| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 06/09/1998 | US5763297 Integrated circuit carrier having lead-socket array with various inner dimensions |
| 06/09/1998 | US5762504 Electric connection unit |
| 06/04/1998 | DE19751064A1 Electric connection arrangement for vehicle measuring device |
| 06/03/1998 | EP0845680A1 Making and testing an integrated circuit using high density probe points |
| 06/03/1998 | EP0845677A1 A method of using a temporary z-axis material |
| 06/03/1998 | EP0788729A4 Programmable high density electronic testing device |
| 06/02/1998 | US5761036 Socket assembly for electrical component |
| 06/02/1998 | US5758537 Method and apparatus for mounting, inspecting and adjusting probe card needles |
| 05/28/1998 | DE19728280A1 Probe for continuous measurement of liquid level in container e.g. system |
| 05/28/1998 | DE19706260C1 Connector for measurement connections to electrical power distribution systems |
| 05/27/1998 | EP0843892A1 Top loading socket for ball grid arrays |
| 05/27/1998 | EP0843825A1 Semiconductor wafer test and burn-in |
| 05/26/1998 | US5757201 Universal testing device for electronic modules with different configurations and operating parameters |
| 05/26/1998 | US5757200 Lead press mechanism for IC test handler |
| 05/26/1998 | US5757199 Test carrier for semiconductor integrated circuit and method of testing semiconductor integrated circuit |
| 05/26/1998 | US5757183 Device to shield a magnetic field in a given plane |
| 05/26/1998 | US5757159 Height stage for positioning apparatus |
| 05/26/1998 | US5756370 Making temporary electrical connection for testing |
| 05/26/1998 | US5756021 Electronic devices comprising dielectric foamed polymers |
| 05/22/1998 | WO1998021597A1 Method for the manufacture of a test adapter as well as test adapter and a method for the testing of printed circuit-boards |
| 05/20/1998 | EP0842438A1 Prober and tester with compact interface for integrated circuits-containing wafer held docked in a vertical plane |
| 05/19/1998 | US5754410 Multi-chip module with accessible test pads |
| 05/19/1998 | US5752771 Integrated circuit module fixing mechanism for temperature cycling test |
| 05/14/1998 | DE19750321A1 Integrated circuit tester for hand-held instruments |
| 05/14/1998 | DE19646252A1 Fault and function tester for electronic circuit plates |
| 05/13/1998 | EP0841698A2 Wafer level contact sheet and method of assembly |
| 05/13/1998 | EP0841697A2 Method of using a permanent z-axis material |
| 05/13/1998 | EP0841695A2 High planarity, low CTE base and method of making the same |
| 05/13/1998 | EP0841573A2 Method and apparatus for performing testing of double-sided ball grid array device |
| 05/13/1998 | EP0841572A2 Wafer-level burn-in system |
| 05/13/1998 | EP0841571A2 Wafer level burn-in base unit substrate and assembly |
| 05/13/1998 | CN1181506A Printed circuit board test apparatus and method |
| 05/12/1998 | US5751157 Method and apparatus for aligning probes |
| 05/12/1998 | US5751153 Method and apparatus for characterizing a multiport circuit |
| 05/12/1998 | US5750981 Non-contact electro-optic detection of photovoltages created in a semiconductor by a probe beam |
| 05/12/1998 | US5750421 Semiconductor device, carrier for carrying semiconductor device, and method of testing and producing semiconductor device |
| 05/12/1998 | US5749738 Electrical interconnect contact system |
| 05/12/1998 | US5749698 Substrate transport apparatus and substrate transport path adjustment method |
| 05/07/1998 | WO1998019174A1 Component testing device |
| 05/06/1998 | EP0840133A2 Probe card integrated with dummy components equivalent to parasitic components coupled to bare chip sealed in package |
| 05/06/1998 | EP0840132A2 A device for detecting and indicating potential differences between two bodies |
| 05/06/1998 | EP0840131A2 Loaded-board guided-probe test fixture |
| 05/06/1998 | EP0840130A2 Standard- and limited-access hybrid test fixture |
| 05/06/1998 | EP0840129A2 Backing plate for IC test fixture |
| 05/06/1998 | EP0839323A1 Microelectronic spring contact elements |
| 05/06/1998 | EP0839322A1 Microelectronic contact structure and method of making same |
| 05/06/1998 | EP0839321A1 Contact tip structures for microelectronic interconnection elements and methods of making same |
| 05/06/1998 | CN2280910Y Testepencil plug |
| 05/05/1998 | US5748392 Optical voltage sensor, group of optical parts and method of manufacturing same |
