| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 10/04/2001 | US20010025725 Electrically Conductive Apparatuses |
| 10/04/2001 | EP1137951A1 Scanning single electron transistor microscope for imaging ambient temperature objects |
| 10/04/2001 | EP1137950A1 Voltage sensor |
| 10/04/2001 | DE10013345A1 Einrichtung zum Messen eines durch eine Leiterbahn fließenden elektrischen Stroms Means for measuring a current flowing through a conductor of electric current |
| 10/02/2001 | US6298312 Method of determining the tip angle of a probe card needle |
| 10/02/2001 | US6297660 Test carrier with variable force applying mechanism for testing semiconductor components |
| 10/02/2001 | US6297658 Wafer burn-in cassette and method of manufacturing probe card for use therein |
| 10/02/2001 | US6297657 Temperature compensated vertical pin probing device |
| 10/02/2001 | US6297656 Probe-test method and prober |
| 10/02/2001 | US6297655 Integrated circuit probing method |
| 10/02/2001 | US6297654 Test socket and method for testing an IC device in a dead bug orientation |
| 10/02/2001 | US6297653 Interconnect and carrier with resistivity measuring contacts for testing semiconductor components |
| 10/02/2001 | US6297652 Electric resistance measuring apparatus and method for circuit board |
| 10/02/2001 | US6297651 Electro-optic sampling probe having unit for adjusting quantity of light incident on electro-optic sampling optical system module |
| 10/02/2001 | US6297650 Electrooptic probe |
| 10/02/2001 | US6297164 Method for producing contact structures |
| 10/02/2001 | US6295729 Angled flying lead wire bonding process |
| 09/27/2001 | WO2001071779A2 Method and apparatus for planarizing a semiconductor contactor |
| 09/27/2001 | WO2001071371A1 Testing device for printed boards |
| 09/27/2001 | WO2000074110A3 Integrated circuit wafer probe card assembly |
| 09/27/2001 | US20010024896 Socket for electric part |
| 09/27/2001 | US20010024892 Contact sheet |
| 09/27/2001 | US20010024890 Contactor having LSI-circuit-side contact piece and test-board-side contact piece for testing semiconductor device and manufacturing method thereof |
| 09/27/2001 | US20010024129 Interposer and methods for fabricating same |
| 09/27/2001 | US20010024119 Robotic probe for testing printed circuit boards in-situ using a single printed circuit card slot |
| 09/27/2001 | US20010024118 Bondpad attachments having self-limiting properties for penetration of semiconductor die |
| 09/27/2001 | US20010024116 Electronic probe for measuring high impedance tri-state logic circuits |
| 09/27/2001 | US20010023770 Packaging and interconnection of contact structure |
| 09/26/2001 | EP1137124A2 Retractable connector mechanism for signal connectors |
| 09/26/2001 | EP1136827A2 Contactor having LSI-circuit-side contact piece and test-board-side contact piece for testing semiconductor device and manufacturing method thereof |
| 09/26/2001 | EP1135794A1 A method and apparatus for the transport and tracking of an electronic component |
| 09/26/2001 | EP1135693A1 Probe card for probing wafers with raised contact elements |
| 09/26/2001 | EP1135690A2 Lithographic contact elements |
| 09/26/2001 | CN1315002A High resolution analytical probe station |
| 09/26/2001 | CN1314703A Contact switch for semiconductor device detection and its producing method |
| 09/25/2001 | US6294922 Probe for testing a semiconductor integrated circuit |
| 09/25/2001 | US6294920 Test mounting for surface mount device packages |
| 09/25/2001 | US6293817 Extended length, high frequency contactor block |
| 09/25/2001 | US6293814 Socket contact with kelvin contact for testing integrated circuit devices |
| 09/25/2001 | US6293808 Contact sheet |
| 09/20/2001 | WO2001069269A2 Device for measuring an electric current that flows through a strip conductor |
| 09/20/2001 | WO2001069268A2 Integrated circuit test socket lid assembly |
| 09/20/2001 | US20010023176 System for measuring a radio frequency signal in a wireless station and a wiring board switch |
| 09/20/2001 | US20010022340 Electro-optic probe |
| 09/20/2001 | US20010022339 Probe signal outputting apparatus |
| 09/20/2001 | US20010022338 Probe signal outputting apparatus |
| 09/20/2001 | DE10012327A1 Current-measuring arrangement for semiconductor power switches, has resistor which detects and subsequently adds up the voltage drops within the leads and at a contact transition between leads and semiconductor component, respectively |
| 09/20/2001 | DE10011466A1 Hochspannungsprüfvorrichtung Hochspannungsprüfvorrichtung |
