| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 10/25/2000 | CN1271178A Probe card for testing semiconductor device and method for testing semiconductor device |
| 10/24/2000 | US6137302 Low-current probe card with reduced triboelectric current generating cables |
| 10/24/2000 | US6137300 Test probe device for a display panel and test probe positioning method |
| 10/24/2000 | US6137299 Method and apparatus for testing integrated circuit chips |
| 10/24/2000 | US6137298 Method and apparatus for clamping land grid array integrated circuit devices |
| 10/24/2000 | US6137297 Electronic test probe interface assembly and method of manufacture |
| 10/24/2000 | US6137296 Probe card for testing semiconductor devices |
| 10/19/2000 | DE10012045A1 Elektrooptische Abtastsonde mit Photodioden, die bezüglich des Main Frames eines optischen EOS-Systems isoliert sind An electro-optical scanning probe with photodiodes, which are insulated with respect to the mainframe of an optical system EOS |
| 10/19/2000 | DE10003282A1 Probe contact assembly for probe card in semiconductor chip inspection system, has inclined contact pin assembly with conductive layer formed on substrate, which when contacts pad spring power is generated |
| 10/18/2000 | EP1045438A2 Probe card for testing semiconductor device, and semiconductor device test method |
| 10/18/2000 | EP1045253A2 Prober for electrical measurements and method of measuring electrical characteristics with said prober |
| 10/17/2000 | US6133745 Socket type module test apparatus and socket for the same |
| 10/17/2000 | US6133744 Apparatus for testing semiconductor wafer |
| 10/17/2000 | US6133742 Multi-pulse sampling of signals using electrostatic force sampling |
| 10/17/2000 | US6133534 Wiring board for electrical tests with bumps having polymeric coating |
| 10/17/2000 | US6131255 Repairable wafer scale integration system |
| 10/12/2000 | CA2268572A1 A method and structure for performing integrated circuit wafer testing and assembly |
| 10/11/2000 | EP1043591A2 Power semiconductor module |
| 10/11/2000 | EP1042682A1 Device and method for testing an electronic chip sensitive element |
| 10/11/2000 | EP1042681A1 Compound switching matrix for probing and interconnecting devices under test to measurement equipment |
| 10/11/2000 | EP0950273A4 Multiple rolling contacts |
| 10/11/2000 | EP0808459B1 Top load socket for ball grid array devices |
| 10/10/2000 | US6131073 Electronic circuit with an operating characteristic correcting function |
| 10/10/2000 | US6130547 Test apparatus for printed circuit board and assembly kit therefor |
| 10/10/2000 | US6130546 Area array (flip chip) probe card |
| 10/10/2000 | US6130545 Method and apparatus for scrubbing the bond pads of an integrated circuit during wafer sort |
| 10/10/2000 | US6130544 System for evaluating probing networks |
| 10/10/2000 | US6129428 Storage device for objects, storage station and air-conditioned cabinet |
| 10/10/2000 | US6128818 Method for testing integrated circuits which are on printed circuit boards |
| 10/04/2000 | EP1041389A1 System and method for characterising a test fixture |
| 10/04/2000 | EP1040359A1 Method and apparatus for guiding electric current |
| 10/04/2000 | CN2399730Y Intelligent security anti-fraudulence watt-hour meter |
| 10/03/2000 | US6127835 Apparatus and method for assembling test fixtures |
| 10/03/2000 | US6127832 Electrical test tool having easily replaceable electrical probe |
| 10/03/2000 | US6127831 Method of testing a semiconductor device by automatically measuring probe tip parameters |
| 10/03/2000 | US6127818 Tightening rings for integrated circuit tester heads |
| 10/03/2000 | US6127196 Method for testing a tape carrier package |
| 10/03/2000 | US6127195 Methods of forming an apparatus for engaging electrically conductive pads and method of forming a removable electrical interconnect apparatus |
| 09/30/2000 | CA2303473A1 Prober for electrical measurement and method of measuring electrical characteristics with said prober |
| 09/27/2000 | EP1038225A1 Parallel test method |
| 09/27/2000 | EP1038186A1 Test socket |
| 09/27/2000 | EP1038185A2 Wideband isolation system |
| 09/27/2000 | CN2398636Y Current grade and resistance grade protection circuit for pointer-type multimeter |
| 09/26/2000 | US6124725 Apparatus and method for testing semiconductor devices formed on a semiconductor wafer |
| 09/26/2000 | US6124723 Probe holder for low voltage, low current measurements in a water probe station |
| 09/26/2000 | US6124722 Universal apparatus for testing printed circuit boards utilizing independently movable needle boards |
| 09/26/2000 | US6124721 Method of engaging electrically conductive test pads on a semiconductor substrate |
| 09/26/2000 | US6124720 Test socket for surface mount device packages |
| 09/26/2000 | US6124706 Electro-optic voltage sensor with Multiple Beam Splitting |
| 09/20/2000 | EP1037055A2 Spring probe |
