| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 02/29/2000 | US6031384 IC testing method and apparatus |
| 02/29/2000 | US6031383 Probe station for low current, low voltage parametric measurements using multiple probes |
| 02/29/2000 | US6030254 Edge connector interposing probe |
| 02/29/2000 | US6029344 Composite interconnection element for microelectronic components, and method of making same |
| 02/24/2000 | WO2000010016A1 Contactor and production method for contactor |
| 02/23/2000 | EP0944840A4 Probe card for high speed testing |
| 02/23/2000 | EP0799406B1 Indicator |
| 02/23/2000 | CN2365671Y Hanging support for electric energy meter |
| 02/23/2000 | CN1245367A Device for leading-out trigger signal from ac line |
| 02/23/2000 | CN1245291A Probe, device and method for testing liquid crystal display panel |
| 02/22/2000 | US6028437 Probe head assembly |
| 02/22/2000 | US6028436 Method for forming coaxial silicon interconnects |
| 02/22/2000 | US6028426 Temperature compensated current measurement device |
| 02/22/2000 | US6028423 Isolation instrument for electrical testing |
| 02/22/2000 | US6027354 High temperature test fixture |
| 02/17/2000 | WO2000008478A1 Method and apparatus using an infrared laser probe for measuring voltages directly in an integrated circuit |
| 02/17/2000 | WO2000008476A1 A current shunt |
| 02/16/2000 | EP0979415A1 Manipulator with expanded range of motion |
| 02/16/2000 | EP0979414A1 Multi-probe test head |
| 02/16/2000 | EP0979389A1 Cable tray assembly for testing device |
| 02/15/2000 | US6025732 Reusable die carrier for burn-in and burn-in process |
| 02/15/2000 | US6025731 Hybrid interconnect and system for testing semiconductor dice |
| 02/15/2000 | US6025730 Direct connect interconnect for testing semiconductor dice and wafers |
| 02/15/2000 | US6025729 Floating spring probe wireless test fixture |
| 02/15/2000 | US6025728 Semiconductor package with wire bond protective member |
| 02/15/2000 | US6024579 Electrical connector having buckling beam contacts |
| 02/15/2000 | CA2167062C Adapter with solid body |
| 02/14/2000 | CA2685426A1 Reduced cost automatic meter reading system and method using locally communicating utility meters |
| 02/14/2000 | CA2685207A1 Reduced cost automatic meter reading system and method using locally communicating utility meters |
| 02/14/2000 | CA2685205A1 Reduced cost automatic meter reading system and method using locally communicating utility meters |
| 02/10/2000 | WO2000007029A1 Holder of electroconductive contactor, and method for producing the same |
| 02/09/2000 | EP0977652A1 Abrasive material for the needle point of a probe card |
| 02/08/2000 | US6023173 Manipulator with expanded range of motion |
| 02/08/2000 | US6023171 Dual-contact probe tip for flying probe tester |
| 02/08/2000 | US6023160 Electrical metering system having an electrical meter and an external current sensor |
| 02/08/2000 | US6022750 Method for fabricating semiconductor interconnect having test structures for evaluating electrical characteristics of the interconnect |
| 02/03/2000 | WO2000005595A1 Grinding chip |
| 02/03/2000 | WO1999058386A9 Retractable self-locking cleat for rope, cable and the like |
| 02/03/2000 | DE19836082A1 Wandlereinrichtung für Schutzgeräte und Leistungsschaltereinrichtungen Transducer means for protection devices and circuit breakers facilities |
| 02/03/2000 | DE19835862A1 Test device for integrated modules esp. memory modules |
| 02/02/2000 | EP0977045A2 Apparatus for coupling a test head and probe card in a wafer testing system |
| 02/02/2000 | EP0977041A2 Transducer arrangement for protection apparatus and power breakers |
| 02/02/2000 | EP0975985A1 Probe assembly and method for switchable multi-dut testing of integrated circuit wafers |
| 02/02/2000 | EP0975979A1 Method for making cards with multiple contact tips for testing semiconductor chips |
| 02/02/2000 | CN2362128Y Enclosed watt-hour meter housing with shutter avoiding or indicating fraudulent use of electricity |
| 02/01/2000 | US6020749 Method and apparatus for performing testing of double-sided ball grid array devices |
| 02/01/2000 | US6020747 Electrical contact probe |
| 02/01/2000 | US6020746 Method and apparatus for probing an integrated circuit through the back side of an integrated circuit die |
| 02/01/2000 | US6020745 Method of batch testing surface mount devices using a substrate edge connector |
| 02/01/2000 | US6020735 Switching device internal diode detection circuit and method of operating the same |
