| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 04/25/2001 | EP1094319A2 Wear-resistant spring contacts |
| 04/25/2001 | CN1292875A Electricity meter having conductive shield for reflecting electric fields |
| 04/25/2001 | CN1292561A Active earth fault turn-off |
| 04/24/2001 | US6222379 Conventionally sized temporary package for testing semiconductor dice |
| 04/24/2001 | US6222378 Probe adapter for a ball-grid-array package |
| 04/24/2001 | US6222377 Circuit board probe device |
| 04/24/2001 | US6222280 Test interconnect for semiconductor components having bumped and planar contacts |
| 04/24/2001 | US6219908 Method and apparatus for manufacturing known good semiconductor die |
| 04/24/2001 | CA2091956C Signal probe apparatus |
| 04/19/2001 | WO2001027992A1 Substrate falling-preventive mechanism and substrate tester having the same |
| 04/19/2001 | WO2001027640A1 Method to control the apparatus for measurement of electrical quantities through measurement cable |
| 04/19/2001 | WO2001027639A1 Sensor for detecting high-frequency oscillations of a voltage and an arrangement of a sensor |
| 04/19/2001 | US20010000295 Test carrier with variable force applying mechanism for testing semiconductor components |
| 04/19/2001 | DE10047136A1 Electrical property testing method of ICs, obtains laser and reference interference signals by enabling overlapping of primary and secondary laser signals and reference signals within given time respectively |
| 04/18/2001 | EP1092338A1 Assembly of an electronic component with spring packaging |
| 04/18/2001 | EP1092160A1 Residual current detection device |
| 04/18/2001 | EP1092159A1 Layered current sensor |
| 04/18/2001 | EP1092158A1 Current detector and current measurement apparatus including such detector |
| 04/18/2001 | CN1292091A Coaxial probe interface for automatic test equipment |
| 04/18/2001 | CN1291728A Supporting frame of panel display device or probe block |
| 04/18/2001 | CN1064783C Connector module with test and jumper access |
| 04/17/2001 | US6218910 High bandwidth passive integrated circuit tester probe card assembly |
| 04/17/2001 | US6218851 Method and apparatus for testing a printed circuit |
| 04/17/2001 | US6218849 Device for detecting proper mounting of an IC for testing in an IC testing apparatus |
| 04/17/2001 | US6218848 Semiconductor probe card having resistance measuring circuitry and method of fabrication |
| 04/17/2001 | US6218846 Multi-probe impedance measurement system and method for detection of flaws in conductive articles |
| 04/17/2001 | US6218826 Measurement probe having an internal alignment fixture |
| 04/17/2001 | US6218203 Method of producing a contact structure |
| 04/17/2001 | US6217343 Multipoint conductive sheet |
| 04/17/2001 | US6217341 Integrated circuit test socket having torsion wire contacts |
| 04/17/2001 | US6216630 Bearing arrangement and indicating instrument using the same |
| 04/11/2001 | EP1091400A1 Wafer prober |
| 04/11/2001 | CN1291286A Method and device for testing printed circuit board |
| 04/10/2001 | US6215670 Method for manufacturing raised electrical contact pattern of controlled geometry |
| 04/10/2001 | US6215322 Conventionally sized temporary package for testing semiconductor dice |
| 04/10/2001 | US6215321 Probe card for wafer-level measurement, multilayer ceramic wiring board, and fabricating methods therefor |
| 04/10/2001 | US6215320 High density printed circuit board |
| 04/10/2001 | US6215295 Photonic field probe and calibration means thereof |
| 04/10/2001 | US6214716 Semiconductor substrate-based BGA interconnection and methods of farication same |
| 04/10/2001 | US6213789 Method and apparatus for interconnecting devices using an adhesive |
| 04/05/2001 | WO2001023898A1 Method of manufacturing semiconductor inspection |
| 04/04/2001 | EP1088241A1 Voltage measuring device |
| 04/04/2001 | EP1088238A1 Adapter base for receiving electronic test objects |
| 04/04/2001 | CN1290292A Method for preparing emulsified and implementing device |
| 04/04/2001 | CN1290034A Manufacture of semiconductor device and equipment therefor |
| 04/04/2001 | CN1289934A Combined tester probe |
| 04/03/2001 | US6211691 Probe unit |
| 04/03/2001 | US6211690 Apparatus for electrically testing bare printed circuits |
| 04/03/2001 | US6211688 Test area with automatic positioning of a microprobe and a method of producing such a test area |
| 04/03/2001 | US6211687 Connector contact fingers for testing integrated circuit packages |
| 04/03/2001 | US6211685 Surface probe for determining physical properties of a semiconductor device |
| 04/03/2001 | US6211571 Method and apparatus for testing chips |
