| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 03/31/1999 | EP0428681B1 Improved electrical connectors and ic chip tester embodying same |
| 03/30/1999 | US5889407 Press assembly for electrically testing a printed circuit board having an exchangeable lower adapter |
| 03/30/1999 | US5888837 Chip burn-in and test structure and method |
| 03/25/1999 | WO1999014772A1 Transformer system provided with a decoupling system |
| 03/25/1999 | WO1999014608A1 A method of controlling test probes in a testing apparatus for electronic printed circuit boards, and an apparatus for performing the method |
| 03/25/1999 | WO1999014604A1 Voltage divider |
| 03/25/1999 | WO1999014603A1 Test contactor |
| 03/25/1999 | WO1999014404A1 Method of making a structure with improved material properties by moderate heat treatment of a metal deposit |
| 03/24/1999 | CN1042673C Tester |
| 03/23/1999 | US5886535 Wafer level burn-in base unit substrate and assembly |
| 03/23/1999 | US5886413 Reusable, selectively conductive, z-axis elastomeric composite substrate |
| 03/23/1999 | US5884398 Mounting spring elements on semiconductor devices |
| 03/23/1999 | US5884395 Assembly structure for making integrated circuit chip probe cards |
| 03/18/1999 | WO1999013698A1 Hands-free signal level meter |
| 03/18/1999 | WO1998053330A3 Test head structure for integrated circuit tester |
| 03/18/1999 | DE19740664A1 Transformer arrangement with isolating device |
| 03/18/1999 | CA2301792A1 Hands-free signal level meter |
| 03/17/1999 | EP0902297A2 Adapter devices for testing printed circuit boards |
| 03/17/1999 | EP0902296A1 Adapter devices for testing printed circuit boards |
| 03/17/1999 | EP0902293A1 Contact probe |
| 03/17/1999 | CN1210982A Pin contact point having through-hole and circuit board comprising the same |
| 03/16/1999 | US5883788 Backing plate for LGA mounting of integrated circuits facilitates probing of the IC's pins |
| 03/16/1999 | US5883522 Apparatus and method for retaining a semiconductor wafer during testing |
| 03/16/1999 | US5883520 Retention of test probes in translator fixtures |
| 03/16/1999 | US5883519 Deflection device |
| 03/16/1999 | US5883508 Voltage transformer with voltage divider for measuring voltage in medium high and high voltage installations |
| 03/16/1999 | US5882221 Socket for semiconductor devices |
| 03/11/1999 | WO1999012046A1 Pointer indicator |
| 03/11/1999 | DE19833500A1 Test-head positioning arrangement for testing semiconductor components on tablet |
| 03/11/1999 | DE19802000A1 Plug connector with retaining device |
| 03/09/1999 | US5880591 System for circuit modules having a plurality of independently positionable probes |
| 03/09/1999 | US5880590 Apparatus and method for burn-in and testing of devices with solder bumps or preforms |
| 03/09/1999 | US5879172 Surface mounted adapter using elastomeric conductors |
| 03/09/1999 | US5879168 Single C-beam contact |
| 03/09/1999 | US5878486 Method of burning-in semiconductor devices |
| 03/09/1999 | US5878485 Method for fabricating a carrier for testing unpackaged semiconductor dice |
| 03/04/1999 | WO1999010748A1 Checker head |
| 03/03/1999 | EP0899538A1 A probe tip configuration, a method of fabricating probe tips and use thereof |
| 03/03/1999 | EP0898712A2 Wafer-level burn-in and test |
| 03/03/1999 | CN2309571Y Antiskid electrical measuring probe |
| 03/03/1999 | CN1209541A Portable meter with safety inter-locked battery box |
| 03/02/1999 | US5877630 System and method for protecting an electronic device from electromagnetic radiation interference |
| 03/02/1999 | US5877618 Hand held non-contact voltage tester |
| 03/02/1999 | US5877554 Converter socket terminal |
| 02/25/1999 | WO1999009421A1 Current monitoring device |
| 02/25/1999 | DE19736564A1 Test block for connecting SMD components to meters |
| 02/25/1999 | DE19733861A1 Measurement probe contacting device for semiconductor laser testing |
| 02/24/1999 | EP0897655A1 Connection base |
| 02/24/1999 | CN1208935A Test head positioner for semiconductor device testing apparatus |
| 02/23/1999 | US5874319 Vacuum die bond for known good die assembly |
| 02/18/1999 | WO1999008122A1 Kelvin contact socket |
