| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 09/09/1997 | US5666063 Method and apparatus for testing an integrated circuit |
| 09/04/1997 | WO1997032217A1 Apparatus for measuring a.c. current in a cable |
| 09/03/1997 | EP0792519A1 Interconnection elements for microelectronic components |
| 09/03/1997 | EP0792518A1 Method for fabricating a self-limiting silicon based interconnect for testing bare semiconductor dice |
| 09/03/1997 | EP0792517A1 Electrical contact structures from flexible wire |
| 09/03/1997 | EP0792464A1 A measuring line for a coaxial conductor for determining energy throughflow and standing wave ratios |
| 09/03/1997 | EP0792463A1 Mounting spring elements on semiconductor devices, and wafer-level testing methodology |
| 09/03/1997 | EP0792462A1 Probe card assembly and kit, and methods of using same |
| 09/02/1997 | US5663655 ESD protection for universal grid type test fixtures |
| 09/02/1997 | US5663654 For testing an array of semiconductor dice located on a wafer |
| 09/02/1997 | US5663653 Wafer probe station for low-current measurements |
| 09/02/1997 | US5663652 Method for measuring current distribution in an integrated circuit by detecting magneto-optic polarization rotation in an adjacent magneto-optic film |
| 08/28/1997 | DE19708037A1 Test unit for testing unencapsulated semiconductor integrated circuit |
| 08/28/1997 | DE19652271A1 Terminal contact pin giving electrically conducting detachable connection e.g. for radio and television electronics |
| 08/27/1997 | EP0791833A2 Device for converting the test point grid of a machine for electrically testing unassembled printed circuit boards |
| 08/27/1997 | CN1158172A A voltage preference apparatus, a voltameter, a battery voltage detection apparatus, and a wireless communication device |
| 08/26/1997 | US5661403 Apparatus and method for testing a solid electrolyte |
| 08/26/1997 | US5661042 Process for electrically connecting electrical devices using a conductive anisotropic material |
| 08/26/1997 | CA2063524C Optical sensor and method for producing the same |
| 08/21/1997 | WO1997030358A1 Method and device for eliminating the centring error during electrical testing of printed circuit boards |
| 08/20/1997 | EP0790502A2 Probe, manufacture of same, and vertically operative type probe card assembly employing same |
| 08/20/1997 | EP0789840A1 Current/voltage transformer for the detection of the electron current in a scanning tunnelling-electron microscope |
| 08/19/1997 | US5659256 Method and apparatus for testing integrated circuit chips |
| 08/19/1997 | US5659255 Method of evaluating signal conditions in a probe measurement network having a plurality of separate measurement channels |
| 08/19/1997 | US5659245 ESD bypass and EMI shielding trace design in burn-in board |
| 08/14/1997 | WO1997029379A1 Carrier for receiving and holding a test base for integrated circuits |
| 08/14/1997 | DE19604781A1 Carrier for receiving and holding test base for integrated circuits |
| 08/13/1997 | EP0788729A1 Programmable high density electronic testing device |
| 08/13/1997 | EP0531428B1 Test fixture alignment apparatus and method |
| 08/13/1997 | CA2197373A1 Probe, manufacture of same, and vertically operative type probe card assembly employing same |
| 08/12/1997 | US5657394 Integrated circuit probe card inspection system |
| 08/12/1997 | US5656945 Apparatus for testing a nonpackaged die |
| 08/12/1997 | US5656943 Apparatus for forming a test stack for semiconductor wafer probing and method for using the same |
| 08/12/1997 | US5656942 Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane |
| 08/12/1997 | US5656941 Tab tape-based bare chip test and burn-in carrier |
| 08/12/1997 | US5655926 Socket for semiconductor device |
| 08/07/1997 | WO1997028424A1 Analog display having electroluminescent pointer |
| 08/07/1997 | DE19603368A1 HF-tight housing for electronic measurement devices |
| 08/06/1997 | EP0787997A2 Adaptive digital filter for improved measurement accuracy in an electronic instrument |
| 08/06/1997 | EP0787303A1 Probe card having vertical type needles and the method thereof |
| 08/05/1997 | US5654669 Programmable instrumentation amplifier |
| 08/05/1997 | US5654647 Multiple lead voltage probe and method of making same |
| 08/05/1997 | US5654646 Apparatus for testing printed circuit boards |
| 08/05/1997 | US5654630 Contactless sensor driven by single power supply |
| 08/05/1997 | US5654127 Forming cavities in substrate, lining and covering with flexible layer, metal layer, second flexible layer, removing substrate to expose flexible material, removing to expose metal, forming metal tip, removing rest of substrate |
