| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 01/30/2003 | US20030020503 Test vehicle with zig-zag structures |
| 01/30/2003 | US20030020502 Contact probe member and manufacturing method of the same |
| 01/30/2003 | US20030020456 Hardened process controller |
| 01/30/2003 | US20030020453 Device for measuring an electric current that flows through a strip conductor |
| 01/30/2003 | US20030020158 Semiconductor device and contactor for inspection |
| 01/30/2003 | DE10034706C2 Elektrooptik-Meßfühler Electro-optic probe |
| 01/29/2003 | CN1393921A Semiconductor detector |
| 01/29/2003 | CN1393696A Pressing contacting structure for detector |
| 01/29/2003 | CN1393695A Automatic tester for plug |
| 01/29/2003 | CN1100268C Method for testing printed circuit card |
| 01/28/2003 | US6512391 Probe station thermal chuck with shielding for capacitive current |
| 01/28/2003 | US6512389 Apparatus for use in an electronic component test interface having multiple printed circuit boards |
| 01/28/2003 | US6512388 IC socket and spring means of IC socket |
| 01/28/2003 | US6512386 Device testing contactor, method of producing the same, and device testing carrier |
| 01/28/2003 | US6512361 14/42-volt automotive circuit tester |
| 01/28/2003 | US6512181 Multilayer type printed-wiring board and method of measuring impedance of multilayer type printed-wiring board |
| 01/28/2003 | US6511857 Process for manufacturing semiconductor device |
| 01/28/2003 | US6511574 Fixture for securing hard stops to a substrate |
| 01/23/2003 | WO2003007435A1 Contactor |
| 01/23/2003 | WO2003007431A1 Self-aligning socket connector |
| 01/23/2003 | WO2003007430A1 Feed-through manufacturing method and feed-through |
| 01/23/2003 | WO2003007003A1 Method of manufacturing a probe card |
| 01/23/2003 | WO2003007002A2 Interface apparatus for integrated circuit testing |
| 01/23/2003 | US20030017753 Battery clamp with integrated current sensor |
| 01/23/2003 | US20030016039 Wireless test fixture for printed circuit board test systems |
| 01/23/2003 | US20030016038 Programmable test socket |
| 01/23/2003 | US20030016037 Conductive coil contact member |
| 01/23/2003 | US20030015779 Packaging device for holding a plurality of semiconductor devices to be inspected |
| 01/23/2003 | US20030015347 Interconnection element with contact blade |
| 01/22/2003 | EP1278069A1 Low ohmic measuring resistor |
| 01/22/2003 | EP1277696A2 Spring with conductive coating |
| 01/22/2003 | EP1092159B1 Layered current sensor |
| 01/22/2003 | CN1392416A Portable electric meter |
| 01/21/2003 | US6509751 Planarizer for a semiconductor contactor |
| 01/21/2003 | US6509750 Apparatus for detecting defects in patterned substrates |
| 01/21/2003 | US6509647 Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer |
| 01/21/2003 | US6509208 Method for forming structures on a wafer |
| 01/21/2003 | US6508845 Preparation of a chip scale package; heatable pressing plate movable to press against the solder balls to planarize |
| 01/16/2003 | WO2003005044A1 Conductive contact |
| 01/16/2003 | WO2003005043A1 Conductive contact |
| 01/16/2003 | WO2003005042A1 Conductive contact |
| 01/16/2003 | WO2003005041A2 A test handling apparatus and method |
| 01/16/2003 | WO2002097451A8 14/42-volt automotive circuit tester |
| 01/16/2003 | WO2002058137A3 Composite microelectronic spring structure and method for making same |
| 01/16/2003 | US20030013340 Fiducial alignment marks on microelectronic spring contacts |
| 01/16/2003 | US20030011394 Self-aligning wafer burn-in probe |
| 01/16/2003 | US20030011393 CSP BGA test socket with insert and method |
| 01/16/2003 | US20030011390 Interface apparatus for integrated circuit testing |
| 01/16/2003 | US20030011060 Semiconductor die adapter and method of using |
| 01/16/2003 | US20030010976 Method of manufacturing a probe card |
| 01/16/2003 | US20030010615 Microspring with conductive coating deposited on tip after release |
| 01/15/2003 | EP1275150A2 Shaped springs and methods of fabricating and using shaped springs |
| 01/15/2003 | EP1274991A1 Current measuring apparatus for battery |
