| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 05/30/1995 | US5419807 Method of providing electrical interconnect between two layers within a silicon substrate, semiconductor apparatus, and method of forming apparatus for testing semiconductor circuitry for operability |
| 05/30/1995 | US5419710 Mounting apparatus for ball grid array device |
| 05/26/1995 | WO1995014314A1 Contact structure for interconnections, interposer, semiconductor assembly and method |
| 05/24/1995 | EP0654672A2 Integrated circuit test apparatus |
| 05/24/1995 | EP0654204A1 Adapter for an automatic inspection device of printed circuit boards. |
| 05/23/1995 | US5418471 Adapter which emulates ball grid array packages |
| 05/23/1995 | US5418469 Interconnection device for connecting test equipment with a circuit board designed for fine pitch solder lead integrated circuit components |
| 05/23/1995 | US5418450 Coupling circuit for a measuring instrument |
| 05/23/1995 | US5418428 Waveguide system with support for magnetrons |
| 05/18/1995 | WO1995013632A1 Passive conductor component for surface mounting on a printed circuit board |
| 05/18/1995 | DE4338714A1 Schaltungsanordnung zur Strommessung über einen Schalttransistor Circuit arrangement for measuring the current through a switching transistor |
| 05/17/1995 | EP0653642A1 System for measuring the integrity of an electrical contact |
| 05/17/1995 | CN1028450C Electromagnetic Nd-Fe-B electric meter |
| 05/16/1995 | US5416592 Probe apparatus for measuring electrical characteristics of objects |
| 05/16/1995 | US5416429 Probe assembly for testing integrated circuits |
| 05/16/1995 | US5416428 Marker probe |
| 05/16/1995 | US5416408 Current sensor employing a mutually inductive current sensing scheme with a magnetic field substantially uniform in angular direction |
| 05/16/1995 | US5416405 Test probe with improved capture assembly and threaded needle point probe adjustment |
| 05/16/1995 | US5415560 Test clip for IC device |
| 05/11/1995 | DE4338135A1 Adaptor device for connecting contact points of a test object to a testing device |
| 05/10/1995 | CN2196783Y Cardioelectric wave form generator |
| 05/09/1995 | US5414371 Semiconductor device test probe ring apparatus and method of manufacture |
| 05/09/1995 | US5414369 Coil spring-pressed needle contact probe modules with offset needles |
| 05/09/1995 | US5414348 Measurement device with common mode current cancellation |
| 05/09/1995 | US5414346 Adjustable piercing probe tip |
| 05/09/1995 | US5412866 Method of making a cast elastomer/membrane test probe assembly |
| 05/04/1995 | DE4337500A1 Two-part adapter device |
| 05/04/1995 | DE4336521C1 Seal for a vacuum adaptor |
| 05/03/1995 | EP0651260A2 Machine with press assembly for electrically testing a printed circuit board |
| 05/03/1995 | CN2196306Y Electricity-stealing-proof single phase watt-hour meter |
| 05/02/1995 | US5412329 Probe card |
| 05/02/1995 | US5410807 High density electronic connector and method of assembly |
| 04/26/1995 | EP0650067A1 Electrooptic instrument |
| 04/26/1995 | EP0650065A2 Vacuum adapter |
| 04/26/1995 | EP0650064A2 Method of coupling test equipment to an electrical component |
| 04/26/1995 | EP0650063A2 Connection apparatus |
| 04/26/1995 | EP0650062A2 Connection appartus |
| 04/25/1995 | US5410260 Coil spring-pressed needle contact probe |
| 04/25/1995 | US5410259 Probing device setting a probe card parallel |
| 04/25/1995 | US5410258 Self-guiding receptacle for a semiconductor test socket |
| 04/25/1995 | US5410257 Zero insertion force test/burn-in socket |
| 04/25/1995 | US5410162 Apparatus for and method of rapid testing of semiconductor components at elevated temperature |
| 04/25/1995 | US5409392 Burn-in socket |
| 04/20/1995 | DE4401070C1 Device for mounting a data carrier on an electrical conductor |
| 04/19/1995 | EP0649031A2 Apparatus for and method of testing of semiconductor components |
| 04/18/1995 | US5408190 Testing apparatus having substrate interconnect for discrete die burn-in for nonpackaged die |
| 04/18/1995 | US5408189 Test fixture alignment system for printed circuit boards |
| 04/18/1995 | US5408188 High frequency wafer probe including open end waveguide |
| 04/11/1995 | US5406211 Jigs for burn-in test |
| 04/11/1995 | US5406210 Apparatus and method for testing bare dies with low contact resistance between the die and testing station |
