| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 07/26/2001 | US20010009378 Probe holder for low current measurements |
| 07/26/2001 | US20010009377 Wafer probe station for low-current measurements |
| 07/26/2001 | US20010009376 Probe arrangement assembly, method of manufacturing probe arrangement assembly, probe mounting method using probe arrangement assembly, and probe mounting apparatus |
| 07/26/2001 | DE19961311A1 Battery sensor device, has attachment device, sensor combined into integrated unit; attachment device is connected to single pole and has conventional terminal |
| 07/26/2001 | DE10001117A1 Testvorrichtung für ein Halbleiterbauelement Test device for a semiconductor component |
| 07/26/2001 | DE10000500A1 Current measurement device for electronics module, has manganin strip which is welded directly to the seams of sense conductors of current feed and shunt units |
| 07/25/2001 | EP1118002A1 Thermal isolation plate for probe card |
| 07/25/2001 | CN1305225A Device inspection apparatus and inspection method |
| 07/25/2001 | CN1305111A Apparatus and method for detecting electric trace by using photoelectric effect |
| 07/24/2001 | US6265888 Wafer probe card |
| 07/24/2001 | US6265887 Mounting fixture for a pin grid array device |
| 07/24/2001 | US6265245 Compliant interconnect for testing a semiconductor die |
| 07/24/2001 | US6264477 Photolithographically patterned spring contact |
| 07/24/2001 | US6263563 Method of manufacturing and checking electronic components |
| 07/19/2001 | WO2001052454A1 Electro-optic interface system and method of operation |
| 07/19/2001 | WO2001051939A1 Robotic probe for testing printed circuit boards in-situ using a single printed circuit card slot |
| 07/19/2001 | WO2001051935A1 Test device for a semiconductor component |
| 07/19/2001 | DE19962323A1 Electrical measurement device, e.g. current tong tester; has annular jaw head with at least one moving jaw element, where width with jaw element open is not greater than with jaw element closed |
| 07/19/2001 | DE10100816A1 Abtastung integrierter Schaltungen mit differentiell gepulstem Laserstrahl Scanning of integrated circuits with differential pulsed laser beam |
| 07/19/2001 | DE10100183A1 Spring loaded test connector for electrical junction block or disconnectors, test rod can be slid from an inactive stable position to an stable active position by applying pressure to its insulated enclosure |
| 07/19/2001 | DE10062543A1 Electro-optical measurement sensor for electro-optic sampling oscilloscope has insulator that is connected by optical path to quarter wavelength plate, polarizing beam splitters, and Faraday cell |
| 07/19/2001 | CA2366970A1 Electro-optic interface system and method of operation |
| 07/18/2001 | EP1116423A1 Vertically actuated bga socket |
| 07/18/2001 | EP1116420A1 Printed circuit plate used for testing electric components |
| 07/18/2001 | CN1304194A System for testing bare integrated circuit chip and socket for said chip |
| 07/17/2001 | US6262586 Probing method and apparatus utilizing an optimal probing mode |
| 07/17/2001 | US6262583 Test socket and methods |
| 07/17/2001 | US6262581 Test carrier for unpackaged semiconducter chip |
| 07/17/2001 | US6262571 Adjustable electrical connector for test fixture nest |
| 07/17/2001 | US6261854 Interconnect with pressure sensing mechanism for testing semiconductor wafers |
| 07/17/2001 | US6261114 Socket for electrical parts |
| 07/12/2001 | WO2001050140A2 Electric test connector, equipment and system using same |
| 07/12/2001 | WO2001050139A2 Galvanometer with axial symmetry and improved bearing design |
| 07/12/2001 | DE19961791A1 Anordnung zum Testen von Chips mittels einer gedruckten Schaltungsplatte Arrangement for testing chips by means of a printed circuit board |
| 07/12/2001 | DE10028835A1 Verfahren und Gerät zum Testen einer Halbleitervorrichtung Method and apparatus for testing a semiconductor device |
| 07/11/2001 | EP1015895B1 Voltage divider |
| 07/10/2001 | US6259963 Equipment, method and computer program product for determining positions of inspection terminals on printed wiring board |
| 07/10/2001 | US6259266 Testing device and method for known good chip |
| 07/10/2001 | US6259265 Unified test system and method for testing printed circuit boards |
| 07/10/2001 | US6259260 Apparatus for coupling a test head and probe card in a wafer testing system |
| 07/10/2001 | US6259243 Method for electromagnetically shielding inductive voltage detectors |
| 07/10/2001 | US6257933 Connector |
| 07/05/2001 | WO2001048818A1 Resilient interconnect structure for electronic components and method for making the same |
| 07/05/2001 | WO2001048471A2 Electro-optic system controller and method of operation |
| 07/05/2001 | WO2001047831A1 Carbon-containing aluminum nitride sintered compact, and ceramic substrate for use in apparatus for manufacturing and inspecting semiconductor |
