Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
12/1999
12/28/1999USRE36469 Packaging for semiconductor logic devices
12/23/1999WO1999066339A1 Voltage measuring device
12/23/1999DE19926701A1 Contact plug for testing semiconductor disc of encased LSI component or printed circuit board for component to be tested
12/23/1999DE19924239A1 Method to produce contact point on conductor, for electrical contacting to electric part
12/23/1999DE19860704A1 Semiconductor wafer inspecting method using a scanning electron microscope (SEM)
12/22/1999EP0965849A2 Trigger clip-on to detect high voltage pulses
12/22/1999EP0965847A2 Electrode spacing conversion adaptor
12/22/1999EP0965846A2 Integrated circuit test socket
12/22/1999EP0965845A1 Test head assembly
12/22/1999CN1239321A Apparatus and method for contact failure inspection in semiconductor devices
12/21/1999US6005405 Probe plate assembly for high-node-count circuit board test fixtures
12/21/1999US6005403 Flexible electrical test fixture for integrated circuits on prototype and production printed circuit boards
12/21/1999US6005402 Translator fixture for use in circuit board testing
12/21/1999US6005401 Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method
12/21/1999US6005290 Multi chip module having self limiting contact members
12/21/1999US6005288 Compliant contact system with alignment structure for testing unpackaged semiconductor device
12/16/1999DE19926088A1 Drive unit of crossed coil indicating instrument with coil body and pair of crossed coils crossed over by each other
12/15/1999EP0964254A1 Apparatus for deriving a trigger signal from the AC line
12/15/1999CN1238457A Intrument with installation-evident accessory modules
12/14/1999USRE36442 Adapter which emulates ball grid array packages
12/14/1999US6002267 In-line voltage plane tests for multi-chip modules
12/14/1999US6002266 Socket including centrally distributed test tips for testing unpackaged singulated die
12/14/1999US6002263 Probe station having inner and outer shielding
12/14/1999US6002252 Compact sensing apparatus having transducer and signal conditioner with a plurality of mounting pins
12/14/1999US6000890 Retractable self-locking cleat for rope, cable and the like
12/09/1999DE19822315A1 Triggerzange zum Erfassen von Hochspannungsimpulsen Trigger clamp for detecting high-voltage pulses
12/08/1999EP0962776A2 Probe card suitable for inspection of multi-pin devices
12/08/1999CN2352963Y Apparatus for mechanically setting zero for electric measuring instrument
12/08/1999CN1237709A Probe card suitable for inspection of multi-pin devices
12/07/1999US5999005 Voltage and displacement measuring apparatus and probe
12/07/1999US5998986 Method of cleaning probe of probe card and probe-cleaning apparatus
12/07/1999US5998864 Stacking semiconductor devices, particularly memory chips
12/07/1999US5998228 Method of testing semiconductor
12/07/1999US5997316 Slide-lock test socket assembly
12/07/1999CA2081491C Housing for cable mounted power line monitoring device
12/01/1999CN1236894A Battery tester
11/1999
11/30/1999CA2114336C Hands-free user-supported portable computer
11/25/1999WO1999060624A1 System for testing semiconductor device formed on semiconductor wafer
11/25/1999WO1999060414A2 Voltage level indicator
11/24/1999CN2350769Y Probe structure
11/24/1999CN1236185A Integrated circuit test socket
11/23/1999US5991177 Capacitive voltage transformer for a metal-enclosed, gas-filled high-voltage system
11/23/1999US5990697 Electroconductive contact unit having compression spring with normally and coarsely wound segments
11/23/1999US5990696 Test fixture with self contained shorting means for testing small scale test packs
11/23/1999US5990695 Membrane test probe
11/23/1999US5990694 Integrated circuit probing method
11/23/1999US5990693 Test contactor
11/23/1999US5990578 Capacitive sensor arrangement
11/23/1999US5989994 Method for producing contact structures
11/23/1999US5989039 Socket apparatus for testing package
