Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
10/1999
10/19/1999US5969534 Semiconductor testing apparatus
10/19/1999US5969533 Probe card and LSI test method using probe card
10/19/1999US5969530 Circuit board inspection apparatus and method employing a rapidly changing electrical parameter signal
10/19/1999US5969341 Optical integrated voltage sensor for optically measuring the magnitude of a voltage
10/19/1999US5968282 Brush with thinner bristles; soft rubber cleaner with inorganic filler; semiconductors
10/19/1999US5967798 Integrated circuit module having springy contacts of at least two different types for reduced stress
10/19/1999CA2032801C Mounting of a pointer to the rotor of an air core meter
10/14/1999WO1999052139A1 Probe device
10/13/1999EP0948712A1 Apparatus and method for sensing movement of fuel injector valve
10/13/1999CN2343588Y Explosion-proof protective panel of equipment for testing lithium ion cell
10/13/1999CN1045693C Contact structure for interconnections, interposer, semiconductor assembly and method
10/12/1999US5966593 Method of forming a wafer level contact sheet having a permanent z-axis material
10/12/1999US5966023 Rapid action engagement interface connection system
10/12/1999US5966022 Wafer level burn-in system
10/12/1999US5966017 Devices, methods and systems using load-pulled electronic monitoring
10/12/1999US5966015 Test fixture for circuit component
10/07/1999WO1999050677A1 Burn-in test socket
10/07/1999WO1999050676A1 Test socket lattice
10/07/1999WO1999030172A3 Wideband isolation system
10/07/1999WO1999022572A3 Method for producing and controlling electronic components
10/07/1999DE19900833A1 Vacuum test-fixture for testing of printed circuit board (PCB)
10/06/1999EP0947836A2 Instrument with installation-evident accessory modules
10/06/1999CN2342372Y New structure for probe casing
10/06/1999CN1230691A IC testing device
10/05/1999USRE36325 Directly bonded SIMM module
10/05/1999US5963045 Method for testing circuit board assemblies
10/05/1999US5963027 For probing a test device
10/05/1999US5962921 Interconnect having recessed contact members with penetrating blades for testing semiconductor dice and packages with contact bumps
10/05/1999US5961728 The present invention relates to the field of semiconductor testing equipment and, more specifically, to the field of probe cards and probers for semiconductor test systems.
10/05/1999US5961026 Apparatus and method for removing known good die using hot shear process
09/1999
09/30/1999WO1999049329A1 Variable contact pressure probe
09/30/1999WO1999049325A1 Automatic fixture building for electrical testing
09/30/1999WO1999035547A3 Power contact for testing a power source
09/30/1999DE19832330A1 Test holder for integrated circuit with solder ball connections serving as test points
09/29/1999EP0944840A1 Probe card for high speed testing
09/29/1999CN1045334C Clamp for detecting characteriztic of semiconductor and manufacture and application of same
09/28/1999US5959461 Probe station adapter for backside emission inspection
09/28/1999US5959460 High frequency stripline blade probe device and method of probing
09/28/1999US5956835 Test fixtures for testing of printed circuit boards
09/23/1999WO1999048147A1 Process for manufacturing semiconductor device
09/22/1999EP0943924A2 Loaded-board, guided-probe test fixture
09/22/1999CN1229192A Voltage measurement instrument having transient overvoltage input protection
09/21/1999US5955876 Board positioning apparatus
09/21/1999US5955683 Method and apparatus for detecting a solder bridge in a ball grid array
09/15/1999EP0942288A2 Method and apparatus for assigning pins for electrical testing of printed circuit boards
09/15/1999EP0758454B1 Test system for equipped and unequipped printed circuit boards
09/15/1999CN2338751Y Electric power box for high tension testing
09/14/1999US5952843 Variable contact pressure probe
09/14/1999US5952841 Bare chip prober device
09/14/1999US5952840 Apparatus for testing semiconductor wafers
09/14/1999US5952839 Method and apparatus for a pin-configurable integrated circuit tester board
09/14/1999US5952838 For testing portions of a semiconductor device
09/14/1999US5952820 Foreign voltage detector
09/14/1999US5951323 Connector for semiconductor microelectrodes and flexible wiring
09/10/1999WO1999045400A1 Coaxial probe interface for automatic test equipment
09/09/1999DE19821128C1 Contact element for touch contact with tested microchip
09/09/1999DE19820285A1 Test adapter for assemblies with ball-grid arrays
09/08/1999CN2337557Y Electric meter box
09/08/1999CN2337556Y Inserting socket of electric energy meter
09/08/1999CN1228160A Probe card
09/08/1999CN1227923A Circuit board for testing semiconductor device
09/07/1999US5949245 Probe card with ground shield structure to minimize noise coupling effect during multiple-chip testing
09/07/1999US5949244 Low tolerance probe card and probe ring systems
09/07/1999US5949242 Method and apparatus for testing unpackaged semiconductor dice
09/07/1999US5949240 Test connecting device including testkey and probe card for use in the testing of integrated circuits
09/07/1999US5949239 Test head apparatus for use in electronic device test equipment
09/07/1999US5949238 Method and apparatus for probing large pin count integrated circuits
09/07/1999US5949230 Non-contact voltage probe apparatus
09/07/1999US5949002 Manipulator for automatic test equipment with active compliance
09/07/1999US5947751 Production and test socket for ball grid array semiconductor package
09/07/1999US5946791 Method for testing and mounting integrated circuits onto printed circuit boards
09/02/1999DE19811795C1 Needle for test adapter for populated or unpopulated circuit boards
09/02/1999DE19809848A1 Control and switching devices for power supply and distribution with removable connecting cables
09/02/1999DE19809825A1 Switching and control devices for power supply and distribution
09/01/1999CN2336362Y Wear state on-line monitor based on oil and power test
09/01/1999CN1227351A Test head for microstructures with interface
09/01/1999CN1044951C Contacting system for electrical device
08/1999
08/31/1999US5946553 Process for manufacturing a semiconductor package with bi-substrate die
08/31/1999US5946546 Chip burn-in and test structure and method
08/31/1999US5945853 Current sensing circuit with automatic offset compensation
08/31/1999US5945838 Apparatus for testing circuit boards
08/31/1999US5945837 Interface structure for an integrated circuit device tester
08/31/1999US5945836 Loaded-board, guided-probe test fixture
08/31/1999US5945835 Radio frequency test probe with integral mount for circuit board under test
08/31/1999US5945834 Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method
08/31/1999US5944548 Floating mount apparatus for coaxial connector
08/26/1999WO1999043010A2 Self-powered current monitor
08/26/1999WO1999042851A1 Structure of test fixture interface
08/26/1999WO1999042850A1 Method and device for testing printed circuit boards
08/26/1999CA2319409A1 Self-powered current monitor
08/25/1999EP0937986A2 Single cable, single point, stimulus and response probing system and method
08/25/1999EP0937541A2 Probe end cleaning sheet
08/25/1999EP0789840B1 Current/voltage transformer for the detection of the electron current in a scanning tunnelling-electron microscope
08/25/1999CN1226758A Testing IC socket
08/24/1999US5942908 Apparatus for testing a nonpackaged die
08/24/1999US5942906 Interface system utilizing engagement mechanism
08/24/1999US5942905 For engaging terminals
08/24/1999US5942895 Magnetic field sensor and current and/or energy sensor
08/24/1999US5942701 Test probe for a measuring instrument and tester incorporating the test probe
08/24/1999US5942100 Crystal etch monitor
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