Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
06/1999
06/17/1999WO1999030172A2 Wideband isolation system
06/17/1999DE19813526A1 Multiple contact device for fine-pitch ball-grid-array (FPBGA) component
06/17/1999DE19753366A1 Clamping connector, especially for medium voltage switchgear
06/16/1999EP0922964A1 Socket for inspection of semiconductor device
06/16/1999EP0922961A2 Voltage measurement instrument having transient overvoltage input protection
06/16/1999EP0922960A1 Microcircuit testing device
06/16/1999EP0886894A4 Contact carriers (tiles) for populating larger substrates with spring contacts
06/16/1999CN1220028A Semiconductor package and device socket
06/15/1999US5913181 Circuit for providing a switch signal to trigger changer in a digital potentiometer
06/15/1999US5912046 By placing the liquid having solids in suspension in a centrifuge and spinning it about an axis so that liquid is forced against the surface of component
06/15/1999US5911897 Temperature control for high power burn-in for integrated circuits
06/10/1999WO1999028995A1 Manually operated top loading socket for ball grid arrays
06/09/1999EP0921401A1 Probe and method for inspection of electronic circuit board
06/09/1999EP0921400A2 Terminal apparatus for electro-optic probe
06/09/1999EP0920715A1 Socket for positioning and installing an integrated circuit chip on a flexible connector sheet
06/08/1999US5910024 Carrier socket for receiving a damaged IC
06/02/1999EP0919820A2 Circuit board testing apparatus and method
06/02/1999EP0919817A2 Improved method and apparatus for direct probe sensing
06/02/1999EP0919816A2 Electrical connecting apparatus
06/02/1999CN1218554A Conductive contact unit system
06/02/1999CN1218285A Probe card for testing integrated circuit chip
06/01/1999USRE36217 Top load socket for ball grid array devices
06/01/1999US5909124 Apparatus for testing a header
06/01/1999US5909123 Method for performing reliability screening and burn-in of semi-conductor wafers
06/01/1999US5909121 Method and apparatus for scrubbing the bond pads of an integrated circuit during wafer sort
06/01/1999US5908324 Socket for electric parts
05/1999
05/27/1999WO1999013698B1 Hands-free signal level meter
05/27/1999WO1999005308A3 Apparatus and methods for arraying solution onto a solid support
05/27/1999DE19852751A1 Bearing arrangement for rotating shaft electric coil display instrument in vehicle
05/27/1999DE19847244A1 Test head for microstructures with interface and contact device for contacting closely spaced test points of electrical equipment
05/27/1999DE19748825A1 Test head with contact arrangement
05/26/1999EP0918224A2 Signal processing circuit for electro-optic probe
05/26/1999CN2321007Y Junction box for electric energy measuring device
05/25/1999US5907246 Testing of semiconductor chips
05/25/1999US5907245 Semiconductor device tester and handler interface
05/20/1999WO1999024838A1 Manipulator for automatic test equipment with active compliance
05/20/1999DE19750928A1 High frequency shielding box case for electronic device
05/19/1999EP0916955A2 Test head manipulator
05/19/1999CN2319814Y Multifunctional pointer multimeter
05/18/1999US5905421 Apparatus for measuring and/or injecting high frequency signals in integrated systems
05/18/1999US5905382 Universal wafer carrier for wafer level die burn-in
05/14/1999WO1999023731A1 Multiple rolling contacts
05/14/1999WO1999023730A1 Converter socket terminal
05/14/1999WO1999022572A2 Method for producing and controlling electronic components
05/14/1999CA2216201A1 A load and supply status indicator
05/12/1999EP0915344A2 Test head for microstructures with interface
05/12/1999EP0915343A2 Service friendly contacting device
05/12/1999EP0915342A2 Test head for microstructures with interface
05/12/1999CN1216369A Test head for microstructures with interface
05/11/1999US5903164 Active wafer level contacting system
05/11/1999US5903162 Probe adapter for electronic devices
