| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 08/24/1999 | US5940965 Method of making multiple lead voltage probe |
| 08/19/1999 | WO1999041812A1 Ic socket |
| 08/19/1999 | DE19831600C1 Pressure sensor groups intactness assessment method |
| 08/18/1999 | EP0936468A1 Probe with retractable tip |
| 08/17/1999 | US5940679 Method of checking electric circuits of semiconductor device and conductive adhesive for checking usage |
| 08/17/1999 | US5940278 Backing plate for gate arrays or the like carries auxiliary components and provides probe access to electrical test points |
| 08/17/1999 | US5939893 Contact probe arrangement for functional electrical testing |
| 08/17/1999 | US5939892 Circuit board testing fixture |
| 08/17/1999 | US5939890 Tweezer probe and arm therefor |
| 08/17/1999 | US5939875 Universal probe interface |
| 08/17/1999 | US5939711 Electro-optic voltage sensor head |
| 08/12/1999 | DE19838586A1 Interchangeable oscilloscope probe tip with high-frequency cable-loss compensation network |
| 08/11/1999 | CN1225724A Wafer-level burn-in and test |
| 08/11/1999 | CN1044643C Testing apparatus |
| 08/10/1999 | US5936876 Semiconductor integrated circuit core probing for failure analysis |
| 08/10/1999 | US5936849 Text fixture retainer for an integrated circuit package |
| 08/10/1999 | US5936845 IC package and IC probe card with organic substrate |
| 08/10/1999 | US5936420 Semiconductor inspecting apparatus |
| 08/10/1999 | US5936415 Method and apparatus for a pin-configurable integrated circuit tester board |
| 08/10/1999 | US5936243 Conductive micro-probe and memory device |
| 08/10/1999 | US5934914 Microelectronic contacts with asperities and methods of making same |
| 08/05/1999 | WO1999039215A1 Multi-probe test head |
| 08/05/1999 | CA2281932A1 Multi-probe test head |
| 08/04/1999 | CN2331972Y Anti-theft instrument |
| 08/04/1999 | CN1225230A Connection base |
| 08/04/1999 | CN1224846A Contact-making apparatus affording ease of servicing |
| 08/04/1999 | CN1044518C Printed circuit board test fixture and method |
| 08/03/1999 | US5933309 Apparatus and method for monitoring the effects of contact resistance |
| 08/03/1999 | US5933019 Circuit board testing switch |
| 08/03/1999 | US5933018 Liquid crystal display panel inspection device and method for manufacturing same |
| 08/03/1999 | US5933017 Prober interface card for shortening the settling time |
| 08/03/1999 | US5932323 Method and apparatus for mounting, inspecting and adjusting probe card needles |
| 08/03/1999 | US5931685 Interconnect for making temporary electrical connections with bumped semiconductor components |
| 08/03/1999 | US5931311 Module handling apparatus and method with rapid switchover capability |
| 08/03/1999 | US5931048 Manipulator for automatic test equipment test head |
| 07/29/1999 | WO1999038232A1 Small contactor for test probes, chip packaging and the like |
| 07/28/1999 | CN1044405C Arrangement of circuit for processing of analogous current and voltage signals |
| 07/27/1999 | US5929651 Semiconductor wafer test and burn-in |
| 07/27/1999 | US5929649 Method and apparatus for electrical parasitic measurement of pin grid array |
| 07/27/1999 | US5929647 Method and apparatus for testing semiconductor dice |
| 07/27/1999 | US5929646 Interposer and module test card assembly |
| 07/27/1999 | US5929643 Scanning probe microscope for measuring the electrical properties of the surface of an electrically conductive sample |
| 07/27/1999 | US5929626 System for measuring low current with contact making and breaking device |
| 07/27/1999 | US5928022 Mechanically-assited clip device for use in testing electrical equipment |
| 07/27/1999 | US5926951 Method of stacking electronic components |
| 07/22/1999 | WO1999037001A1 Ic socket and method for manufacturing ic |
| 07/22/1999 | WO1999036790A2 Test probe interface unit and method of manufacturing the same |
| 07/21/1999 | EP0929819A1 Membrane probing system with local contact scrub |
| 07/21/1999 | CN2329970Y High-voltage prevention device for electric power meter |
| 07/20/1999 | US5926029 Ultra fine probe contacts |
| 07/20/1999 | US5926028 Probe card having separated upper and lower probe needle groups |
| 07/20/1999 | US5926027 Apparatus and method for testing a device |
| 07/20/1999 | US5926014 Magnetic shield for plastic molded electricity meter frames |
| 07/15/1999 | WO1999035719A1 Connector |
