| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 02/28/2002 | US20020024104 Chip carrier socket |
| 02/28/2002 | US20020023773 Method for manufacturing raised electrical contact patten of controlled geometry |
| 02/27/2002 | EP1182460A2 Fritting inspection method and apparatus |
| 02/27/2002 | EP1181698A1 Current pick-up shoe with two assembly positions |
| 02/27/2002 | EP1181565A1 Device for electrically contacting a floating semiconductor wafer having an insulating film |
| 02/27/2002 | CN1337739A Method for producing semi-conductor device |
| 02/27/2002 | CN1337582A Changeable-probe holder and measuring probe |
| 02/26/2002 | US6351405 Pad for integrated circuit device which allows for multiple probing and reliable bonding and integrated circuit device including the pad |
| 02/26/2002 | US6351134 Semiconductor wafer test and burn-in |
| 02/26/2002 | US6351133 Packaging and interconnection of contact structure |
| 02/26/2002 | US6351115 Low profile laminated shunt |
| 02/26/2002 | US6351112 Calibrating combinations of probes and channels in an oscilloscope |
| 02/26/2002 | US6350137 IC socket and contact pins for IC socket |
| 02/26/2002 | US6350130 Electrically coupling an avionics line replaceable unit with an avionics test station |
| 02/26/2002 | US6349670 Plasma treatment equipment |
| 02/21/2002 | WO2002015653A1 Compliant interconnect assembly |
| 02/21/2002 | WO2002015260A1 Probe, probe card and probe manufacturing method |
| 02/21/2002 | US20020022386 Socket for BGA package |
| 02/21/2002 | US20020021142 Inspection method and inspection apparatus |
| 02/21/2002 | US20020021137 Method for calibrating a semiconductor testing device, a semiconductor testing apparatus, and a method for testing a semiconductor device |
| 02/21/2002 | US20020020927 Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer |
| 02/21/2002 | DE10039336A1 Testvorrichtung für Halbleiterschaltung und Verfahren zum Testen von Halbleiterschaltungen Test apparatus for semiconductor circuit and method for testing semiconductor circuits |
| 02/20/2002 | CN1336549A Probe contacting system having plane adjusting mechanism |
| 02/20/2002 | CN1079536C Method and device for testing of electronic components |
| 02/19/2002 | US6348810 Interface unit for a tester and method of connecting a tester with a semiconductor device to be tested |
| 02/19/2002 | US6348805 Method and apparatus for assigning pins for electrical testing of printed circuit boards |
| 02/19/2002 | US6348789 Testboard for IC tester |
| 02/19/2002 | US6348787 Electrooptic probe |
| 02/19/2002 | US6347946 Pin grid array socket |
| 02/14/2002 | WO2002013261A2 Heat spreading die cover |
| 02/14/2002 | US20020018609 Oscilloscope probe with fiberoptic sensor for measuring floating electrical signals |
| 02/14/2002 | US20020017915 Probe card, probe card restoring method, and probe card manufacturing method |
| 02/14/2002 | US20020017914 Intergrated circuit test probe having ridge contact |
| 02/14/2002 | US20020017913 Electro-optic sampling probe |
| 02/14/2002 | DE10036664A1 Digital multimeter for measuring current, voltage, resistance and capacitance, has handle that is activated to switch multimeter between multimeter functions and current tong test instrument function |
| 02/13/2002 | EP1179734A1 Testing head having vertical probes |
| 02/13/2002 | CN1335511A Method and apparatus for searching conductor in conductor array with tight space |
| 02/12/2002 | US6347005 Electro-optic sampling probe |
| 02/07/2002 | WO2002011244A1 Cartridge system for a probing head for an electrical test probe |
| 02/07/2002 | WO2002010784A1 Notched electrical test probe tip |
| 02/07/2002 | WO2002010783A2 Test systems for wireless-communications devices |
| 02/07/2002 | WO2002010780A1 Electrical test probe wedge tip |
| 02/07/2002 | WO2002010779A1 Method for making a card with multiple contact tips for testing microsphere integrated circuits, and testing device using said card |
| 02/07/2002 | WO2002010778A1 Automatic probe identification system |
| 02/07/2002 | WO2002010777A1 Legs for forming a tripod with an electrical test probe tip |
| 02/07/2002 | WO2002010776A1 Signal measurement |
| 02/07/2002 | WO2002010675A1 Electrical test probe flexible spring tip |
| 02/07/2002 | WO2001067116A3 Temperature compensated vertical pin probing device |
| 02/07/2002 | WO2001063301A3 Electromechanical apparatus for testing ic chips using first and second sets of substrates which are pressed together |
