G01R 1 - Details of instruments or arrangements of the types covered by groups or

Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269)
12/2002
12/05/2002	US20020179584 Method and process of contact to a heat softened solder ball array
12/05/2002	US20020178800 Apparatus for evaluating electrical characteristics
12/05/2002	US20020178577 Fixture to couple an integrated circuit to a circuit board
12/04/2002	EP1262782A2 Mounting spring elements on semiconductor devices, and wafer-level testing methodology
12/04/2002	EP0970382A4 Resilient connector having a tubular spring
12/03/2002	US6489795 High-frequency test probe assembly for microcircuits and associated methods
12/03/2002	US6489794 High speed pass through test system and test method for electronic modules
12/03/2002	US6489791 Build off self-test (Bost) testing method
12/03/2002	US6489790 Socket including pressure conductive rubber and mesh for testing of ball grid array package
12/03/2002	US6489789 Probe station having multiple enclosures
12/03/2002	US6489788 Contactor assembly for common grid array devices
12/03/2002	US6489673 Digital signal processor/known good die packaging using rerouted existing package for test and burn-in carriers
12/03/2002	US6488522 Socket for electric part
11/2002
11/28/2002	WO2002095798A2 Fibre optic wafer probe
11/28/2002	WO2002095488A1 Method and apparatus for predicting dc offset in a liquid crystal display device
11/28/2002	WO2002095429A2 Electrical component measuring instrument
11/28/2002	WO2002094508A1 Contactor cleaning sheet, and contactor cleaning method
11/28/2002	US20020177382 Voltage-applying probe, apparatus for manufacturing electron source using the probe, and method for manufacturing electron source using the apparatus
11/28/2002	US20020177347 Socket for IC package
11/28/2002	US20020177344 Semiconductor device-socket
11/28/2002	US20020177343 Contact pin and socket for electrical parts
11/28/2002	US20020177342 Contact pin and socket for electrical parts
11/28/2002	US20020175695 Micro probing techniques for testing electronic assemblies
11/28/2002	US20020175667 Combination low capacitance probe tip and socket for a measurement probe
11/27/2002	EP1259828A2 Electric test connector, equipment and system using same
11/27/2002	EP0766829B1 Method of cleaning probe tips of probe cards
11/26/2002	US6486952 Semiconductor test apparatus
11/26/2002	US6486690 Device under test board and testing method
11/26/2002	US6486689 Printed circuit board testing apparatus and probe device for use in the same
11/26/2002	US6486688 Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristics
11/26/2002	US6486687 Wafer probe station having environment control enclosure
11/26/2002	US6486686 Apparatus for testing a bare-chip LSI mounting on a printed board
11/26/2002	US6486552 Method and apparatus for testing bumped die
11/26/2002	US6486472 Inspecting system using electron beam and inspecting method using same
11/21/2002	WO2002084736A8 Microelectronic spring with additional protruding member
11/21/2002	WO2002054091A3 Capacity coupled rf voltage probe
11/21/2002	US20020173179 IC socket and method of mounting IC package
11/21/2002	US20020173060 Measuring method, inspection method, inspection device, semiconductor device, method of manufacturing a semiconductor device, and method of manufacturing an element substrate
11/21/2002	US20020171445 High-frequency test probe assembly for microcircuits and associated methods
11/21/2002	US20020171442 Application and test methodology for use with compression land grid array connectors
11/21/2002	US20020171414 Method for optimizing probe card analysis and scrub mark analysis data
11/21/2002	US20020171133 Systems for testing and packaging integrated circuits
11/20/2002	EP1257839A2 Electromechanical apparatus for testing ic chips using first and second sets of substrates which are pressed together
11/20/2002	EP1018030B1 A method of controlling test probes in a testing apparatus for electronic printed circuit boards, and an apparatus for performing the method
11/20/2002	CN1380981A Device and method for inspection of circuit basic board
11/20/2002	CN1380979A Probe card and method of producing the same
11/20/2002	CN1380622A Method for operating automatic trade information system
