| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 12/31/2002 | US6501343 Integrated circuit tester with high bandwidth probe assembly |
| 12/31/2002 | US6501291 Testing base for semiconductor devices |
| 12/27/2002 | WO2002103852A2 Method and apparatus for non-destructive testing of leaded packages |
| 12/27/2002 | WO2002103848A2 Apparatus and methods to pre-stress anisotropic conductive elastomer meterials |
| 12/27/2002 | WO2002103775A1 Probe contact system having plane adjusting mechanism |
| 12/27/2002 | WO2002103373A1 Conductive contactor and electric probe unit |
| 12/27/2002 | WO2002103372A1 Socket for semiconductor package |
| 12/26/2002 | US20020197895 Electrical contractor, especially wafer level contactor, using fluid pressure |
| 12/26/2002 | US20020197891 Socket for electrical parts |
| 12/26/2002 | US20020196047 Method and system having switching network for testing semiconductor components on a substrate |
| 12/26/2002 | US20020196046 Method and apparatus for wafer scale testing |
| 12/26/2002 | US20020196043 Apparatus and method for testing semiconductor devices |
| 12/26/2002 | US20020196041 Method and apparatus for testing bumped die |
| 12/26/2002 | US20020196040 Device carrier and autohandler |
| 12/26/2002 | US20020196039 Socket for testing a semiconductor package device |
| 12/26/2002 | US20020196038 Press contact structure of probe unit |
| 12/26/2002 | US20020196037 Method and apparatus to prevent damage to probe card |
| 12/26/2002 | US20020196031 Parallel insulation fault detection system |
| 12/26/2002 | US20020195614 Ball grid array chip packages having improved testing and stacking characteristics |
| 12/26/2002 | US20020195265 High density planar electrical interface |
| 12/26/2002 | US20020195122 Test carrier for temporarily packaging bumped semiconductor components in which contact balls on the components are protected during test procedures; made of wear resistant material |
| 12/24/2002 | US6498998 Method and apparatus for testing a semiconductor device |
| 12/24/2002 | US6498506 Spring probe assemblies |
| 12/24/2002 | US6498505 Jigs for semiconductor components |
| 12/24/2002 | US6498504 Wafer inspection device and wafer inspection method |
| 12/24/2002 | CA2141128C Method and apparatus for sensing an input current with a bridge circuit |
| 12/19/2002 | WO2002101830A2 Electronic components with plurality of contoured microelectronic spring contacts |
| 12/19/2002 | US20020192987 Semiconductor device-socket |
| 12/19/2002 | US20020192986 Probe card for tester head |
| 12/19/2002 | US20020192939 Method of manufacturing a contract element and a multi-layered wiring substrate, and wafer batch contact board |
| 12/19/2002 | US20020191406 Anisotropic conductive sheet, production process, contact structure, electronic device and inspection apparatus for operation test |
| 12/19/2002 | US20020190759 Electrochemically accelerated self-assembly of molecular devices |
| 12/19/2002 | US20020190743 Method of testing semiconductor integrated circuits and testing board for use therein |
| 12/19/2002 | US20020190741 Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor |
| 12/19/2002 | US20020190740 Probe apparatus applicable to a wafer level burn-in screening |
| 12/19/2002 | US20020190739 CSP BGA test socket with insert and method |
| 12/19/2002 | US20020190738 Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof |
| 12/19/2002 | US20020190737 Member for removing foreign matter adhering to probe tip and method of manufacturing the probe tip, method of cleaning foreign matter adhering to probe tip, probe, and probing apparatus |
| 12/19/2002 | US20020190736 Substrate Testing apparatus and substrate testing method |
| 12/19/2002 | US20020190706 Semiconductor device testing apparatus having timing hold function |
| 12/19/2002 | US20020189648 Method and apparatus for cleaning electrical probes |
| 12/19/2002 | US20020189364 Method and apparatus for non-destructive testing of leaded packages |
| 12/19/2002 | DE10223502A1 Sockel für ein IC-Gehäuse Socket for an IC package |
| 12/18/2002 | EP1266234A1 Testing device for printed boards |
| 12/18/2002 | EP1266230A2 Method and apparatus for planarizing a semiconductor contactor |
| 12/18/2002 | CN1386198A Method for making a card with multiple contact tips for testing microsphere integrated circuits, and testing device using said card |
| 12/18/2002 | CN1386197A Conductive contact |
| 12/18/2002 | CN1385888A Measurement, check, manufacturing method and check device for semiconductor device |
