| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 07/30/2002 | US6425771 IC socket |
| 07/30/2002 | US6425178 Carrier for a module integrated circuit handler |
| 07/25/2002 | WO2002058137A2 Composite microelectronic spring structure and method for making same |
| 07/25/2002 | WO2001098793A3 Systems for testing integraged circuits during burn-in |
| 07/25/2002 | WO2001092898A3 Measurement method and device, in particular for the high-frequency measurement of electric components |
| 07/25/2002 | WO2001004652A9 Apparatus for electrical testing of a substrate having a plurality of terminals |
| 07/25/2002 | WO2001004650A9 Test probe head having encapsulated rigid pins |
| 07/25/2002 | US20020097063 Wafer level interposer |
| 07/25/2002 | US20020097062 Method and process of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing analysis, and manufacture |
| 07/25/2002 | US20020097060 Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter |
| 07/25/2002 | US20020097056 Series arc fault diagnostic for aircraft wiring |
| 07/25/2002 | DE10136039A1 Elektro-optische Abtastvorrichtung An electro-optical scanning device |
| 07/24/2002 | EP1224476A1 Test probe for a device for testing printed circuit boards |
| 07/24/2002 | CN2502275Y Card type voltmeter |
| 07/24/2002 | CN2502274Y Portable kilowatt-hour meter |
| 07/23/2002 | US6424167 Vibration resistant test module for use with semiconductor device test apparatus |
| 07/23/2002 | US6424166 Probe and test socket assembly |
| 07/23/2002 | US6424164 Probe apparatus having removable beam probes |
| 07/23/2002 | US6424163 Test fixtures for contacting assembled printed circuit boards |
| 07/23/2002 | US6424141 Wafer probe station |
| 07/23/2002 | US6424140 Chip scale electrical test fixture |
| 07/23/2002 | US6424139 Voltage detection stick |
| 07/23/2002 | US6423981 Low-loss elementary standard structure for the calibration of an integrated circuit probe |
| 07/23/2002 | US6422879 IC socket for surface-mounting semiconductor device |
| 07/18/2002 | WO2002056320A1 Shunt resistance and method of adjusting the shunt resistance |
| 07/18/2002 | WO2002056044A2 Modular parallel interface for intergrated circuit testing and method of assembly |
| 07/18/2002 | WO2002056040A1 Pusher and electronic part tester with the pusher |
| 07/18/2002 | WO2002056035A1 Low cost, on-line corrosion monitor and smart corrosion probe |
| 07/18/2002 | WO2002041010A8 Socket for testing ic and method of ic testing a component |
| 07/18/2002 | WO2002007192A3 Triaxial probe assembly |
| 07/18/2002 | US20020094672 Integrated ball grid array-pin grid array-flex circuit interposing probe assembly |
| 07/18/2002 | US20020093361 Engagement probes |
| 07/18/2002 | US20020093355 Test probe and connector |
| 07/18/2002 | US20020093353 Wafer probe station having environment control enclosure |
| 07/18/2002 | US20020093351 Method for constructing a flex-rigid laminate probe |
| 07/18/2002 | US20020093350 Semiconductor device test method and semiconductor device tester |
| 07/18/2002 | US20020093326 AC phasing voltmeter |
| 07/18/2002 | US20020092975 Electro-optic probe |
| 07/18/2002 | US20020092594 Fixture for securing hard stops to a substrate |
| 07/18/2002 | CA2433493A1 Low cost, on-line corrosion monitor and smart corrosion probe |
| 07/17/2002 | CN2501053Y Fixing plate for electrical elements in oscilloscope |
| 07/17/2002 | CN1359470A Connector apparatus |
| 07/16/2002 | US6420892 Calibration target for calibrating semiconductor wafer test systems |
| 07/16/2002 | US6420891 Wafer prober for in-line cleaning probe card |
| 07/16/2002 | US6420889 Multi probe unit and measuring apparatus comprising thereof |
| 07/16/2002 | US6420888 Test system and associated interface module |
| 07/16/2002 | US6420887 Modulated space transformer for high density buckling beam probe and method for making the same |
| 07/16/2002 | US6420886 Membrane probe card |
| 07/16/2002 | US6420884 Contact structure formed by photolithography process |
| 07/16/2002 | US6420878 System and method of integrated circuit self-testing of circuit board connectors |
| 07/16/2002 | US6420789 Ball grid array chip packages having improved testing and stacking characteristics |
| 07/16/2002 | US6420681 Method and process of contact to a heat softened solder ball array |
