| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 08/22/2000 | US6107792 Test board having a plurality of power supply wiring patterns |
| 08/16/2000 | EP0979415A4 Manipulator with expanded range of motion |
| 08/15/2000 | US6104205 Probe with tab retainer |
| 08/15/2000 | US6104204 Semiconductor device testing apparatus |
| 08/15/2000 | US6104202 Interface apparatus for automatic test equipment |
| 08/10/2000 | WO2000046604A1 Electricity meter having a conductive shield for reflecting electric fields |
| 08/10/2000 | DE10001290A1 Elektrooptische Abtastsonde Electro-optical scanning probe |
| 08/10/2000 | CA2322636A1 Electricity meter having a conductive shield for reflecting electric fields |
| 08/09/2000 | EP1025446A1 Compact sensing apparatus having reduced cross section and methods of mounting same |
| 08/09/2000 | CN1262800A IC socket |
| 08/08/2000 | US6100815 Compound switching matrix for probing and interconnecting devices under test to measurement equipment |
| 08/08/2000 | US6100709 Silicon wafer testing rig and a method for testing a silicon wafer wherein the silicon wafer is bent into a dome shape |
| 08/08/2000 | US6100708 Probe card and wafer testing method using the same |
| 08/08/2000 | US6100707 Apparatus for testing multi-terminal electronic components |
| 08/08/2000 | US6100679 Voltage indicating instrument |
| 08/08/2000 | US6100585 Structure for mounting device on circuit board |
| 08/08/2000 | US6099597 Picker nest for holding an IC package with minimized stress on an IC component during testing |
| 08/03/2000 | WO2000045433A1 Contactor holding mechanism and automatic change mechanism for contactor |
| 08/03/2000 | WO2000045432A1 Drivingly rotatable mechanism of specimen loading table and specimen loading mechanism |
| 08/03/2000 | WO2000045182A1 Deflection device |
| 08/03/2000 | DE10003073A1 Covered electrical connection used for testing semiconductor wafers contains a connecting track electrically joined to one end of a connecting structure made of conducting material on a substrate |
| 08/02/2000 | EP1024366A1 Test method of semiconductor device and anisotropic conductive film therefor |
| 08/02/2000 | EP1023743A2 Composite electrical contact structure and method for manufacturing the same |
| 08/02/2000 | EP1023469A1 Method of making a structure with improved material properties by moderate heat treatment of a metal deposit |
| 08/02/2000 | CN1261959A Electric current pick-up shoe |
| 08/01/2000 | US6098027 Charge mode open/short test circuit |
| 08/01/2000 | US6097198 Inspection jig |
| 08/01/2000 | US6096568 Process for preparing a semiconductor device package for analysis of a die |
| 08/01/2000 | US6096567 Method and apparatus for direct probe sensing |
| 08/01/2000 | US6094949 Lock device for electronic test apparatus |
| 07/27/2000 | WO2000017853A3 Multi-pulse sampling of signals using force sampling |
| 07/26/2000 | EP1022573A2 Scan test machine for densely spaced test sites |
| 07/26/2000 | CN1261173A Carrier, system and method for testing computer and/or software installation |
| 07/25/2000 | US6094058 Temporary semiconductor package having dense array external contacts |
| 07/25/2000 | US6094057 Board for evaluating the characteristics of a semiconductor chip and a method for mounting a semiconductor chip thereon |
| 07/25/2000 | US6094056 Multi-chip module with accessible test pads and test fixture |
| 07/25/2000 | US6094042 Probe compensation for losses in a probe cable |
| 07/25/2000 | US6093643 Electrically conductive projections and semiconductor processing method of forming same |
| 07/25/2000 | US6093030 Contact apparatus for integrated circuits |
| 07/25/2000 | US6092355 Control system |
| 07/25/2000 | CA2059117C Electrical interconnect contact system |
| 07/20/2000 | WO2000042441A1 Clip-on ammeter for measuring a current circulating in conductors |
| 07/20/2000 | WO2000003573A9 Integrated circuit module having springy contacts of at least two different types for reduced stress, and subassembly for such module |
| 07/20/2000 | DE19901767A1 Verfahren und Vorrichtung zum Testen der Funktion einer Vielzahl von Mikrostrukturelementen Method and device for testing the function of a plurality of micro-structural elements |
| 07/19/2000 | EP1020732A2 Procedure and apparatus for testing the function of a multitude of active microstructure elements |
| 07/19/2000 | EP1019736A1 Micromachined element and method of fabrication thereof |
| 07/19/2000 | EP0979389A4 Cable tray assembly for testing device |
| 07/19/2000 | EP0897655B1 Connection base |
| 07/18/2000 | US6092224 Logic analyzer probe assembly with probe and interface boards |
| 07/18/2000 | US6091281 High precision reference voltage generator |
