| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 04/20/2000 | DE19949573A1 Pallet system for testing and/or installing software on a computer system during final stages of the computers manufacture, involves power and data connection between pallet and docking station |
| 04/20/2000 | DE19945665A1 Receiver for determining length and quality of cable in digital data transmission system, has cable processor which calculates cable length based on amplification factor of variable amplifier |
| 04/20/2000 | DE19847179A1 Circuit arrangement for detecting galvanically separated input voltage, comprising arrangement for providing operating voltage of comparator, and arrangement for producing reference signal |
| 04/20/2000 | DE19840501C1 Electrical contact device for mounting microchip on printed circuit board, uses rubber mat with metallised openings receiving contacts of microchip at one side and contacting printed circuit board at opposite side |
| 04/19/2000 | EP0994359A2 Test adapter |
| 04/18/2000 | US6052807 Multiple probe test equipment with channel identification |
| 04/18/2000 | US6052653 Spreading resistance profiling system |
| 04/18/2000 | US6051982 Electronic component test apparatus with rotational probe and conductive spaced apart means |
| 04/18/2000 | US6051978 TDR tester for x-y prober |
| 04/18/2000 | US6050836 Socket apparatus |
| 04/18/2000 | US6050829 Making discrete power connections to a space transformer of a probe card assembly |
| 04/18/2000 | US6049976 Method of mounting free-standing resilient electrical contact structures to electronic components |
| 04/13/2000 | WO2000003252A3 Multi-point probe |
| 04/13/2000 | DE19844428A1 Prüfsonde für einen Fingertester Probe for a finger tester |
| 04/12/2000 | EP0993035A1 Probe device |
| 04/12/2000 | EP0992798A1 Current transformer arrangement for measuring an alternating current |
| 04/12/2000 | EP0991950A1 Electric current pick-up shoe |
| 04/12/2000 | CN2373797Y Electricity collecting board for test |
| 04/11/2000 | US6049219 Signal probing of microwave integrated circuit internal nodes |
| 04/11/2000 | US6049217 Thermally enhanced test contactor |
| 04/11/2000 | US6049215 Bare die carrier |
| 04/11/2000 | US6049214 Universal printed circuit board inspection apparatus, and method of using same |
| 04/11/2000 | US6048744 Integrated circuit package alignment feature |
| 04/11/2000 | US6047469 Method of connecting a unit under test in a wireless test fixture |
| 04/11/2000 | CA2174888C Connector module with test and jumper access |
| 04/06/2000 | WO2000019220A1 Apparatus for testing multi-terminal electronic components |
| 04/06/2000 | WO2000019215A1 Thermal isolation plate for probe card |
| 04/06/2000 | WO1999035505A3 Method for removing accumulated solder from probe card probing features |
| 04/05/2000 | EP0990912A2 Test probe actuator |
| 04/05/2000 | EP0990163A4 Reusable die carrier for burn-in and burn-in process |
| 04/05/2000 | EP0990163A1 Reusable die carrier for burn-in and burn-in process |
| 04/05/2000 | EP0990160A1 Toroidal core current transformer with integrated measuring shunt |
| 04/05/2000 | CN2372691Y A. C. tester |
| 04/04/2000 | US6046598 Test board and a test method using the same providing improved electrical connection |
| 04/04/2000 | US6046597 Test socket for an IC device |
| 04/04/2000 | US6046596 Capacitance probe for magnetic recording head transducer to disc surface spacing measurement |
| 04/04/2000 | US6046583 Miniature crossed coil gauge having an active flux ring |
| 04/04/2000 | US6046060 Method of making a high planarity, low CTE base for semiconductor reliability screening |
| 04/04/2000 | US6045382 Socket apparatus for IC packages |
| 04/04/2000 | US6045370 Test socket for electronic module |
| 03/30/2000 | WO2000018204A1 Vertically actuated bga socket |
| 03/30/2000 | WO2000017853A2 Multi-pulse sampling of signals using force sampling |
| 03/29/2000 | EP0989409A1 Scan test machine for densely spaced test sites |
| 03/28/2000 | US6043671 Semiconductor inspection device with guide member for probe needle for probe card and method of controlling the same |
| 03/28/2000 | US6043669 Wireless test fixture |
| 03/28/2000 | US6043666 Electroconductive spring contact unit |
| 03/28/2000 | US6043640 Multimeter with current sensor |
| 03/28/2000 | US6043563 Electronic components with terminals and spring contact elements extending from areas which are remote from the terminals |
| 03/28/2000 | US6043443 Fabrication of semiconductor devices |
| 03/28/2000 | US6043442 Handler contact checking device and a method of testing integrated circuit devices |
| 03/28/2000 | US6042712 Apparatus for controlling plating over a face of a substrate |
