| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 06/21/2000 | EP1011134A1 Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor |
| 06/21/2000 | DE4338714C2 Schaltungsanordnung zur Strommessung über einen Schalttransistor Circuit arrangement for measuring the current through a switching transistor |
| 06/21/2000 | DE19961999A1 Method to arrange low-impedance resistor on circuit plate, for use in electric vehicle; involves calculating required resistance per square centimeter to determine required area of thin film microresistor |
| 06/21/2000 | CN2384224Y Disposable electric meter box capable of preventing fraudulent use of electricity |
| 06/21/2000 | CN1257209A Small interval contactor |
| 06/20/2000 | US6078387 Test apparatus |
| 06/20/2000 | US6078185 Apparatus for controlling insertion of an integrated circuit into a socket for testing and measurement |
| 06/20/2000 | US6078184 Measuring tip unit |
| 06/20/2000 | US6078171 Dry type load resistor for testing generators or the like |
| 06/20/2000 | US6077091 Surface mounted package adapter using elastomeric conductors |
| 06/15/2000 | WO2000035262A2 Method for mounting an electronic component |
| 06/15/2000 | WO2000034796A1 Scanning single electron transistor microscope for imaging ambient temperature objects |
| 06/15/2000 | WO2000034793A1 Voltage sensor |
| 06/15/2000 | WO2000034419A1 Method for preparing an emulsified fuel and implementing device |
| 06/15/2000 | DE19860560A1 Alignment tool for positioning measuring probe in semiconductor test apparatus has rectangular tip section and cylindrical lower section |
| 06/15/2000 | DE19854436A1 Measurement arrangement for electric current in conductor |
| 06/14/2000 | EP1009027A2 Multipoint conductive sheet |
| 06/14/2000 | EP1007980A1 Printed circuit board testing device |
| 06/13/2000 | US6075986 In-set evaluation procedures for components |
| 06/13/2000 | US6075376 Low-current probe card |
| 06/13/2000 | US6075373 Inspection device for inspecting a semiconductor wafer |
| 06/13/2000 | US6075255 Contactor system for a ball grid array device |
| 06/08/2000 | WO2000033360A1 A method and apparatus for the transport and tracking of an electronic component |
| 06/08/2000 | WO2000033096A1 Probe card for probing wafers with raised contact elements |
| 06/08/2000 | WO2000033089A2 Lithographic contact elements |
| 06/08/2000 | DE19955978A1 Elektrooptische Sonde für ein Oszilloskop das eine Signalwellenform mißt An electro-optic probe for measuring an oscilloscope having a signal waveform |
| 06/06/2000 | US6072356 Apparatus for deriving a trigger signal from the AC line |
| 06/06/2000 | US6072326 System for testing semiconductor components |
| 06/06/2000 | US6072325 Probe device |
| 06/06/2000 | US6072322 Thermally enhanced test socket |
| 06/06/2000 | US6072190 Micro contact pin structure with a piezoelectric element and probe card using the same |
| 06/06/2000 | US6072179 Method and apparatus using an infrared laser based optical probe for measuring voltages directly from active regions in an integrated circuit |
| 06/06/2000 | US6070478 Removable fixture adapter with RF connections |
| 06/02/2000 | WO2000031835A1 Electrical contact system |
| 06/02/2000 | WO2000031828A2 Electrical contact system |
| 06/02/2000 | WO2000031555A1 Probe assembly for testing |
| 05/31/2000 | DE19957326A1 Contact structures, especially for wafer or chip testing pin cards, are produced by a two-dimensional photolithographic process on a silicon substrate |
| 05/31/2000 | DE19852442A1 Device for attaching semiconductor test circuit to testing device; has mounting frame for device under test and device to fix and clamp frame to testing circuit conductor plate |
| 05/31/2000 | DE19835862C2 Anordnung zum Testen von integrierten Bausteinen Arrangement for the testing of integrated modules |
| 05/30/2000 | US6069484 Source measure unit current preamplifier |
| 05/30/2000 | US6069483 Pickup chuck for multichip modules |
| 05/30/2000 | US6069482 Ball grid array package emulator |
| 05/30/2000 | US6069481 Socket for measuring a ball grid array semiconductor |
| 05/30/2000 | US6069480 Kelvin contact-type testing device |
| 05/30/2000 | US6068669 Compliant interconnect for testing a semiconductor die |
| 05/30/2000 | US6067866 Removable fixture adapter with pneumatic actuators |
| 05/25/2000 | DE19853445A1 Contact pins, for semiconductor chip test cards, are produced by electroforming pin tips and adjoining spring stirrups using structured resist layers |
| 05/24/2000 | CN2379807Y Glass fiber reinforced plastics casing for electric meter |
| 05/23/2000 | US6066957 Floating spring probe wireless test fixture |
| 05/18/2000 | WO2000028625A1 Sharpened, oriented contact tip structures |
| 05/18/2000 | WO1997013154A8 Crossed coil gauge with active flux ring |
| 05/18/2000 | DE19946665A1 Elektrooptische Sonde Electro-optical probe |