| 09/20/2001 | DE10011345A1 High voltage test system has two contact probes in which every electrode has associated high voltage cabling and high voltage switching arrangement |
| 09/19/2001 | EP1134591A1 A system for measuring a radio frequency signal in a wireless station and a wiring board switch |
| 09/19/2001 | CN1313722A Multi-layer printed circuit board and method for measuring impendance thereof |
| 09/19/2001 | CN1313655A Socket for electric component |
| 09/19/2001 | CN1313654A Telescopic pin-socket coupling structure for signal coupler |
| 09/18/2001 | US6292342 Voltage protection circuit for semiconductor test system |
| 09/18/2001 | US6292007 Probe head assembly |
| 09/18/2001 | US6292006 Method for preventing condensation on handler board during semiconductor device testing |
| 09/18/2001 | US6292005 Probe card for IC testing apparatus |
| 09/18/2001 | US6292004 Universal grid interface |
| 09/18/2001 | US6292003 Apparatus and method for testing chip scale package integrated circuits |
| 09/18/2001 | US6291986 Insert for measuring current in conductors within an electrical enclosure |
| 09/18/2001 | US6290510 Spring structure with self-aligned release material |
| 09/18/2001 | US6289583 Method for making cards with multiple contact tips for testing semiconductor chips |
| 09/18/2001 | CA2210929C Test clip with standard interface |
| 09/13/2001 | WO2001067116A2 Temperature compensated vertical pin probing device |
| 09/13/2001 | US20010021601 Soket for electric part |
| 09/13/2001 | US20010021483 Forming masking layer with aperture; filling with conductive material; removal |
| 09/13/2001 | US20010020747 Special contact points for accessing internal circuitry of an integrated circuit |
| 09/13/2001 | US20010020743 Special contact points for accessing internal circuitry of an integrated circuit |
| 09/13/2001 | US20010020546 Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures |
| 09/13/2001 | US20010020545 Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures |
| 09/12/2001 | EP1132748A2 High voltage testing device |
| 09/12/2001 | EP1132747A2 High voltage testing device |
| 09/12/2001 | CN1312910A Holder of electroconductive contactor and method for producing same |
| 09/11/2001 | US6288561 Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus |
| 09/11/2001 | US6288557 Probe station having inner and outer shielding |
| 09/11/2001 | US6288555 Fixture for use in measuring an electrical characteristic of a pogo pin |
| 09/11/2001 | US6288531 Probe for electro-optic sampling oscilloscope |
| 09/11/2001 | US6287878 Method of fabricating chip scale package |
| 09/07/2001 | WO2000073905A3 Test interface for electronic circuits |
| 09/06/2001 | US20010019276 Contact probe and probe device |
| 09/06/2001 | US20010019271 System and method for monitoring substances and reactions |
| 09/06/2001 | US20010019177 Method of manufacturing a contact element and a multi-layered wiring substrate, and wafer batch contact board |
| 09/06/2001 | US20010019124 Semiconductor device measuring socket capable of adjusting contact positions, and semiconductor device manufacturing method using the same |
| 09/05/2001 | EP1130407A2 High frequency component, communication apparatus, and method for measuring characteristics of high frequency components |
| 09/05/2001 | EP1129510A1 Sharpened, oriented contact tip structures |
| 09/05/2001 | EP0811167B1 Manipulator for automatic test equipment test head |
| 09/05/2001 | CN1311858A Conductive contact |
| 09/04/2001 | US6285205 Apparatus for electronically testing printed circuit boards or the like |
| 09/04/2001 | US6285203 Test system having alignment member for aligning semiconductor components |
| 09/04/2001 | US6285202 Test carrier with force applying mechanism guide and terminal contact protector |
| 09/04/2001 | US6285180 Probe adapter and holder |
| 09/04/2001 | US6283780 Test socket lattice |
| 09/04/2001 | US6283464 Adjustable tooling pin for a card test fixture |
| 09/04/2001 | CA2248735C Voltage measurement instrument having transient overvoltage input protection |
| 08/30/2001 | WO2001063308A1 Membrane probing system |
| 08/30/2001 | WO2001063307A1 Inspection apparatus and sensor |
| 08/30/2001 | WO2001063301A2 Electromechanical apparatus for testing ic chips using first and second sets of substrates which are pressed together |
| 08/30/2001 | WO2001009980A3 Controlled compliance fine pitch interconnect |
| 08/30/2001 | US20010017878 Method of inspecting pattern and inspecting instrument |
| 08/30/2001 | US20010017551 An electronic device workpiece processing intermediate member |