| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 01/09/2001 | US6172505 Electronic battery tester |
| 01/09/2001 | US6172497 High-frequency wave measurement substrate |
| 01/09/2001 | US6170329 Test fixture customization adapter enclosure |
| 01/09/2001 | US6170116 Abrasive member and cleaning device for probe needle for probe card |
| 01/08/2001 | CA2314284A1 Mobile electric measuring device with detachable operating unit |
| 01/04/2001 | WO2001000659A1 Benzimidazolone peptidomimetics as thrombin receptor antagonists |
| 01/04/2001 | DE10030209A1 Test socket has IC holder with housing contg. contacts, each of which makes contact with IC connection points, apertures in housing and open to side that contacts test socket |
| 01/02/2001 | US6169412 Adjustable tooling pin for a card test fixture |
| 01/02/2001 | US6169411 Integrated circuit testing assembly and method |
| 01/02/2001 | US6169410 Wafer probe with built in RF frequency conversion module |
| 01/02/2001 | US6169409 Low-temperature wafer testing method and prober |
| 01/02/2001 | US6169021 Method of making a metallized recess in a substrate |
| 01/02/2001 | US6168449 Test sockets for integrated circuits |
| 12/28/2000 | WO2000079293A1 Probe device using superelastic probe elements |
| 12/28/2000 | WO2000079290A1 Spatial and temporal scanning of ultrafast electric signals of a cantilever probe used for raster probe microscopy |
| 12/28/2000 | WO2000079289A1 Wiring substrate for conductive contact unit |
| 12/27/2000 | CN1278308A Method of making a structure with improved material properties by moderate heat treatment of a metal deposit |
| 12/26/2000 | US6166845 Electro-optic probe |
| 12/26/2000 | US6166556 Method for testing a semiconductor device and semiconductor device tested thereby |
| 12/26/2000 | US6166554 Flexible electrical test fixture for integrated circuits on prototype and production printed circuit boards |
| 12/26/2000 | US6165806 Fault isolation within an inner lead bond region of a μBGA (micro ball grid array) package for an integrated circuit die |
| 12/26/2000 | US6164982 IC socket for holding IC having multiple parallel pins |
| 12/21/2000 | DE10026280A1 Sonde für ein elektro-optisch abtastendes Oszilloskop A probe for electro-optically scanning oscilloscope |
| 12/20/2000 | EP1061786A2 Socket for IC package |
| 12/20/2000 | EP1061381A2 Method for optimizing probe card analysis and scrub mark analysis data |
| 12/20/2000 | EP1061374A2 Active ground fault disconnect |
| 12/20/2000 | EP1061373A2 Test fixture customization adapter enclosure |
| 12/20/2000 | EP1060398A1 Coaxial probe interface for automatic test equipment |
| 12/19/2000 | US6163162 Temperature compensated vertical pin probing device |
| 12/19/2000 | US6163156 Electrical connection for electronic battery tester |
| 12/19/2000 | US6163145 Transporting apparatus for semiconductor device |
| 12/19/2000 | US6163090 Probe position actuator with an elongated stroke |
| 12/19/2000 | US6162652 Process for sort testing C4 bumped wafers |
| 12/19/2000 | US6162066 Socket for positioning and installing an integrated circuit chip on a flexible connector sheet |
| 12/14/2000 | WO2000075677A1 Segmented contactor |
| 12/14/2000 | DE19925802A1 Leakage current testing device in which the electrode mounting arrangement is improved to give a constant application force of the electrodes on the sample surface |
| 12/13/2000 | EP1059538A2 Printed circuit board testing apparatus |
| 12/13/2000 | CN1276530A Probe unit for inspection of base board for assemblying semiconductor chip |
| 12/12/2000 | US6160415 Apparatus and method for setting zero point of Z-axis in a wafer probe station |
| 12/12/2000 | US6160412 Impedance-matched interconnection device for connecting a vertical-pin integrated circuit probing device to integrated circuit test equipment |
| 12/12/2000 | US6160409 Inspection method of conductive patterns |
| 12/12/2000 | US6160408 Thin profile vertically oriented probe adapter with code disassembly capability |
| 12/12/2000 | US6160404 Circuit for measuring the electrode current of a ceramic gas sensor |
| 12/12/2000 | US6160252 Photoconductive element and method for measuring high frequency signals |
| 12/12/2000 | US6159056 Electrical contact assembly for interconnecting test apparatus and the like |
| 12/07/2000 | WO2000074110A2 Integrated circuit wafer probe card assembly |
| 12/07/2000 | WO2000074108A2 An interface device |
| 12/07/2000 | WO2000073905A2 Test interface for electronic circuits |
| 12/07/2000 | DE19922082A1 Device for testing electronic functional capability of elements with various geometries uses a sliding contact device without depending on an element's geometry. |
| 12/06/2000 | EP1058493A2 Socket for electrical parts |
| 12/06/2000 | EP1057038A1 Method and device for testing printed circuit boards |
| 12/06/2000 | EP1023743A4 Composite electrical contact structure and method for manufacturing the same |
| 12/06/2000 | CN1275719A Probe adapter for spherical grid array component |