11/18/1999WO1999058987A1 Method for transmitting and storing value and value store electric power meter using the same
11/18/1999WO1999058386A1 Retractable self-locking cleat for rope, cable and the like
11/18/1999WO1999036790A3 Test probe interface unit and method of manufacturing the same
11/18/1999CA2332113A1 Method for transmitting and storing value and value store electric power meter using the same
11/18/1999CA2331445A1 Retractable self-locking cleat for rope, cable and the like
11/16/1999US5986460 BGA package semiconductor device and inspection method therefor
11/16/1999US5986459 Semiconductor device testing carrier and method of fixing semiconductor device to testing carrier
11/16/1999US5986447 Test head structure for integrated circuit tester
11/16/1999US5986446 Multi-meter and probe assembly and method of use
11/16/1999US5985682 Method for testing a bumped semiconductor die
11/16/1999US5983493 Method of temporarily, then permanently, connecting to a semiconductor device
11/16/1999CA2188305C Self-powered powerline sensor
11/11/1999WO1999030172B1 Wideband isolation system
11/11/1999DE19914775A1 Guide hole arrangement in testing device of semiconductor integrated circuits
11/09/1999US5982187 Resilient connector having a tubular spring
11/09/1999US5982186 Contactor for test applications including membrane carrier having contacts for an integrated circuit and pins connecting contacts to test board
11/09/1999US5982185 Direct connect carrier for testing semiconductor dice and method of fabrication
11/09/1999US5982184 Test head for integrated circuits
11/09/1999US5982183 Probing method and device with contact film wiper feature
11/09/1999US5982182 Interface apparatus for automatic test equipment with positioning modules incorporating kinematic surfaces
11/09/1999US5980270 Soldering with resilient contacts
11/09/1999CA2172461C Electric service safety disconnect apparatus with overvoltage and overcurrent protection
11/04/1999WO1999056137A1 Method and apparatus for testing interconnect networks
11/04/1999WO1999056121A1 Electronic battery tester
11/04/1999CA2329781A1 Method and apparatus for testing interconnect networks
11/03/1999EP0953844A2 Time domain reflectometry tester for X-Y prober
11/03/1999CN1233756A Semiconductor device measuring socket capable of adjusting contact positions, and semiconductordevice mfg. method using the same
11/02/1999US5978326 Information processing apparatus using an offset signal to control the position of a probe
11/02/1999US5978218 Cooling system for IC tester
11/02/1999US5977787 Large area multiple-chip probe assembly and method of making the same
11/02/1999US5977786 Adapter including solid body
11/02/1999US5977784 Method of performing an operation on an integrated circuit
11/02/1999US5977783 Multilayer probe for measuring electrical characteristics
11/02/1999US5975915 Socket for inspection of semiconductor device
11/02/1999US5974869 Non-vibrating capacitance probe for wear monitoring
11/02/1999US5974662 Method of planarizing tips of probe elements of a probe card assembly
10/1999
10/28/1999DE19817071A1 Sensing head for electrical or electronic measurement or test equipment
10/26/1999US5973928 Multi-layer ceramic substrate decoupling
10/26/1999US5973505 System for evaluating probing networks
10/26/1999US5973504 Programmable high-density electronic device testing
10/26/1999US5973501 Current and voltage probe for measuring harmonic distortion
10/26/1999US5973405 Composite electrical contact structure and method for manufacturing the same
10/26/1999US5973394 Small contactor for test probes, chip packaging and the like
10/20/1999EP0950273A1 Multiple rolling contacts
10/20/1999EP0950271A1 Component for contacting a measuring unit and method for its production
10/20/1999EP0950191A1 Contact probe unit
10/20/1999EP0843825B1 Semiconductor wafer test and burn-in
10/20/1999CN2344778Y Adjustable visual angle meter for multiple-purpose tester
10/20/1999CN1232288A Probe end cleaning sheet
10/19/1999US5969535 Probe card with connector
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