| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 09/13/1995 | EP0671782A1 Electric terminal assembly |
| 09/13/1995 | EP0671630A1 Jig for measuring the characteristics of a semiconductor, manufacturing method therefor and use thereof |
| 09/12/1995 | US5450017 Test fixture having translator for grid interface |
| 09/08/1995 | WO1995023979A1 A resistance network |
| 09/06/1995 | EP0670537A1 Hands-free user-supported portable computer |
| 09/06/1995 | EP0670498A1 Current sensing apparatus |
| 09/06/1995 | EP0670033A1 Circuitry for processing analogical current and voltage signals. |
| 09/06/1995 | CN1107975A Circuit arrangement for current measurement via a switching transistor |
| 09/05/1995 | US5448164 Electrical test apparatus and method of checking the apparatus |
| 09/05/1995 | US5448162 Instrument for testing and/or measuring electric magnitudes |
| 09/05/1995 | US5447450 Live wire detection adapter with grounding capability |
| 09/05/1995 | US5447442 Compliant electrical connectors |
| 08/31/1995 | WO1995023341A1 Translator fixture with module for expanding test points |
| 08/31/1995 | WO1995023340A1 Printed circuit board test set with test adapter and method for setting the latter |
| 08/31/1995 | DE4406538A1 Leiterplatten-Prüfeinrichtung mit Prüfadapter und Verfahren zum Einstellen desselben The same PCB tester with test adapter and method for adjusting |
| 08/31/1995 | DE19506759A1 Halbleitervorrichtung, zugehöriges Herstellungsverfahren, Verfahren zum Testen von Halbleiterelementen, Testsubstrat für das Verfahren sowie Verfahren zur Herstellung des Testsubstrats A semiconductor device manufacturing method thereof, method for testing semiconductor devices, the test substrate for the process and method of manufacturing the test substrate |
| 08/31/1995 | CA2180642A1 Printed circuit board test set with test adapter and method for setting the latter |
| 08/30/1995 | EP0669534A1 Method of producing a sensor assembly for an electromagnetic detecting device, and sensor assembly produced thereby |
| 08/30/1995 | CN1107622A Device for supplying a voltage to an electronic circuit in particular an electronic circuit associated with a current sensor disposed on an electrical line |
| 08/29/1995 | US5446624 Apparatus for testing and producing semiconductor chips and integrated circuits |
| 08/29/1995 | US5446393 Electrical measuring and testing probe having a malleable shaft facilitating positioning of a contact pin |
| 08/29/1995 | US5446372 Noninductive shunt current sensor with self-power capability |
| 08/29/1995 | US5446260 Method of trimming an electronic circuit |
| 08/23/1995 | EP0668611A1 Method for recovering bare semiconductor chips from plastic packaged modules |
| 08/23/1995 | EP0667962A1 Printed circuit board testing device with foil adapter. |
| 08/22/1995 | US5444388 Apparatus for testing semiconductor devices using a conductive sheet |
| 08/22/1995 | US5444387 Test module hanger for test fixtures |
| 08/22/1995 | US5444386 Probing apparatus having an automatic probe card install mechanism and a semiconductor wafer testing system including the same |
| 08/22/1995 | US5444365 Voltage measuring apparatus having an electro-optic member |
| 08/16/1995 | CN1106926A Method for testing electronic devices attached to a leadframe |
| 08/15/1995 | US5442299 Printed circuit board test fixture and method |
| 08/15/1995 | US5440943 Electronic test head manipulator |
| 08/09/1995 | EP0666706A2 Burn-in socket |
| 08/09/1995 | EP0666646A2 Differential voltage monitor |
| 08/09/1995 | EP0666552A2 Method for obtaining working positions of different heights for mechanical adjustable articulated elements |
| 08/09/1995 | EP0662258A4 Socket for multi-lead integrated circuit packages. |
| 08/09/1995 | CN1106552A Hands-free, user-supported portable computer |
| 08/08/1995 | US5440305 Method and apparatus for calibration of a monolithic voltage reference |
| 08/08/1995 | US5440241 Method for testing, burning-in, and manufacturing wafer scale integrated circuits and a packaged wafer assembly produced thereby |
| 08/08/1995 | US5440240 Z-axis interconnect for discrete die burn-in for nonpackaged die |
| 08/08/1995 | US5440239 Transferable solder bumps for interconnect and assembly of MCM substrates |
| 08/08/1995 | US5440231 Method and apparatus for coupling a semiconductor device with a tester |
| 08/03/1995 | WO1995020767A1 Capacitive open-circuit test employing an improved threshold determination |
| 08/03/1995 | DE19500113A1 Cable test adaptor with complementary plug connector for motor vehicle |
| 08/03/1995 | CA2114813A1 Transmission power testing bar of cable television system |
| 08/02/1995 | EP0665439A1 Adaptor for test machine for electronic equipment |
