| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 02/28/2001 | EP1079235A1 Method and system for testing an electrical component |
| 02/28/2001 | EP1077857A1 Retractable self-locking cleat for rope, cable and the like |
| 02/28/2001 | CN2421656Y Multimeter measuring protector |
| 02/28/2001 | CN2421655Y Multimeter fuse tube mounting device |
| 02/28/2001 | CN1285615A Probe card for testing semiconductor chip with many semiconductor device and method thereof |
| 02/27/2001 | US6195773 LSI defective automatic analysis system and analyzing method therefor |
| 02/27/2001 | US6194909 Constructive module of an electronic telecommunications equipment, with an interface towards a testing and diagnosing system |
| 02/27/2001 | US6194908 Test fixture for testing backplanes or populated circuit boards |
| 02/27/2001 | US6194907 Prober and electric evaluation method of semiconductor device |
| 02/27/2001 | US6194906 Inspection adapter board for printed board, method for inspecting printed board, and method and apparatus for producing information for fabricating the inspection adapter board |
| 02/27/2001 | US6194905 Method for testing integrated circuit components of a multi-component card |
| 02/27/2001 | US6194904 Socket test probe and method of making |
| 02/22/2001 | WO2001013422A1 Apparatus and method for protecting electronic assembly contacts |
| 02/22/2001 | WO2001013130A1 Electrical contactor, especially wafer level contactor, using fluid pressure |
| 02/21/2001 | EP1077381A2 Probe card and method of testing wafer having a plurality of semiconductor devices |
| 02/21/2001 | EP1076827A1 Method and apparatus for testing interconnect networks |
| 02/21/2001 | CN2420648Y Multifunction high pressure metering cabinet |
| 02/20/2001 | US6191604 Integrated circuit testing device |
| 02/20/2001 | US6191601 Test fixture for matched impedance testing |
| 02/20/2001 | US6191599 IC device under test temperature control fixture |
| 02/20/2001 | US6191598 High resolution analytical probe station |
| 02/20/2001 | US6191597 Printed circuit board test device with test adapter and method for adjusting the latter |
| 02/20/2001 | US6191596 Method for detecting a contact position between an object to be measured and measuring pins |
| 02/20/2001 | US6191594 Adapter for a measurement test probe |
| 02/20/2001 | US6191591 Battery cell grading holder |
| 02/20/2001 | US6191434 Semiconductor device measuring socket having socket position adjustment member |
| 02/20/2001 | US6190181 Connection base |
| 02/20/2001 | US6190049 Fluid thrust bearing for indicating instruments and the like |
| 02/15/2001 | DE10037216A1 Connecting structure for forming an electrical connection which can be mounted on a testing card for testing semiconductor wafers comprises a connecting substrate with a connecting element |
| 02/14/2001 | EP1075655A1 Electronic battery tester |
| 02/14/2001 | CN1062086C Magnetic permeance device and magnetic permeance electric machinery |
| 02/13/2001 | US6188232 Temporary package, system, and method for testing semiconductor dice and chip scale packages |
| 02/13/2001 | US6188231 Method for forming an interposer for making temporary contact with pads of a semiconductor chip |
| 02/13/2001 | US6188230 Pickup chuck for double sided contact |
| 02/13/2001 | US6188226 Electric potential sensor |
| 02/13/2001 | US6187609 Compact sensing apparatus having reduced cross section and methods of mounting |
| 02/13/2001 | US6186812 Manually operated top loading socket for ball grid arrays |
| 02/08/2001 | WO2001010004A1 Double power supply for electricity meter |
| 02/08/2001 | WO2001009980A2 Controlled compliance fine pitch interconnect |
| 02/08/2001 | WO2001009623A1 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 02/08/2001 | DE19943956C1 Phase detector uses at least 2 series diodes for comparing phase of input signal with reference signal with tuned capacitors and/or inductances for providing circuit symmetry |
| 02/08/2001 | DE19932849A1 Electrical contact device has an elastic isolating body with elastic contacts fixed within it with pointed protrusions at each end so that arranged between two sets of conductors an efficient pressurized connection is made |
| 02/08/2001 | DE10035976A1 Highly reliable test connection structure for large numbers of components on semiconductor wafer or components on PCB, is machine-assembled with great precision in silicon |
| 02/07/2001 | EP1074844A2 Testing integrated circuits |
| 02/07/2001 | CN2418482Y Shutter-like electric-meter box |
| 02/06/2001 | US6184699 Photolithographically patterned spring contact |
| 02/06/2001 | US6184698 Semiconductor component mounting apparatus |
| 02/06/2001 | US6184697 Semiconductor integrated circuit testing apparatus with reduced installation area |
| 02/06/2001 | US6184679 Magnetic field sensor comprising two hall elements |
| 02/06/2001 | US6184672 Current sensor assembly with electrostatic shield |
| 02/06/2001 | US6184587 Resilient contact structures, electronic interconnection component, and method of mounting resilient contact structures to electronic components |
| 02/06/2001 | US6184576 Packaging and interconnection of contact structure |
