G01R 1 - Details of instruments or arrangements of the types covered by groups or

Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269)
10/2002
10/24/2002	WO2002084736A1 Microelectronic spring with additional protruding member
10/24/2002	WO2002084730A1 An integrated silicon contactor and a device and method for manufacturing same
10/24/2002	WO2002084313A1 Measuring probe and device
10/24/2002	WO2002084307A1 Probe card with coplanar daughter card
10/24/2002	WO2002084306A1 Contact probe
10/24/2002	WO2002083364A1 Implement for cleaning tip and lateral surface of contactor
10/24/2002	WO2000035262A3 Method for mounting an electronic component
10/24/2002	US20020155736 Probe pin assembly
10/24/2002	US20020155735 Contact structure and production method thereof and probe contact assembly using same
10/24/2002	US20020155697 Silicide pattern structures and methods of fabricating the same
10/24/2002	US20020155696 Silicide pattern structures and methods of fabricating the same
10/24/2002	US20020153913 Probe for the probe card
10/24/2002	US20020153912 Compliant probe apparatus
10/24/2002	US20020153911 Probe structure for testing semiconductor devices and method for fabricating the same
10/24/2002	US20020153910 Testing head having vertical probes for semiconductor integrated electronic devices
10/24/2002	US20020153909 Nano-drive for high resolution positioning and for positioning of a multi-point probe
10/24/2002	US20020153877 Indexing rotatable chuck for a probe station
10/24/2002	US20020153612 Silicide pattern structures and methods of fabricating the same
10/24/2002	US20020153602 Ball grid array chip packages having improved testing and stacking characteristics
10/24/2002	EP1145612A3 Method for mounting an electronic component
10/24/2002	DE10119122A1 Verfahren sowie Vorrichtung zum Messen, insbesondere Hochfrequenzmessen von elektrischen Bauelementen Method and apparatus for measuring, particularly high-frequency measurement of electrical components
10/22/2002	US6469537 System for testing semiconductor wafers having interconnect with pressure sensing mechanism
10/22/2002	US6469532 Apparatus for forming coaxial silicon interconnects
10/22/2002	US6469531 Loaded-board, guided-probe test fixture
10/22/2002	US6469530 Method and apparatus for testing of ball grid array circuitry
10/22/2002	US6469494 Programmable connector
10/22/2002	US6469257 Integrated circuit packages
10/22/2002	US6468098 Electrical contactor especially wafer level contactor using fluid pressure
10/17/2002	WO2002082528A1 Contactor device for semiconductor device and method of testing semiconductor device
10/17/2002	WO2002082104A1 Probe substrate and method of manufacturing the probe substrate
10/17/2002	US20020152096 Medical consultation management system
10/17/2002	US20020151194 Microelectronic spring with additional protruding member
10/17/2002	US20020149386 Blade-like connecting needle
10/17/2002	US20020149385 Semiconductor element test apparatus, and method of testing semiconductor element using the apparatus
10/17/2002	US20020149384 Test probe including control device
10/17/2002	US20020149383 Apparatus for electrical testing of a substrate having a plurality of terminals
10/17/2002	US20020149382 Distance change output device and method
10/16/2002	EP1249706A2 Non-contact voltage measurement method and device, and related detection probe
10/16/2002	EP0729652B1 Method for fabricating a contact structure for interconnections, interposer, semiconductor assembly
10/16/2002	CN1374688A Pin block structure for fixing plug pin
10/15/2002	US6466047 System for testing bumped semiconductor components with on-board multiplex circuit for expanding tester resources
10/15/2002	US6466046 Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor
10/15/2002	US6466043 Contact structure for electrical communication with contact targets
10/15/2002	US6466042 Wafer type probe card with micro tips for testing integrated circuit chips
10/15/2002	US6466027 Apparatus for measuring electric charge
10/15/2002	US6466000 Replaceable probe tip holder and measurement probe head
10/15/2002	US6465264 Method for producing semiconductor device and apparatus usable therein
10/15/2002	US6464511 IC socket and IC tester
10/10/2002	US20020146920 Method of soldering contact pins and the contact pins
10/10/2002	US20020145484 Ultrafast sampler with coaxial transition