| 09/20/2000 | EP1037054A1 Elementary low loss calibrating structure for calibrating an integrated circuit probe |
| 09/19/2000 | US6121784 Probe tip and a process for testing a semiconductor device |
| 09/19/2000 | US6121576 Method and process of contact to a heat softened solder ball array |
| 09/19/2000 | US6121063 Method of testing a ball grid array IC |
| 09/19/2000 | US6121058 Method for removing accumulated solder from probe card probing features |
| 09/15/2000 | CA2300350A1 An electrical connecting device |
| 09/14/2000 | WO2000053528A1 Method and apparatus for amplifying electrical test signals from a micromechanical device |
| 09/13/2000 | EP1034435A1 Apparatus for testing multi-terminal electronic components |
| 09/13/2000 | CN1266492A Test socket lattice |
| 09/13/2000 | CN1266491A Aging test socket |
| 09/13/2000 | CN1056449C Tester and method for circuit traces on a flexible substrate |
| 09/12/2000 | US6118894 Integrated circuit probe card inspection system |
| 09/12/2000 | US6118291 Test socket and methods |
| 09/12/2000 | US6118289 Cleaning method and cleaning device and cleaning tool for board electrical-test probes, and board electrical-test device and method |
| 09/12/2000 | US6118288 Adaptive PCB testing system employing rearrangable test probes |
| 09/12/2000 | US6118287 Probe tip structure |
| 09/12/2000 | US6118286 Semiconductor device tester-to-handler Interface board with large test area |
| 09/12/2000 | US6118285 Non-contact plasma probe for testing electrical continuity of printed wire boards |
| 09/08/2000 | WO2000017853A9 Multi-pulse sampling of signals using force sampling |
| 09/07/2000 | DE19909892A1 Experimental design and testing apparatus for electronic circuits with programmable logic devices has modules for logic devices and modules for power supply, joined by connection modules |
| 09/07/2000 | DE10007399A1 Sleeve for sprung contact probe has collar-shaped end for discrete point contact |
| 09/07/2000 | DE10004367A1 Elektrooptische Sonde Electro-optical probe |
| 09/05/2000 | US6114869 Method and apparatus for interfacing between automatic wafer probe machines, automatic testers, and probe cards |
| 09/05/2000 | US6114865 Device for electrically contacting a floating semiconductor wafer having an insulating film |
| 09/05/2000 | US6114864 Probe card with plural probe tips on a unitary flexible tongue |
| 09/05/2000 | US6113053 Electronic chip component for measurement and tape cartridge holding the same |
| 08/31/2000 | WO2000050905A1 High bandwidth passive integrated circuit tester probe card assembly |
| 08/31/2000 | WO2000050847A1 Measuring transducer |
| 08/31/2000 | DE10004366A1 Sonde für ein elektrooptisches Abtast-Oszilloskop Probe for an electro-optical sampling oscilloscope |
| 08/31/2000 | DE10003426A1 Elektro-optische Abtastsonde Electro-optical scanning probe |
| 08/31/2000 | DE10000362A1 Detecting structured substrates defects involves scanning charged particle beam over substrate with optical column stationary w.r.t. surface, comparing detected images with reference |
| 08/30/2000 | EP1031841A2 Test adapter for contacting populated printed circuit boards |
| 08/30/2000 | EP1031840A2 Electric resistance measuring apparatus and method for circuit board |
| 08/30/2000 | EP1031839A2 Test fixture for matched impedance testing |
| 08/29/2000 | US6111418 Method for building and a structure of a contact end in a contact probe |
| 08/29/2000 | US6111417 Semiconductor component test apparatus including sucking mechanism maintaining components in tray during testing |
| 08/29/2000 | US6110823 Method of modifying the thickness of a plating on a member by creating a temperature gradient on the member, applications for employing such a method, and structures resulting from such a method |
| 08/29/2000 | CA2152220C Monitoring device secured to power distribution system conductors |
| 08/24/2000 | DE19907727A1 Testadapter zur Kontaktierung von bestückten Leiterplatinen Test adapter for connection of printed circuit boards |
| 08/24/2000 | DE19903430A1 Measurement adapter for inspection of electric drive for robots; uses selection switch through which socket elements of pin jack and measurement sockets may be operable |
| 08/23/2000 | EP1030345A2 Plasma treatment equipment and impedance measurement tool |
| 08/23/2000 | EP1030183A1 Current sensor |
| 08/23/2000 | EP1029386A1 Converter socket terminal |
| 08/23/2000 | EP1029249A2 Test head structure for integrated circuit tester |
| 08/23/2000 | CN2392975Y Electroprobe lamp for multimeter |
| 08/23/2000 | CN1264470A Conductive contact |
| 08/23/2000 | CN1264319A Apparatus and methods for arraying solution onto solid support |
| 08/22/2000 | US6107813 Probe card changer system and method |
| 08/22/2000 | US6107812 Apparatus and method for testing integrated circuit components of a multi-component card |
| 08/22/2000 | US6107804 Apparatus for measuring the amount of electric charge induced in conductive part and method of measuring electric charge |