G01R 1 - Details of instruments or arrangements of the types covered by groups or

Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269)
12/1997
12/02/1997	US5694049 For testing devices having leads
12/02/1997	US5692911 Flexible electrical test fixure for integrated circuits on prototype and production printed circuit boards
11/1997
11/27/1997	WO1997044676A1 Microelectronic contact structure and method of making same
11/26/1997	EP0809328A2 Electrical interconnect contact system
11/26/1997	EP0808459A1 Top load socket for ball grid array devices
11/26/1997	CN1166206A Probe card having verticle type needles and the method thereof
11/25/1997	US5691651 Device for testing integrated circuits
11/25/1997	US5691650 Apparatus for coupling a semiconductor device with a tester
11/25/1997	US5691649 Carrier having slide connectors for testing unpackaged semiconductor dice
11/25/1997	US5691635 Probe identification system for a measurement instrument
11/25/1997	US5691210 Method for fabrication of probe structure and circuit substrate therefor
11/25/1997	US5690998 Method of coating a conductive probe needle
11/20/1997	WO1997043886A1 Electrical connector
11/20/1997	WO1997043885A1 Connection base
11/20/1997	WO1997043658A1 Reusable die carrier for burn-in and burn-in process
11/20/1997	WO1997043656A2 Wafer-level burn-in and test
11/20/1997	WO1997043655A1 Test device, particularly for a multicontact electronic component
11/20/1997	WO1997043654A1 Microelectronic spring contact elements
11/20/1997	WO1997043653A1 Contact tip structures for microelectronic interconnection elements and methods of making same
11/20/1997	WO1997043652A1 Probe needle
11/20/1997	DE19625493C1 Contact probe arrangement for electronic functional testing
11/19/1997	EP0807258A1 Test device for flat electronic assemblies
11/18/1997	US5689193 For inspecting electrical properties of an object
11/18/1997	US5689191 Terminal-in-connector checking device
11/18/1997	US5688127 Universal contactor system for testing ball grid array (BGA) devices on multiple handlers and method therefor
11/13/1997	WO1997042513A1 Method and apparatus for throttle position sensor testing
11/13/1997	DE19714941A1 Measuring card on which device to be tested can be set for input-output connection test
11/13/1997	DE19648199A1 Detecting cooking point of cooking position with conducting track temp. sensor
11/13/1997	DE19648196A1 Detecting cooking point of cooking position with conducting track temp. sensor
11/13/1997	DE19647987A1 Detecting cooking point of cooking position with conducting track temp. sensor
11/13/1997	DE19647985A1 Detecting cooking point of cooking position with conducting track temp. sensor
11/13/1997	DE19643698A1 Detecting cooking point of cooking position with conducting track temp. sensor
11/13/1997	DE19617488A1 Contact element for detachable electrical connections e.g. for testing microelectronics components
11/13/1997	CA2253879A1 Method and apparatus for throttle position sensor testing
11/12/1997	EP0795200A4 Mounting electronic components to a circuit board
11/12/1997	CN2267570Y Automatic switching over arrangement for instrument power supply
11/12/1997	CN1164762A Integrated circuit tester for semiconductor
11/11/1997	US5686843 Methods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip module
11/11/1997	US5686842 Known good die test apparatus and method
11/11/1997	US5686840 Method and apparatus for throttle position sensor testing
11/11/1997	US5686833 Load board enhanced for differential pressure retention in an IC test head
11/11/1997	US5686832 Miniature crossed coil gauge having an active flux ring
11/11/1997	US5686317 Method for forming an interconnect having a penetration limited contact structure for establishing a temporary electrical connection with a semiconductor die
11/11/1997	US5685725 IC socket
11/11/1997	CA2129556C Impedance synthesizer
11/06/1997	DE19715094A1 Rigid mounting for holding PCBs under test
11/05/1997	EP0805526A1 Shielded banana plug with double shroud and input receptacle
11/04/1997	US5684407 Electronic circuit packaged with a position sensor
10/1997
10/29/1997	EP0803902A2 Semiconductor device with on-board memory areas for test purposes
10/28/1997	US5682064 Repairable wafer scale integration system
