| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 03/26/1996 | US5502372 Microstrip diagnostic probe for thick metal flared notch and ridged waveguide radiators |
| 03/21/1996 | WO1996008728A1 A surface mount test point enabling hands free diagnostic testing of electronical circuits |
| 03/21/1996 | DE19534469A1 Integrated circuit module terminal contact configuration for esp. BGA or PGA |
| 03/20/1996 | EP0702303A1 Prescaler IC test method capable of executing alternate current test by the use of IC tester for direct current test |
| 03/19/1996 | US5500607 Probe-oxide-semiconductor method and apparatus for measuring oxide charge on a semiconductor wafer |
| 03/19/1996 | US5500606 Completely wireless dual-access test fixture |
| 03/19/1996 | US5500605 Electrical test apparatus and method |
| 03/19/1996 | US5500604 Radial tensioning lamination fixture for membrane test probe |
| 03/19/1996 | US5500587 E-O probe |
| 03/19/1996 | US5499933 Probe pins for inspection and slip-on sockets thereof |
| 03/14/1996 | WO1996008056A1 Ball grid array socket |
| 03/14/1996 | WO1996007924A1 Membrane probing of circuits |
| 03/14/1996 | WO1996007921A1 Membrane probing of circuits |
| 03/14/1996 | DE4432274A1 Motor vehicle electric instruments display with ribbon cable connector |
| 03/14/1996 | DE19533272A1 Test contact e.g. for ball-grid array (BGA) type IC modules |
| 03/13/1996 | EP0701140A2 Checking apparatus for array electrode substrate |
| 03/13/1996 | EP0701136A2 Electrical probe apparatus |
| 03/12/1996 | US5498970 Top load socket for ball grid array devices |
| 03/12/1996 | US5498964 Capacitive electrode system for detecting open solder joints in printed circuit assemblies |
| 03/06/1996 | EP0699915A2 Measuring jig used for evaluation of a device with a nonradiative dielectric waveguide |
| 03/06/1996 | EP0699913A2 Interface apparatus for automatic test equipment |
| 03/06/1996 | EP0699912A2 An apparatus, method, and wafer used for testing integrated circuits formed on a product wafer |
| 03/05/1996 | US5497104 Flexible interface IC test clip |
| 03/05/1996 | US5497103 Test apparatus for circuitized substrate |
| 03/05/1996 | US5495667 Method for forming contact pins for semiconductor dice and interconnects |
| 02/29/1996 | DE4430025A1 Potential-free measurement of output current |
| 02/28/1996 | CN1117654A Temporary package for bare die test and burn-in |
| 02/28/1996 | CN1031157C Wave generator |
| 02/27/1996 | US5495180 DC biasing and AC loading of high gain frequency transistors |
| 02/27/1996 | US5495179 Carrier having interchangeable substrate used for testing of semiconductor dies |
| 02/27/1996 | US5495173 Method and apparatus for characterizing a differential circuit |
| 02/27/1996 | US5494448 Cantilever spring and method for temporarily coupling a semiconductor device to a transmission line using the cantilever spring |
| 02/27/1996 | CA2128791A1 Meter-base electrical service shield |
| 02/21/1996 | CN1117138A Testing fixture and method for circuit traces on a flexible substrate |
| 02/20/1996 | US5493237 Integrated circuit chip testing apparatus |
| 02/20/1996 | US5493230 Retention of test probes in translator fixtures |
| 02/20/1996 | US5491891 Method of making a test probe ring |
| 02/15/1996 | WO1996004562A1 A method and a system for moving a measuring means above a test object |
| 02/15/1996 | DE4428797A1 PCB and/or flat electric circuit assembly test appts. |
| 02/15/1996 | DE19528972A1 Kabeldämpfungssimulator mit einem passiven Netzwerk für serielle digitale Signalquellen Cable loss simulator with a passive network for serial digital signal sources |
| 02/14/1996 | EP0696740A2 Multimeter-like user interface for a graphical instrument |
| 02/13/1996 | US5491427 Probe and electrical part/circuit inspecting apparatus as well as electrical part/circuit inspecting method |
| 02/13/1996 | US5491426 Adaptable wafer probe assembly for testing ICs with different power/ground bond pad configurations |
| 02/13/1996 | US5491425 Apparatus for evaluating characteristics of semiconductor device and method of evaluating characteristics of semiconductor device using the same |
| 02/09/1996 | CA2153742A1 Multimeter-like user interface for a graphical instrument |
| 02/07/1996 | EP0695943A2 Temporary package for bare die test and-burn-in |
| 02/06/1996 | US5490044 Electric terminal assembly |
| 02/06/1996 | US5489855 Apparatus and process providing controlled probing |
