Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
12/1996
12/05/1996WO1996038858A2 Method and probe card for testing semiconductor devices
12/05/1996DE19519834A1 Measuring system contact design for simultaneous contacting and fixing system
12/03/1996US5581195 Semiconductor chip holding device
11/1996
11/28/1996WO1996037931A1 Spring element electrical contact and methods
11/28/1996WO1996037334A1 Method and apparatus for shaping spring elements
11/28/1996WO1996037333A1 Ribbon-like core interconnection elements
11/28/1996WO1996037332A1 Fabricating interconnects and tips using sacrificial substrates
11/28/1996WO1996037331A1 Wire bonding, severing, and ball forming
11/28/1996WO1996033419A3 Method of cleaning probe tips of probe cards and apparatus for implementing the method
11/27/1996EP0744033A1 An integrated resistor for sensing electrical parameters
11/27/1996CN1136699A Improved flexible strip cable
11/27/1996CN1136665A Method and apparatus for automated docking of test head to device handler
11/26/1996US5578934 Method and apparatus for testing unpackaged semiconductor dice
11/26/1996US5578919 Method of testing semiconductor device and test apparatus for the same
11/26/1996US5578870 Top loading test socket for ball grid arrays
11/26/1996US5578526 Method for forming a multi chip module (MCM)
11/21/1996WO1996036884A1 Method and device for making connection
11/20/1996EP0743710A1 Connector module with test and jumper access
11/20/1996EP0743527A2 Device testing system with cable pivot and method of installation
11/19/1996US5576937 Connector including a connector body, an annular air-tight material and a closure plate to seal an IC
11/19/1996US5576631 Electrical interface board
11/19/1996US5575662 Methods for connecting flexible circuit substrates to contact objects and structures thereof
11/19/1996US5575076 Circuit board testing fixture with registration plate
11/14/1996DE19516272A1 Primary element scanner for determining deflection of scanning pin or similar
11/13/1996EP0742649A2 Directional coupler arrangement for the measurement of power
11/13/1996CN2240150Y Probe of test pencil
11/13/1996CN1135794A A surface mount test point enabling hands free diagnostic testing of electronical circuits
11/12/1996US5574383 IC tester and measuring method
11/12/1996US5574382 Inspection electrode unit for printed wiring board
11/12/1996US5574359 Removable tester contact
11/12/1996US5573418 Press-in connection type structure for electric part
11/07/1996WO1996035129A1 Method and apparatus for testing semiconductor dice
11/06/1996EP0740796A1 Current sensor including magnetic sensors
11/06/1996EP0740795A1 Reversible chip contacting device
11/06/1996CN2239625Y Protective testing rod with concealed probe
11/06/1996CN1135268A Contact structure for interconnections, interposer, semiconductor assembly and method
11/05/1996US5572409 Apparatus including a programmable socket adapter for coupling an electronic component to a component socket on a printed circuit board
11/05/1996US5572396 Electric service safety disconnect apparatus with overvoltage and overcurrent protection
11/05/1996US5572144 Test jig and method for probing a printed circuit board
11/05/1996US5572141 Memory metal hot plug connector and method
11/05/1996US5572140 Reusable carrier for burn-in/testing on non packaged die
11/05/1996US5572118 Charge rate electrometer including means for substantially eliminating leakage currents
11/05/1996US5571027 Non-destructive interconnect system for semiconductor devices
11/05/1996US5571021 Emulator probe
10/1996
10/31/1996DE19616820A1 Magazine fitting frame for test manipulator for testing integrated circuit modules
10/31/1996DE19616810A1 Circuit board exchange mechanism for semiconductor test system
10/31/1996DE19616809A1 Test manipulator with rotating table for testing integrated circuits
10/31/1996DE19616212A1 Test probe station appts. for low noise measurement of wafer formed electronic device
10/31/1996DE19515068A1 Arrangement for partial discharge detection in high voltage cables and connection elements
10/30/1996EP0740160A1 Vertically operative probe card assembly
10/30/1996CN1134605A Pallet installation table for processor
10/29/1996US5570033 Spring probe BGA (ball grid array) contactor with device stop and method therefor
10/29/1996US5569951 Precision integrated resistors
10/29/1996US5569328 Silicon semiconductor wafer test
10/24/1996WO1996033419A2 Method of cleaning probe tips of probe cards and apparatus for implementing the method
10/22/1996US5568057 Method for performing a burn-in test
10/22/1996US5568056 Wafer prober
10/22/1996US5567165 Fluid actuated connector/carrier for electric part
10/16/1996CN2237852Y Input socket with sampling
10/15/1996US5565788 Coaxial wafer probe with tip shielding
10/15/1996US5565787 Testing contactor for small-size semiconductor devices
10/15/1996US5565716 Variable resistance, liquid-cooled load bank
10/15/1996EP0746772A4 Reusable die carrier for burn-in and burn-in process
10/09/1996EP0737027A2 Integrated circuit testing board having constrained thermal expansion characteristics
10/09/1996EP0736776A2 Searching electromagnetic disturbing source
10/09/1996EP0736774A2 Improved flexible strip cable
10/09/1996CN1132858A Electrical metering system having electrical meter and external current sensor ensor
10/08/1996US5563541 Load current detection circuit
10/08/1996US5563522 Microwave band probing apparatus
10/08/1996US5563521 Membrane connector with stretch induced micro scrub
10/08/1996US5563519 Circuit and method for determining the physical position of a variable resistive device between its mechanical limits
10/08/1996US5563509 Adaptable load board assembly for testing ICs with different power/ground bond pad and/or pin configurations
10/08/1996US5562505 Adaptor for a machine for testing electronic equipment
10/08/1996CA2169427A1 Flexible strip cable
10/03/1996WO1996030772A1 Interface apparatus for automatic test equipment
10/02/1996EP0735372A1 Test adapter
10/02/1996DE19508640C1 Electrical test probe for checking electrical parameters
10/02/1996CN2236659Y Low electric resistance testing rods
10/01/1996US5561386 Chip tester with improvements in handling efficiency and measurement precision
10/01/1996US5561378 Circuit probe for measuring a differential circuit
10/01/1996US5561377 System for evaluating probing networks
09/1996
09/26/1996WO1996029607A1 Method and apparatus for inspecting substrate
09/26/1996DE19508582A1 Spannungswandler Voltage converter
09/25/1996CN1131747A Electronic devices comprising dielectric foamed polymers
09/24/1996US5559446 Probing method and device
09/24/1996US5559445 For adapting a chip carrier to test equipment
09/24/1996US5559444 Method and apparatus for testing unpackaged semiconductor dice
09/24/1996US5559443 Jig for measuring the characteristics of a semiconductor, manufacturing method for the same, and usage of the same
09/24/1996US5559365 Semiconductor device including a plurality of leads each having two end portions extending downward and upward
09/24/1996US5558541 Blind mate connector for an electronic circuit tester
09/19/1996WO1996028736A1 Voltage transformer
09/19/1996DE19610328A1 Integrated circuit test fixture for automatic test
09/19/1996DE19509690A1 Gerät der Kommunikationsmeßtechnik Device Kommunikationsmeßtechnik
09/19/1996DE19509110A1 Inductive ammeter for contactless current measurement
09/17/1996US5557214 Micro beam probe semiconductor test interface
09/17/1996US5557213 Spring-loaded electrical contact probe
09/17/1996US5557212 Semiconductor test socket and contacts
09/17/1996US5557211 Vacuum test fixture for printed circuit boards
09/17/1996US5556293 Mounting apparatus for ball grid array device
09/17/1996US5556024 Process for separating an active/passive device from a device carrier
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