| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 08/30/2001 | US20010017549 Probe and method for examining electrical characteristics of devices |
| 08/30/2001 | DE10109506A1 Method for connecting integrated circuit test head to automatic handling device, with improved pipe connection, allowing low temperature testing of ICs by supply of carbon dioxide vapor to test head |
| 08/30/2001 | DE10008885A1 Kupplung oder Stecker für eine Steckverbindung zur Anwendung in der Messtechnik, insbesondere in der Umweltmesstechnik Coupling or connector for a connector for use in measuring technology, particularly in the environmental monitoring |
| 08/29/2001 | EP1128484A2 Coupling or connector for a connection for use in measurement technique, particularly in environmental measurement technique |
| 08/29/2001 | EP1128479A2 Interconnect contact |
| 08/29/2001 | EP1128186A1 Test apparatus for wire harnesses |
| 08/29/2001 | CN2445332Y Digital multimeter mechanical anti-misoperation |
| 08/28/2001 | US6282594 Pallet, system and method for use in testing and/or installing software onto a personal computer system unit |
| 08/28/2001 | US6281695 Integrated circuit package pin indicator |
| 08/28/2001 | US6281694 Monitor method for testing probe pins |
| 08/28/2001 | US6281693 Semiconductor device test board and a method of testing a semiconductor device |
| 08/28/2001 | US6281692 Interposer for maintaining temporary contact between a substrate and a test bed |
| 08/28/2001 | US6281691 Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable |
| 08/28/2001 | US6281690 Coaxial radio frequency test probe |
| 08/28/2001 | US6281029 Probe points for heat dissipation during testing of flip chip IC |
| 08/28/2001 | US6280219 Socket apparatus for IC packages |
| 08/28/2001 | US6280202 Board-to-board alignment and securement device |
| 08/28/2001 | US6279227 Method of forming a resilient contact structure |
| 08/28/2001 | CA2321623A1 Interconnect contact |
| 08/23/2001 | WO2001061368A1 Tester and holder for tester |
| 08/23/2001 | WO2001061365A1 Voltage sensor |
| 08/23/2001 | WO2001061364A2 Semiconductor component test socket |
| 08/23/2001 | US20010016938 Inspection method and inspection system using charged particle beam |
| 08/23/2001 | US20010016437 Electrical connection apparatus |
| 08/23/2001 | US20010016435 IC socket for surface-monuting semiconductor device |
| 08/23/2001 | US20010015773 Special contact points for accessing internal circuitry of an integrated circuit |
| 08/23/2001 | US20010015655 Removable electrical interconnect apparatuses and removable engagement probes |
| 08/23/2001 | US20010015652 Probe card assembly and kit, and methods of making same |
| 08/23/2001 | US20010015650 Probe card for testing semiconductor integrated circuit and method of manufacturing the same |
| 08/23/2001 | US20010015641 Circuit board testing apparatus |
| 08/22/2001 | EP1126280A1 A press assembly for electrically testing a printed circuit board |
| 08/22/2001 | EP1125330A1 Method of creating an electrical interconnect device bearing an array of electrical contact pads |
| 08/22/2001 | EP0975979B1 Method for making cards with multiple contact tips for testing semiconductor chips |
| 08/22/2001 | CN2444243Y Circuit of protector of electric source and ammeter for ion pump |
| 08/22/2001 | CN1309772A Residual current detection device |
| 08/21/2001 | US6278596 Active ground fault disconnect |
| 08/21/2001 | US6278286 Interconnect and system for making temporary electrical connections to semiconductor components |
| 08/21/2001 | US6278285 Configuration for testing integrated components |
| 08/21/2001 | US6278284 Testing IC socket |
| 08/21/2001 | US6277660 Method and apparatus for testing chips |
| 08/21/2001 | US6277218 Conducting a thermal treatment on the probe needles, wherein the temperature of the thermal treatment is about 60 degrees celsius to about 100 degrees celsius and rapidly cooling the probe needles |
| 08/21/2001 | US6276956 Dual point test probe for surface mount type circuit board connections |
| 08/21/2001 | US6276949 Socket for IC package |
| 08/16/2001 | US20010014556 Packaging and interconnection of contact structure |
| 08/16/2001 | US20010013787 Needle load measuring method, needle load setting method and needle load detecting mechanism |
| 08/16/2001 | US20010013783 Circuit board testing apparatus and method |
| 08/16/2001 | US20010013773 Configuration with a plurality of sensor groups and method of determining its intactness |
| 08/16/2001 | US20010013772 Chuck device and chuck method |
| 08/16/2001 | EP1123512A1 High density printed circuit board |
| 08/16/2001 | EP1123465A1 Fluid thrust bearing - indicator with an assembling |
| 08/16/2001 | DE10105876A1 Anschlußstruktur und zugehöriges Herstellungsverfahren Terminal structure and manufacturing method thereof |