11/20/2002	CN1094595C Measuring equipment for electricity meter
11/19/2002	US6483336 Indexing rotatable chuck for a probe station
11/19/2002	US6483331 Tester for semiconductor device
11/19/2002	US6483329 Test system, test contactor, and test method for electronic modules
11/19/2002	US6483328 Probe card for probing wafers with raised contact elements
11/19/2002	US6483327 Quadrant avalanche photodiode time-resolved detection
11/19/2002	US6483284 Wide-bandwidth probe using pole-zero cancellation
11/14/2002	WO2002090054A2 Contactor cleaning sheet, contactor cleaning sheet manufacturing method, and contactor cleaning method
11/14/2002	US20020167373 Ultrafast sampler with non-parallel shockline
11/14/2002	US20020167329 Probe station thermal chuck with shielding for capacitive current
11/14/2002	US20020167328 Modular probe apparatus
11/14/2002	US20020167303 Non-contact voltage measurement method and device, and detection probe
11/14/2002	US20020166964 Detection of defects in patterned substrates
11/14/2002	DE10025900C2 Sonde für ein elektro-optisch abtastendes Oszilloskop A probe for electro-optically scanning oscilloscope
11/13/2002	EP1256006A1 Non-invasive electrical measurement of semiconductor wafers
11/13/2002	EP1256004A1 Voltage sensor
11/13/2002	EP1256003A2 Semiconductor component test socket
11/13/2002	CN1379513A Contactor device
11/12/2002	US6480015 Circuit probing methods
11/12/2002	US6480012 Probe card device
11/12/2002	US6479983 Semiconductor device testing apparatus having timing hold function
11/07/2002	WO2002056044A3 Modular parallel interface for intergrated circuit testing and method of assembly
11/07/2002	WO2002027335A3 A method and an apparatus for testing electronic devices
11/07/2002	US20020164145 Fiber optic wafer probe
11/07/2002	US20020163350 Substrate-holding device for testing circuit arrangements on substrates
11/07/2002	US20020163349 Probe card and method of producing the same
11/07/2002	US20020163341 Device and method for inspecting circuit board
11/07/2002	DE10118051A1 Battery measurement terminal with external start connection, monitors charging state of a vehicle battery by checking the total current drawn from the battery via all connections to the battery terminal
11/07/2002	DE10118027A1 Battery measurement terminal with external start tie lug, monitors charging state of a vehicle battery by checking the total current drawn from the battery via all connections to the battery terminal
11/06/2002	EP1254874A1 Carbon-containing aluminum nitride sintered compact, and ceramic substrate for use in apparatus for manufacturing and inspecting semiconductor
11/06/2002	CN1378649A Sensor for detecting high-frequency oscillations of voltage and arrangement of sensor
11/06/2002	CN1093950C Voltage reference apparatus, voltameter, battery voltage detection apparatus and wireless communication device
11/05/2002	US6476626 Probe contact system having planarity adjustment mechanism
11/05/2002	US6476582 Battery power supply apparatus
11/05/2002	US6476333 Raised contact structures (solder columns)
11/05/2002	US6474997 Contact sheet
11/05/2002	US6474350 Cleaning device for probe needle of probe card and washing liquid used therefor
10/2002
10/31/2002	US20020158655 Method and apparatus for testing bumped die
10/31/2002	US20020158646 Spiral leaf spring contacts
10/31/2002	US20020158644 Test needle for pattern adapter of circuit board tester
10/30/2002	CN2519281Y Probe measurment and test device
10/30/2002	CN1376928A Liquid crystal substrate and check device
10/30/2002	CN1376926A Gauge head device
10/29/2002	US6472901 Method for in-line testing of flip-chip semiconductor assemblies
10/29/2002	US6472900 Efficient device debug system
10/29/2002	US6472894 Apparatus for testing bumped die
10/29/2002	US6472893 Test socket and methods
10/29/2002	US6472892 Configuration for testing chips using a printed circuit board
10/29/2002	US6472890 Method for producing a contact structure
10/29/2002	US6472234 Failure analysis method for chip of ball grid array type semiconductor device
10/29/2002	US6471538 Contact structure and production method thereof and probe contact assembly using same
10/29/2002	US6471531 Socket for electric part
10/24/2002	WO2002084786A2 Ultrafast sampler with coaxial transition

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