| 04/11/1995 | US5406194 High speed resolution |
| 04/06/1995 | DE4333662A1 Measuring probe |
| 04/05/1995 | EP0646800A1 Probe for testing semi-conductor chips |
| 04/04/1995 | US5404111 Probe apparatus with a swinging holder for an object of examination |
| 03/30/1995 | WO1995008910A1 Compliant electrical connectors |
| 03/29/1995 | EP0645635A2 Electro-optic voltage detector |
| 03/28/1995 | US5402082 Voltage and resistance synthesizer using pulse width modulation |
| 03/28/1995 | US5402077 For use in testing semiconductor integrated circuits |
| 03/28/1995 | US5402075 Capacitive moisture sensor |
| 03/23/1995 | DE4433906A1 Testing instrument for integrated semiconductor circuits |
| 03/22/1995 | EP0644579A2 Semiconductor device burn-in apparatus |
| 03/22/1995 | EP0644428A2 Oscilloscope casing structure |
| 03/22/1995 | EP0643842A1 Capacitive probe type circuit board with shielded connector |
| 03/21/1995 | US5399983 Probe apparatus |
| 03/21/1995 | US5399982 Printed circuit board testing device with foil adapter |
| 03/21/1995 | US5399978 Probe apparatus and method for measuring high-frequency signals |
| 03/21/1995 | US5399963 Method and apparatus for calibration of an electricity meter |
| 03/21/1995 | US5399905 Resin sealed semiconductor device including multiple current detecting resistors |
| 03/21/1995 | US5399104 Socket for multi-lead integrated circuit packages |
| 03/21/1995 | US5399100 Transmission wire connector assemblies |
| 03/16/1995 | DE4417580A1 Testen von elektronischen Anordnungen unter Verwendung der Rotortechnik zum Anordnen der Fühler Testing electronic devices using the rotor technology for locating the sensor |
| 03/15/1995 | EP0643308A1 Electronic test head manipulator |
| 03/14/1995 | US5397245 Non-destructive interconnect system for semiconductor devices |
| 03/09/1995 | WO1995006824A1 Pendulum face bearing |
| 03/07/1995 | US5396186 Vacuum actuated multiple level printed circuit board test fixture |
| 03/07/1995 | US5396185 System and carrier for testing semiconductor integrated circuit devices |
| 03/07/1995 | US5395253 Membrane connector with stretch induced micro scrub |
| 03/07/1995 | US5395099 Tooling pin assembly |
| 03/01/1995 | EP0641057A1 Distribution system for two or more electrical consumers |
| 03/01/1995 | EP0641038A2 Methods for connecting flexible circuit substrates to contact objects and structures thereof |
| 03/01/1995 | EP0640218A1 High-speed, high-impedance external photoconductive-type sampling probe/pulser |
| 03/01/1995 | EP0454860B1 Potential sensor using electro-optical crystal and method of measuring potential |
| 02/28/1995 | US5394100 Probe system with automatic control of contact pressure and probe alignment |
| 02/28/1995 | US5394099 Electroconductive contact probe with intermediately supported, spring urged converging needles having parallel free ends |
| 02/28/1995 | US5393246 Transmission power testing bar of cable television system |
| 02/28/1995 | US5393235 Telecommunications test adapter |
| 02/22/1995 | EP0639777A1 Inspecting electrical components using a probe |
| 02/22/1995 | CN2190302Y Reference signal generator |
| 02/21/1995 | US5392001 Capacitively-coupled amplifier with improved low frequency response |
| 02/21/1995 | US5391995 Twisting electrical test probe with controlled pointing accuracy |
| 02/21/1995 | US5391993 Capacitive open-circuit test employing threshold determination |
| 02/21/1995 | US5391082 Conductive wedges for interdigitating with adjacent legs of an IC or the like |
| 02/16/1995 | WO1995004971A1 Voice trouble-shooting system for computer-controlled machines |
| 02/16/1995 | DE4410817C1 Current detection device |
| 02/15/1995 | CN2189745Y Speech-sound multimeter electrography |
| 02/15/1995 | CN1098820A Wire dispensing board for electric test and manufacture of same |
| 02/14/1995 | US5389885 Expandable diaphragm test modules and connectors |
| 02/14/1995 | US5389874 Method for control of ground bounce above an internal ground plane in a short-wire board test fixture |
| 02/14/1995 | US5389873 Pressure contact chip and wafer testing device |
| 02/14/1995 | US5389819 Socket for an IC carrier having a flexible wiring sheet superimposed over an IC body and an elastic backup member elastically pressing the flexible wiring sheet into contact with the IC body |