10/10/2002	US20020145439 Temperature control device for an electronic component
10/10/2002	US20020145438 Robust universal docking system
10/10/2002	US20020145437 Probe card with coplanar daughter card
10/10/2002	US20020145182 Microelectronic packages having an array of resilient leads and methods therefor
10/10/2002	US20020144399 Contact column array template and method of use
10/09/2002	EP1248292A1 Inspection apparatus and probe card
10/09/2002	EP1247304A2 Shunt resistance device for monitoring battery state of charge
10/09/2002	EP1247108A2 Galvanometer with axial symmetry and improved bearing design
10/09/2002	EP1247107A1 Test device for a semiconductor component
10/09/2002	EP1247063A1 Scanning force microscope probe cantilever with reflective structure
10/09/2002	EP1102999A4 Method and apparatus using an infrared laser probe for measuring voltages directly in an integrated circuit
10/09/2002	CN1373853A Measuring probe for measuring high frequencies and method for producing same
10/09/2002	CN1373534A Socket for spheric grid array package
10/08/2002	US6462575 Method and system for wafer level testing and burning-in semiconductor components
10/08/2002	US6462573 System interface assembly and method
10/08/2002	US6462572 Socket used for semiconductor device and testing system connected to socket through dual-transmission lines
10/08/2002	US6462571 Engagement probes
10/08/2002	US6462569 Probe card
10/08/2002	US6462568 Conductive polymer contact system and test method for semiconductor components
10/08/2002	US6462567 Self-retained spring probe
10/08/2002	US6462556 Circuit board testing apparatus and method
10/08/2002	US6462534 Semiconductor package testing equipment including loader having package guider and method of loading a semiconductor package onto a test socket as aligned therewith
10/08/2002	US6462533 IC test system for testing BGA packages
10/08/2002	US6462529 Legs for trimming a tripod with an electrical test probe tip
10/08/2002	US6462528 Method and apparatus for probing a conductor of an array of closely-spaced conductors
10/06/2002	CA2343348A1 Contact column array template and method of use
10/03/2002	US20020142509 Having first interlayer film serving not only as layer to form contact or via hole but also etch stop layer in etching second interlayer film to form interconnect trench opened to contact hole
10/03/2002	US20020140450 Methods of engaging electrically conductive test pads on a semiconductor substrate removable electrical interconnect apparatuses, engagement probes and removable engagement probes
10/03/2002	US20020140448 Inspection apparatus and sensor
10/03/2002	US20020140445 Tester and holder for tester
10/03/2002	US20020140444 Device testing contactor, method of producing the same, and device testing carrier
10/03/2002	US20020140443 Method and apparatus for inspecting conductive pattern
10/03/2002	US20020140416 Probe for electro-optic sampling oscilloscope
10/02/2002	EP1245962A1 Improved connection interface system
10/02/2002	DE10206756A1 Spring contact pin for fixing sleeve, has connection pin at opposite end of contact head and slit at free end of connection pin for contacting inside of insulation piece, which is provided at fixing sleeve of contact pin
10/02/2002	DE10137669A1 Method of aligning contact support onto countercontact support for chip test head
10/02/2002	DE10128433C1 Non-inductive low-impedance electrical resistor for use as a shunt resistor, has strip-shaped planar metal layers stacked in levels with congruent symmetrical contours and insulated from each other
10/02/2002	CN2514356Y Electrode container for testing cells
10/02/2002	CN1372643A Contact conductor
10/01/2002	US6459287 Attachable/detachable probing point
10/01/2002	US6459283 Method and system for testing an electrical component
10/01/2002	US6459252 AC phasing voltmeter
10/01/2002	CA2237397C Watthour meter socket adapter snap-on jaw contacts
10/01/2002	CA2181578C Magnetic sensors
09/2002
09/26/2002	WO2002075807A1 Probing method and device
09/26/2002	WO2002075783A2 Wafer level interposer
09/26/2002	WO2002075330A2 Universal test interface between a device under test and a test head
09/26/2002	WO2002075329A2 Support member assembly for electroconductive contact members
09/26/2002	WO2002075328A1 Test contact mechanism
09/26/2002	US20020137389 Connection interface system

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