| 07/16/2002 | US6419844 Method for fabricating calibration target for calibrating semiconductor wafer test systems |
| 07/16/2002 | US6419500 Probe assembly having floatable buckling beam probes and apparatus for abrading the same |
| 07/11/2002 | WO2002054091A2 Capacity coupled rf voltage probe |
| 07/11/2002 | WO2002054089A1 Electrical resistance for the measurement of preferably high frequency alternating currents |
| 07/11/2002 | WO2000074108A3 An interface device |
| 07/11/2002 | US20020089344 Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof |
| 07/11/2002 | US20020089343 Contact structure for electrical communication with contact targets |
| 07/11/2002 | US20020089342 Method for producing a contact structure |
| 07/11/2002 | US20020089331 Test lead for cathode ray tube aging line socket and method of making and using same |
| 07/11/2002 | US20020089322 Modular high parallelism interface for integrated circuit testing, method of assembly, and use of same |
| 07/11/2002 | US20020088113 Index head in semiconductor device test handler |
| 07/11/2002 | DE10162222A1 Optical test system for testing integrated circuits via optical coupling uses a device under test to hold an optical fibre in optical alignment by applying an alignment holder |
| 07/10/2002 | EP1221056A1 Sensor for detecting high-frequency oscillations of a voltage and an arrangement of a sensor |
| 07/10/2002 | CN2499838Y 探针结构 Probe structure |
| 07/10/2002 | CN1358276A Inspection apparatus and sensor |
| 07/10/2002 | CN1358275A Tester and holder for tester |
| 07/09/2002 | US6417685 Test system having alignment member for aligning semiconductor components |
| 07/09/2002 | US6417684 Securement of test points in a test head |
| 07/09/2002 | US6417683 Apparatus for electrical testing of a substrate having a plurality of terminals |
| 07/09/2002 | US6417681 Enhanced probe device for use in high density applications |
| 07/09/2002 | US6416352 Telecommunication apparatus test module with deflectable circuit switching contact |
| 07/09/2002 | US6416331 IC socket and semiconductor device with replaceable lead members |
| 07/09/2002 | CA2250703C Constructive module of an electronic telecommunications equipment, with an interface towards a testing and diagnosing system |
| 07/04/2002 | US20020086562 Contact pin module and testing device provided with the same |
| 07/04/2002 | US20020086451 Manufacture method for semiconductor inspection apparatus |
| 07/04/2002 | US20020084799 Semiconductor test structure having a laser defined current carrying structure |
| 07/04/2002 | US20020084796 Method for forming coaxial silicon interconnects |
| 07/04/2002 | US20020084794 Probe tile for probing semiconductor wafer |
| 07/04/2002 | US20020084791 Measurement probe for detecting electrical signals in an integrated semiconductor circuit |
| 07/04/2002 | US20020084790 Four- terminal measuring device that uses nanotube terminals |
| 07/04/2002 | US20020084456 Multilayered wiring board and production method thereof |
| 07/03/2002 | EP1218765A2 Wafer-level burn-in and test cartridge and methods |
| 07/03/2002 | EP1218761A1 Phase detector |
| 07/03/2002 | EP1218757A1 Method for making a card with multiple contact tips for testing microsphere integrated circuits, and testing device using said card |
| 07/03/2002 | EP1088241B1 Voltage measuring device |
| 07/03/2002 | CN2498610Y Clamp vertical assembling structure |
| 07/03/2002 | CN1087101C 半导体检查装置 The semiconductor inspection apparatus |
| 07/02/2002 | US6414506 Interconnect for testing semiconductor dice having raised bond pads |
| 07/02/2002 | US6414504 Coaxial tilt pin fixture for testing high frequency circuit boards |
| 07/02/2002 | US6414502 Loaded-board, guided-probe test fixture |
| 07/02/2002 | US6414501 Micro cantilever style contact pin structure for wafer probing |
| 07/02/2002 | US6414500 Test socket for an electronic circuit device having improved contact pins and manufacturing method thereof |
| 07/02/2002 | US6414478 Transfer mechanism for use in exchange of probe card |
| 07/02/2002 | US6414477 Method for optimizing probe card analysis and scrub mark analysis data |
| 07/02/2002 | US6413113 Kinematic coupling |
| 06/27/2002 | WO2002029856A3 A testing device for semiconductor components and a method of using the same |
| 06/27/2002 | WO2002019471B1 Ic test socket |
| 06/27/2002 | WO2001096883A3 Microcontactor probe and electric probe unit |