| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 11/14/2001 | EP1154277A1 Device for measuring electric currents |
| 11/14/2001 | EP1154276A2 Testing head for microstructures |
| 11/14/2001 | EP1154275A2 Bga on-board tester |
| 11/14/2001 | CN2459664Y Mechanical protector for digital multimeter |
| 11/13/2001 | US6316954 High performance test interface |
| 11/13/2001 | US6316952 Flexible conductive structures and method |
| 11/13/2001 | US6314641 Interconnect for testing semiconductor components and method of fabrication |
| 11/08/2001 | WO2001084900A1 Connector apparatus |
| 11/08/2001 | WO2001084167A1 Pneumatic planar probe |
| 11/08/2001 | WO2001084166A1 Compliant probe apparatus |
| 11/08/2001 | US20010039128 Method of connecting IC package to IC contactor with weaker force and IC contactor for such method |
| 11/08/2001 | US20010039109 Lithographic contact elements |
| 11/08/2001 | US20010038294 Method for fabricating probe tip portion composed by coaxial cable |
| 11/08/2001 | US20010038293 Projection electrode, its forming method and apparatus for testing an electronic component |
| 11/07/2001 | CN1321129A Retractable self-locking cleat for rope, cable and the like |
| 11/06/2001 | US6313653 IC chip tester with heating element for preventing condensation |
| 11/06/2001 | US6313652 Test and burn-in apparatus, in-line system using the test and burn-in apparatus, and test method using the in-line system |
| 11/06/2001 | US6313651 Carrier and system for testing bumped semiconductor components |
| 11/06/2001 | US6313650 Insert testing system |
| 11/06/2001 | US6313649 Wafer probe station having environment control enclosure |
| 11/06/2001 | US6313530 Converter socket terminal |
| 11/06/2001 | US6313411 Wafer level contact sheet and method of assembly |
| 11/01/2001 | WO2001082415A1 Lga package socket |
| 11/01/2001 | WO2001082371A2 Chip carrier socket |
| 11/01/2001 | US20010035800 Integrated circuit tester with high bandwidth probe assembly |
| 11/01/2001 | US20010035761 Checker head and a method of manufacturing the same |
| 11/01/2001 | US20010035760 Test socket and methods |
| 11/01/2001 | US20010035525 Semiconductor device having a test pattern same as conductive pattern to be tested and method for testing semiconductor device for short-circuit |
| 11/01/2001 | US20010035196 Removal deposits with air vibration |
| 10/31/2001 | CN2457596Y Adjustable constant pressure probe drive frame |
| 10/30/2001 | US6310483 Longitudinal type high frequency probe for narrow pitched electrodes |
| 10/25/2001 | WO2001080315A2 Shaped springs and methods of fabricating and using shaped springs |
| 10/25/2001 | WO2001080275A1 Short and break tester probe for plasma display pannel |
| 10/25/2001 | WO2001079867A1 Method of making a probe test board |
| 10/25/2001 | WO2001079866A1 Probe unit and measuring instrument |
| 10/25/2001 | WO2001079865A1 Probe card device and probe for use therein |
| 10/25/2001 | US20010034150 Socket for electric part |
| 10/25/2001 | US20010033181 Method and apparatus for testing semiconductor devices using the back side of a circuit board |
| 10/25/2001 | US20010033180 Test pin with removable head |
| 10/25/2001 | US20010033178 Probe tip card for the testing of semiconductor components |
| 10/25/2001 | US20010033171 Current measuring apparatus for battery |
| 10/25/2001 | US20010033010 Semiconductor device tester and method of testing semiconductor device |
| 10/25/2001 | CA2406111A1 Probe card device and probe for use therein |
| 10/24/2001 | EP1147426A1 Clip-on ammeter for measuring a current circulating in conductors |
| 10/23/2001 | US6307394 Test carrier with variable force applying mechanism for testing semiconductor components |
| 10/23/2001 | US6307392 Probe card and method of forming a probe card |
| 10/23/2001 | US6307389 Test device for flat electronic assemblies |
| 10/23/2001 | US6307388 Electromechanical apparatus for testing IC chips using first and second sets of substrates which are pressed together |
| 10/23/2001 | US6307387 Membrane probing system with local contact scrub |
| 10/23/2001 | US6307363 Ultrahigh-frequency high-impedance passive voltage probe |
| 10/23/2001 | US6307292 Galvanometer with axial symmetry and improved bearing design |
| 10/23/2001 | US6307161 Partially-overcoated elongate contact structures |