| 08/02/1995 | EP0664925A1 Interconnection structure for integrated circuits and method for making same |
| 07/27/1995 | WO1995020167A1 Current sensor including magnetic sensors |
| 07/27/1995 | DE4416151C1 Arrangement for contacting test points on circuit board |
| 07/25/1995 | US5436571 Probing test method of contacting a plurality of probes of a probe card with pads on a chip on a semiconductor wafer |
| 07/25/1995 | US5436568 Pivotable self-centering elastomer pressure-wafer probe |
| 07/25/1995 | US5436567 Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts |
| 07/25/1995 | US5436097 Mask for evaluation of aligner and method of evaluating aligner using the same |
| 07/20/1995 | DE4333304C1 Adaptor for testing circuit boards |
| 07/19/1995 | EP0663596A2 Electro-optic voltage probe with fibre optic plate |
| 07/19/1995 | EP0412119B1 Static-free interrogating connector for electric components |
| 07/18/1995 | US5434698 Potential sensor employing electrooptic crystal and potential measuring method |
| 07/18/1995 | US5434513 Semiconductor wafer testing apparatus using intermediate semiconductor wafer |
| 07/18/1995 | US5434512 Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
| 07/18/1995 | US5434510 Mini light bulb tool |
| 07/18/1995 | US5434502 Calibration device for hyper-frequency adjustment of the reference planes of an apparatus for measuring the dispersion parameters of elements of integrated circuits |
| 07/13/1995 | WO1995018975A1 Reversible chip contacting device |
| 07/12/1995 | EP0662614A2 Printed circuit board test fixture and method |
| 07/12/1995 | EP0662258A1 Socket for multi-lead integrated circuit packages. |
| 07/11/1995 | US5431579 Socket for IC package |
| 07/05/1995 | EP0661545A2 Apparatus for probing circuit boards |
| 07/04/1995 | US5430385 Test fixture for printed circuit boards having a dual seal system |
| 06/29/1995 | WO1995017681A1 Automatic probe fixture loading apparatus with gimballing compensation |
| 06/29/1995 | DE4344785A1 System for testing HV constructional element esp. HV capacitors |
| 06/28/1995 | EP0660387A2 Method and apparatus for measuring oxide charge on a semiconductor wafer |
| 06/28/1995 | EP0660088A1 Moving-pointer instrument incorporating a screened electro-magnetic drive system |
| 06/28/1995 | CN2202314Y Spindle-like and pincer-like iron cores |
| 06/28/1995 | CN2202313Y Taper hand for meter |
| 06/27/1995 | US5428548 Method of and apparatus for scanning the surface of a workpiece |
| 06/27/1995 | US5428298 Probe structure for testing a semiconductor chip and a press member for same |
| 06/27/1995 | US5428297 For measuring current by applying a test voltage to a pin |
| 06/27/1995 | US5428245 For use in an integrated circuit package |
| 06/27/1995 | US5428204 Active trim method and apparatus |
| 06/27/1995 | US5427536 Socket for tab testing |
| 06/21/1995 | EP0506655B1 Device for automatically ascertaining capacitor breakdown voltage |
| 06/20/1995 | US5426372 For testing on a circuit board |
| 06/14/1995 | DE4443010A1 Single or multipole test connector for high power terminal |
| 06/13/1995 | US5424677 Common mode error correction for differential amplifiers |
| 06/13/1995 | US5424652 Method and apparatus for testing an unpackaged semiconductor die |
| 06/13/1995 | US5424630 Circuit test device for detecting the presence of an electric current in a conductor |
| 06/13/1995 | US5424588 Self-contained, portable compact load bank and testing method; compact load bank with improved power handling capability |
| 06/13/1995 | US5424254 Process for recovering bare semiconductor chips from plastic packaged modules by thermal shock |
| 06/13/1995 | US5423688 Clip for small outline IC device |
| 06/08/1995 | DE4405527C1 Semiconductor wafer testing appts. |
| 06/07/1995 | EP0656542A2 Impedance synthesizer |
| 06/06/1995 | US5422579 Method of identifying probe position and probing method in prober |
| 06/06/1995 | US5422575 Test fixture with adjustable bearings and optical alignment system |
| 06/06/1995 | US5422574 Large scale protrusion membrane for semiconductor devices under test with very high pin counts |
| 05/30/1995 | US5420686 Polarization interferometer optical voltage detector utilizing movement of interference fringe |
| 05/30/1995 | US5420519 Double-headed spring contact probe assembly |
| 05/30/1995 | US5420515 Active circuit trimming with AC and DC response trims relative to a known response |
| 05/30/1995 | US5420506 Apparatus and method for testing packaged integrated circuits |
| 05/30/1995 | US5420504 Noninductive shunt current sensor based on concentric-pipe geometry |
| 05/30/1995 | US5420500 Test probe |
| 05/30/1995 | US5420464 RF voltage/current sensor apparatus |