| 07/18/2000 | US6091256 Contact device for making connection to an electronic circuit device |
| 07/18/2000 | US6091254 Universal wafer carrier for wafer level die burn-in |
| 07/18/2000 | US6091252 Method, apparatus and system for testing bumped semiconductor components |
| 07/18/2000 | US6091251 Discrete die burn-in for nonpackaged die |
| 07/18/2000 | US6091250 Discrete die burn-in for nonpackaged die |
| 07/18/2000 | US6091249 Method and apparatus for detecting defects in wafers |
| 07/18/2000 | US6091248 Method for measuring the electrical potential in a semiconductor element |
| 07/18/2000 | US6091237 Three-phrase clamp-type power meter |
| 07/18/2000 | US6090261 Method and apparatus for controlling plating over a face of a substrate |
| 07/18/2000 | US6089894 Test connector |
| 07/18/2000 | US6089880 Electric connector arrangement |
| 07/18/2000 | US6089635 Modular IC holding device in modular IC handler |
| 07/18/2000 | US6089107 Process for testing a semiconductor device |
| 07/13/2000 | WO2000040975A1 Text probe interface assembly and manufacture method |
| 07/13/2000 | DE19962702A1 Test card, for testing conductivity between a chip-sized package component and a solder ball on a BGA component, has a contact element block with a sloping face for uniform pressure application to a solder ball surface |
| 07/13/2000 | DE10000361A1 Means for detection of microstructure defects in semiconductor wafers around through contact holes using a charged particle beam scanning system which involves negatively charging the zone around the contact hole prior to scanning |
| 07/13/2000 | CA2358405A1 Text probe interface assembly and manufacture method |
| 07/12/2000 | WO2000073805A1 Conductive contact |
| 07/12/2000 | EP1018651A1 Grinding chip |
| 07/12/2000 | EP1018030A1 A method of controlling test probes in a testing apparatus for electronic printed circuit boards, and an apparatus for performing the method |
| 07/12/2000 | EP1018024A1 Combined current/voltage transformer for low level signals |
| 07/12/2000 | EP1018023A1 Probe card and system for testing wafers |
| 07/12/2000 | EP0985154A4 Broadband impedance matching probe |
| 07/12/2000 | EP0975985A4 Probe assembly and method for switchable multi-dut testing of integrated circuit wafers |
| 07/12/2000 | EP0850419B1 Near-field resistivity microscope |
| 07/11/2000 | US6087845 Universal wafer carrier for wafer level die burn-in |
| 07/11/2000 | US6087840 Probe card with vertical needle for enabling improved wafer testing and method of manufacturing the same |
| 07/11/2000 | US6087838 Signal processing circuit for electro-optic probe |
| 07/11/2000 | US6086387 Cover assembly for a socket adaptable to IC modules of varying thickness used for burn-in testing |
| 07/06/2000 | WO2000039848A2 Test method and assembly including a test die for testing a semiconductor product die |
| 07/06/2000 | WO2000039595A1 Dual-pin probe for testing circuit boards |
| 07/06/2000 | DE10002097A1 Method for installing interposition device, for testing dense connection area array; involves applying solder preform to ends of terminal pins protruding through interposition circuit board and soldering in soldering furnace |
| 07/06/2000 | CA2357012A1 Dual-pin probe for testing circuit boards |
| 07/05/2000 | EP1016104A1 Transformer system provided with a decoupling system |
| 07/05/2000 | EP1015895A1 Voltage divider |
| 07/04/2000 | US6084422 Printed circuit board testing device |
| 07/04/2000 | US6084421 Test socket |
| 07/04/2000 | US6084420 Probe assembly for testing |
| 07/04/2000 | US6084397 Verification gauge for an electronic package lead inspection apparatus |
| 06/29/2000 | WO2000037950A1 Lead frame structure for testing integrated circuits |
| 06/29/2000 | DE19960112A1 Testvorrichtung zum Testen von Rückwandplatinen bzw. bestückten Leiterplatten Test apparatus for testing of backplanes and printed circuit boards |
| 06/28/2000 | EP1014097A2 Probe unit |
| 06/28/2000 | EP1013157A1 Hands-free signal level meter |
| 06/28/2000 | CN1258096A Semiconductor device contactor, detection device and method thereby and cleaning method |
| 06/28/2000 | CN1053966C Open frame gantry probing system |
| 06/27/2000 | US6081429 Test interposer for use with ball grid array packages assemblies and ball grid array packages including same and methods |
| 06/27/2000 | US6081110 Thermal isolation plate for probe card |
| 06/27/2000 | US6079989 Electrical connection device having electrical connection members with a tubular body and a sliding tip |
| 06/27/2000 | US6079987 Connector for electronic parts |
| 06/27/2000 | CA2148640C Contacting system for electrical devices |