| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 09/26/2002 | US20020137316 Manufacture of probe unit having lead probes extending beyong edge of substrate |
| 09/26/2002 | US20020137238 Method for releasable contact-connection of a plurality of integrated semiconductor modules on a wafer |
| 09/26/2002 | US20020135392 Apparatus that probing de-capsulated chip |
| 09/26/2002 | US20020135388 Membrane probing system with local contact scrub |
| 09/26/2002 | US20020135387 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof |
| 09/26/2002 | US20020135354 Current sensor, current measuring method, and switch circuit |
| 09/26/2002 | US20020135349 Auto-selecting, auto-ranging contact/noncontact voltage and continuity tester |
| 09/26/2002 | US20020134936 Wafer inspection system and wafer inspection process using charged particle beam |
| 09/26/2002 | US20020133941 Electrical connector |
| 09/26/2002 | DE10210902A1 Paralleltestplatine und zugehöriges Speichermodultestverfahren Parallel test board and associated memory module test method |
| 09/26/2002 | DE10108743A1 Needle card for testing integrated circuit has contacting device with aperture in contacting area to engage connecting surface structure to hold contacting device parallel to connecting surface |
| 09/25/2002 | EP1243931A1 "Testing head having vertical probes for semiconductor integrated electronic devices." |
| 09/25/2002 | EP1243915A1 Apparatus for evaluating electrical characteristics |
| 09/25/2002 | CN1371478A Test needle for raster-matching adapter and device for testing printed circuit boards |
| 09/24/2002 | US6457158 Method and device for placing electrode for signal observation |
| 09/24/2002 | US6456100 Apparatus for attaching to a semiconductor |
| 09/24/2002 | US6456099 Special contact points for accessing internal circuitry of an integrated circuit |
| 09/24/2002 | US6456060 Multi-meter with locking clamp |
| 09/24/2002 | US6455335 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step |
| 09/24/2002 | CA2068213C Fluidics head for testing chemical and ionic sensors |
| 09/19/2002 | WO2002073220A2 Method and apparatus for retaining a spring probe |
| 09/19/2002 | WO2002073219A2 High bandwidth probe assembly |
| 09/19/2002 | US20020132514 Method and apparatus for retaining a spring probe |
| 09/19/2002 | US20020132501 Wafer level interposer |
| 09/19/2002 | US20020132382 Method and apparatus of testing memory device power and ground pins in an array assembly platform |
| 09/19/2002 | US20020132378 Wafer level system for producing burn-in/screen, and reliability evaluations to be performed on all chips simultaneously without any wafer contacting |
| 09/19/2002 | US20020130677 Semiconductor die test carrier having conductive elastomeric interposer |
| 09/19/2002 | US20020130676 Integrated compliant probe for wafer level test and burn-in |
| 09/19/2002 | US20020130668 Parallel arc fault diagnostic for aircraft wiring |
| 09/19/2002 | US20020130653 Universal test interface between a device under test and a test head |
| 09/19/2002 | US20020130651 Eddy-optic sensor for object inspection |
| 09/19/2002 | US20020130636 Battery power supply apparatus |
| 09/19/2002 | US20020130413 Ball grid array chip packages having improved testing and stacking characteristics |
| 09/18/2002 | EP1241481A2 Contact structure for interconnections, interposer, semiconductor assembly and method |
| 09/18/2002 | CN2512113Y Test device for electronic component |
| 09/18/2002 | CN2512112Y Test device for electronic components |
| 09/17/2002 | US6452807 Test interposer for use with ball grid array packages, assemblies and ball grid array packages including same, and methods |
| 09/17/2002 | US6452407 Probe contactor and production method thereof |
| 09/17/2002 | US6452406 Probe structure having a plurality of discrete insulated probe tips |
| 09/17/2002 | US6452405 Method and apparatus for calibrating a current sensing system |
| 09/17/2002 | US6452379 Methods and apparatus for connecting to a signal launch |
| 09/17/2002 | US6452378 Probe for electro-optic sampling oscilloscope |
| 09/17/2002 | US6450469 Flat panel display or probe block support framework |
| 09/12/2002 | WO2002070789A2 Electrical potential-assisted assembly of molecular devices |
| 09/12/2002 | US20020129323 Connection device and test system |
| 09/12/2002 | US20020127812 Probe pin for testing electrical characteristics of apparatus, probe card using probe pins |
| 09/12/2002 | US20020125902 Jigs for semiconductor components |
| 09/12/2002 | US20020125901 Probe for inspecting semiconductor device and method of manufacturing the same |
