| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 06/27/2002 | US20020080588 Probe card assembly and kit, and methods of making same |
| 06/27/2002 | US20020079919 Burn-in carrier and semiconductor die assembly |
| 06/27/2002 | US20020079913 Module test socket for test adapters |
| 06/27/2002 | US20020079912 Test socket and system |
| 06/27/2002 | US20020079911 Probe holder for low current measurements |
| 06/27/2002 | US20020079885 Remote, wireless electrical signal measurement device |
| 06/27/2002 | US20020079884 Tightening rings for integrated circuit tester heads |
| 06/27/2002 | US20020079881 IC tester adjusting unit |
| 06/27/2002 | US20020079195 Carrier positional displacement detecting mechanism |
| 06/27/2002 | DE10061893A1 Gehäuse zur Aufnahme eines Messgerätes Housing for receiving a measuring instrument |
| 06/26/2002 | EP1216419A1 Measuring probe for measuring high frequencies and a method for producing the same |
| 06/26/2002 | EP1116420B1 Printed circuit plate used for testing electric components |
| 06/26/2002 | EP1060398B1 Coaxial probe interface for automatic test equipment |
| 06/26/2002 | CN1355559A Carrier for testing chip |
| 06/26/2002 | CN1355436A Device parallel fitted with testing probe assembly |
| 06/25/2002 | US6411118 Method and apparatus for testing bumped die |
| 06/25/2002 | US6411116 Method for testing a product integrated circuit wafer using a stimulus integrated circuit wafer |
| 06/25/2002 | US6411113 Radio frequency test fixture |
| 06/25/2002 | US6411112 Off-axis contact tip and dense packing design for a fine pitch probe |
| 06/25/2002 | US6411109 Connecting lug used as a current-sense resistor |
| 06/25/2002 | US6411108 Noncontact signal analyzer |
| 06/25/2002 | US6411079 Printed circuit board testing apparatus with dedicated test head and versatile-use test head |
| 06/25/2002 | US6410906 Electro-optic probe |
| 06/25/2002 | US6410420 Method of fabricating silicide pattern structures |
| 06/25/2002 | US6410354 Semiconductor substrate test device and method |
| 06/25/2002 | US6409073 Method for transfering solder to a device and/or testing the device |
| 06/25/2002 | US6408500 Method of retrofitting a probe station |
| 06/20/2002 | WO2002049406A2 Housing for receiving a measuring device |
| 06/20/2002 | WO2001082371A3 Chip carrier socket |
| 06/20/2002 | US20020076971 Contact structure and production method thereof |
| 06/20/2002 | US20020076957 Contact elements for surface mounting of burn-in socket |
| 06/20/2002 | US20020075027 Triaxial probe assembly |
| 06/20/2002 | US20020075026 Method and system for providing an automated switching box for testing of integrated circuit devices |
| 06/20/2002 | US20020075025 Semiconductor testing tool |
| 06/20/2002 | US20020075024 Actively controlled heat sink for convective burn-in oven |
| 06/20/2002 | US20020075023 Method for electrically testing a wafer interposer |
| 06/20/2002 | US20020075022 Wafer interposer for testing and assembly into a conventional package |
| 06/20/2002 | US20020075021 Contact structure having silicon finger contactor |
| 06/20/2002 | US20020075019 Wafer probe |
| 06/20/2002 | US20020075016 Methods and structures for electronic probing arrays |
| 06/20/2002 | US20020075009 Automated domain reflectometry testing system |
| 06/20/2002 | US20020075008 Method of inspecting an electrical disconnection between circuits by calculating physical quantities thereof based on capacitances regarding the circuits measured twice |
| 06/20/2002 | US20020074990 Electric energy service apparatus with tamper detection |
| 06/20/2002 | US20020074640 Semiconductor test socket having pogo-pin contacts |
| 06/20/2002 | US20020074157 Apparatus and method for connecting high-frequency circuit boards provided with connecting electrodes formed on bar-shaped member |
| 06/19/2002 | CN2496026Y Voltage drop error electricity quatity integrating instrument for secondary circuit of voltage mutual inductor |
| 06/19/2002 | CN1354366A Measuring test instrument for auxiliary equipment and related voltage control system |
| 06/18/2002 | US6407903 PDA coupler containing a flexible joint |
| 06/18/2002 | US6407570 Interconnect for testing semiconductor components having support members for preventing component flexure |
| 06/18/2002 | US6407568 Apparatus for probing ends of pins |
| 06/18/2002 | US6407566 Test module for multi-chip module simulation testing of integrated circuit packages |
| 06/18/2002 | US6407565 Loaded-board, guided-probe test fixture |
