| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 12/19/2001 | EP0891558B1 Constructive module of an electronic telecommunications equipment, with an interface towards a testing and diagnosing system |
| 12/19/2001 | CN2466661Y Probe type testing device |
| 12/18/2001 | US6331781 Spaced adaptor plate for semiconductor tester |
| 12/18/2001 | US6331118 Electrode spacing conversion adaptor |
| 12/18/2001 | US6330744 Customized electrical test probe head using uniform probe assemblies |
| 12/13/2001 | WO2001094955A2 Scanning electro-optic near field device and method of scanning |
| 12/13/2001 | WO2001094954A1 Test pen |
| 12/13/2001 | WO2001031718A3 Shunt resistance device for monitoring battery state of charge |
| 12/13/2001 | US20010050936 Logic determination device for semiconductor integrated device and logic determination method |
| 12/13/2001 | US20010050574 Interconnect for testing semiconductor dice having raised bond pads |
| 12/13/2001 | US20010050571 Coaxial tilt pin fixture for testing high frequency circuit boards |
| 12/13/2001 | US20010050570 Method of forming an apparatus configured to engage an electrically conductive pad on a semiconductive substrate and a method of engaging electrically conductive pads on a semiconductive substrate |
| 12/13/2001 | US20010050569 Apparatus and method of inspecting semiconductor integrated circuit |
| 12/13/2001 | US20010050568 Flexible conductive structures and method |
| 12/13/2001 | US20010050566 Printed circuit board for use in the testing of electrical components and method for producing it |
| 12/13/2001 | US20010050565 Multi-point probe |
| 12/13/2001 | US20010050564 Crown shaped contact barrel configuration for spring probe |
| 12/13/2001 | US20010050553 Apparatus and method for testing a substrate having a plurality of terminals |
| 12/13/2001 | US20010050550 High frequency component, communication apparatus, and method for measuring characteristics of high frequency component |
| 12/13/2001 | US20010050427 Test soket of semiconductor device |
| 12/13/2001 | DE10027042A1 Method and device for measuring high frequencies in electrical components has a centering/clamping device moving downwards using a ram to pick up a component on a vacuum holder from a centering opening and to center it |
| 12/12/2001 | CN2465191Y Horizontal rod type prober tester |
| 12/12/2001 | CN2465190Y High-voltage output terminal |
| 12/11/2001 | US6330164 Interconnect assemblies and methods including ancillary electronic component connected in immediate proximity of semiconductor device |
| 12/11/2001 | US6329832 Method for in-line testing of flip-chip semiconductor assemblies |
| 12/11/2001 | US6329829 Interconnect and system for making temporary electrical connections to semiconductor components |
| 12/11/2001 | US6329827 High density cantilevered probe for electronic devices |
| 12/11/2001 | US6329811 Calibration unit for semiconductor integrated circuit tester |
| 12/11/2001 | US6329637 Method and process of contract to a heat softened solder ball array |
| 12/11/2001 | US6328902 Probe tip configuration and a method of fabrication thereof |
| 12/06/2001 | WO2001092898A2 Measurement method and device, in particular for the high-frequency measurement of electric components |
| 12/06/2001 | US20010049208 Anisotropically conductive sheet and connector |
| 12/06/2001 | US20010048527 Semiconductor test apparatus |
| 12/06/2001 | US20010048314 Component holder for testing devices and component holder system microlithography |
| 12/06/2001 | US20010048153 Method and apparatus for testing bumped die |
| 12/06/2001 | US20010048075 Particle beam apparatus |
| 12/06/2001 | DE10026968A1 Test apparatus for waterproof connectors for motor vehicle control equipment has moisture-sensitive contacts connected to contact elements of plug connector |
| 12/05/2001 | EP1160825A1 Particle beam apparatus |
| 12/05/2001 | EP1160579A1 Containment device for burn-in boards, for testing integrated circuits and the like |
| 12/05/2001 | EP1160576A2 Contact probe and fabrication method thereof |
| 12/05/2001 | EP1160575A2 Replaceable probe tip holder and measurement probe head |
| 12/05/2001 | EP1159624A1 High bandwidth passive integrated circuit tester probe card assembly |
| 12/05/2001 | CN1325610A Vertically actuated BGA socket |
| 12/05/2001 | CN1325553A Sharpened oriented contact tip structure |
| 12/04/2001 | US6326799 Wireless test fixture for testing printed circuit boards |
| 12/04/2001 | US6326688 Socket for semiconductor devices |
| 11/29/2001 | US20010047496 Semiconductor test device for conducting an operation test in parallel on many chips in a wafer test and semiconductor test method |
| 11/29/2001 | US20010046715 Semiconductor device test probe, manufacturing method therefor and semiconductor device tested by the probe |
| 11/29/2001 | US20010046127 Semiconductor package and device socket |
| 11/29/2001 | US20010045636 Semiconductor integrated circuit package, semiconductor apparatus provided with a plurality of semiconductor integrated circuit packages, method of inspecting semiconductor integrated circuit package and method of fabricating semiconductor integrated circuit |
| 11/29/2001 | US20010045012 Angled flying lead wire bonding process |
| 11/29/2001 | US20010045011 Method of positioning a conductive element in a laminated electrical device |
| 11/29/2001 | US20010045007 System and method for mounting integrated circuits onto printed circuit boards, and testing method |
| 11/29/2001 | DE10024875A1 Bauteilhalter für Testvorrichtungen und Bauteilhaltersystem Component holder for test equipment and component holder system |
| 11/29/2001 | DE10024165A1 Contacting system e.g. for testing semiconductor components, has contact elements with first spring arms for contacting each connection; at least one contact element has second spring arm for supporting electronic component |
| 11/28/2001 | EP1158302A2 Method and apparatus for probing a conductor of an array of closely-spaced conductors |
| 11/28/2001 | EP1018024B1 Combined current/voltage transformer for low level signals |
| 11/28/2001 | EP0990160B1 Toroidal core current transformer with integrated measuring shunt |
| 11/28/2001 | EP0981722B1 Measuring system |
| 11/28/2001 | CN2462413Y Mirror and refractor for copying number of ground watt-hour meter |
| 11/28/2001 | CN1324108A Multiple line grid for application of packaging or testing |
| 11/27/2001 | US6323670 PCB adapter for IC chip failure analysis |
| 11/27/2001 | US6323667 Contact probe unit |
| 11/27/2001 | US6323665 Apparatus capable of high power dissipation during burn-in of a device under test |
| 11/27/2001 | US6323663 Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method |
| 11/27/2001 | US6323638 High-resistance probe and voltage detector incorporating same |
| 11/27/2001 | US6323637 Miniature crossed coil gauge having an active flux ring |
| 11/27/2001 | US6323636 Electric current pick-up shoe |
| 11/27/2001 | US6322433 Grinding chip |
| 11/27/2001 | CA2241326C Machine for the electric test of printed circuits with adjustable position of the sound needles |
| 11/22/2001 | WO2001088612A1 Photolithographically-patterned out-of-plane coil structures and method of making |
| 11/22/2001 | WO2001088557A1 Test probe and connector |
| 11/22/2001 | WO2001088555A2 Low compliance tester interface |
| 11/22/2001 | WO2001088551A1 Probe card and method of producing the same |
| 11/22/2001 | US20010044226 Contact pin assembly, contact pin assembly manufacturing method, contact pin assembling structure, contact pin assembling structure manufacturing method, and socket for electrical parts |
| 11/22/2001 | US20010044225 Method for forming microelectronic spring structures on a substrate |
| 11/22/2001 | US20010043077 Method for in-line testing of flip-chip semiconductor assemblies |
| 11/22/2001 | US20010043076 Method and apparatus for testing semiconductor devices |
| 11/22/2001 | US20010043075 Apparatus for inspecting IC wafer |
| 11/22/2001 | US20010043074 Test carrier with molded interconnect for testing semiconductor components |
| 11/22/2001 | US20010043073 Prober interface plate |
| 11/21/2001 | EP1156342A1 Dry load test apparatus |
| 11/21/2001 | EP1155519A1 Electro-optic interface system and method of operation |
| 11/21/2001 | EP1155331A1 Text probe interface assembly and manufacture method |
| 11/21/2001 | CN1323457A IC socket and IC tester |
| 11/20/2001 | US6320398 Semiconductor device testing apparatus |
| 11/20/2001 | US6320397 Molded plastic carrier for testing semiconductor dice |
| 11/20/2001 | US6320372 Apparatus and method for testing a substrate having a plurality of terminals |
| 11/20/2001 | CA2246935C Multimeter with current sensor |
| 11/15/2001 | WO2001086312A1 Wide-bandwidth coaxial probe |
| 11/15/2001 | US20010040464 Electric contact device for testing semiconductor device |
| 11/15/2001 | US20010040462 Semiconductor element testing carrier using a membrane contactor and a semiconductor element testing method and apparatus using such a carrier |
| 11/15/2001 | US20010040461 Wafer probe station having environment control enclosure |
| 11/15/2001 | US20010040460 Method of making a high density integral test probe |
| 11/15/2001 | US20010040456 Method and apparatus for detecting line-shorts by potential and temperature distribution |
| 11/15/2001 | US20010040451 Contact probe for testing liquid crystal display and liquid crystal display testing device having thereof |
| 11/15/2001 | US20010040297 Multiple line grid for use in a packaging of a testing application |
| 11/15/2001 | US20010039729 Method of aligning features in a multi-layer electrical connective device |
| 11/15/2001 | DE10016453A1 In-circuit test adaptors, includes double sleeve with optimal test spring contacts through which the test terminals of a PCB is directly connected to a test system |
| 11/14/2001 | EP1154479A2 Multiple line grid for use in a packaging or a testing application |