| 05/05/1998 | US5748007 Universal test and burn-in socket adaptable to varying IC module thickness |
| 05/05/1998 | US5748006 High-frequency-transmission printed wiring board, probe card, and probe apparatus |
| 05/05/1998 | US5748002 RF probe for montoring composition of substances |
| 05/05/1998 | US5747994 Board exchange mechanism for semiconductor test system |
| 04/30/1998 | DE19703109C1 Screw-cap for fuse holder |
| 04/29/1998 | EP0838688A2 Device and procedure for testing printed circuit boards |
| 04/29/1998 | EP0838685A2 Probe card with needle-like probes resiliently supported by rigid substrate and process for fabricating thereof |
| 04/29/1998 | EP0837750A1 Wire bonding, severing, and ball forming |
| 04/29/1998 | EP0748450B1 Printed circuit board test set with test adapter and method for setting the latter |
| 04/28/1998 | US5745016 Method for improving power measurement implemented with a directional coupler at low power levels |
| 04/28/1998 | US5744977 High-force spring probe with improved axial alignment |
| 04/28/1998 | US5744976 Floating guide plate test fixture |
| 04/28/1998 | US5744948 Test fixture assembly for retaining a printed circuit board on test fixtures |
| 04/28/1998 | US5743748 Emulator probe |
| 04/22/1998 | EP0836710A1 Shunt assembly for current measurement |
| 04/22/1998 | CN2279612Y Antivibrating housing for universal instrument |
| 04/21/1998 | US5742487 IC carrier |
| 04/21/1998 | US5742216 Contact making and breaking device and system for measuring low current |
| 04/21/1998 | US5742174 Membrane for holding a probe tip in proper location |
| 04/21/1998 | US5742173 Method and apparatus for probe testing substrate |
| 04/21/1998 | US5742171 Test device for multi-contact integrated circuit |
| 04/21/1998 | US5742170 Semiconductor test socket and contacts |
| 04/21/1998 | US5742168 Test section for use in an IC handler |
| 04/21/1998 | US5741141 Non-destructive interconnect system for semiconductor devices and a carrier assembly for use therewith |
| 04/16/1998 | WO1998015841A1 Opening arrangement of a clamp-on probe |
| 04/15/1998 | EP0836099A1 Device for opening a current measuring clamp |
| 04/15/1998 | EP0836098A2 Height stage for positioning apparatus |
| 04/15/1998 | EP0836097A2 Measuring probe |
| 04/15/1998 | EP0780028B1 Ball grid array socket |
| 04/15/1998 | CN1179006A Probe card and tester using said card |
| 04/14/1998 | US5739697 Locking mechanism for IC test clip |
| 04/14/1998 | US5739696 Probe and apparatus for testing electronic components |
| 04/14/1998 | US5738531 Self-alligning low profile socket for connecting ball grid array devices through a dendritic interposer |
| 04/14/1998 | US5738267 Apparatus and method for removing known good die using hot shear process |
| 04/14/1998 | US5738071 Apparatus and method for sensing movement of fuel injector valve |
| 04/09/1998 | WO1998015161A1 Electromagnetic field shielding device |
| 04/09/1998 | WO1998014998A1 Temporary semiconductor package having hard-metal, dense-array ball contacts and method of fabrication |
| 04/09/1998 | DE19717369A1 Probe card and probe device using such probe card |
| 04/09/1998 | DE19703898C1 Electrical resistance measurement tongs e.g. for heavy current cable |
| 04/08/1998 | EP0834886A1 A reusable, selectively conductive, Z-axis, elastomeric composite substrate |
| 04/08/1998 | EP0834243A1 Photolithographically patterned spring contact |
| 04/08/1998 | CN2278221Y Mixed permanent magnet assembly for instrument and meter |
| 04/07/1998 | US5736850 For use in testing semiconductor components on a wafer |
| 04/07/1998 | US5736428 Process for manufacturing a semiconductor device having a stepped encapsulated package |
| 04/07/1998 | US5736279 Accurate drilling of probe holes in the insulating plate of an electrical test head |
| 04/02/1998 | WO1998013696A1 Circuit arrangement for measuring current in an electric conductor to control electronically controllable tripping devices |
| 04/02/1998 | WO1998013695A1 Grid array package test contactor |
| 04/02/1998 | DE19644725C1 System for testing electric printed circuit board |
| 04/02/1998 | DE19641186A1 Schaltungsanordnung zur Strommessung eines Stromleiters zur Ansteuerung von elektrisch steuerbaren Auslöseeinrichtungen Circuitry for measuring current a conductor for the control of electrically controllable release mechanisms |
| 04/01/1998 | EP0833164A2 Contact device for testing electrical components in mounting machines |
| 04/01/1998 | EP0832438A1 Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus |