| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 06/04/2002 | US6400169 Test socket with interposer for testing semiconductor components having contact balls |
| 06/04/2002 | US6400168 Method for fabricating probe tip portion composed by coaxial cable |
| 06/04/2002 | US6400167 Probe tip adapter for a measurement probe |
| 06/04/2002 | US6400166 Micro probe and method of fabricating same |
| 06/04/2002 | US6400165 Ultra-fast probe |
| 06/04/2002 | US6400134 Automated bad socket masking in real-time for test handlers |
| 06/04/2002 | US6400132 Cross-coil type indicating instrument |
| 06/04/2002 | US6399900 Contact structure formed over a groove |
| 06/04/2002 | US6399474 Method and apparatus for precoining BGA type packages prior to electrical characterization |
| 06/04/2002 | US6398570 Semiconductor component mounting apparatus |
| 06/04/2002 | US6398561 Contact structure of lead |
| 06/04/2002 | US6397460 Electrical connector |
| 05/30/2002 | WO2001088555A3 Low compliance tester interface |
| 05/30/2002 | US20020066063 Methods for making contact device for making connection to an electronic circuit device and methods of using the same |
| 05/30/2002 | US20020065026 IC handler and contact cleaning method |
| 05/30/2002 | US20020063635 Point of use digital electric energy apparatus with TCP/ IP network communication |
| 05/30/2002 | US20020063566 Mechanism for clamping device interface board to peripheral |
| 05/30/2002 | US20020063558 Test head connection unit |
| 05/30/2002 | US20020063555 Mounting bracket for a utility meter transceiver unit |
| 05/30/2002 | US20020063250 Semiconductor device and method of inspecting the same |
| 05/29/2002 | EP1209778A1 A wire control apparatus and a wire mount control method |
| 05/29/2002 | EP1209777A1 A wire insertion detection jig |
| 05/29/2002 | EP1209474A1 System and method for measuring the power consumed by a circuit on a printed circuit board |
| 05/29/2002 | EP1209473A2 Unit with inspection probe blocks mounted thereon in parallel |
| 05/29/2002 | EP1209472A2 Smart probe apparatus and method for automatic self-adjustment of an oscilloscope's bandwidth |
| 05/29/2002 | DE10053745A1 Vorrichtung und Verfahren zur Kontaktierung eines oder mehrerer Anschlüsse an einem elektronischen Bauteil An apparatus and method for contacting one or more connections to an electronic component |
| 05/29/2002 | CN2494034Y Means for testing semiconductor package element |
| 05/28/2002 | US6396294 Socket pin and socket for electrical testing of semiconductor packages |
| 05/28/2002 | US6396293 Self-closing spring probe |
| 05/28/2002 | US6396291 Method for testing semiconductor components |
| 05/28/2002 | US6396290 Test carrier and method of mounting semiconductor device thereon |
| 05/28/2002 | US6396278 Hand-held ignition voltage tester |
| 05/23/2002 | WO2002041017A1 Test adapter for testing printed circuit boards |
| 05/23/2002 | WO2002041016A1 Arrangement for connecting the test needles of a test adapter to a testing device |
| 05/23/2002 | WO2002041015A1 Kit and method for cleaning socket connection terminal, and electronic part tester |
| 05/23/2002 | WO2002041010A1 Socket for testing ic and method of ic testing a component |
| 05/23/2002 | WO2002004961A3 Self-retained spring probe |
| 05/23/2002 | US20020061668 Probe card and method of fabricating same |
| 05/23/2002 | US20020060581 Mechanism for connecting test head to handler |
| 05/23/2002 | US20020060580 Probe card |
| 05/23/2002 | US20020060579 Semiconductor device testing method, using a spring-biased transformable conductive member electrode connection |
| 05/23/2002 | US20020059715 Method for a galvanometer with axial symmetry and improved bearing design |
| 05/23/2002 | DE10057457A1 Test adapter for testing printed circuit boards has very thin, closely packed test needles running in sleeves held in position by lamination stacks |
| 05/23/2002 | DE10057456A1 Arrangement for connecting test needles of test adapter to test equipment using separate terminal board to interface with test equipment |
| 05/22/2002 | EP1207398A2 A measurement test instrument and associated voltage management system for accessory device |
| 05/22/2002 | EP1206704A1 Test needle for a raster-matching adapter and a device for testing printed circuit boards |
| 05/22/2002 | CN1350325A Contact structure member and production method thereof, and probe contact assembly using said contact structure member |
| 05/21/2002 | US6392433 Method and apparatus for testing semiconductor devices |