| 02/07/2002 | US20020016095 Spring structure with self-aligned release material |
| 02/07/2002 | US20020016013 Semiconductor device manufacturing method |
| 02/07/2002 | US20020014895 Semiconductor chip, semiconductor device package, probe card and package testing method |
| 02/07/2002 | US20020014892 Electrical test tool having easily replaceable electrical probe |
| 02/07/2002 | US20020014857 Voltage level indicator |
| 02/07/2002 | US20020014580 Optoelectronic oscilloscope probe for measuring floating electrical signals |
| 02/07/2002 | US20020014004 High density integrated circuit apparatus, test probe and methods of use thereof |
| 02/07/2002 | DE10037448A1 Semiconductor component test fixture integrates connectors with vacuum holder |
| 02/06/2002 | EP1178320A2 Testing head having cantilever probes |
| 02/06/2002 | CN2476027Y Testing clamp |
| 02/06/2002 | CN2476026Y Testing gun |
| 02/05/2002 | US6344754 Semiconductor chip, semiconductor device package, probe card and package testing method |
| 02/05/2002 | US6344753 Test socket having improved contact terminals, and method of forming contact terminals of the test socket |
| 02/05/2002 | US6344752 Contactor and production method for contractor |
| 02/05/2002 | US6344751 Finger tester probe |
| 02/05/2002 | US6344737 Picker nest for holding an IC package with minimized stress on an IC component during testing |
| 02/05/2002 | US6344736 Self-aligning interface apparatus for use in testing electrical |
| 02/05/2002 | US6344684 Multi-layered pin grid array interposer apparatus and method for testing semiconductor devices having a non-pin grid array footprint |
| 02/05/2002 | US6343940 Contact structure and assembly mechanism thereof |
| 01/31/2002 | WO2002009169A1 Inspection apparatus and probe card |
| 01/31/2002 | WO2002008774A1 Probe driving method, and probe apparatus |
| 01/31/2002 | WO2002008773A2 Apparatus and method for electrical testing of electrical circuits |
| 01/31/2002 | WO2002008770A2 Spring probe assemblies |
| 01/31/2002 | WO2001050139A3 Galvanometer with axial symmetry and improved bearing design |
| 01/31/2002 | US20020013670 Methods and apparatus for secure programming of an electricity meter |
| 01/31/2002 | US20020013667 Apparatus and method for electrical testing of electrical circuits |
| 01/31/2002 | US20020013085 Contact apparatus particularly useful with test equipment |
| 01/31/2002 | US20020013070 Spring structure with self-aligned release material |
| 01/31/2002 | US20020013010 Contactor having conductive particles in a hole as a contact electrode |
| 01/31/2002 | US20020013009 Failure analysis method for chip of ball grid array type semiconductor |
| 01/31/2002 | US20020011864 Socket pin and socket for electrical testing of semiconductor packages |
| 01/31/2002 | US20020011863 IC chip tester with heating element for preventing condensation |
| 01/31/2002 | US20020011861 Circuit board misalignment detection apparatus and method |
| 01/31/2002 | US20020011859 Method for forming conductive bumps for the purpose of contrructing a fine pitch test device |
| 01/31/2002 | US20020011858 Temperature compensated vertical pin probing device |
| 01/31/2002 | US20020011856 Test methods, systems, and probes for high-frequency wireless-communications devices |
| 01/31/2002 | US20020011855 Microwave probe for surface mount and hybrid assemblies |
| 01/31/2002 | US20020011854 Probe device |
| 01/31/2002 | US20020011853 Probe stylus |
| 01/31/2002 | US20020011835 Low-temperature test equipment |
| 01/31/2002 | US20020011830 Electro-optical probe for oscilloscope measuring signal waveform |
| 01/31/2002 | US20020011001 High density integral test probe and fabrication method |
| 01/30/2002 | EP1176635A2 Spring structure and method |
| 01/30/2002 | CN1333466A Semiconductor device test method and apparatus |
| 01/29/2002 | US6343369 Methods for making contact device for making connection to an electronic circuit device and methods of using the same |
| 01/29/2002 | US6342789 Universal wafer carrier for wafer level die burn-in |
| 01/29/2002 | US6342783 Electrooptic probe |
| 01/29/2002 | US6341963 System level test socket |
| 01/24/2002 | WO2002007265A1 Contact apparatus particularly useful with test equipment |
| 01/24/2002 | WO2002007192A2 Triaxial probe assembly |
| 01/24/2002 | US20020009904 Probe card |