| 01/15/2003 | CN2531395Y Instrument terminal connector |
| 01/14/2003 | US6507222 High speed single ended sense amplifier |
| 01/14/2003 | US6507208 Low-current probe card |
| 01/14/2003 | US6507207 Contact probe pin for wafer probing apparatus |
| 01/14/2003 | US6507205 Load board with matrix card for interfacing to test device |
| 01/14/2003 | US6507204 Semiconductor testing equipment with probe formed on a cantilever of a substrate |
| 01/14/2003 | US6507203 Test head assembly |
| 01/14/2003 | US6507014 Electro-optic probe |
| 01/09/2003 | WO2003003027A1 Support body assembly for conductive contactor |
| 01/09/2003 | WO2001069269A3 Device for measuring an electric current that flows through a strip conductor |
| 01/09/2003 | US20030006798 Engagement probes |
| 01/09/2003 | US20030006797 Testing device for a semiconductor component |
| 01/09/2003 | US20030006792 Test socket for ball grib array electronic module |
| 01/09/2003 | US20030006790 Method for constructing a flex-rigid laminate probe |
| 01/09/2003 | US20030006789 Test system, test contactor, and test method for electronic modules |
| 01/09/2003 | US20030006788 Inspection apparatus and probe card |
| 01/09/2003 | US20030006787 Conductive contact |
| 01/09/2003 | US20030006757 Inspection apparatus and method adapted to a scanning technique employing a rolling wire probe |
| 01/09/2003 | US20030006754 A clamp for measuring an electrical current flowing in conductors |
| 01/08/2003 | EP1092158B1 Current detector and current measurement apparatus including such detector |
| 01/08/2003 | CN1390306A 相位检测器 Phase detector |
| 01/08/2003 | CN1390305A Probe device, method of manufacture thereof, method of testing substrate using probe device |
| 01/07/2003 | US6504392 Actively controlled heat sink for convective burn-in oven |
| 01/07/2003 | US6504389 Test carrier for packaging semiconductor components having contact balls and calibration carrier for calibrating semiconductor test systems |
| 01/07/2003 | US6504388 Electrical test tool having easily replaceable electrical probe |
| 01/07/2003 | US6504223 Contact structure and production method thereof and probe contact assembly using same |
| 01/07/2003 | US6504152 Probe tip configuration and a method of fabrication thereof |
| 01/03/2003 | WO2003001223A2 High density planar electrical interface |
| 01/03/2003 | WO2002073219A3 High bandwidth probe assembly |
| 01/02/2003 | US20030003782 Contact pin assembly, contact pin assembly manufacturing method, contact pin assembling structure, contact pin assembling structure manufacturing method, and socket for electrical parts |
| 01/02/2003 | US20030003781 Socket for testing a component and method of ic testing a component |
| 01/02/2003 | US20030003780 Integrated ball grid array-pin grid array-flex laminate assembly |
| 01/02/2003 | US20030003740 Contact structure production method |
| 01/02/2003 | US20030001661 Programmable reference voltage generating circuit |
| 01/02/2003 | US20030001606 Probes for probe cards used for testing semiconductor devices, manufacturing method and positioning method |
| 01/02/2003 | US20030001603 Method for forming coaxial silicon interconnects |
| 01/02/2003 | US20030001602 Tester apparatus for electronic components |
| 01/02/2003 | US20030001601 Load board socket adapter and interface method |
| 01/02/2003 | US20030001600 Semiconductor device-socket |
| 01/02/2003 | US20030001599 Zero connection for on-chip testing |
| 01/02/2003 | US20030001593 System and method for measuring the thickness or temperature of a circuit in a printed circuit board |
| 01/02/2003 | US20030001288 Ball grid array chip packages having improved testing and stacking characteristics |
| 01/02/2003 | EP1271158A2 Press contact structure of probe unit |
| 01/02/2003 | EP1271157A1 Needles for probe card for testing semi conductor devices, manufacturing procedure and positioning procedure |
| 01/02/2003 | EP1271156A2 Test/burn in socket assembly |
| 01/01/2003 | CN2529260Y Active watt-hour meter |
| 01/01/2003 | CN1388900A Inspection unit and method of manufacturing substrate |