| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 05/02/2002 | US20020052155 Electrical test probe flexible spring tip |
| 05/02/2002 | US20020052129 Wafer probe assemblage with spring enhanced needles |
| 05/02/2002 | US20020051907 Battery terminal unit provided with a current sensor |
| 05/02/2002 | US20020051906 Battery terminal provided with a current sensor |
| 05/02/2002 | US20020050837 Electronic part inspection device |
| 05/02/2002 | US20020050832 Probe contact system having planarity adjustment mechanism |
| 05/02/2002 | US20020050831 Probe station having multiple enclosures |
| 05/02/2002 | US20020050827 System and method for measuring the power consumed by a circuit on a printed circuit board |
| 05/02/2002 | US20020050652 Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer |
| 05/02/2002 | EP1202337A2 Probe pin for a probe card |
| 05/02/2002 | EP1202070A2 Method of inspecting an electrical disconnection between circuits |
| 05/02/2002 | EP1200992A1 Resilient interconnect structure for electronic components and method for making the same |
| 05/02/2002 | EP1200843A1 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 05/02/2002 | DE10052998A1 Mounting platform for electricity meter unit, has rapid coupling for connecting unit electrically and mechanically without tools; unit is moved parallel to platform to locking position |
| 05/02/2002 | DE10049301A1 Modul für eine Prüfvorrichtung zum Testen von Leiterplatten Module for a test apparatus for testing printed circuit boards |
| 05/02/2002 | DE10048303A1 Pneumatic spring contact for electrical test has tip can be exchanged without air and electrical disconnection |
| 05/01/2002 | CN1347502A Clip-on ammeter for measuring current circulating in conductors |
| 05/01/2002 | CN1347174A Ic插座 Ic Socket |
| 05/01/2002 | CN1347143A Spiral contactor and mfg. method thereof, semiconductor detection apparatus using same and electronic element |
| 05/01/2002 | CN1083985C Semiconductor device testing apparatus |
| 04/30/2002 | US6380756 Burin carrier and semiconductor die assembly |
| 04/30/2002 | US6380754 Removable electrical interconnect apparatuses including an engagement proble |
| 04/30/2002 | US6380753 Screening method of semiconductor device and apparatus thereof |
| 04/30/2002 | US6380752 IC socket |
| 04/30/2002 | US6380751 Wafer probe station having environment control enclosure |
| 04/30/2002 | US6380725 Voltage sensor |
| 04/30/2002 | US6380492 Contact film used for devices having ball grid array structure and device mounting structure |
| 04/25/2002 | US20020048973 Contact structure and production method thereof and probe contact assembly using same |
| 04/25/2002 | US20020048954 Contact structure and production method thereof and probe contact assembly using same |
| 04/25/2002 | US20020048827 Semiconductor-package measuring method, measuring socket, and semiconductor package |
| 04/25/2002 | US20020047721 Probe pin for a probe card |
| 04/25/2002 | US20020047720 CSP BGA test socket with insert and method |
| 04/24/2002 | EP1199571A2 Apparatus for inspecting display board or circuit board |
| 04/24/2002 | CN1083577C Processor contact checking device and method of testing integrated circuit devices |
| 04/23/2002 | US6377902 Arrangement for continuous and uninterrupted reading of a large volume of data from an electronic measuring device into a memory |
| 04/23/2002 | US6377066 Method and apparatus for sub-micron imaging and probing on probe station |
| 04/23/2002 | US6377062 Floating interface for integrated circuit test head |
| 04/23/2002 | US6377061 Expanded lead pitch for semiconductor package and method of electrical testing |
| 04/23/2002 | US6377059 Crown shaped contact barrel configuration for spring probe |
| 04/23/2002 | US6377054 Test device for electrical voltages with integrated illumination unit |
| 04/23/2002 | US6376352 Stud-cone bump for probe tips used in known good die carriers |
| 04/23/2002 | US6376054 Surface metallization structure for multiple chip test and burn-in |
| 04/23/2002 | US6375476 LGA package socket |
| 04/18/2002 | WO2002031516A1 Module for a testing device for testing printed circuit boards |
| 04/18/2002 | WO2002010783A3 Test systems for wireless-communications devices |
| 04/18/2002 | WO2002005606A3 Closed-grid bus architecture for wafer interconnect structure |
| 04/18/2002 | WO2002004965A3 Load board feeder |
| 04/18/2002 | WO2001094955A3 Scanning electro-optic near field device and method of scanning |
| 04/18/2002 | WO2001004643A3 Wafer-level burn-in and test cartridge and methods |
| 04/18/2002 | US20020045993 Point of use digital electric energy apparatus with wireless communication port |