| 02/06/1996 | US5489854 IC chip test socket with double-ended spring biased contacts |
| 02/06/1996 | US5489853 Testing apparatus and connection method for the testing apparatus |
| 01/30/1996 | US5488334 Air-cooled power load |
| 01/30/1996 | US5488314 Buckling beam test probe assembly |
| 01/30/1996 | US5488313 Test probe and circuit board arrangement for the circuit under test for microstrip circuitry |
| 01/30/1996 | US5488304 Method and apparatus for judging active/dead status of communication cable |
| 01/30/1996 | US5488290 Energizing devices for kilowatt hour meter displays |
| 01/30/1996 | US5487999 Method for fabricating a penetration limited contact having a rough textured surface |
| 01/24/1996 | EP0693692A2 Voltage and resistance synthesizer using pulse width modulation |
| 01/24/1996 | EP0632950B1 Integrated circuit test socket |
| 01/24/1996 | CN2218406Y Folding meter |
| 01/24/1996 | CN1030800C Method and electrical measuring apparatus for analyzing impedance of source of actual alternating voltage |
| 01/23/1996 | US5486771 Burn-in socket testing apparatus |
| 01/23/1996 | US5486770 High frequency wafer probe apparatus and method |
| 01/23/1996 | CA2150663A1 Control system |
| 01/18/1996 | WO1996001433A1 Characterizing a differential circuit |
| 01/16/1996 | US5485351 Socket assembly for integrated circuit chip package |
| 01/16/1996 | US5485115 Impedance synthesizer |
| 01/16/1996 | US5485096 Printed circuit board tester having a test bed with spring probes and easily replaceable switch cards |
| 01/16/1996 | US5484306 Quick-connect terminal and receptacle |
| 01/16/1996 | US5483741 Method for fabricating a self limiting silicon based interconnect for testing bare semiconductor dice |
| 01/11/1996 | DE19513275A1 Probe adaptor for connecting integrated circuit components to electronic test-measurement appts. |
| 01/10/1996 | EP0691543A1 Device for testing and/or measuring electric variables |
| 01/09/1996 | US5483174 Temporary connection of semiconductor die using optical alignment techniques |
| 01/09/1996 | US5483173 Current measuring structure for testing integrated circuits |
| 01/09/1996 | US5482471 Socket apparatus for IC package testing |
| 01/09/1996 | US5481929 Instrument holder and method for inspection of a dynamo-electric machine in a gap between a stator and a rotor and dynamo-electric machine having the instrument holder |
| 01/03/1996 | EP0690565A1 Common mode error correction for differential amplifiers |
| 01/02/1996 | US5481205 Temporary connections for fast electrical access to electronic devices |
| 01/02/1996 | US5481203 Test socket assembly |
| 01/02/1996 | US5481202 Optical scan and alignment of devices under test |
| 01/02/1996 | US5481185 Solenoid, type voltage, polarity and continuity tester |
| 01/02/1996 | US5479694 Method for mounting integrated circuits onto printed circuit boards and testing |
| 01/02/1996 | CA2043255C Polarimetric directional field sensor |
| 12/28/1995 | WO1995035648A1 Adapter for use in an apparatus for testing circuit cards |
| 12/27/1995 | EP0689241A2 Carrier for carrying semiconductor device |
| 12/27/1995 | EP0689057A2 Monitoring device secured to power distribution system conductors |
| 12/26/1995 | US5479110 Printed flexible circuit terminations and method of manufacture |
| 12/26/1995 | US5479109 Testing device for integrated circuits on wafer |
| 12/26/1995 | US5479106 Electro-optic voltage detector |
| 12/26/1995 | US5478779 Electrically conductive projections and semiconductor processing method of forming same |
| 12/26/1995 | CA2074428C Electrical contact test probe |
| 12/21/1995 | WO1995034825A1 Carrier of ic handler |
| 12/20/1995 | CN1113604A Probe-type test handler, IC test method using the same, and IC |
| 12/19/1995 | US5477161 Test adapter for packaged integrated circuits |
| 12/19/1995 | US5477160 Module test card |
| 12/19/1995 | US5477159 Integrated circuit probe fixture with detachable high frequency probe carrier |
| 12/19/1995 | US5477137 For receiving an electronic device |
| 12/19/1995 | US5476211 Method of manufacturing electrical contacts, using a sacrificial member |
| 12/14/1995 | WO1995034106A1 Microelectronic contacts and assemblies |
| 12/14/1995 | WO1995034000A1 Connecting device and its manufacture |
| 12/14/1995 | DE4420268A1 Device for contacting a plug contact of cable connector connected to at least one cable |