| 08/16/2001 | DE10006023A1 Clip-on measurement terminals making row of closely-adjacent connections, indicate signal state on upper- and rear illuminated displays |
| 08/15/2001 | CN1308728A Current detector and current measurement apparatus including such detector |
| 08/15/2001 | CN1308727A Conductive contact |
| 08/15/2001 | CN1308387A Interconnected contacts |
| 08/14/2001 | US6275056 Prober device having a specific linear expansion coefficient and probe pitch and method of probing thereof |
| 08/14/2001 | US6275054 Electrical contact system |
| 08/14/2001 | US6275052 Probe card and testing method for semiconductor wafers |
| 08/14/2001 | US6275051 Segmented architecture for wafer test and burn-in |
| 08/14/2001 | US6274823 Interconnection substrates with resilient contact structures on both sides |
| 08/09/2001 | WO2001057545A1 Inspection apparatus and method adapted to a scanning technique employing a rolling wire probe |
| 08/09/2001 | WO2001057541A1 Adapter for testing printed circuit boards and testing needle for such an adapter |
| 08/09/2001 | US20010012739 Composite microelectronic spring structure and method for making same |
| 08/09/2001 | US20010012725 System for testing bare IC chips and a socket for such chips |
| 08/09/2001 | US20010012707 Integrated circuit socket with contact pad |
| 08/09/2001 | US20010012704 Interconnect assemblies and methods |
| 08/09/2001 | US20010011907 Test interconnect for bumped semiconductor components and method of fabrication |
| 08/09/2001 | US20010011906 Method of testing semiconductor integrated circuits and testing board for use therein |
| 08/09/2001 | US20010011902 Low-current probe card |
| 08/09/2001 | US20010011899 Method for testing semiconductor wafers |
| 08/09/2001 | US20010011898 IC socket, a test method using the same and an IC socket mounting mechanism |
| 08/09/2001 | US20010011897 Metal buckling beam probe |
| 08/09/2001 | US20010011896 Contact probe arrangement |
| 08/09/2001 | US20010011888 Voltage detection stick |
| 08/09/2001 | US20010011762 Integrated circuit package alignment feature |
| 08/09/2001 | DE10101961A1 Trägeridentifizierungssystem, Trägeridentifizierungsverfahren und Speichermedium Carrier identification system, vehicle identification method and storage medium |
| 08/09/2001 | DE10004974A1 Adapter for testing circuit boards comprises testing needles and two guide plate units which are laterally movable relative to one another for alignment of the respective guide holes for testing needles |
| 08/08/2001 | EP1122546A2 Scan test machine for densely spaced test sites |
| 08/08/2001 | CN1307793A Assembly of an electronic component with spring packaging |
| 08/08/2001 | CN1069448C Self-aligning low profile socket for connecting ball grid array devices through dendritic interposer |
| 08/07/2001 | US6271673 Probe for measuring signals |
| 08/07/2001 | US6271672 Biased BGA contactor probe tip |
| 08/07/2001 | US6271659 Integrated circuit sample package for checking electrical functionality and alignment of checking devices and corresponding checking method |
| 08/07/2001 | US6271657 Test head positioner for semiconductor device testing apparatus |
| 08/07/2001 | US6270357 Mounting for high frequency device packages |
| 08/02/2001 | WO2001004642A3 Kinematic coupling |
| 08/02/2001 | US20010010971 Silicide pattern structures and methods of fabricating the same |
| 08/02/2001 | US20010010462 Carrier identification system, carrier identification method and storage media |
| 08/02/2001 | DE19945178A1 Meßspitze zur Hochfrequenzmessung und Verfahren zu deren Herstellung Probe head for high-frequency measurement and process for their preparation |
| 08/02/2001 | DE10102177A1 Mit Anschlußvorsprüngen versehene Anschlußstruktur Provided with terminal projections terminal structure |
| 08/02/2001 | DE10101538A1 Anschlußstruktur Terminal structure |
| 08/02/2001 | DE10064515A1 Measurement signal output device for testing integrated circuit, has electro-optical probe which is connected to input/output unit by cables, and signal measurement unit connected to input/output unit by connector |
| 08/01/2001 | EP1120657A1 Test connector with high interconnection density for integrated circuits |
| 08/01/2001 | CN1306322A Socket for electrical components |
| 07/31/2001 | US6268740 System for testing semiconductor device formed on semiconductor wafer |
| 07/31/2001 | US6268719 Printed circuit board test apparatus |
| 07/31/2001 | US6268015 Method of making and using lithographic contact springs |
| 07/31/2001 | US6267603 Burn-in test socket |
| 07/26/2001 | WO2001054186A1 Failure analysis method using emission microscope and system thereof and production method for semiconductor device |
| 07/26/2001 | US20010009724 Depositing coating on elongate member to give a coated elongate member, coating comprising at least one metal and at least one additive, the additive capable of codepositing with the metal, heat treating; electronics packaging |