| 12/18/2002 | CN1385709A Multiple virtual logic tester supported semiconductor test system |
| 12/17/2002 | US6496261 Double-pulsed optical interferometer for waveform probing of integrated circuits |
| 12/17/2002 | US6496026 Method of manufacturing and testing an electronic device using a contact device having fingers and a mechanical ground |
| 12/17/2002 | US6496024 Probe holder for testing of a test device |
| 12/17/2002 | US6496023 Semiconductor-device inspecting apparatus and a method for manufacturing the same |
| 12/17/2002 | US6496014 Cable tester error compensation method and apparatus |
| 12/17/2002 | US6496001 System and method for probe mechanism planarization |
| 12/17/2002 | US6495856 Semiconductor device having a test pattern same as conductive pattern to be tested and method for testing semiconductor device for short-circuit |
| 12/17/2002 | US6495379 Semiconductor device manufacturing method |
| 12/17/2002 | US6494370 Electro-optic system controller and method of operation |
| 12/12/2002 | WO2002099930A1 Socket connector and contact for use in a socket connector |
| 12/12/2002 | US20020186189 Method and apparatus for predicting DC offset potential in a liquid crystal display (LCD) device |
| 12/12/2002 | US20020186030 Contact probe and probe device |
| 12/12/2002 | US20020186029 Circuit board test fixture with electrostatic discharge (ESD) protection |
| 12/12/2002 | US20020186022 Method, system, and recording medium of testing a 1394 interface card |
| 12/12/2002 | US20020186003 Semiconductor device testing apparatus having timing hold function |
| 12/12/2002 | US20020186002 Method and apparatus of interconnecting with a system board |
| 12/12/2002 | US20020185301 Method and apparatus for testing bumped die |
| 12/12/2002 | DE10122036A1 Substrathaltevorrichtung für Prober zum Testen von Schaltungsanordnungen auf scheibenförmigen Substraten Substrate holder for Prober for testing circuits on disc substrates |
| 12/11/2002 | EP1264187A2 Integrated circuit test socket lid assembly |
| 12/11/2002 | CN2525531Y Chip test foot seat using surface adhesive technology |
| 12/11/2002 | CN2525523Y Integrated circuit test socket with spring probe |
| 12/11/2002 | CN2525522Y Electronic probe |
| 12/11/2002 | CN2525521Y Factor regulator of industive electric power meter |
| 12/11/2002 | CN1384922A Wafer-level burn-in and test cartridge and methods |
| 12/11/2002 | CN1384921A Test probe for device for testing printed circuit boards |
| 12/10/2002 | US6492829 Contactor for inspection |
| 12/10/2002 | US6492827 Non-invasive electrical measurement of semiconductor wafers |
| 12/10/2002 | US6492825 Socket and printed circuit board for semiconductor device, and method of testing semiconductor device |
| 12/10/2002 | US6492824 Adapter base for receiving electronic test objects |
| 12/10/2002 | US6492823 Customizable nest providing for adjustable audio isolation for testing wireless devices |
| 12/10/2002 | US6492822 Wafer probe station for low-current measurements |
| 12/10/2002 | US6492800 Electro-optic voltage sensor with beam splitting |
| 12/10/2002 | US6492738 Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer |
| 12/10/2002 | US6492599 Multilayer wiring board, manufacturing method thereof, and wafer block contact board |
| 12/10/2002 | US6491968 Methods for making spring interconnect structures |
| 12/05/2002 | WO2002097453A1 Probe card, probe, probe manufacturing method, and probe card manufacturing method |
| 12/05/2002 | WO2002097452A1 Method for manufacture of probe pin, and method for manufacture of probe card |
| 12/05/2002 | WO2002097451A1 14/42-volt automotive circuit tester |
| 12/05/2002 | WO2002070789A3 Electrical potential-assisted assembly of molecular devices |
| 12/05/2002 | WO2002050556A3 High-frequency probe-tip |
| 12/05/2002 | US20020182919 Socket for electrical parts |
| 12/05/2002 | US20020182916 IC socket |
| 12/05/2002 | US20020182915 Socket for electrical parts |
| 12/05/2002 | US20020182796 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step |
| 12/05/2002 | US20020180478 Device power supply and IC test apparatus |
| 12/05/2002 | US20020180473 Single-sided compliant probe apparatus |
| 12/05/2002 | US20020180471 Signal launch connecting techniques |
| 12/05/2002 | US20020180469 Reusable test jig |
| 12/05/2002 | US20020180454 Inspection unit and method of manufacturing substrate |
| 12/05/2002 | US20020180422 Method and apparatus of interconnecting with a system board |
| 12/05/2002 | US20020179904 Contact structure production method |