| 06/18/2002 | US6407564 Universal BGA board for failure analysis and method of using |
| 06/18/2002 | US6407562 Probe tip terminating device providing an easily changeable feed-through termination |
| 06/18/2002 | US6407561 Probe for electro-optic sampling oscilloscope |
| 06/18/2002 | US6407542 Implementation of a multi-port modal decomposition system |
| 06/18/2002 | US6406991 Method of manufacturing a contact element and a multi-layered wiring substrate, and wafer batch contact board |
| 06/18/2002 | US6405447 Alignment device for electrically connecting a testing device to a sliding plate on a conveyer |
| 06/13/2002 | WO2002047209A1 Contact structure and production method thereof and probe contact assembly using same |
| 06/13/2002 | WO2002047149A1 Anisotropic conductive sheet and wafer inspection device |
| 06/13/2002 | WO2002046781A1 Socket for electronic component test, and electronic component test apparatus using the socket |
| 06/13/2002 | WO2002046776A1 Voltage detection stick |
| 06/13/2002 | WO2002046775A1 Conductive contact shoe |
| 06/13/2002 | WO2002024400A3 Electronic test head positioner |
| 06/13/2002 | US20020072203 Thin film-structure and a method for producing the same |
| 06/13/2002 | US20020072136 Method for manufacturing semiconductor device utilizing semiconductor testing equipment |
| 06/13/2002 | US20020071127 Positioning apparatus for probe card and TAB |
| 06/13/2002 | US20020070743 Testing head having vertical probes |
| 06/13/2002 | US20020070742 Universal wafer carrier for wafer level die burn-in |
| 06/13/2002 | US20020070740 Measuring device for testing unpacked chips |
| 06/13/2002 | US20020070738 Semiconductor device inspecting apparatus |
| 06/13/2002 | US20020070144 Test tray insert of test handler |
| 06/13/2002 | DE10060437A1 Needle card device for parallel testing of IC's has active module inserted in signal path between test system and each tested IC |
| 06/12/2002 | EP1042682B1 Device and method for testing an electronic chip sensitive element |
| 06/12/2002 | CN1353858A Short and break tester probe for plasma display panel |
| 06/12/2002 | CN1353817A Self-aligning interface apparatus for use in testing electrical devices |
| 06/11/2002 | US6404645 System for supporting electronic components |
| 06/11/2002 | US6404215 Variable spacing probe tip adapter for a measurement probe |
| 06/11/2002 | US6404213 Probe stylus |
| 06/11/2002 | US6404211 Metal buckling beam probe |
| 06/11/2002 | US6403946 Electro-optic sampling probe comprising photodiodes insulated from main frame of EOS optical system |
| 06/11/2002 | US6401330 Apparatus for mounting an integrated circuit onto a printed circuit board and then testing the integrated circuit |
| 06/06/2002 | WO2002044742A2 Mechanism for clamping device interface board to peripheral |
| 06/06/2002 | WO2002008773A3 Apparatus and method for electrical testing of electrical circuits |
| 06/06/2002 | WO2001099232A3 Electrically shielded connector |
| 06/06/2002 | US20020067183 Methods of engaging electrically conductive pads on a semiconductor substrate |
| 06/06/2002 | US20020067181 Probe card assembly and kit, and methods of making same |
| 06/06/2002 | US20020067179 Probe card for testing an LSI operating on two power source voltages |
| 06/06/2002 | US20020067178 Testing head having cantilever probes |
| 06/06/2002 | DE10151125A1 Anschlussstruktur und zugehöriges Herstellungsverfahren sowie die Anschlussstruktur verwendende Prüfanschlussanordnung Terminal structure and manufacturing method thereof, and the connection structure Prüfanschlussanordnung use |
| 06/06/2002 | DE10146940A1 Leiterplatte und Verfahren zur Herstellung derselben Printed circuit board and method of manufacturing the same |
| 06/06/2002 | DE10143173A1 Wafer probe has contact finger array with impedance matching network suitable for wide band |
| 06/05/2002 | EP1210612A1 Apparatus for electrical testing of a substrate having a plurality of terminals |
| 06/05/2002 | EP1210208A1 Membrane probing system |
| 06/05/2002 | CN2494510Y Probe |
| 06/05/2002 | CN1352746A Adaptive probe device |
| 06/05/2002 | CN1352397A Method and device for detecting circuit board |
| 06/04/2002 | US6401048 Circuit trace probe and method |
| 06/04/2002 | US6400175 Method of testing semiconductor integrated circuits and testing board for use therein |
| 06/04/2002 | US6400174 Test system having alignment member for aligning semiconductor components |