| 04/18/2002 | US20020045992 Point of use digital electric energy apparatus and method for measuring out-of-specification energy |
| 04/18/2002 | US20020045365 Socket for testing IC package |
| 04/18/2002 | US20020045293 Structure for mounting a bare chip using an interposer |
| 04/18/2002 | US20020043986 Ball grid array chip packages having improved testing and stacking characteristics |
| 04/18/2002 | US20020043984 Support carrier for temporarily attaching integrated circuit chips to a chip carrier and method |
| 04/18/2002 | US20020043983 Chip-testing socket using surface mount techinology |
| 04/18/2002 | US20020043982 Apparatus for inspecting display board or circuit board |
| 04/18/2002 | US20020043981 Wafer probe station for low-current measurements |
| 04/18/2002 | US20020043980 Multiple-chip probe and universal tester contact assemblage |
| 04/18/2002 | US20020043979 Semiconductor testing apparatus |
| 04/18/2002 | US20020043726 Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer |
| 04/18/2002 | DE10143175A1 Spannfutter zum Halten einer zu testenden Vorrichtung A chuck for supporting a device under test |
| 04/17/2002 | EP1198001A2 Method of testing and mounting devices using a resilient contact structure |
| 04/17/2002 | EP1197756A2 Probe card for testing integrated circuits |
| 04/17/2002 | CN2486976Y Composite needle board of curing tools |
| 04/17/2002 | CN1345087A Contact component and its manufacture and probe contact assembly using the contact component |
| 04/17/2002 | CN1345086A Manufacture and testing apparatus for semiconductor integrated circuit device |
| 04/17/2002 | CN1083107C 电流传感器 Current Sensors |
| 04/16/2002 | US6373273 Test insert containing vias for interfacing a device containing contact bumps with a test substrate |
| 04/16/2002 | US6373269 Circuit board particularly adapted for use with high density test point in-circuit testers |
| 04/16/2002 | US6373268 Test handling method and equipment for conjoined integrated circuit dice |
| 04/16/2002 | US6373267 Ball grid array-integrated circuit testing device |
| 04/16/2002 | US6373260 Single cable, single point, stimulus and response probing system and method |
| 04/16/2002 | US6372991 Crimpless strain relief termination for a coaxial cable |
| 04/11/2002 | WO2002029856A2 A testing device for semiconductor components and a method of using the same |
| 04/11/2002 | WO2002029423A1 Multicontact electric connector |
| 04/11/2002 | WO2002004966A3 An apparatus and method for testing a socket on a burn-in board using a flex strip probe |
| 04/11/2002 | US20020042684 Point of use digital electric energy apparatus with uninterruptible telephone communication |
| 04/11/2002 | US20020042683 Point of use digital electric energy apparatus with real-time dual channel metering |
| 04/11/2002 | US20020041189 Vertical probe card |
| 04/11/2002 | US20020040884 Probe tip configuration and a method of fabrication thereof |
| 04/11/2002 | US20020040809 Multilayer type printed-wiring board and method of measuring impedance of multilayer type printed-wiring board |
| 04/10/2002 | EP1194784A2 Temperature compensated vertical pin probing device |
| 04/10/2002 | CN1344045A Non-folding strain eliminating terminal of coaxial cable |
| 04/10/2002 | CN1343901A Support frame of displaying panel or detector block |
| 04/09/2002 | US6369602 Method for in-line testing of flip-chip semiconductor assemblies |
| 04/09/2002 | US6369600 Test carrier for testing semiconductor components including interconnect with support members for preventing component flexure |
| 04/09/2002 | US6369598 Pneumatic planar probe |
| 04/09/2002 | US6369596 Vacuum-assisted integrated circuit test socket |
| 04/09/2002 | US6369595 CSP BGA test socket with insert and method |
| 04/09/2002 | US6369594 Test clip for electrical testing of an electronic component |
| 04/09/2002 | US6369591 Apparatus and method using photoelectric effect for testing electrical traces |
| 04/09/2002 | US6369562 Electro-optical probe for oscilloscope measuring signal waveform |
| 04/09/2002 | US6369445 Method and apparatus for edge connection between elements of an integrated circuit |
| 04/09/2002 | US6368137 Vertically actuated BGA socket |
| 04/09/2002 | US6367763 Test mounting for grid array packages |
| 04/04/2002 | WO2002027869A1 Conductive contactor with movable guide plate |
| 04/04/2002 | WO2002027337A2 High performance tester interface module |
| 04/04/2002 | WO2002027335A2 A method and an apparatus for testing electronic devices |
| 04/04/2002 | WO2002027334A1 Point of use digital electric energy measurement, control and monitoring apparatus |