| 05/21/2002 | US6392432 Automated protection of IC devices from EOS (electro over stress) damage due to an undesired DC transient |
| 05/21/2002 | US6392430 Method of forming coaxial silicon interconnects |
| 05/21/2002 | US6392429 Temporary semiconductor package having dense array external contacts |
| 05/21/2002 | US6392428 Wafer level interposer |
| 05/21/2002 | US6392427 Testing electronic devices |
| 05/21/2002 | US6392426 Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate |
| 05/21/2002 | US6392425 Multi-chip packaging having non-sticking test structure |
| 05/21/2002 | US6392424 Press plate of wire bond checking system |
| 05/21/2002 | US6390826 Connection base |
| 05/16/2002 | WO2002039129A1 Holding device for electronic part test, and device and method for electronic part test |
| 05/16/2002 | US20020057099 Contactor, method for manufacturing the same, and probe card using the same |
| 05/16/2002 | US20020057098 Probe contract system having planarity adjustment mechanism |
| 05/15/2002 | EP1204988A2 Controlled compliance fine pitch interconnect |
| 05/15/2002 | EP1204872A1 Electrical contactor, especially wafer level contactor, using fluid pressure |
| 05/15/2002 | CN2491847Y watt-hour meter pointer structure |
| 05/15/2002 | CN2491845Y Probe board structure of detecting tool |
| 05/15/2002 | CN2491844Y Faller structure of test tool |
| 05/15/2002 | CN2491843Y Reusable detective tool bench |
| 05/15/2002 | CN1349100A Device for testing display plate or circuit board |
| 05/14/2002 | US6388458 Spring element for use in an apparatus for attaching to a semiconductor and a method of making |
| 05/14/2002 | US6388457 Automated monitoring of placement of an IC package onto a socket for proper orientation and proper alignment |
| 05/14/2002 | US6388456 Probe card and manufactoring method therefor |
| 05/10/2002 | WO2002037616A1 Electric resistance measuring connector and measuring device and measuring method for circuit board electric resistance |
| 05/10/2002 | WO2002037132A1 Methods and devices for dissolving hyperpolarised solid material for nmr analyses |
| 05/09/2002 | US20020055284 Socket apparatus for removably mounting electronic packages |
| 05/09/2002 | US20020055282 Electronic components with plurality of contoured microelectronic spring contacts |
| 05/09/2002 | US20020054483 Device and method for contacting at least one terminal of an electronic element |
| 05/09/2002 | US20020054209 Method for aligning two objects, method for detecting superimposing state of two objects, and apparatus for aligning two objects |
| 05/09/2002 | US20020053922 Assembly apparatus and method of contactor |
| 05/09/2002 | US20020053919 Test socket and methods |
| 05/09/2002 | US20020053918 Unit with inspection probe blocks mounted thereon in parallel |
| 05/09/2002 | US20020053917 Probe structure and method for manufacturing the same |
| 05/09/2002 | US20020053734 Probe card assembly and kit, and methods of making same |
| 05/08/2002 | EP1204166A1 Battery terminal unit with current sensor |
| 05/08/2002 | EP1204165A1 A battery terminal provided with a current sensor |
| 05/08/2002 | EP1203962A2 A test instrument powered video camera |
| 05/08/2002 | EP1203202A1 Enhancing voltmeter functionality |
| 05/08/2002 | CN1084518C Foamed polymer forming method and electric apparatus using with the same foamed polymer |
| 05/08/2002 | CN1084477C Installation testing system with cable pivot and its installing method |
| 05/07/2002 | US6385550 Apparatus and method for providing forward and backward compatibility between a host instrument and an accessory |
| 05/07/2002 | US6384618 Chip scale electrical test fixture with isolation plate having an angled test hole |
| 05/07/2002 | US6384617 Signal transfer device for probe test fixture |
| 05/07/2002 | US6384616 Packaging and interconnection of contact structure |
| 05/07/2002 | US6384615 Probe holder for low current measurements |
| 05/07/2002 | US6384614 Single tip Kelvin probe |
| 05/07/2002 | US6384591 Hands-free signal level meter |
| 05/07/2002 | US6384470 Contact terminal element, contact terminal device |
| 05/07/2002 | US6384377 Aging socket, aging cassette and aging apparatus |
| 05/07/2002 | US6383005 Integrated circuit socket with contact pad |
| 05/02/2002 | WO2002035603A1 Wafer prover device, and ceramic substrate used for wafer prover device |
| 05/02/2002 | WO2002035244A1 Method for making a block for testing components |
| 05/02/2002 | WO2001004653A9 Method and apparatus for sub-micron imaging and probing on probe station |