| 03/23/2000 | WO2000016106A1 Checker head and method of manufacturing the checker head |
| 03/23/2000 | DE19944980A1 Encased electrical connection for a connecting structure used for testing, e.g., semiconductor wafer has a holding structure arranged between an elastomeric element and PCB substrate |
| 03/23/2000 | DE19938660A1 Electrooptic probe for electrooptic oscilloscope, comprises laser diode, electrooptic element, photodiodes and support formed of polyacetal resin insulator |
| 03/23/2000 | DE19919946A1 Reproducible and retractable electromagnetic interference source having programmable frequency source that can be contained in sealed container usable in test location either closed or partially open |
| 03/22/2000 | CN2370420Y Combined anti-theft electric power metering box |
| 03/22/2000 | CN1248063A Device for connection of test head and probe board in substrate-testing system |
| 03/21/2000 | US6040704 Probe unit and inspection head |
| 03/21/2000 | US6040702 Carrier and system for testing bumped semiconductor components |
| 03/21/2000 | US6040239 Non-oxidizing touch contact interconnect for semiconductor test systems and method of fabrication |
| 03/16/2000 | WO2000014833A1 Socket for handler |
| 03/16/2000 | WO2000014558A1 Interface device between testing equipment and integrated circuit |
| 03/16/2000 | WO1999060414A3 Voltage level indicator |
| 03/15/2000 | EP0985154A1 Broadband impedance matching probe |
| 03/15/2000 | EP0764352A4 Microelectronic contacts and assemblies |
| 03/15/2000 | CN2369377Y Universal high voltage socket for testing |
| 03/15/2000 | CN2369250Y Dry all sealed high voltage electric power meter |
| 03/15/2000 | CN2369249Y Anti-charge-evasion distributing box-cover for kilowatt meter |
| 03/15/2000 | CN2369248Y 电表箱 Meter box |
| 03/15/2000 | CN1247318A Assembly device for semiconductor components |
| 03/15/2000 | CN1247317A AC and DC two-purpose clipper-type current meter |
| 03/14/2000 | US6037789 Wiping contacts |
| 03/14/2000 | US6037787 High performance probe interface for automatic test equipment |
| 03/14/2000 | US6037786 Testing integrated circuit chips |
| 03/14/2000 | US6037785 Probe card apparatus |
| 03/14/2000 | US6037667 Socket assembly for use with solder ball |
| 03/09/2000 | WO2000013033A1 Electro-optic voltage sensor |
| 03/09/2000 | WO2000013031A1 Electric circuit with device for detecting a current magnitude |
| 03/09/2000 | WO2000013030A1 High resolution analytical probe station |
| 03/09/2000 | DE19941129A1 Measuring attachment for structural element with integrated circuit; has several test points with top casing having cavity for structural element with integrated circuit and bottom casing having apertures for solid test pins |
| 03/09/2000 | DE19840479A1 Strommessung in Pumpen Current measurement in pump |
| 03/09/2000 | DE19838407A1 Contact device, especially for testing electrical components, comprises dielectric-separated electrical connections for connecting contacts on both sides of translator and contact elements |
| 03/08/2000 | EP0984292A2 Current measurements in pumps |
| 03/08/2000 | EP0984287A1 Oscilloscope probe having stored probe identification |
| 03/08/2000 | EP0729585B1 A surface mount test point enabling hands free diagnostic testing of electronical circuits |
| 03/07/2000 | US6034534 Laminated contact probe for inspection of ultra-microscopic pitch |
| 03/07/2000 | US6034533 Low-current pogo probe card |
| 03/07/2000 | US6034532 Resilient connector having a tubular spring |
| 03/07/2000 | US6034530 Apparatus and method for measuring a movable electric charge induced in a conductive member |
| 03/07/2000 | US6033935 Sockets for "springed" semiconductor devices |
| 03/07/2000 | US6033235 Socket apparatus particularly adapted for BGA type semiconductor devices |
| 03/07/2000 | US6033233 Electrical connecting device, and semiconductor device testing method |
| 03/07/2000 | US6032994 Adjustment tool comprises a cylindrical base portion, a triangular intermediate portion, and a flat, rectangular tip portion made of titanium nitride. |
| 03/07/2000 | US6032356 Wafer-level test and burn-in, and semiconductor process |
| 03/02/2000 | WO2000011920A1 Printed circuit plate used for testing electric components |
| 03/02/2000 | DE19839121A1 Continuous and interruption free reading and processing system for data in data acquisition system with pair of dynamic data buffers |
| 03/02/2000 | DE19838974A1 Elektrische Schaltung mit einer Vorrichtung zur Erfassung einer Stromgröße Electrical circuit with a device for detecting a current value |
| 03/01/2000 | EP0982596A1 Dry type load resistor for testing generators or the like |
| 03/01/2000 | EP0981722A1 Measuring system |
| 03/01/2000 | CN2366851Y Apparatus for placing or removing object to be measured |