| 07/31/1997 | WO1997027490A1 Performing an operation on an integrated circuit |
| 07/31/1997 | WO1997027489A1 Improved method and apparatus for scrubbing the bond pads of an integrated circuit during wafer sort |
| 07/30/1997 | EP0786647A1 Probe identification system for a measurement system |
| 07/30/1997 | EP0563234B1 Testing clip and circuit board contacting method |
| 07/29/1997 | US5652538 Integrated curcuit with conductance adjustable by digital control signal |
| 07/29/1997 | US5652523 For providing an electric connection |
| 07/29/1997 | US5652506 Apparatus for measuring an a.c. current in a cable |
| 07/24/1997 | DE19652293A1 Universal measurement amplification module compatible with 5B amplifier module series |
| 07/23/1997 | EP0784799A1 Bus for sensitive analog signals |
| 07/23/1997 | CN1155172A Socket device for electronic instrument |
| 07/22/1997 | US5650771 Electrical socket with monitoring unit for monitoring operating conditions |
| 07/22/1997 | US5650732 Semiconductor device test system |
| 07/17/1997 | DE19700523A1 Test apparatus for testing multipolar integrated circuit chip using burn-in test |
| 07/15/1997 | US5648729 Board positioning method and apparatus of the methods |
| 07/15/1997 | US5648728 Method and apparatus for positioning a workpiece |
| 07/15/1997 | US5647756 Integrated circuit test socket having toggle clamp lid |
| 07/15/1997 | US5647750 Socket for a tape carrier package |
| 07/10/1997 | WO1997024785A1 Conductive contactor |
| 07/09/1997 | EP0654204B1 Adapter for an automatic inspection device of printed circuit boards |
| 07/08/1997 | US5646542 Probing adapter for testing IC packages |
| 07/08/1997 | US5646522 Wireless test fixture for high frequency testing |
| 07/08/1997 | US5646447 Top loading cam activated test socket for ball grid arrays |
| 07/08/1997 | US5646442 Contact structure for IC socket |
| 07/08/1997 | US5645433 Contacting system for electrical devices |
| 07/03/1997 | WO1997023784A1 Machine for the electric test of printed circuits with adjustable position of the sound needles |
| 07/02/1997 | EP0782001A1 Probe card identification for computer aided manufacturing |
| 07/02/1997 | EP0781419A1 Method and device for making connection |
| 07/02/1997 | EP0757870A4 Self-powered powerline sensor |
| 07/01/1997 | US5644249 Method and circuit testing apparatus for equalizing a contact force between probes and pads |
| 07/01/1997 | US5644247 For testing unpackaged semiconductor ships |
| 07/01/1997 | US5644246 Probe card locking device of a semiconductor wafer probe station |
| 07/01/1997 | US5644245 Probe apparatus for inspecting electrical characteristics of a microelectronic element |
| 07/01/1997 | US5644238 Method and apparatus for comparing load current in an electrical circuit with the capacity of its supply source |
| 06/26/1997 | WO1997022884A1 Current sensing device |
| 06/26/1997 | CA2240493A1 Current sensing device |
| 06/25/1997 | EP0780695A2 Hybrid scanner for use in a tester |
| 06/25/1997 | EP0780690A2 Field sensor |
| 06/25/1997 | EP0780662A2 Adjustment data input device |
| 06/25/1997 | EP0780028A1 Ball grid array socket |
| 06/25/1997 | EP0779989A1 Membrane probing of circuits |
| 06/25/1997 | EP0779987A1 Membrane probing of circuits |
| 06/24/1997 | US5642432 Probe device |
| 06/24/1997 | US5642056 Probe apparatus for correcting the probe card posture before testing |
| 06/24/1997 | US5642054 Active circuit multi-port membrane probe for full wafer testing |
| 06/24/1997 | US5642040 Electrooptic probe for measuring voltage of an object having a high permittivity film fixed on an end face of a reflecting film fixed on an electrooptic material |
| 06/24/1997 | US5641945 Contacting structure with respect to spherical bump |
| 06/24/1997 | US5641315 Telescoping spring probe |
| 06/24/1997 | US5640762 Method and apparatus for manufacturing known good semiconductor die |
| 06/19/1997 | WO1997022012A1 Electro-optic voltage sensor |
| 06/17/1997 | US5640101 Probe system and probe method |
| 06/17/1997 | US5640100 Probe apparatus having probe card exchanging mechanism |
| 06/17/1997 | US5639385 Method of fabricating a wafer probe card for testing an integrated circuit die |
| 06/17/1997 | US5639247 Contacting system for electrical devices |
| 06/17/1997 | US5638596 Method of employing multi-layer tab tape in semiconductor device assembly by selecting, breaking, downwardly bending and bonding tab tape trace free ends to a ground or power plane |
| 06/12/1997 | WO1997021105A1 Wafer probe card having micro tips and manufacturing method thereof |