| 05/17/2000 | EP1001490A2 Network services terminating point conductor insertion and test circuit tool |
| 05/17/2000 | EP1000363A1 Spreading resistance profiling system |
| 05/17/2000 | EP1000361A2 Voltage level indicator |
| 05/17/2000 | CN1052541C Circuit arrangement for current measurement via switching transistor |
| 05/16/2000 | US6064312 Method and apparatus for automatic verification of measurement probe functionality and compensation |
| 05/16/2000 | US6064221 Method of temporarily securing a die to a burn-in carrier |
| 05/16/2000 | US6064218 Peripherally leaded package test contactor |
| 05/16/2000 | US6064216 Apparatus for testing semiconductor wafers |
| 05/16/2000 | US6064214 Perimeter trace probe for plastic ball grid arrays |
| 05/16/2000 | US6064213 Wafer-level burn-in and test |
| 05/16/2000 | US6064195 Test probe positioning device |
| 05/16/2000 | US6062879 High density test probe with rigid surface structure |
| 05/16/2000 | US6062873 Socket for chip package test |
| 05/11/2000 | WO2000026678A1 Voltage detection stick |
| 05/11/2000 | DE19954041A1 Ball grid array measuring device for integrated circuit (IC) component uses spring biased test pins contained in angled bores in measuring device housing mounted on circuit board |
| 05/11/2000 | DE19943366A1 Single-tipped probe for analyzing tri-state logic systems, etc.; has ac signal termination and RCR filter |
| 05/10/2000 | EP0999451A2 Connecting apparatus, method of fabricating wiring film with holder, inspection system and method of fabricating semiconductor element |
| 05/10/2000 | EP0999450A1 Modular interface between test and application equipment |
| 05/10/2000 | CN1252894A BGA connector with heat activated connection and disconnection means |
| 05/10/2000 | CN1252745A Abrasive material for needle point of probe card |
| 05/09/2000 | US6061006 Apparatus for sensing RF current delivered to a plasma with two inductive loops |
| 05/09/2000 | US6060893 Carrier having slide connectors for testing unpackaged semiconductor dice |
| 05/09/2000 | US6060892 Probe card attaching mechanism |
| 05/09/2000 | US6060891 Probe card for semiconductor wafers and method and system for testing wafers |
| 05/09/2000 | US6059982 Micro probe assembly and method of fabrication |
| 05/04/2000 | WO2000025141A1 High density printed circuit board |
| 05/04/2000 | DE19946664A1 Elektrooptische Sonde Electro-optical probe |
| 05/04/2000 | DE19946112A1 Electron beam test device and adjustment for testing electronic devices accurately determines slice level of S-curve used in determination of secondary electron current |
| 05/04/2000 | DE19941110A1 Vereinheitlichtes Testsystem und Testverfahren mit Verwendung selbiges Unified Test System and method using selbiges |
| 05/04/2000 | DE19847613A1 Test device for testing electronic circuit boards uses interchangeable connection elements that can have different pin configurations with device for moving test head up and down relative to circuit under test |
| 05/04/2000 | DE19847146A1 Testadapter Test Adapter |
| 05/04/2000 | DE19623441C2 Elektronische Meßschaltung, insbesondere zum Messen von Strömen, mit einem integrierten Meßwiderstand An electronic measuring circuit, particularly for measuring currents with an integrated measuring resistor |
| 05/03/2000 | EP0997741A2 Carrier for an integrated circuit module handler |
| 05/03/2000 | EP0996500A1 Apparatus and methods for arraying solution onto a solid support |
| 05/03/2000 | CN2376629Y Program controlled power source used in testing |
| 05/03/2000 | CN1252129A Method for making cards with multiple contact tips for testing semiconductor chips |
| 05/02/2000 | US6058024 Electronic instrument with electromagnetic interference shield and method of manufacturing |
| 05/02/2000 | US6057700 Pressure controlled alignment fixture |
| 05/02/2000 | US6057695 Method and apparatus for automated docking of a test head to a device handler |
| 05/02/2000 | US6056627 Probe cleaning tool, probe cleaning method and semiconductor wafer testing method |
| 04/27/2000 | WO2000023719A1 Fluid thrust bearing - indicator with an assembling |
| 04/27/2000 | DE19947996A1 Electrooptic probe for sampling oscilloscope, has probe head comprising head body for retaining electrooptic element and tip detachably provided on head body for retaining a metallic pin |
| 04/27/2000 | DE19946709A1 Electro-optic probe for oscilloscope, comprises electro-optic element and photo-diodes for converting light to electric signals |
| 04/26/2000 | EP0995996A1 Conductive contact |
| 04/26/2000 | CN1251425A Combined testing system and testing method using same |
| 04/25/2000 | US6053777 Coaxial contact assembly apparatus |
| 04/20/2000 | WO2000022445A1 Test socket |
| 04/20/2000 | WO2000004585A3 Chip carrier device and method for the production of a chip carrier device with an electrical test |