| 12/05/2000 | US6156484 One photolithographic masking step in the fabrication of sculpted, uniformly shaped contacts using mask comprising different sized features, through which differing etch rates can be achieved; make array of electrical test probe contacts |
| 12/05/2000 | US6156188 Using the main shaft of an electrodischarge machining machine to mount thereon a probe for effecting the drilling operation of a pcb board; upon completion of the drilling operation, the probe is severed and then fastened with the pcb board |
| 11/30/2000 | WO2000072339A1 Current sensor with two assembly positions |
| 11/30/2000 | WO2000072026A1 Current, voltage or power detector |
| 11/29/2000 | EP1055930A2 Printed circuit board testing apparatus and probe device for use in the same |
| 11/29/2000 | CN1275204A Grinding chip |
| 11/28/2000 | US6154863 Apparatus and method for testing non-componented printed circuit boards |
| 11/28/2000 | US6154710 Method and apparatus for searching electromagnetic disturbing source and non-contact voltage probe apparatus therefor |
| 11/28/2000 | US6154043 Method and apparatus for identifying the position of a selected semiconductor die relative to other dice formed from the same semiconductor wafer |
| 11/28/2000 | US6154040 Apparatus for testing an electronic device |
| 11/28/2000 | US6154023 Remote current sensor |
| 11/28/2000 | US6152744 Integrated circuit test socket |
| 11/23/2000 | WO2000070355A1 Component geometry-independent device for testing electronic components with movable contact means |
| 11/23/2000 | WO2000039848A3 Test method and assembly including a test die for testing a semiconductor product die |
| 11/22/2000 | CN1274518A Burn-in board with adaptable heat sink device |
| 11/21/2000 | US6151063 Printed circuit board inspection apparatus and method |
| 11/21/2000 | US6150992 Traceable self-contained programmable frequency source for performing alternate test site and open area test site comparisons |
| 11/21/2000 | US6150833 LCD panel power-up test fixture and method of using |
| 11/21/2000 | US6150830 Test head for microstructures with interface |
| 11/21/2000 | US6150829 Three-dimensional programmable connector |
| 11/21/2000 | US6150827 Automatic adjustment method for elimination of the centering error during the electrical test on printed circuit boards |
| 11/21/2000 | US6150825 Electric circuit board tester |
| 11/21/2000 | US6150616 Electroconductive contact unit system |
| 11/21/2000 | US6150186 Method of making a product with improved material properties by moderate heat-treatment of a metal incorporating a dilute additive |
| 11/16/2000 | WO2000068972A2 Method of creating an electrical interconnect device bearing an array of electrical contact pads |
| 11/15/2000 | EP1051464A1 Ef |
| 11/14/2000 | US6147505 Adapter arrangement for electrically testing printed circuit boards |
| 11/14/2000 | US6147485 Universal test fixture for circuit packs |
| 11/14/2000 | US6145191 Method for mounting and testing integrated circuits on printed circuit boards |
| 11/09/2000 | WO2000067540A1 Chip carrier socket |
| 11/09/2000 | DE10007434A1 Support module for a micro-ball grid array (BGA) device for testing semiconductor devices and solder connections, includes projections and elastic device to hold the module body and test container |
| 11/08/2000 | CN2405224Y Measuring probe for coaxial radio-frequency signal |
| 11/07/2000 | US6144559 Process for assembling an interposer to probe dense pad arrays |
| 11/07/2000 | US6144212 Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card |
| 11/02/2000 | EP1049199A2 Strain relief, pull-strength termination with controlled impedance for an electrical cable |
| 11/02/2000 | DE10017074A1 Elektro-Optische Abtastsonde und ein Verfahren zur Einstellung derselben Electro-optic sampling probe and method for setting the same |
| 10/31/2000 | US6140905 Electrically conductive contact pin having a temperature fuse function |
| 10/31/2000 | US6140830 Adapter system for component assembly circuit boards, for use in a test device |
| 10/31/2000 | US6140827 Method and apparatus for testing bumped die |
| 10/31/2000 | US6140812 Electronic instrument with multiple position spring detented handle |
| 10/31/2000 | US6139403 Method and device for positioning and accessing a die under analysis |
| 10/26/2000 | WO2000063708A1 Device for electrically contacting a floating semiconductor wafer having an insulating film |
| 10/26/2000 | WO2000063706A1 Adapter base for receiving electronic test objects |
| 10/26/2000 | DE10013986A1 Electro optic probe for electro-optic sampling oscilloscope, has voltage applied at metal pin to change polarization of pulsed light |
| 10/26/2000 | DE10002099A1 Probe tip arrangement in dense pad array, has aggressor conductor located in close proximity to the access transmission line, where redefined capacitance is created between conductor and transmission line |
| 10/26/2000 | DE10002098A1 System for testing dense connection area arrays has probe tip arrangement with connection area in array and probe tip resistance coupled to connection area and access transfer line |
| 10/25/2000 | EP1046093A2 An improved power contact for testing a power delivery system |