| 07/05/2001 | DE10064514A1 Probe signal output device for electro-optical probe, has driver current control circuit with current drive circuit that supplies driver current to light source according to change in adder output |
| 07/04/2001 | EP1113277A1 A bushing element for medium and high voltage applications |
| 07/04/2001 | EP1113275A1 Conductive contact |
| 07/04/2001 | EP1113274A1 Conductive contact |
| 07/04/2001 | EP1113273A2 System for testing bare IC chips and a socket for such chips |
| 07/04/2001 | EP0876619B1 Machine for the electric test of printed circuits with adjustable position of the testing needles |
| 07/04/2001 | EP0713589B1 Voice trouble-shooting system for computer-controlled machines |
| 07/04/2001 | CN2438174Y Test tool switching device |
| 07/04/2001 | CN2438128Y Measuring probe adapted for measurer of electric energy meter |
| 07/04/2001 | CN1302378A Method for transmitting and storing value and valve store electric power meter using the same |
| 07/03/2001 | US6256613 Medical consultation management system |
| 07/03/2001 | US6255840 Semiconductor package with wire bond protective member |
| 07/03/2001 | US6255833 Method for testing semiconductor dice and chip scale packages |
| 07/03/2001 | US6255832 Flexible wafer level probe |
| 07/03/2001 | US6255827 Search routine for 2-point electrical tester |
| 07/03/2001 | US6255727 Contact structure formed by microfabrication process |
| 07/03/2001 | US6255602 Multiple layer electrical interface |
| 07/03/2001 | US6255585 Packaging and interconnection of contact structure |
| 07/03/2001 | US6255213 Method of forming a structure upon a semiconductive substrate |
| 07/03/2001 | US6255126 Lithographic contact elements |
| 06/28/2001 | WO2001046674A1 Apparatus for evaluating electrical characteristics |
| 06/28/2001 | WO2001046643A1 Scanning force microscope probe cantilever with reflective structure |
| 06/28/2001 | WO2000068972A3 Method of creating an electrical interconnect device bearing an array of electrical contact pads |
| 06/28/2001 | US20010005817 Circuit trace probe and method |
| 06/28/2001 | US20010005142 Contact pin elastic body for supporting the same and socket having them for testing module |
| 06/28/2001 | US20010005141 Configuration for testing chips using a printed circuit board |
| 06/28/2001 | DE19957844A1 Checking device for semiconductor integrated circuit arrangement on support has anisotropic leading material which electrically contacts first contacts on first surface of support |
| 06/27/2001 | EP1111668A2 Semiconductor testing device comprising a light emitting device |
| 06/27/2001 | EP1111397A2 Means for testing chips using a printed circuit |
| 06/27/2001 | CN1300943A Whisker calibrator for levelling set of whiskers |
| 06/26/2001 | US6252415 Pin block structure for mounting contact pins |
| 06/26/2001 | US6252412 Method of detecting defects in patterned substrates |
| 06/26/2001 | US6252392 Probe station having environment control chamber with bendably extensible and retractable lateral wall assembly |
| 06/26/2001 | US6252391 High frequency probe |
| 06/26/2001 | US6252388 Method and apparatus for measuring voltage using electric field sensors |
| 06/26/2001 | US6252289 Electrical contact and housing for use as an interface between a testing fixture and a device under test |
| 06/26/2001 | US6252222 Differential pulsed laser beam probing of integrated circuits |
| 06/26/2001 | US6252175 Electronic assembly comprising a substrate and a plurality of springable interconnection elements secured to terminals of the substrate |
| 06/26/2001 | US6250933 Contact structure and production method thereof |
| 06/21/2001 | WO2001044825A1 Battery sensor device |
| 06/21/2001 | WO2001044824A1 Automated domain reflectometry testing system |
| 06/21/2001 | US20010004556 Contact structure and production method thereof and probe contact assembly using same |
| 06/21/2001 | US20010004216 Socket and printed circuit board for semiconductor device, and method of testing semiconductor device |
| 06/20/2001 | EP1109029A1 Apparatus and method using photoelectric effect for testing electrical traces |
| 06/20/2001 | EP1108260A1 Dual-rated current transformer circuit |
| 06/20/2001 | EP1108216A1 High resolution analytical probe station |
| 06/19/2001 | US6249133 Low-current probe card |
| 06/19/2001 | US6249131 Electronics package having a ball grid array which is electrically accessible |
| 06/19/2001 | US6249116 Driving unit of cross-coil type indicating instrument |
| 06/19/2001 | US6249114 Electronic component continuity inspection method and apparatus |
| 06/19/2001 | US6249006 Electromagnetic field shielding device |
| 06/19/2001 | US6248962 Electrically conductive projections of the same material as their substrate |
| 06/19/2001 | US6248429 Metallized recess in a substrate |
| 06/14/2001 | US20010003419 Apparatus for measuring current flowing in a conductor |
| 06/13/2001 | EP1107009A1 Current intensity measuring apparatus in a conductor |