| 10/23/2001 | US6307158 Clip structure for extracting electric signals |
| 10/23/2001 | US6305969 Electrical continuity checker for connector |
| 10/23/2001 | US6305230 Connector and probing system |
| 10/18/2001 | US20010031575 High density interconnection test connector especially for verification of integrated circuits |
| 10/18/2001 | US20010030553 Method and apparatus for inspecting semiconductor device |
| 10/18/2001 | US20010030551 Pneumatic planar probe |
| 10/18/2001 | US20010030550 Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate |
| 10/18/2001 | US20010030547 Spaced adapter plate for semiconductor tester |
| 10/18/2001 | US20010030360 Digital signal processor/known good die packaging using rerouted existing package for test and burn-in carriers |
| 10/17/2001 | EP1146341A2 Test connector for series terminal |
| 10/17/2001 | EP1145612A2 Method for mounting an electronic component |
| 10/17/2001 | CN1317881A Decoder circuit of binary dial code |
| 10/16/2001 | US6304092 Self-aligning docking assembly for semiconductor tester |
| 10/16/2001 | US6304062 Shunt resistance device for monitoring battery state of charge |
| 10/16/2001 | US6303993 Method and apparatus for testing bumped die |
| 10/16/2001 | US6303988 Wafer scale burn-in socket |
| 10/16/2001 | US6302725 Self-latching terminal strip |
| 10/12/2001 | CA2305069A1 Micromachined element and method of fabrication thereof |
| 10/11/2001 | WO2001075461A1 Tester, testing unit and method of manufacturing tester |
| 10/11/2001 | WO2001075458A1 Multiple layer electrical interface |
| 10/11/2001 | WO2001075431A1 Current measuring apparatus for battery |
| 10/11/2001 | US20010028256 Diagnostic apparatus for electronics circuit and diagnostic method using same |
| 10/11/2001 | US20010028255 Measuring apparatus for semiconductor device |
| 10/11/2001 | US20010028254 Test device for flat electronic assemblies |
| 10/11/2001 | US20010028111 Contact device and method of manufacturing the same |
| 10/10/2001 | EP1141735A2 Test method and assembly including a test die for testing a semiconductor product die |
| 10/10/2001 | EP1141731A1 Dual-pin probe for testing circuit boards |
| 10/10/2001 | CN1317224A Interconnect assembly for printed circuit boards and manufacturing method thereof |
| 10/10/2001 | CN1316650A Device for testing chip with the help of printed circuit board |
| 10/09/2001 | US6301517 Automated test position monitoring and notification system |
| 10/09/2001 | US6300998 Probe for inspecting liquid crystal display panel, and apparatus and method for inspecting liquid crystal display panel |
| 10/09/2001 | US6300786 Wafer test method with probe card having on-board multiplex circuitry for expanding tester resources |
| 10/09/2001 | US6300784 IC socket |
| 10/09/2001 | US6300783 Probe, manufacture of same, and vertically operative type probe card assembly employing same |
| 10/09/2001 | US6300781 Reliable method and apparatus for interfacing between a ball grid array handler and a ball grid array testing system |
| 10/09/2001 | US6300780 High density integrated circuit apparatus, test probe and methods of use thereof |
| 10/09/2001 | US6299459 compressible conductive interface |
| 10/09/2001 | US6299456 Interposer with contact structures for electrical testing |
| 10/09/2001 | US6298738 Removable fixture adapter with RF connections |
| 10/09/2001 | US6298715 Scanning force microscope probe cantilever with reflective structure |
| 10/04/2001 | WO2001073451A1 High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board |
| 10/04/2001 | WO2001048471A8 Electro-optic system controller and method of operation |
| 10/04/2001 | US20010027053 Electrical contact method and apparatus in semiconductor device inspection equipment |
| 10/04/2001 | US20010027046 Socket for electric part |
| 10/04/2001 | US20010026168 Tester for semiconductor device |
| 10/04/2001 | US20010026166 Probe contactor and production method thereof |
| 10/04/2001 | US20010026152 Semiconductor package testing equipment including loader having package guider and method of loading a semiconductor package onto a test socket as aligned therewith |
| 10/04/2001 | US20010025957 Socket used for semiconductor device and testing system connected to socket through dual-transmission lines |