| 02/01/2000 | US6020624 Semiconductor package with bi-substrate die |
| 01/27/2000 | WO2000004585A2 Chip carrier device and method for the production of a chip carrier device with an electrical test |
| 01/27/2000 | WO2000004578A1 Method for transferring solder to a device and/or testing the device |
| 01/27/2000 | WO2000004394A1 Socket for device measurement, and method of measuring device |
| 01/27/2000 | WO2000004392A1 An electrical supply measurement and management system |
| 01/27/2000 | WO2000004342A1 System comprising a plurality of sensor groups and method for determining the intactness of same |
| 01/27/2000 | DE19931337A1 Fixing system for testing semiconductor components |
| 01/27/2000 | DE19832021A1 Probe or scanning head for microwave circuit measurements inside planar conductor |
| 01/27/2000 | DE19831634A1 Chip carrier device production for an encased chip arrangement with an electrical test simplifies chip contact mechanism on substrates by a strip conductor structure and through-plating |
| 01/26/2000 | EP0974845A1 Apparatus for testing electric properties using a multi-point probe |
| 01/26/2000 | EP0974844A1 Electrical probe with light source |
| 01/26/2000 | EP0974173A1 Telecommunications apparatus |
| 01/25/2000 | US6018700 Self-powered current monitor |
| 01/25/2000 | US6018249 Test system with mechanical alignment for semiconductor chip scale packages and dice |
| 01/25/2000 | US6018194 Transistor clamping fixture |
| 01/25/2000 | CA2169290C Voice trouble-shooting system for computer-controlled machines |
| 01/20/2000 | WO2000003573A1 Integrated circuit module having springy contacts of at least two different types for reduced stress, and subassembly for such module |
| 01/20/2000 | WO2000003569A1 Interconnect assembly for printed circuit boards and method of fabrication |
| 01/20/2000 | WO2000003252A2 Multi-point probe |
| 01/20/2000 | WO2000003251A1 Conductive contact |
| 01/20/2000 | WO2000003250A1 Conductive contact |
| 01/20/2000 | DE19857256A1 IC (integrated circuit) socket for IC with multiple parallel pins |
| 01/20/2000 | CA2336531A1 Multi-point probe |
| 01/19/2000 | EP0972204A1 Flexible shielded laminate beam for electrical contacts |
| 01/19/2000 | EP0807258B1 Test device for flat electronic assemblies |
| 01/19/2000 | CN2359698Y Electric energy batch box for avoiding stealing electric and its special operating tool |
| 01/19/2000 | CN1242078A Contact probe unit |
| 01/18/2000 | US6016061 Cantilever type probe needle for probe card and method of fabrication and control thereof |
| 01/18/2000 | US6016060 Method, apparatus and system for testing bumped semiconductor components |
| 01/18/2000 | US6015955 Reworkability solution for wirebound chips using high performance capacitor |
| 01/13/2000 | DE19931278A1 Test card for IC testing device uses needle contacts coupled to contact test object |
| 01/12/2000 | EP0970522A1 Bga connector with heat activated connection and disconnection means |
| 01/12/2000 | EP0970382A1 Resilient connector having a tubular spring |
| 01/11/2000 | US6014032 Micro probe ring assembly and method of fabrication |
| 01/11/2000 | US6014027 Current and voltage probe for measuring harmonic distortion |
| 01/11/2000 | US6013169 Method of reforming a tip portion of a probe |
| 01/11/2000 | CA2169021C Integrated circuit having a conductance adjustable by means of a digital set point signal |
| 01/06/2000 | WO2000001208A1 Assembly of an electronic component with spring packaging |
| 01/06/2000 | WO2000000834A1 Residual current detection device |
| 01/06/2000 | WO2000000833A1 Current detector and current measurement apparatus including such detector |
| 01/05/2000 | EP0968435A1 Apparatus for testing boards provided with electrically conductive patterns and an adapter intended for such an apparatus |
| 01/05/2000 | DE19827045A1 Vorrichtung zur Spannungsmessung Apparatus for voltage measurement |
| 01/05/2000 | DE19826717A1 Electrical voltage tester with low-voltage neon glow lamp |
| 01/05/2000 | CN2357334Y Electromechanical watt-hour meter voltage element using induction watt-hour meter as base meter |
| 01/05/2000 | CN2357333Y Reusable printed-circuit board testing probe template |
| 12/30/1999 | DE19928612A1 Test adapter card for printed circuit board, for line testing of integrated circuits |
| 12/29/1999 | WO1999067653A1 Layered current sensor |
| 12/29/1999 | EP0966718A1 A medical consultation management system |
| 12/29/1999 | EP0966687A1 Peripherally leaded package test contactor |
| 12/29/1999 | CN2356352Y Electric meter box |