Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
11/1998
11/04/1998EP0875767A2 Device and procedure for testing naked circuit boards
11/03/1998US5831994 Semiconductor device testing fixture
11/03/1998US5831961 Information processing apparatus with probe undergoing circular motion
11/03/1998US5831444 Apparatus for performing a function on an integrated circuit
11/03/1998US5831443 For testing semiconductor probe cards
11/03/1998US5831441 Test board for testing a semiconductor device, method of testing the semiconductor device, contact device, test method using the contact device, and test jig for testing the semiconductor device
11/03/1998US5831425 Bus bar structure for electrical junction box
11/03/1998US5831302 Voltage reference circuit
11/03/1998US5831160 Test fixture clamping system
11/03/1998US5830565 High planarity and low thermal coefficient of expansion base for semi-conductor reliability screening
11/03/1998US5829651 Nonconductive holster for electrical meter
11/03/1998US5829128 Method of mounting resilient contact structures to semiconductor devices
11/03/1998US5829126 Method of manufacturing probe card
10/1998
10/29/1998WO1998047663A1 Abrasive material for the needle point of a probe card
10/28/1998EP0874243A2 Automatic adjustment method for elimination of the centering error during the electrical test on printed circuit boards
10/28/1998EP0873908A2 Current detecting resistor and car-borne unit
10/28/1998CN1197514A Microelectronic contact structure and method of making same
10/27/1998US5828226 Probe card assembly for high density integrated circuits
10/27/1998US5828225 Semiconductor wafer probing apparatus
10/27/1998US5828224 Test carrier for semiconductor integrated circuit and method of testing semiconductor integrated circuit
10/27/1998US5828209 Voltage reference arrangement, a voltameter, a battery voltage detection arrangement, and a wireless communication device
10/22/1998WO1998047010A1 Probe assembly and method for switchable multi-dut testing of integrated circuit wafers
10/22/1998CA2230211A1 Automatic adjustment method for elimination of the centering error during the electrical test on printed circuit boards
10/21/1998CN1196794A Machine for opposite control of printed circuits
10/20/1998US5825500 Unit for transferring to-be-inspected object to inspection position
10/20/1998US5825195 Method and apparatus for testing an unpackaged semiconductor die
10/20/1998US5825192 For testing the electrical characteristics of an object
10/20/1998US5825175 Of an electrical measuring device
10/20/1998US5824953 Coaxial connector for vacuum chamber for microwave and millimeter wave measurement
10/20/1998US5823818 Test probe for computer circuit board test fixture
10/15/1998WO1998045897A1 Telecommunications apparatus
10/15/1998WO1998045716A1 Method for making cards with multiple contact tips for testing semiconductor chips
10/15/1998WO1998045674A2 Probe tile and platform for large area wafer probing
10/15/1998DE19746160C1 Contact clamping unit for engaging pins on electronic integrated circuits
10/14/1998CN1195964A Electronic device and detecting method thereof
10/13/1998US5821764 Interface apparatus for automatic test equipment
10/13/1998US5821763 For probing an electronic device
10/13/1998US5821762 Semiconductor device, production method therefor, method for testing semiconductor elements, test substrate for the method and method for producing the test substrate
10/13/1998US5821759 Method and apparatus for detecting shorts in a multi-layer electronic package
10/13/1998US5821757 Noise reduction in an on-line battery impedance measurement system
10/13/1998US5821529 Measuring board having an optically driven switch and I/O terminal testing system using the same
10/13/1998US5821440 Cable tray assembly for testing device
10/08/1998WO1998044354A1 Flexible shielded laminate beam for electrical contacts
10/08/1998WO1998037426A3 Probe plate for a test fixture
10/08/1998DE19814866A1 Test arrangement for electric testing of electrical systems
10/07/1998EP0869369A2 Capacitive voltage transducer for a metal-encapsulated gas-insulated high voltage installation
10/07/1998EP0868666A1 Current sensing device
