| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 06/13/2001 | DE19952943A1 Nadelkarten-Justageeinrichtung zur Planarisierung von Nadelsätzen einer Nadelkarte Probe card adjusting device for planarization of needle sets a probe card |
| 06/13/2001 | CN1299060A Device for testing electric passing through for electric wire connector |
| 06/12/2001 | US6246252 Efficient debug package design |
| 06/12/2001 | US6246250 Probe card having on-board multiplex circuitry for expanding tester resources |
| 06/12/2001 | US6246247 Probe card assembly and kit, and methods of using same |
| 06/12/2001 | US6246245 Probe card, test method and test system for semiconductor wafers |
| 06/12/2001 | US6246108 Integrated circuit package including lead frame with electrically isolated alignment feature |
| 06/12/2001 | US6245444 Substrate with cantilever |
| 06/07/2001 | WO2001040817A1 Dry load test apparatus |
| 06/07/2001 | WO2000034796A8 Scanning single electron transistor microscope for imaging ambient temperature objects |
| 06/07/2001 | US20010002794 Split resistor probe and method |
| 06/07/2001 | US20010002624 Tip structures. |
| 06/07/2001 | DE10046952A1 Elektrooptik-Messfühler Electro-optic probe |
| 06/05/2001 | US6243655 Circuit trace probe and method |
| 06/05/2001 | US6242935 Interconnect for testing semiconductor components and method of fabrication |
| 06/05/2001 | US6242933 Device probe socket forming part of a test head, interfacing between test head and a probe handler, used for device strip testing |
| 06/05/2001 | US6242932 Interposer for semiconductor components having contact balls |
| 06/05/2001 | US6242930 High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachable |
| 06/05/2001 | US6242929 Probe needle for vertical needle type probe card and fabrication thereof |
| 06/05/2001 | US6242923 Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards |
| 06/05/2001 | US6242903 Method for using an insulated electrical probe |
| 06/05/2001 | US6242803 Semiconductor devices with integral contact structures |
| 05/31/2001 | US20010002330 Integrated circuit assembly has pads of a chip electrically connected to pads of a substrate with rolling metal balls, a pliable material bonds the balls in movable contact with the pads, avoiding thermal stress |
| 05/31/2001 | US20010002068 Test interconnect for semiconductor components having bumped and planar contacts |
| 05/30/2001 | EP1103818A2 A PDA coupler containing a flexible joint |
| 05/30/2001 | EP1102999A1 Method and apparatus using an infrared laser probe for measuring voltages directly in an integrated circuit |
| 05/30/2001 | EP1102997A1 A current shunt |
| 05/30/2001 | CN1297254A Cooling system for IC module processing device |
| 05/29/2001 | US6239592 Test fixture with quick connect and release board interconnect mechanism |
| 05/29/2001 | US6239590 Calibration target for calibrating semiconductor wafer test systems |
| 05/29/2001 | US6239588 Method of fabricating a magnetic shield for a plastic molded electricity meter frame |
| 05/29/2001 | US6239587 Probe for monitoring radio frequency voltage and current |
| 05/29/2001 | US6239388 Device for reducing the time for measuring on a cable |
| 05/29/2001 | US6237400 Vehicle diagnosing apparatus |
| 05/25/2001 | WO2001037381A1 Ic socket and ic tester |
| 05/25/2001 | WO2001037233A1 Programmable connector |
| 05/25/2001 | WO2001036990A2 Wafer level interposer |
| 05/25/2001 | WO2001036987A1 Probe device, method of manufacture thereof, method of testing substrate using probe device |
| 05/25/2001 | WO2001036986A1 Probe card |
| 05/25/2001 | WO2001036985A1 Measuring station for integrated circuits on wafers or other electronic components and kits for assembly of said measuring stations |
| 05/25/2001 | WO2001036984A1 A test fixture |
| 05/24/2001 | US20010001538 Wafer probe station having environment control enclosure |
| 05/24/2001 | US20010001537 High-resistance probe and voltage detector incorporating same |
| 05/24/2001 | US20010001536 Ultra-high-frequency current probe in surface-mount form factor |
| 05/23/2001 | EP1102071A1 Holder of electroconductive contactor, and method for producing the same |
| 05/23/2001 | DE19955933A1 Support device for measurement cable contacts used with testing and tool vehicles that are widely used in the automotive construction industry to move testing instruments and meters around the shop floor |
| 05/23/2001 | DE19951501A1 Prüfstift für eine Vorrichtung zum Testen von Leiterplatten Test pin for an apparatus for testing printed circuit boards |
| 05/23/2001 | DE10050077A1 Contact structure for establishing electrical connection with contact target, has contact substrate with traces on surface connected to silicon bases of contactors to establish signal paths for external components |
| 05/23/2001 | CN1296568A Power contact for testing power source |
