1998US5788524 Test clip with standard interface
07/1998
07/30/1998DE19708914C1 Test plug for use with terminal blocks mounted in switch-cabinet
07/29/1998EP0855037A1 Loaded board drop pin fixture
07/29/1998EP0760936B1 Strain gauge sensor and modulation amplifier for bridge circuits
07/29/1998CN1188895A Measuring equipment for electricity meter
07/28/1998US5786701 Bare die testing
07/28/1998US5786697 Capacitive open-circuit and short-circuit tests of component connections to circuit boards
07/28/1998US5785538 High density test probe with rigid surface structure
07/28/1998CA2105270C Electro-optic sampling
07/22/1998EP0853657A1 Storage device for objects, storage station, and air-conditioned cabinet
07/21/1998US5783461 Useful for testing semiconductor dice
07/16/1998WO1998030914A1 Contact probe assembly for testing electrical devices
07/16/1998DE19800461A1 Test clamping device for electronic circuit boards used to mount integrated circuits for burn-in testing
07/16/1998DE19709054C1 Test plug with actuating tool e.g. for tapping safety spring- terminals on terminal blocks
07/15/1998EP0853243A2 Method and apparatus for detecting defects in wafers
07/15/1998EP0852701A1 Electro-optic interface for field instrument
07/15/1998CN1187618A Method to process optical information, device realising method and postal automate including such device
07/14/1998US5781759 Emulator probe mountable to a target board at different orientation angles
07/14/1998US5781023 For performing tests on an electrical device
07/14/1998US5781022 Substrate having self limiting contacts for establishing an electrical connection with a semiconductor die
07/14/1998US5781021 Universal fixtureless test equipment
07/14/1998US5781018 Near-field resistivity microscope
07/14/1998US5778552 Touch sensor
07/14/1998US5778485 Probe card cleaning apparatus, probe apparatus with the cleaning apparatus, and probe card cleaning method
07/09/1998WO1998029751A1 Contact probe unit
07/08/1998EP0852014A1 Machine for the opposite control of printed circuits
07/08/1998CN2285903Y Test converting bar
07/08/1998CN1186919A Cover structure of linear drive device
07/07/1998US5777235 Strain gage measuring arrangement, use of same, and modulation amplifier for such measuring arrangements
07/07/1998US5775942 Clamp jaw, lever bypass meter socket
07/02/1998WO1998028819A1 Component for contacting a measuring unit and method for its production
07/02/1998DE19757273A1 Test device for integrated circuit components
07/02/1998DE19703897C1 Terminal device for providing releasable electrical connection e.g. for testing SMD components
07/02/1998DE19648421C1 Contact device for testing integrated circuits (ICs)
07/01/1998EP0851234A2 Adapter arrangement for electrically testing printed circuit boards
07/01/1998EP0850490A1 Process and device for testing a chip
07/01/1998EP0850419A1 Near-field resistivity microscope
07/01/1998EP0515577B1 Making and testing an integrated circuit using high density probe points
06/1998
06/30/1998US5773988 For electrically connecting limited-access test targets
06/30/1998US5773987 Method for probing a semiconductor wafer using a motor controlled scrub process
06/30/1998US5773780 Method of severing bond wires and forming balls at their ends
06/30/1998US5772451 Sockets for electronic components and methods of connecting to electronic components
06/25/1998DE19654382A1 Bauelement für eine Meßwerkkontaktierung und Verfahren zu dessen Herstellung Component for a Meßwerkkontaktierung and process for its preparation
06/24/1998EP0849599A1 Apparatus for contacting semiconductor die
06/24/1998EP0792519A4 Interconnection elements for microelectronic components
06/24/1998EP0792517A4 Electrical contact structures from flexible wire
06/24/1998EP0792463A4 Mounting spring elements on semiconductor devices, and wafer-level testing methodology
06/24/1998EP0729652A4 Contact structure for interconnections, interposer, semiconductor assembly and method
06/23/1998US5770956 Measurement amplifier
06/23/1998US5770946 Photon assisted sub-tunneling electrical probe, probe tip, and probing method
06/18/1998WO1998026300A1 Probe card for high speed testing
06/17/1998EP0848395A2 Current-meter transformer provided with a current divider
06/17/1998EP0848258A1 Measuring appliance for electricity meter
06/17/1998EP0848233A1 A method to process optical information, a device realising the method and a postal automate including such a device
06/17/1998CN1184941A Semiconductor device testing apparatus
06/16/1998US5767692 Device for converting the test point grid of a machine for electrically testing unassembled printed circuit boards
06/16/1998US5767691 Probe-oxide-semiconductor method and apparatus for measuring oxide charge on a semiconductor wafer
06/16/1998US5767689 Bare chip test carrier with an improved holding structure for a semiconductor chip
06/16/1998US5767688 For detecting a voltage of a sample
06/16/1998US5767668 Remote current sensor
06/16/1998US5767425 Surface bearing for indicating instrument
06/16/1998US5766979 Wafer level contact sheet and method of assembly
06/11/1998WO1998025016A1 Apparatus and method for sensing movement of fuel injector valve
06/10/1998EP0847138A2 Capacitive sensing device
06/10/1998EP0846953A2 Printed circuit board inspecting apparatus, and method of using a universal-type printed circuit board inspecting apparatus
06/09/1998US5764071 Method and system for testing an electronic module mounted on a printed circuit board
06/09/1998US5764070 Structure for testing bare integrated circuit devices
06/09/1998US5764069 High density grid for testing circuit boards
06/09/1998US5764048 Ultra high accuracy voltage measurement system
06/09/1998US5763952 Multi-layer tape having distinct signal, power and ground planes, semiconductor device assembly employing same, apparatus for and method of assembling same
06/09/1998US5763879 Diamond probe tip
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