| 07/15/1999 | WO1999035715A1 Coaxial contact assembly apparatus |
| 07/15/1999 | WO1999035547A2 Power contact for testing a power source |
| 07/15/1999 | WO1999035505A2 Method for removing accumulated solder from probe card probing features |
| 07/15/1999 | DE19836557A1 Holder for manipulator for modular integrated circuit for use in quality control testing |
| 07/14/1999 | EP0928422A1 Grid array package test contactor |
| 07/14/1999 | CN1222976A Reusable die carrier for burn-in and burn-in process |
| 07/13/1999 | US5923181 Methods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip module |
| 07/13/1999 | US5923180 Compliant wafer prober docking adapter |
| 07/13/1999 | US5923179 Thermal enhancing test/burn in socket for C4 and tab packaging |
| 07/13/1999 | US5923178 Probe assembly and method for switchable multi-DUT testing of integrated circuit wafers |
| 07/13/1999 | US5923177 Portable wedge probe for perusing signals on the pins of an IC |
| 07/13/1999 | US5923176 Of a board-mounted integrated circuit chip |
| 07/13/1999 | US5923175 Apparatus for contactless measurement of the electrical resistance of a conductor |
| 07/13/1999 | US5921786 Flexible shielded laminated beam for electrical contacts and the like and method of contact operation |
| 07/08/1999 | WO1999034228A1 Kelvin contact-type testing device |
| 07/08/1999 | WO1999034227A1 Device and method for testing an electronic chip sensitive element |
| 07/08/1999 | WO1999034225A1 Compound switching matrix for probing and interconnecting devices under test to measurement equipment |
| 07/07/1999 | EP0707743B1 Lead frame including an inductor or other such magnetic component |
| 07/06/1999 | US5920200 Apparatus and method for precise alignment of a ceramic module to a test apparatus |
| 07/06/1999 | US5920196 Rapid low voltage testing apparatus |
| 07/06/1999 | US5920188 Voltage measurement instrument having transient overvoltage input protection |
| 07/01/1999 | WO1999033109A1 Bga connector with heat activated connection and disconnection means |
| 07/01/1999 | WO1999032895A1 Apparatus and method for testing a device |
| 06/30/1999 | EP0925513A1 Wafer scale high density probe assembly, apparatus for use thereof and methods of fabrication thereof |
| 06/30/1999 | EP0925510A1 Integrated compliant probe for wafer level test and burn-in |
| 06/30/1999 | EP0925509A1 Probe structure having a plurality of discrete insulated probe tips |
| 06/30/1999 | CN1221112A Test and burn-in apparatus in-line system using apparatus, and test method using the system |
| 06/29/1999 | US5917707 Flexible contact structure with an electrically conductive shell |
| 06/29/1999 | US5917401 Conductive bus member and method of fabricating same |
| 06/29/1999 | US5917330 Probe ring having electrical components affixed thereto and related apparatus and processes |
| 06/29/1999 | US5917318 High-speed responsive power supply for measuring equipment |
| 06/29/1999 | US5917229 Programmable/reprogrammable printed circuit board using fuse and/or antifuse as interconnect |
| 06/29/1999 | US5915977 System and interconnect for making temporary electrical connections with bumped semiconductor components |
| 06/29/1999 | US5915755 Method for forming an interconnect for testing unpackaged semiconductor dice |
| 06/29/1999 | US5915749 Method for mounting an integrated circuit device onto a printed circuit board |
| 06/24/1999 | WO1999031586A1 Parallel test method |
| 06/24/1999 | WO1999031518A1 Method and apparatus for guiding electric current |
| 06/23/1999 | CN2325778Y Sampling probe mechanism of mechanical type single phase kilowatt-hour meter |
| 06/22/1999 | US5914614 High density cantilevered probe for electronic devices |
| 06/22/1999 | US5914613 Membrane probing system with local contact scrub |
| 06/22/1999 | US5914612 Tweezer probe and arm therefor |
| 06/22/1999 | US5914218 Spring contact anchored on one end, the free portion compliantly contacts a second contact pad, electrically interconnecting the two contact pads; spring compensates for thermal and mechanical variations |
| 06/22/1999 | CA2148106C Printed circuit board testing device with foil adapter |
| 06/17/1999 | WO1999030203A1 Electro-optic voltage sensor head |
| 06/17/1999 | WO1999030175A1 An electrical contact assembly |
| 06/17/1999 | WO1999030174A1 Test system with mechanical alignment for semiconductor chip scale packages and dice |