| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 08/28/2002 | EP0837750B1 Wire bonding, severing, and ball forming |
| 08/28/2002 | CN1366612A Current measuring apparatus for battery |
| 08/28/2002 | CN1366185A Sensitive detector for automatically regulating band width of oscillograph and method of detecting |
| 08/27/2002 | US6441632 Spring probe contactor for testing PGA devices |
| 08/27/2002 | US6441631 Processor module heatsink mounting guide posts for function test |
| 08/27/2002 | US6441630 Probing apparatus and head plate opening/closing force-reducing mechanism |
| 08/27/2002 | US6441629 Probe contact system having planarity adjustment mechanism |
| 08/27/2002 | US6441628 CSP BGA test socket with insert and method |
| 08/27/2002 | US6441606 Dual zone wafer test apparatus |
| 08/27/2002 | US6441320 Electrically conductive projections having conductive coverings |
| 08/27/2002 | US6441315 Contact structures with blades having a wiping motion |
| 08/27/2002 | US6440775 Method and apparatus for edge connection between elements of an integrated circuit |
| 08/27/2002 | US6440771 Method for constructing a wafer interposer by using conductive columns |
| 08/27/2002 | US6439910 Rotatable guide member for a socket for electrical parts |
| 08/27/2002 | US6439898 Method and apparatus for interconnecting devices using an adhesive |
| 08/27/2002 | US6439897 Socket apparatus for removably mounting electronic packages with improved contacting system |
| 08/22/2002 | WO2002065588A1 Anisotropic conductive connector, its manufacture method and probe member |
| 08/22/2002 | WO2002064496A2 Method for forming microelectronic spring structures on a substrate |
| 08/22/2002 | US20020115337 Socket for electrical parts |
| 08/22/2002 | US20020115315 Burn in socket |
| 08/22/2002 | US20020113958 Optical coupling for testing integrated circuits |
| 08/22/2002 | US20020113612 Contact probe pin for wafer probing apparatus |
| 08/22/2002 | US20020113611 Checker head |
| 08/22/2002 | US20020113610 Test system and associated interface module |
| 08/22/2002 | US20020113609 Probe stylus |
| 08/22/2002 | US20020113608 Probe card |
| 08/21/2002 | EP1233272A1 Manufacturing procedure for a probe adapter using a light sensitive photopolymer |
| 08/21/2002 | EP1232828A1 Wire bonding, severing, and ball forming |
| 08/21/2002 | EP1232634A1 Non-contact signal analyzer |
| 08/20/2002 | US6438163 Cable length and quality indicator |
| 08/20/2002 | US6437595 Method and system for providing an automated switching box for testing of integrated circuit devices |
| 08/20/2002 | US6437591 Test interconnect for bumped semiconductor components and method of fabrication |
| 08/20/2002 | US6437588 Circuitry testing substrates |
| 08/20/2002 | US6437586 Load board socket adapter and interface method |
| 08/20/2002 | US6437585 Electrical contactor for automatic testing of chips including RF chips |
| 08/20/2002 | US6437584 Membrane probing system with local contact scrub |
| 08/20/2002 | US6437556 Electrical contact assembly |
| 08/20/2002 | US6437552 Automatic probe identification system |
| 08/20/2002 | US6437451 Test interconnect for semiconductor components having bumped and planar contacts |
| 08/20/2002 | US6436802 Method of producing contact structure |
| 08/15/2002 | WO2002063682A2 Lithographic type microelectronic spring structures with improved contours |
| 08/15/2002 | WO2002063314A1 Probe |
| 08/15/2002 | WO2002049406A3 Housing for receiving a measuring device |
| 08/15/2002 | US20020111051 Bare chip carrier and method for manufacturing semiconductor device using the bare chip carrier |
| 08/15/2002 | US20020109518 Device testing apparatus |
| 08/15/2002 | US20020109516 Clamping and unclamping apparatus for a semiconductor test board |
| 08/15/2002 | US20020109515 Semiconductor testing device having a nest with a detachable anvil |
| 08/15/2002 | US20020109514 Planarizing interposer |
| 08/15/2002 | US20020109513 Probe pin array for socket testing |
| 08/14/2002 | EP1231474A2 Method and apparatus for locating faulty pins in a test adapter and pin drawing tool |
| 08/13/2002 | US6433574 Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources |
| 08/13/2002 | US6433566 Probing method and probing system |