| 03/29/2001 | WO2001022537A1 Assembly of spring contacts in a predetermined raster |
| 03/29/2001 | WO2001022097A1 Measuring probe for measuring high frequencies and a method for producing the same |
| 03/29/2001 | WO2001004653A8 Method and apparatus for sub-micron imaging and probing on probe station |
| 03/28/2001 | EP1087467A2 Contact and contact assembly using the same |
| 03/28/2001 | EP1086379A1 Method for transmitting and storing value and value store electric power meter using the same |
| 03/28/2001 | CN1063849C Integrated circuit carrier |
| 03/27/2001 | US6208375 Test probe positioning method and system for micro-sized devices |
| 03/27/2001 | US6208158 Zero static force assembly for wireless test fixtures |
| 03/27/2001 | US6208157 Method for testing semiconductor components |
| 03/27/2001 | US6208156 Test carrier for packaging semiconductor components having contact balls and calibration carrier for calibrating semiconductor test systems |
| 03/27/2001 | US6208155 Probe tip and method for making electrical contact with a solder ball contact of an integrated circuit device |
| 03/27/2001 | US6208151 Method and apparatus for measurement of microscopic electrical characteristics |
| 03/27/2001 | US6206273 Structures and processes to create a desired probetip contact geometry on a wafer test probe |
| 03/27/2001 | US6205660 Method of making an electronic contact |
| 03/27/2001 | CA2194644C Probe type tester with circuit board stabilizer |
| 03/22/2001 | WO2001020358A1 Method and apparatus for calibrating a current sensing system |
| 03/22/2001 | WO2001020350A1 Phase detector |
| 03/22/2001 | WO2001020347A1 Nano-drive for high resolution positioning and for positioning of a multi-point probe |
| 03/22/2001 | CA2381803A1 Nano-drive for high resolution positioning and for positioning of a multi-point probe |
| 03/21/2001 | EP1085327A1 Multi-point probe |
| 03/21/2001 | EP1085326A2 Multilayer wiring board, manufacturing method thereof, and wafer block contact board |
| 03/20/2001 | US6204680 Test socket |
| 03/20/2001 | US6204678 Direct connect interconnect for testing semiconductor dice and wafers |
| 03/20/2001 | US6204676 Testing apparatus for testing a ball grid array device |
| 03/20/2001 | US6203332 Attachment structure of semiconductor device socket |
| 03/15/2001 | WO2001018553A1 Conductive contact |
| 03/15/2001 | DE19943388A1 Vorrichtung zum Prüfen von Leiterplatten An apparatus for testing printed circuit boards |
| 03/15/2001 | DE10044408A1 Pin block structure for containment and support of connector pins for use in automatic testing of a wide range of semiconductor structures having different connector pin arrangements |
| 03/15/2001 | DE10025900A1 Sonde für ein elektro-optisch abtastendes Oszilloskop A probe for electro-optically scanning oscilloscope |
| 03/14/2001 | EP1083434A2 Apparatus for testing printed circuit boards |
| 03/13/2001 | US6201402 Probe tile and platform for large area wafer probing |
| 03/13/2001 | US6201401 Method for measuring the electrical potential in a semiconductor element |
| 03/13/2001 | US6201383 Method and apparatus for determining short circuit conditions using a gang probe circuit tester |
| 03/08/2001 | WO2000033089A3 Lithographic contact elements |
| 03/08/2001 | DE10023379A1 Thin film probe manufacturing method for testing integrated circuit, involves removing substrate from electrical conducting material after connecting track to electrical conducting material |
| 03/07/2001 | EP1081994A2 Board-to-board alignment and securement device. |
| 03/07/2001 | EP1081497A2 Flat panel display support framework |
| 03/07/2001 | CN1286757A Apparatus for testing multi-terminal electronic components |
| 03/06/2001 | US6198299 High Resolution analytical probe station |
| 03/06/2001 | US6198297 Microcircuit testing device |
| 03/06/2001 | US6198272 Plug construction having positive and negative poles for circuit testing on vehicles |
| 03/06/2001 | US6197603 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step |
| 03/06/2001 | US6196866 Vertical probe housing |
| 03/01/2001 | WO2001014893A1 Test needle for a raster-matching adapter and a device for testing printed circuit boards |
| 03/01/2001 | DE19939955A1 Prüfnadel für einen Rasteranpassungsadapter einer Vorrichtung zum Testen von Leiterplatten Test needle for a pattern adapter of a device for testing printed circuit boards |
| 03/01/2001 | DE10034706A1 Elektrooptik-Meßfühler Electro-optic probe |
| 03/01/2001 | DE10028381A1 Sondenspitzenabschlussvorrichtung für einen leicht änderbaren Durchführungabschluss Probe tip termination device for an easily modifiable implementation completion |
| 03/01/2001 | CA2313269A1 Board-to-board alignment and securement device |