| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 04/04/2002 | US20020039854 IC socket |
| 04/04/2002 | US20020039847 Grid interposer |
| 04/04/2002 | US20020039802 Fabrication method of semiconductor integrated circuit device and its testing apparatus |
| 04/04/2002 | US20020039028 Noncontact signal analyzer |
| 04/04/2002 | US20020039022 Calibration device for semiconductor testing apparatus, calibration method and semiconductor testing apparatus |
| 04/03/2002 | EP1193803A1 IC socket |
| 04/03/2002 | EP1038225B1 Parallel test method |
| 04/03/2002 | EP0950271B1 Component for contacting a measuring unit and method for its production |
| 04/03/2002 | EP0797794B1 A voltage reference arrangement, a voltameter, a battery voltage detection arrangement, and a wireless communication device |
| 04/03/2002 | CN2484569Y Ring-type voltage-dependant resistor measuring probe |
| 04/02/2002 | US6366112 Probe card having on-board multiplex circuitry for expanding tester resources |
| 04/02/2002 | US6366106 Probe needle for probe card |
| 04/02/2002 | US6366105 Electrical test apparatus with gas purge |
| 04/02/2002 | US6366104 Microwave probe for surface mount and hybrid assemblies |
| 04/02/2002 | US6365977 Insulating interposer between two electronic components and process thereof |
| 04/02/2002 | US6365349 Spring probe for use in depositing oligonucleotides onto biochips |
| 03/28/2002 | WO2002025298A1 Inspection unit and method of manufacturing substrate |
| 03/28/2002 | WO2002024400A2 Electronic test head positioner |
| 03/28/2002 | WO2001080315A3 Shaped springs and methods of fabricating and using shaped springs |
| 03/28/2002 | US20020037657 Spiral contactor and manufacturing method for this apparatus, and a semiconductor inspecting equipment and electronical parts using this apparatus |
| 03/28/2002 | US20020036514 Semiconductor device testing apparatus |
| 03/28/2002 | US20020036511 Printed circuit board and method of manufacturing the same |
| 03/28/2002 | US20020036491 Scanning electromagnetic-field imager with optical-fiber-based electro-optic field-mapping system |
| 03/28/2002 | DE10145147A1 Connecting structure used for forming electrical connection in highly integrated circuits comprises connecting substrate, connecting elements mounted on horizontal surface of the substrate, base region, and spring region |
| 03/28/2002 | DE10042224A1 Module test socket for test adapters is constituted so that the principal surfaces of the module being tested and the connector plate lie in the same planes |
| 03/27/2002 | EP1191655A1 A crimpless strain relief termination for a coaxial cable |
| 03/27/2002 | EP1191588A2 A spiral contactor and manufacturing method therefor |
| 03/26/2002 | US6362637 Apparatus for testing semiconductor wafers including base with contact members and terminal contacts |
| 03/26/2002 | US6362636 Probe station having multiple enclosures |
| 03/26/2002 | US6362635 Split resistor probe and method |
| 03/26/2002 | US6362615 Electro-optic voltage sensor for sensing voltage in an E-field |
| 03/26/2002 | US6362614 Electronic probe for measuring high impedance tri-state logic circuits |
| 03/26/2002 | US6361331 Spring structure with self-aligned release material |
| 03/21/2002 | WO2002023203A1 Electronic device test socket |
| 03/21/2002 | WO2002022303A1 Method of retrofitting a probe station |
| 03/21/2002 | US20020034888 Insulating interposer between two electronic components and process thereof |
| 03/21/2002 | US20020034833 Methods of testing integrated circuitry, methods of forming tester substrates, and circuitry testing substrates |
| 03/21/2002 | US20020033707 Semiconductor device testing apparatus and semiconductor device manufacturing method using it |
| 03/21/2002 | US20020033522 IC socket |
| 03/21/2002 | DE10043731A1 Measuring probe for detection of IC signals has lever arm of high conductivity material covered by insulation layer provided with window at apex of probe point |
| 03/21/2002 | DE10043726A1 Verfahren und Vorrichtung zum Prüfen von Leiterplatten Method and apparatus for testing circuit boards |
| 03/20/2002 | EP1188061A1 Segmented contactor |
| 03/20/2002 | CN1340715A Variable-spacing probe head adapter for measuring probe |
| 03/20/2002 | CN1340714A Probe head adapter for checking probe |
| 03/20/2002 | CN1340713A Probe head adapter for measuring probe |
| 03/19/2002 | US6359456 Probe card and test system for semiconductor wafers |
| 03/19/2002 | US6359455 Probing card |