| 08/13/2002 | US6433565 Test fixture for flip chip ball grid array circuits |
| 08/13/2002 | US6433564 BGA device positioner kit |
| 08/13/2002 | US6433563 Probe card with rigid base having apertures for testing semiconductor device, and semiconductor device test method using probe card |
| 08/13/2002 | US6433562 Method and apparatus of interconnecting with a system board |
| 08/13/2002 | US6433532 Method and apparatus for mounting a load board onto a test head |
| 08/13/2002 | US6433530 Hand held circuit and polarity tester |
| 08/13/2002 | US6433410 Semiconductor device tester and method of testing semiconductor device |
| 08/13/2002 | US6433360 Structure and method of testing failed or returned die to determine failure location and type |
| 08/08/2002 | WO2002061885A1 Terminal connector |
| 08/08/2002 | WO2002061443A1 Nickel alloy probe card frame laminate |
| 08/08/2002 | WO2002061442A1 Planarizing interposer |
| 08/08/2002 | WO2002061439A1 Contact probe, method of manufacturing the contact probe, and device and method for inspection |
| 08/08/2002 | US20020107204 Protease-activated receptor-1 or 2 (PAR-1, PAR-2) |
| 08/08/2002 | US20020106911 Apparatus for establishing an electrical connection with a wafer to facilitate wafer-level burn-in and methods |
| 08/08/2002 | US20020106154 Apparatus for and method of jointing probes |
| 08/08/2002 | US20020105354 Semiconductor integrated circuit testing system and method |
| 08/08/2002 | US20020105352 Apparatus and method for testing semiconductor integrated circuit |
| 08/08/2002 | US20020105349 Method and apparatus for testing electronic devices |
| 08/08/2002 | US20020105347 Contactor for testing semiconductor device and manufacturing method thereof |
| 08/08/2002 | US20020105346 Low cost, on-line corrosion monitor and smart corrosion probe |
| 08/08/2002 | US20020104212 Apparatus for establishing an electrical connection with a wafer to facilitate wafer-level burn-in and methods |
| 08/06/2002 | US6430047 Standardized test board for testing custom chips |
| 08/06/2002 | US6429673 Printed wiring board inspection apparatus |
| 08/06/2002 | US6429672 Contamination-tolerant electrical test probe |
| 08/06/2002 | US6429671 Electrical test probe card having a removable probe head assembly with alignment features and a method for aligning the probe head assembly to the probe card |
| 08/06/2002 | US6429669 Temperature-insensitive electro-optic probe |
| 08/06/2002 | US6429645 Verification gauge for an electronic package lead inspection apparatus |
| 08/06/2002 | US6429644 Method and apparatus of interconnecting with a system board |
| 08/06/2002 | US6429516 Structure for mounting a bare chip using an interposer |
| 08/06/2002 | US6429030 Method for testing a semiconductor die using wells |
| 08/06/2002 | US6429029 Concurrent design and subsequent partitioning of product and test die |
| 08/06/2002 | US6428356 Test interface for coaxial cable |
| 08/06/2002 | CA2211703C Test device for flat electronic assemblies |
| 08/01/2002 | WO2001031718A9 Shunt resistance device for monitoring battery state of charge |
| 08/01/2002 | WO2000075677A9 Segmented contactor |
| 08/01/2002 | US20020103651 Voice-responsive command and control system and methodology for use in a signal measurement system |
| 08/01/2002 | US20020102746 Method of manufacturing probe unit and probe unit manufactured using this method |
| 08/01/2002 | US20020101255 Method and apparatus for a device under test fixture |
| 08/01/2002 | US20020101248 Bundled probe apparatus for multiple terminal contacting |
| 08/01/2002 | US20020101227 Dc terminal polarity tester |
| 08/01/2002 | US20020100971 Integrated circuit packages |
| 07/31/2002 | CN1361725A Membrane probing system |
| 07/30/2002 | US6426642 Insert for seating a microelectronic device having a protrusion and a plurality of raised-contacts |
| 07/30/2002 | US6426638 Compliant probe apparatus |
| 07/30/2002 | US6426637 Alignment guide and signal transmission apparatus and method for spring contact probe needles |
| 07/30/2002 | US6426636 Wafer probe interface arrangement with nonresilient probe elements and support structure |
| 07/30/2002 | US6426553 Test socket of semiconductor device |
| 07/30/2002 | US6426499 Multi-probe test head and process using same |