10/06/1998US5818252 Reduced output test configuration for tape automated bonding
10/06/1998US5818249 Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits
10/06/1998US5818248 Loaded board test fixture with integral translator fixture for testing closely spaced test sites
10/06/1998US5818246 Automatic multi-probe PWB tester
10/01/1998DE19811567A1 Precision voltage generator for generating DC reference voltage
09/1998
09/30/1998EP0866975A1 Electro-optic voltage sensor
09/30/1998CN1194693A Microelectronic spring contact element
09/30/1998CN1194692A Microelectronic tontact structure and method of making same
09/29/1998US5815027 Circuit configuration for detecting a load current of a power semiconductor component with a source-side load
09/29/1998US5815000 Method for testing semiconductor dice with conventionally sized temporary packages
09/29/1998US5814158 Dipping probe tips in cleaning solution so only ends touch solution
09/29/1998US5813881 Programmable cable and cable adapter using fuses and antifuses
09/24/1998WO1998041943A1 A medical consultation management system
09/24/1998WO1998041878A1 Apparatus for testing boards provided with electrically conductive patterns and an adapter intended for such an apparatus
09/24/1998WO1998041877A1 Resilient connector having a tubular spring
09/24/1998DE19709687A1 Electric or electronic instrument
09/23/1998EP0866509A2 Hand held instrument with safety locked battery compartment
09/23/1998EP0866337A2 Rigid needle for the electrical test on printed circuit boards
09/23/1998CN2292289Y Multi-function electric power measuring box capable of preventing fraudulent use
09/22/1998US5812378 Microelectronic connector for engaging bump leads
09/22/1998US5811993 Supply voltage independent bandgap based reference generator circuit for SOI/bulk CMOS technologies
09/22/1998US5811982 High density cantilevered probe for electronic devices
09/22/1998US5811981 Apparatus for facilitating zero-insertion of a burn-in test probe into a socket
09/19/1998CA2231763A1 High precision reference voltage generator
09/17/1998WO1998040752A1 Peripherally leaded package test contactor
09/16/1998EP0864871A2 Cleaning method, device and tool for board electrical-test probes and board electrical-test device and method
09/16/1998EP0864870A2 Method of making an integrated circuit testing device
09/16/1998EP0864097A1 Device for carrying out measurements on communication lines
09/16/1998EP0843892A4 Top loading socket for ball grid arrays
09/16/1998CN1193386A Shunt assembly for current measurement
09/16/1998CN1193111A Resistance-voltage converting circuit
09/15/1998US5808475 Semiconductor probe card for low current measurements
09/15/1998US5808474 Test socket for testing integrated circuit packages
09/15/1998US5808415 Apparatus for sensing RF current delivered to a plasma with two inductive loops
09/15/1998US5808351 Programmable/reprogramable structure using fuses and antifuses
09/15/1998US5808259 Thick film apparatus and method for customizing IC test PCB
09/15/1998US5807104 Test socket for detachable IC chip
09/09/1998EP0832438A4 Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus
09/09/1998CN2290857Y Mini multitester fixator
09/09/1998CN2290856Y Digital multitester plastic outer shell
09/09/1998CN1192825A Top loading socket for ball grid arrays
09/09/1998CN1039756C Method for recovering bare semicoductor chips from plastic packaged moduler
09/08/1998US5804984 Electronic component test apparatus with rotational probe
09/08/1998US5804983 Probe apparatus with tilt correction mechanisms
09/08/1998US5804982 Miniature probe positioning actuator
09/08/1998US5802699 Methods of assembling microelectronic assembly with socket for engaging bump leads
09/02/1998EP0862061A2 Circuit board inspection apparatus and method
09/02/1998EP0781419A4 Method and device for making connection
09/01/1998US5801544 Spring probe and method for biasing
09/01/1998US5801543 For electrical circuits
09/01/1998US5801528 Semiconductor element evaluating apparatus
09/01/1998US5800205 Contact mechanism for IC testing
09/01/1998US5800185 Adapter for use with an electrical component
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