05/11/1999US5903161 Electrically conductive rod-shaped single crystal product and assembly for measuring electrical properties employing such product, as well as processes for their production
05/11/1999US5903143 Probe apparatus with RC circuit connected between ground and a guard
05/11/1999US5902144 Integrated circuit package burn-in socket linkage system
05/06/1999EP0913695A2 Multimeter with current sensor
05/06/1999EP0912903A1 A device for reducing the time for measuring on a cable
05/06/1999DE19850159A1 Device for testing electronic equipment
05/06/1999DE19829934A1 Test head for microstructures with interface
05/05/1999CN1215839A Multimeter with current sensor
05/04/1999US5901028 Electricity meter provided with a system for protection against surges
05/04/1999US5900738 Method of testing semiconductor devices
05/04/1999US5900737 Method and apparatus for automated docking of a test head to a device handler
05/04/1999US5899755 For interconnecting device terminals to board terminals
04/1999
04/29/1999WO1999021227A1 Connector assembly for accommodating bga-style components
04/29/1999WO1999021018A1 Compact sensing apparatus having reduced cross section and methods of mounting same
04/29/1999WO1999000844A3 Sockets for semiconductor devices with spring contact elements
04/28/1999EP0911641A1 Test pad having an automatic positioning microprobe and method for realisation therefor
04/28/1999EP0911637A2 Signal processing circuit for electro-optic probe
04/27/1999US5898314 Translator fixture with force applying blind pins
04/27/1999US5898313 Test fixture for two sided circuit boards
04/27/1999US5898312 Multiple lead voltage probe and method of making same
04/27/1999US5898311 Shorting pad having a flexible conductive sheet
04/27/1999US5898299 Probe type tester with circuit board stabilizer
04/27/1999US5897728 Integrated circuit test structure and test process
04/27/1999US5897608 Compensating apparatus and method for signal processing circuit
04/27/1999US5897326 Method of exercising semiconductor devices
04/21/1999EP0910135A2 Extended core connector
04/21/1999CN1214546A Probe-type test handler, IC test method using the same, and IC
04/20/1999US5896037 Interface test adapter for actively testing an integrated circuit chip package
04/20/1999US5896036 Carrier for testing semiconductor dice
04/15/1999WO1999018445A1 Micromachined element and method of fabrication thereof
04/15/1999WO1999018444A1 Test socket for electronic module
04/15/1999WO1999005701A3 Composite electrical contact structure and method for manufacturing the same
04/15/1999DE19741352A1 Test socket for testing integrated circuit structural elements having connecting legs
04/14/1999EP0907893A1 A method of testing and fitting electronic surface-mounted components
04/14/1999CN2314376Y Portable acoustic and optical electroscope with capacitor high voltage source
04/14/1999CN2314375Y Universal test meter electrode with cup joint
04/14/1999CN2314374Y Hole for mounting support of watthour meter
04/13/1999US5894217 Test handler having turn table
04/13/1999US5894161 Interconnect with pressure sensing mechanism for testing semiconductor wafers
04/08/1999WO1999017125A1 Method and apparatus for probing an integrated circuit through the back side of an integrated circuit die
04/07/1999CN1213083A Probe for testing semiconductor device and its manufacture method and probe device used thereof
04/06/1999US5892430 Self-powered powerline sensor
04/06/1999US5892366 Adjustable tooling pin for a card test fixture
04/06/1999US5892357 Electro-optic voltage sensor for sensing voltage in an E-field
04/06/1999US5892245 Ball grid array package emulator
04/06/1999US5890390 Method and apparatus for mounting, inspecting and adjusting probe card needles
04/01/1999WO1999015906A1 Combined current/voltage transformer for low level signals
03/1999
03/31/1999EP0905521A2 Burn-in testing device
03/31/1999EP0879420A4 Improved charge rate electrometer
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