| 03/19/2002 | US6359454 Pick and place mechanism for contactor |
| 03/19/2002 | US6359452 Method and apparatus for testing an electronic assembly |
| 03/19/2002 | US6359337 Composite electrical contact structure and method for manufacturing the same |
| 03/19/2002 | US6358762 Manufacture method for semiconductor inspection apparatus |
| 03/19/2002 | US6358627 Rolling ball connector |
| 03/14/2002 | WO2002021146A1 Current sensor, method of measuring current, and switch circuit |
| 03/14/2002 | WO2001071779A3 Method and apparatus for planarizing a semiconductor contactor |
| 03/14/2002 | WO2001050140A3 Electric test connector, equipment and system using same |
| 03/14/2002 | US20020031921 Contact structure of lead |
| 03/14/2002 | US20020031849 Semiconductor substrate test device and method |
| 03/14/2002 | US20020031847 Protective structures for bond wires, methods for forming same, and test apparatus including such structures |
| 03/14/2002 | US20020030149 Supporting framework for display panel or probe block |
| 03/14/2002 | DE10121501A1 Test station mount for ICs has indexed rotation reduces height maintains planarity |
| 03/14/2002 | DE10041879A1 Load current measurement method in on-board power supply of vehicle, involves connecting fuse element parallel to load, where fuse element acts as shunt resistor |
| 03/13/2002 | EP1186903A2 Wafer inspection device and wafer inspection method |
| 03/13/2002 | EP1186899A2 Supporting framework for display panel or probe block |
| 03/13/2002 | EP1186898A2 Procedure and apparatus for testing printed circuit boards |
| 03/13/2002 | EP1186895A1 Improved RF test probe |
| 03/13/2002 | EP0950191B1 Contact probe unit |
| 03/12/2002 | US6356853 Enhancing voltmeter functionality |
| 03/12/2002 | US6356098 Probe card, test method and test system for semiconductor wafers |
| 03/12/2002 | US6356090 Probe tip card for the testing of semiconductor components |
| 03/12/2002 | US6356089 Contact probe arrangement |
| 03/12/2002 | US6354859 Cover assembly for an IC socket |
| 03/12/2002 | US6354000 Method of creating an electrical interconnect device bearing an array of electrical contact pads |
| 03/07/2002 | WO2002019471A1 Ic test socket |
| 03/07/2002 | WO2002018963A1 Re-locatable partial discharge transducer head |
| 03/07/2002 | WO2001061364A3 Semiconductor component test socket |
| 03/07/2002 | US20020028641 Probe end cleaning sheet |
| 03/07/2002 | US20020028607 Coupling or plug for a connector for use in metrology, specifically in environmental metrology |
| 03/07/2002 | US20020027445 Contactor assembly for common grid array devices |
| 03/07/2002 | US20020027444 Packaging and interconnection of contact structure |
| 03/07/2002 | US20020027443 High density probe card apparatus and method of manufacture |
| 03/07/2002 | US20020027442 Probe station having multiple enclosures |
| 03/07/2002 | US20020027433 Chuck for holding a device under test |
| 03/07/2002 | DE10128387A1 Integrierter Mikrokontakt-Pin und Verfahren zu dessen Herstellung Integrated micro-contact pin and method for its production |
| 03/06/2002 | EP1183604A2 Test interface for electronic circuirts |
| 03/06/2002 | CN2480847Y Main unit for digital effective work power meter |
| 03/06/2002 | CN1339113A Dry load test apparatus |
| 03/05/2002 | US6353329 Integrated circuit test socket lid assembly |
| 03/05/2002 | US6353328 Test system with mechanical alignment for semiconductor chip scale packages and dice |
| 03/05/2002 | US6353327 Circuit board misalignment detection apparatus and method |
| 03/05/2002 | US6353326 Test carrier with molded interconnect for testing semiconductor components |
| 03/05/2002 | US6353313 Remote, wireless electrical signal measurement device |
| 03/05/2002 | US6352454 Wear-resistant spring contacts |
| 02/28/2002 | WO2001069268A3 Integrated circuit test socket lid assembly |
| 02/28/2002 | US20020025698 Electric contact device for establishing an improved contact with contactors of other device |
| 02/28/2002 | US20020025603 Method for mounting an electronic component |
| 02/28/2002 | US20020024355 Wafer inspection device and wafer inspection method |
| 02/28/2002 | US20020024354 Test apparatus for semiconductor circuit and method of testing semiconductor circuits |
| 02/28/2002 | US20020024348 Packaging and interconnection of contact structure |
| 02/28/2002 | US20020024347 Microstructure testing head |
| 02/28/2002 | US20020024334 Layered current sensor |