Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
03/2003
03/06/2003WO2003019211A1 Tap switch for frequency response and partial discharge measurement
03/06/2003WO2002103848A3 Apparatus and methods to pre-stress anisotropic conductive elastomer meterials
03/06/2003US20030045148 Socket for electrical parts
03/06/2003US20030045136 IC pocket
03/06/2003US20030043554 Method and apparatus for building and testing electronic circuits
03/06/2003US20030042924 Inspection terminal for inspecting electronic chip component, and inspection method and inspection apparatus using the same
03/06/2003US20030042922 Probe having a microstylet and method of manufacturing the same
03/06/2003US20030042921 High resolution analytical probe station
03/06/2003US20030042889 Optical testing device
03/06/2003US20030042883 Electrical contact spring probe with RF shielding
03/06/2003US20030042595 Spring bias electrical contactors; lamination sheet
03/06/2003US20030042381 Semiconductor wafer positioning system and method
03/06/2003CA2458568A1 Tap switch for frequency response and partial discharge measurement
03/05/2003EP0852014B1 Method of controlling printed circuits
03/05/2003CN1400468A Short-circuit rod for electrode figure test of panel
03/04/2003US6529355 Input protection circuit implementing a voltage limiter
03/04/2003US6529027 Interposer and methods for fabricating same
03/04/2003US6529026 Method for fabricating an interconnect for making temporary electrical connections to semiconductor components
03/04/2003US6529025 Electrical continuity enhancement for sockets/contactors
03/04/2003US6529024 Probe stylus
03/04/2003US6529023 Application and test methodology for use with compression land grid array connectors
03/04/2003US6529022 Wafer testing interposer for a conventional package
03/04/2003US6529021 Self-scrub buckling beam probe
03/04/2003US6528984 Integrated compliant probe for wafer level test and burn-in
03/04/2003US6528960 Cost effective measurement of high currents
03/04/2003US6528352 Use of conductive adhesive to form temporary electrical connections for use in TCA (temporary chip attach) applications
03/04/2003US6527563 Grid interposer
03/04/2003US6526655 Angled flying lead wire bonding process
02/2003
02/27/2003WO2003017351A1 Probe card manufacturing method
02/27/2003WO2003016930A1 Probe module and tester
02/27/2003US20030040139 Spring contact for establishing non-permanent electrical connection between an integrated circuit device lead element and a substrate, apparatus including same and method of use
02/27/2003US20030038647 Probe card for probing wafers with raised contact elements
02/27/2003US20030038645 Electron beam test system and electron beam test method
02/27/2003US20030038622 Probe station having multiple enclosures
02/27/2003US20030038620 Electrical resistance for the measurement of preferably high frequency alternating currents
02/27/2003US20030038016 Tap switch for frequency response and partial discharge measurement
02/27/2003US20030037870 Electrical connector
02/25/2003WO2002050556A2 High-frequency probe-tip
02/25/2003US6525553 Ground pin concept for singulated ball grid array
02/25/2003US6525552 Modular probe apparatus
02/25/2003US6525551 Probe structures for testing electrical interconnections to integrated circuit electronic devices
02/25/2003US6525527 Cooling system for a module IC handler
02/25/2003US6525526 Method and device for testing printed circuit boards
02/25/2003US6524115 Compliant interconnect assembly
02/25/2003CA2420581A1 High-frequency probe-tip
02/20/2003WO2003015155A1 Method of manufacturing thin film sheet with bumps and thin film sheet with bumps
02/20/2003WO2003014755A1 Device for measuring characteristics of probe cards and probing method
02/20/2003WO2002054091A8 Capacity coupled rf voltage probe
02/20/2003US20030034789 Probe holder for testing of a test device
02/20/2003US20030034782 Electric connection-inspection device
02/20/2003US20030033711 Carrier for a module integrated circuit handler
02/19/2003CN1398448A Contact structure and prodn. method thereof and probe contact assembly using same
02/19/2003CN1398352A Inspection appts. and method adapted to scanning technique employing rolling wire probe
02/19/2003CN1398351A Adapter for testing printed circuit boards and testing needle for such adapter
02/19/2003CN1397805A Contact member and its mfg. method
02/19/2003CN1397804A Contact structure having contact block
02/19/2003CN1102019C Electronic device and detecting method thereof and detector of such electronic device
02/18/2003US6522986 Apparatus and method for testing processing circuit for joystick buttons
02/18/2003US6522162 Test system and associated interface module
02/18/2003US6522157 Mechanism for connecting test head to handler
02/18/2003US6522123 Apparatus for measuring current flowing in a conductor
02/18/2003US6522019 Ball grid array chip packages having improved testing and stacking characteristics
02/18/2003US6522018 Ball grid array chip packages having improved testing and stacking characteristics
02/18/2003US6521468 Lead formation, assembly strip test and singulation method
02/18/2003US6520778 Microelectronic contact structures, and methods of making same
02/13/2003WO2003012828A2 Systems and methods for measuring properties of conductive layers
02/13/2003WO2003012461A1 High frequency measuring device comprising a plurality of measuring probes and a method for producing the same
02/13/2003US20030032326 IC socket
02/13/2003US20030030462 Tester for semiconductor device
02/13/2003US20030030457 Air socket for testing integrated circuits
02/13/2003US20030030455 Test probe having a sheet body
02/13/2003US20030030449 Apertured probes for localized measurements of a material's complex permittivity and fabrication method
02/13/2003US20030030427 Test apparatus for testing devices under test and method for transmitting a test signal
02/11/2003US6518781 Probe structure and manufacturing method thereof
02/11/2003US6518780 Electrical test probe wedge tip
02/11/2003US6518779 Probe card
02/11/2003US6518766 Method of inspecting an electrical disconnection between circuits by calculating physical quantities thereof based on capacitances regarding the circuits measured twice
02/11/2003US6517371 Anti-contaminant component socket
02/11/2003US6517362 Spiral contactor, semiconductor device inspecting apparatus and electronic part using same, and method of manufacturing the same
02/06/2003WO2003010813A2 Grid interposer
02/06/2003WO2003010547A2 Programmable test socket
02/06/2003US20030027438 Test/burn in socket assembly with improved resistance to thermally induced mechanical stress
02/06/2003US20030027423 Contact structure and production method thereof and probe contact assembly using same
02/06/2003US20030027081 Photolithographically-patterned out-of-plane coil structures and method of making
02/06/2003US20030025485 Two path wide-band probe using pole-zero cancellation
02/06/2003US20030025172 Method of manufacturing a probe card
02/05/2003EP1281973A1 Probe card device and probe for use therein
02/05/2003CN1101077C Split-path linear isolation circuit apparatus and method
02/04/2003US6516281 Scanning single electron transistor microscope for imaging ambient temperature objects
02/04/2003US6515499 Modular semiconductor tester interface assembly for high performance coaxial connections
02/04/2003US6515498 Apparatus and method for pressing prober
02/04/2003US6515497 Air pump operated test fixture and method for testing a circuit board
02/04/2003US6515496 Microstructure testing head
02/04/2003US6514097 Test and burn-in socket clamping mechanism
01/2003
01/30/2003US20030022546 CRT aging line load voltage socket
01/30/2003US20030022405 Lead formation, assembly strip test and singulation method
01/30/2003US20030020592 Current detection resistor, mounting structure thereof and method of measuring effective inductance
01/30/2003US20030020509 Lead formation, assembly strip test, and singulation system
01/30/2003US20030020506 Testing device for printed circuit boards
01/30/2003US20030020505 High speed pass through test system and test method for electronic modules
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