| 05/22/2001 | US6236221 Low inertia microcircuit test fixture |
| 05/22/2001 | US6236110 Power semiconductor module |
| 05/22/2001 | US6235630 Silicide pattern structures and methods of fabricating the same |
| 05/17/2001 | WO2001035606A1 Non-contact signal analyzer |
| 05/17/2001 | DE10001143A1 Remote control of measuring appts. for electrical quantities through a cable connecting the appts with the measured object using high frequency current representation of commands giving improved safety |
| 05/16/2001 | EP1099247A1 Method for transferring solder to a device and/or testing the device |
| 05/16/2001 | CN1295252A Electrical characteristics determining device |
| 05/15/2001 | US6232791 Testing Board |
| 05/15/2001 | US6232790 Method and apparatus for amplifying electrical test signals from a micromechanical device |
| 05/15/2001 | US6232789 Probe holder for low current measurements |
| 05/15/2001 | US6232788 Wafer probe station for low-current measurements |
| 05/15/2001 | US6232787 Microstructure defect detection |
| 05/15/2001 | US6232669 Contact structure having silicon finger contactors and total stack-up structure using same |
| 05/15/2001 | US6232243 Interconnect having recessed contact members with penetrating blades for testing semiconductor dice and packages with contact bumps |
| 05/15/2001 | US6232149 Sockets for “springed” semiconductor devices |
| 05/15/2001 | US6232143 Micro probe ring assembly and method of fabrication |
| 05/10/2001 | US20010000947 Test socket |
| 05/10/2001 | DE19953169A1 Arrangement to allow precise drilling of contact mounting holes in an existing test adapter board for use in testing printed circuit boards with components already mounted on it |
| 05/10/2001 | DE19952183A1 Appliance for forming a needle point used for measurement/testing purposes in biological and engineering oscillates point in grinding powder on oscillating plate |
| 05/10/2001 | DE19945176A1 Anordnung von Federkontakten in einem vorbestimmten Raster Arrangement of spring contacts in a predetermined grid |
| 05/09/2001 | EP1098200A2 Adjusting device for the planarization of probe sets of a probe card |
| 05/09/2001 | EP1097619A1 Integrated circuit module having springy contacts of at least two different types for reduced stress, and subassembly for such module |
| 05/09/2001 | EP1097617A1 Interconnect assembly for printed circuit boards and method of fabrication |
| 05/09/2001 | EP1097353A1 System comprising a plurality of sensor groups and method for determining the intactness of same |
| 05/09/2001 | CN2429833Y Testing probe |
| 05/09/2001 | CN1065629C Measure clamp for nonradiative dielectric waveguide device |
| 05/08/2001 | US6230276 Energy conserving measurement system under software control and method for battery powered products |
| 05/08/2001 | US6229330 Contactor floor that holds an IC package to contactor pins within an IC package testing system with minimized solder flaking |
| 05/08/2001 | US6229329 Method of testing electrical characteristics of multiple semiconductor integrated circuits simultaneously |
| 05/08/2001 | US6229327 Broadband impedance matching probe |
| 05/08/2001 | US6229324 Test system with mechanical alignment for semiconductor chip scale packages and dice |
| 05/08/2001 | US6229321 Process for manufacturing high frequency multichip module enabling independent test of bare chip |
| 05/08/2001 | US6229320 IC socket, a test method using the same and an IC socket mounting mechanism |
| 05/08/2001 | US6229319 Chip carrier to allow electron beam probing and fib modifications |
| 05/08/2001 | US6229315 Hand-held harmonics detector |
| 05/08/2001 | US6229266 Voltage level indicator |
| 05/08/2001 | US6227878 Method and apparatus for improving RF contact positioning in an RF test socket |
| 05/08/2001 | US6226863 Reworkability method for wirebond chips using high performance capacitor |
| 05/03/2001 | WO2001031718A2 Shunt resistance device for monitoring battery state of charge |
| 05/03/2001 | WO2001031348A1 Test probe for a device for testing printed circuit boards |
| 05/03/2001 | US20010000650 Test system having alignment member for aligning semiconductor components |
| 05/03/2001 | US20010000648 Method of forming tester substrates |
| 05/03/2001 | US20010000647 Circuitry testing substrates |
| 05/03/2001 | US20010000646 Test system with mechanical alignment for semiconductor chip scale packages and dice |
| 05/02/2001 | EP1095282A2 Multi-point probe |
| 05/02/2001 | CN2428777Y Detection probe automatic-assembling device |
| 05/02/2001 | CN1293824A Process for manufacturing semiconductor device |
| 05/01/2001 | US6225817 Loaded-board, guided-probe test fixture |
| 05/01/2001 | US6225816 Split resistor probe and method |
| 05/01/2001 | US6224389 Component for contacting a measuring unit and method for its production |
| 04/26/2001 | WO2001029568A1 Non-invasive electrical measurement of semiconductor wafers |