| 09/12/2002 | US20020125879 Parallel test board used in testing semiconductor memory devices |
| 09/12/2002 | US20020125473 Semiconductor device and method of analyzing same |
| 09/12/2002 | DE10152095A1 Blank-Chip-Träger und Verfahren zum Herstellen einer Halbleitervorrichtung unter Verwendung des Blank-Chip-Trägers Blank chip carrier and method for producing a semiconductor device using the chip carrier blank |
| 09/12/2002 | DE10150370A1 Apparat und Verfahren zum Testen einer integrierten Halbleiterschaltung Apparatus and method for testing a semiconductor integrated circuit |
| 09/11/2002 | EP1238288A1 Battery sensor device |
| 09/11/2002 | EP1057038B1 Method and device for testing printed circuit boards |
| 09/11/2002 | EP0991950B1 Current sensor |
| 09/11/2002 | CN2511014Y Solid connection mechanism of connector |
| 09/11/2002 | CN2510869Y Electric characteristic detecting apparatus |
| 09/11/2002 | CN1368640A Modular testing probe |
| 09/10/2002 | US6449167 Method and apparatus for building and testing electronic circuits |
| 09/10/2002 | US6449165 Electrical interconnecting device for a semiconductor assembly |
| 09/10/2002 | US6448803 Test socket |
| 09/10/2002 | US6448801 Method and device for supporting flip chip circuitry in analysis |
| 09/10/2002 | US6448797 Method and apparatus automated docking of a test head to a device handler |
| 09/10/2002 | US6448664 Ball grid array chip packages having improved testing and stacking characteristics |
| 09/10/2002 | US6448662 Arrangement for accessing region of a flip chip die |
| 09/10/2002 | US6447328 Method and apparatus for retaining a spring probe |
| 09/10/2002 | US6447322 Test socket for an electronic assembly which reduces damage to the electronic assembly |
| 09/10/2002 | US6446867 Electro-optic interface system and method of operation |
| 09/06/2002 | WO2002068970A1 Electrical test adaptor |
| 09/06/2002 | WO2002068321A2 Forming tool for forming a contoured microelectronic spring mold |
| 09/06/2002 | WO2001007871A9 Enhancing voltmeter functionality |
| 09/06/2002 | WO2001004642A9 Kinematic coupling |
| 09/05/2002 | US20020123252 Contact structure and production method thereof and probe contact assembly using same |
| 09/05/2002 | US20020123161 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 09/05/2002 | US20020121912 Method for making a card with multiple contact tips for testing microsphere integrated circuits, and testing device using said card |
| 09/05/2002 | US20020121911 Wafer level probe card |
| 09/05/2002 | DE10114291C1 IC chip testing method compares voltage applied to one supply voltage terminal of each tested IC chip with detected voltage at different supply voltage terminal of IC chip |
| 09/05/2002 | DE10104633A1 Anschlussklemme Terminal |
| 09/04/2002 | CN2509685Y Instrument base mounted on machine shell |
| 09/04/2002 | CN1090302C Cover structure of linear drive device |
| 09/04/2002 | CN1090301C Telescopic self-locked rope clip for rope cable and the like |
| 09/03/2002 | US6445202 Probe station thermal chuck with shielding for capacitive current |
| 09/03/2002 | US6445201 IC package testing device and method for testing IC package using the same |
| 09/03/2002 | US6445200 Semiconductor element testing carrier using a membrane contactor and a semiconductor element testing method and apparatus using such a carrier |
| 09/03/2002 | US6445198 Electro-optic sampling probe and a method for adjusting the same |
| 09/03/2002 | US6445197 Electron beam tester, recording medium therefor and signal data detecting method |
| 09/03/2002 | US6445175 Remote, wireless electrical signal measurement device |
| 09/03/2002 | US6445173 Printed circuit board tester |
| 09/03/2002 | US6445172 Wafer probing system and method of calibrating wafer probing needle using the same |
| 09/03/2002 | US6443784 Contact and contact assembly using the same |
| 08/29/2002 | WO2002067000A1 Insert for electronic component test device |
| 08/29/2002 | WO2002027337A3 High performance tester interface module |
| 08/29/2002 | US20020119689 Electrical test adapter |
| 08/29/2002 | US20020118030 Circuit board tester probe system |
| 08/29/2002 | US20020118029 Probe card and contactor |
| 08/29/2002 | US20020118009 Wafer probe station |
| 08/29/2002 | US20020117791 Spring element for use in an apparatus for attaching to a semiconductor and a method for making |
| 08/29/2002 | US20020117619 Inspecting system using electron beam and inspecting method using same |
| 08/29/2002 | US20020117330 Resilient contact structures formed and then attached to a substrate |
| 08/29/2002 | DE10059745A1 Messvorrichtung zum Testen unverpackter Chips Measuring device for testing unpackaged chips |