| 02/06/2001 | US6184065 Photolithographically patterned spring contact |
| 02/06/2001 | US6182828 Reel tape for provisionally supporting a bare chip |
| 02/01/2001 | WO2001007923A1 Self-aligning interface apparatus for use in testing electrical devices |
| 02/01/2001 | WO2001007871A1 Enhancing voltmeter functionality |
| 02/01/2001 | WO2001007207A1 Membrane probing system |
| 02/01/2001 | DE19931888A1 Elektrisches Meßgerät mit abnehmbarer Bedienungseinheit Electrical measuring with removable control panel |
| 02/01/2001 | CA2380267A1 Enhancing voltmeter functionality |
| 02/01/2001 | CA2378832A1 Self-aligning interface apparatus for use in testing electrical devices |
| 01/31/2001 | EP1073164A1 A probe, a wire insertion detection jig, a wire mount control apparatus and a wire mount control method |
| 01/31/2001 | EP1072897A2 Method and apparatus for searching electromagnetic disturbing source and noncontact voltage probe therefor |
| 01/31/2001 | EP1046093A4 An improved power contact for testing a power delivery system |
| 01/31/2001 | EP0855037A4 Loaded board drop pin fixture |
| 01/31/2001 | CN2417473Y Probe sonnectinig device used for electronic measurment |
| 01/30/2001 | US6181264 Precision bipolar digital-to-analog converter for an instrument probe interface |
| 01/30/2001 | US6181150 Contact probe |
| 01/30/2001 | US6181149 Grid array package test contactor |
| 01/30/2001 | US6181147 Device evaluation circuit |
| 01/30/2001 | US6181145 Probe card |
| 01/30/2001 | US6181144 Semiconductor probe card having resistance measuring circuitry and method fabrication |
| 01/25/2001 | WO2001006559A1 Wafer prober |
| 01/25/2001 | WO2001006271A1 A test socket and method for testing an ic device in a dead bug orientation |
| 01/24/2001 | CN1281270A Socket of integrated circuit module |
| 01/23/2001 | US6178359 Instrument with installation-evident accessory modules |
| 01/23/2001 | US6177805 High density test connector for disk drives in a high volume manufacturing environment |
| 01/23/2001 | US6177804 Common-mode voltage probe for predicting EMI from unshielded differential-pair cables |
| 01/23/2001 | US6177729 Rolling ball connector |
| 01/18/2001 | WO2001004653A1 Method and apparatus for sub-micron imaging and probing on probe station |
| 01/18/2001 | WO2001004652A1 Apparatus for electrical testing of a substrate having a plurality of terminals |
| 01/18/2001 | WO2001004650A1 Test probe head having encapsulated rigid pins |
| 01/18/2001 | WO2001004643A2 Wafer-level burn-in and test cartridge and methods |
| 01/18/2001 | WO2001004642A2 Kinematic coupling |
| 01/18/2001 | DE19931725A1 Multi-function tool has a handle with a forward assembly in which sensors or tools can be fitted including sensors for measurement and testing purposes to reduce the amount of instruments needing to be carried |
| 01/18/2001 | DE19928338C1 Verfahren zur räumlichen und zeitlichen Abtastung ultraschneller elektrischer Signale einer Probe mittels einer Cantileversonde aus Halbleitermaterial für die Rastersondenmikroskopie A method for spatial and temporal sampling ultrafast electric signals of a sample using a cantilever probe of semiconductor material for scanning probe microscopy |
| 01/18/2001 | DE10031543A1 Production of a connecting structure used in the production of electronic circuits comprises producing an insert in a plastic layer formed on a planar substrate |
| 01/18/2001 | DE10015744A1 Contact structure in probe card, has projection made of electrically conducting material provided in contact board to connect contact pad that is in electrical communication with PCB, via contact trace in via hole |
| 01/16/2001 | US6175244 Current signatures for IDDQ testing |
| 01/16/2001 | US6175243 Apparatus and method for assembling test fixtures |
| 01/16/2001 | US6175242 Method for forming coaxial silicon interconnects |
| 01/16/2001 | US6175228 Electronic probe for measuring high impedance tri-state logic circuits |
| 01/16/2001 | US6175080 Strain relief, pull-strength termination with controlled impedance for an electrical cable |
| 01/16/2001 | US6174744 Method of producing micro contact structure and contact probe using same |
| 01/16/2001 | US6174178 Retractable connector mechanism for signal connectors |
| 01/16/2001 | US6174174 Socket for IC and method for manufacturing IC |
| 01/16/2001 | US6174172 Electric contact unit |
| 01/11/2001 | DE10031035A1 Thermal chuck for holding test devices such as integrated circuits for carrying out low voltage and low power tests at varying temperatures has a capacitative connection for filtering out electrical noise |
| 01/11/2001 | DE10025211A1 Test socket for measuring electric characteristics of electronic device or semiconductor package has protrusions formed from smooth curved surfaces in portion to contact external connection terminals of electronic device |
| 01/11/2001 | DE10020713A1 Contact structure for probe card, has contactor formed on dielectric substrate by minute machining operation such that contact section of contactor is perpendicularly formed on one end of horizontal section |
| 01/10/2001 | EP1067390A1 Mobile electrical measuring apparatus with removable control panel |