10/28/1997	US5681777 Process for manufacturing a multi-layer tab tape semiconductor device
10/23/1997	WO1997039362A1 Apparatus for testing products with electrically interconnected networks
10/23/1997	WO1997039361A1 Conductive contact unit system
10/23/1997	DE19615907A1 Calculating frequency dependent complex or real parameters of lossy lines in HF region for components
10/23/1997	DE19614973A1 AC sensor with parallel plate geometry and shunt for self powering
10/22/1997	EP0802419A2 Probe card and method of forming the same
10/22/1997	EP0802418A2 Method for high-speed testing a semiconductor device
10/22/1997	CN2265538Y Indicating panel for electric meter
10/22/1997	CN1162863A Crystal resonator with vibration control member
10/21/1997	US5680057 Integrated circuit testing assembly and method
10/21/1997	US5680051 Electromagnetic induction-type probe
10/21/1997	US5680039 Probe apparatus for use in both high and low frequency measurements
10/21/1997	US5678301 Method for forming an interconnect for testing unpackaged semiconductor dice
10/16/1997	DE19620550C1 Chip card function testing method
10/15/1997	CN2264915Y Protective case for universal meter
10/14/1997	US5677635 Voltage and displacement measuring apparatus and probe
10/14/1997	US5677203 Method for providing known good bare semiconductor die
10/09/1997	WO1997037234A1 Constructive module of an electronic telecommunications equipment, with an interface towards a testing and diagnosing system
10/09/1997	DE19613690A1 Low voltage sensor with flat plate type capacitor as sensor element
10/08/1997	EP0799424A1 Method and apparatus for semiconductor die testing
10/08/1997	EP0799406A1 Indicator
10/08/1997	CN1161455A Handler contact checking device and method of testing integrated circuit devices
10/07/1997	US5675261 Probe card locking device of a probe station for testing a semiconductor wafer
10/07/1997	US5673477 Method of fabricating probe unit
10/02/1997	WO1997036180A1 Device for measuring an electrical current in a conductor through which current flows
10/02/1997	DE19612259A1 Integrated circuit component with cooling arrangement for high pin count package
10/01/1997	EP0797794A1 A voltage reference arrangement, a voltameter, a battery voltage detection arrangement, and a wireless communication device
09/1997
09/30/1997	US5672981 Universal power interface adapter for burn-in board
09/30/1997	US5672980 Method and apparatus for testing integrated circuit chips
09/30/1997	US5672979 Method of using an anisotropically conductive material to locate alignment of a semiconductor substrate
09/30/1997	US5672978 Inspection apparatus for printed wiring board
09/30/1997	US5672977 For examining an electrical characteristic of an object
09/30/1997	US5672965 Evaluation board for evaluating electrical characteristics of an IC package
09/30/1997	US5672964 Voltage probe testing device
09/23/1997	US5670889 Probe card for maintaining the position of a probe in high temperature application
09/23/1997	US5670871 Polymeric film electrooptic sensor device
09/23/1997	US5669780 IC socket
09/23/1997	US5669774 Ball grid array socket
09/17/1997	EP0795936A2 Integrated circuit test socket with enhanced noise immunity
09/17/1997	EP0795200A1 Mounting electronic components to a circuit board
09/17/1997	EP0705438B1 Measurement amplifier
09/16/1997	US5668407 Integrated circuit carrier having lead-socket array with various inner dimensions
09/16/1997	US5667410 One-piece compliant probe
09/16/1997	US5667077 For handling assembled multiple chip modules
09/16/1997	CA2125267C Device for applying a voltage to an electronic circuit, particularly to an electronic circuit associated with a current sensor on an electrical line
09/11/1997	DE19633711A1 Semiconductor component testing system
09/10/1997	EP0793905A1 Adapter for use in an apparatus for testing circuit cards
09/10/1997	EP0793807A1 Method and device for testing of electronic components
09/10/1997	CN1159001A Probe, manufacture of same, and vertically operative type probe card assembly employing same
09/09/1997	US5666064 Semiconductor device, carrier for carrying semiconductor device, and method of testing and producing semiconductor device

1 ... 225 226 227 228 229 230 231 232 233 234 235 236 237 238 239 240 241 242 243 244 245 ... 273