| 02/17/1999 | CN2308094Y Improved probe sleeving |
| 02/17/1999 | CN1208368A Fabricating interconnects and tips using sacrificial substrates |
| 02/17/1999 | CN1042187C Wire dispensing board for electric test and manufacture of same |
| 02/16/1999 | US5872459 Method of testing integrated circuits |
| 02/11/1999 | DE19729453A1 Isolating amplifier for measuring electrical values |
| 02/09/1999 | US5869975 System for evaluating probing networks that have multiple probing ends |
| 02/09/1999 | US5869961 Smart IC-test receptacle having holes adapted for mounting capacitors arranged adjacent to pin positions |
| 02/09/1999 | US5869787 Electrically conductive projections |
| 02/04/1999 | WO1999005701A2 Composite electrical contact structure and method for manufacturing the same |
| 02/04/1999 | WO1999005308A2 Apparatus and methods for arraying solution onto a solid support |
| 02/04/1999 | CA2297681A1 Apparatus and methods for arraying solution onto a solid support |
| 02/03/1999 | EP0760104B1 Process and system for testing the correct position of printed circuit boards having contact islands and conductor paths in a testing device |
| 02/03/1999 | CN2306508Y Terminal-type pannel signal treating instrument |
| 02/02/1999 | US5867032 Process for testing a semiconductor device |
| 02/02/1999 | US5867020 Capacitively coupled RF voltage probe having optimized flux linkage |
| 02/02/1999 | US5867018 High accuracy four-terminal standard resistor for use in electrical metrology |
| 02/02/1999 | US5866024 Probe card identification for computer aided manufacturing |
| 02/02/1999 | US5865632 Semiconductor package socket |
| 02/02/1999 | US5864946 Method of making contact tip structures |
| 01/28/1999 | WO1999004278A1 Probe station adapter for backside emission inspection |
| 01/28/1999 | WO1999004276A1 Probe station with emi shielding |
| 01/28/1999 | WO1999004274A1 Conductive contact |
| 01/28/1999 | WO1999004273A1 Probe station with multiple adjustable probe supports |
| 01/27/1999 | EP0893695A2 Test probe for semiconductor devices and method of manufacturing of the same |
| 01/27/1999 | EP0893694A2 Method of reforming a tip portion of a probe |
| 01/27/1999 | EP0815454B1 Voltage transformer |
| 01/27/1999 | CN2305673Y Pen stick for universal meter |
| 01/27/1999 | CN2305672Y Built-in circuit board insulation shield casing for electromechanical integrate electric meter |
| 01/27/1999 | CN1206511A Conductive contactor |
| 01/27/1999 | CN1206199A Electronic instrument with electromagnetic interference shield and method of manufacturing |
| 01/26/1999 | US5864259 Measuring line for a coaxial conductor for determining energy throughflow and standing wave ratios |
| 01/26/1999 | US5863636 Adhesive bond for densely ordered elements |
| 01/21/1999 | WO1999002999A1 Spreading resistance profiling system |
| 01/21/1999 | DE19745365A1 Integrated circuit holder |
| 01/20/1999 | EP0892594A2 Electronic instrument with electromagnetic interference shield and method of manufacturing |
| 01/20/1999 | EP0891558A1 Constructive module of an electronic telecommunications equipment, with an interface towards a testing and diagnosing system |
| 01/20/1999 | CN2304912Y Casing for kilowatt-hour meter |
| 01/20/1999 | CN1205774A Machine for electric test of printed circuits with adjustable position of sound needles |
| 01/20/1999 | CN1205438A Semiconductor device testing apparatus |
| 01/19/1999 | US5862147 Semiconductor device on semiconductor wafer having simple wirings for test and capable of being tested in a short time |
| 01/19/1999 | US5861759 Automatic probe card planarization system |
| 01/19/1999 | US5861743 Hybrid scanner for use in an improved MDA tester |
| 01/14/1999 | WO1999001775A1 Carrier and system for testing bumped semiconductor components |
| 01/14/1999 | WO1999001773A1 Electric current pick-up shoe |
| 01/14/1999 | WO1999001772A1 Printed circuit board testing device |
| 01/13/1999 | EP0890843A2 Test socket assembly |
| 01/13/1999 | CN2304123Y Electric measuring meter |
| 01/13/1999 | CN1205082A Opening arrangement of ammeter pincers |
| 01/13/1999 | CN1041668C Support for waveguide system |