Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
05/2003
05/07/2003EP1308737A2 Electronic test system
05/07/2003EP1308733A1 RF enclosure with a testing fixture
05/07/2003EP1307751A2 Test systems for wireless-communications devices
05/07/2003EP1141731B1 Dual-pin probe for testing circuit boards
05/07/2003CN2549589Y Brace and seat cover assembly
05/07/2003CN1415969A Detector for measuring voltage/current of distribution low voltage line
05/06/2003US6560735 Methods and apparatus for testing integrated circuits
05/06/2003US6559668 Low-current pogo probe card
05/06/2003US6559665 Test socket for an IC device
05/06/2003US6559662 Semiconductor device tester and semiconductor device test method
05/06/2003US6558168 Probe card
05/02/2003EP1306677A2 Current sensor
05/02/2003EP1305643A1 Signal measurement
05/02/2003EP1181565A4 Device for electrically contacting a floating semiconductor wafer having an insulating film
05/01/2003WO2003035541A2 Probe needle for testing semiconductor chips and method for producing said probe needle
05/01/2003WO2002101830A3 Electronic components with plurality of contoured microelectronic spring contacts
05/01/2003US20030082934 IC socket
05/01/2003US20030082850 Methods of fabricating semiconductor substrate-based BGA interconnections
05/01/2003US20030080770 Method for universal wafer carrier for wafer level die burn-in
05/01/2003US20030080768 Test method of semiconductor device
05/01/2003US20030080765 Probe station thermal chuck with shielding for capacitive current
05/01/2003US20030080764 Probe contact system having planarity adjustment mechanism
05/01/2003US20030080763 Probe contact system having planarity adjustment mechanism
05/01/2003US20030080752 Method and apparatus for filtering unwanted noise while amplifying a desired signal
05/01/2003US20030080726 Mechanical interface for rapid replacement of RF fixture components
05/01/2003US20030080722 Probe for measuring voltage/current of low voltage power distribution cable
04/2003
04/30/2003CN2548162Y Measuring probe mechanism
04/30/2003CN1414823A Substrate detecting device
04/30/2003CN1414394A Probe cladding device of probe measuring and testing card
04/30/2003CN1107232C Reusable chip carrier for pre-analog running and pre-analog running process
04/30/2003CN1107231C Method and apparatus for automated docking of test head to device handler
04/29/2003US6556033 Electroconductive contact unit assembly
04/29/2003US6556030 Method of forming an electrical contact
04/29/2003US6556027 Low cost, on-line corrosion monitor and smart corrosion probe
04/29/2003US6556004 Supporting framework for display panel or probe block
04/29/2003US6555764 Used to electrically test integrated circuit of large-scale integration device with terminals of integrated circuit being connected to contacts of integrated circuit contactor
04/29/2003US6553661 Semiconductor test structure having a laser defined current carrying structure
04/29/2003CA2239722C Electro-optic voltage sensor
04/24/2003WO2003034078A1 Probe pin, probe card, test apparatus, and method of manufacturing probe pin
04/24/2003WO2003012828A3 Systems and methods for measuring properties of conductive layers
04/24/2003WO2002084736A3 Microelectronic spring with additional protruding member
04/24/2003US20030078747 Electronic test system with test results view filter
04/24/2003US20030076124 Modular interface between test and application equipment
04/24/2003US20030076123 Socket apparatus and method for removably mounting an electronic package
04/24/2003US20030075732 Shunt resistor configuration
04/23/2003EP1304768A2 Spring structure
04/23/2003EP1303763A2 Spring probe assemblies
04/23/2003EP1007980B1 Printed circuit board testing device
04/23/2003EP0792518B1 Method for fabricating a self-limiting silicon based interconnect for testing bare semiconductor dice
04/23/2003CN1413408A 非接触信号分析器 Non-contact signal analyzer
04/23/2003CN1106576C Top load socket for ball grid array devices
04/22/2003US6552559 IC tester adjusting unit
04/22/2003US6552556 Prober for electrical measurement of potentials in the interior of ultra-fine semiconductor devices, and method of measuring electrical characteristics with said prober
04/22/2003US6552529 Testing high temperature attachments prior to permanent joining of low temperature attachments
04/22/2003US6552528 Modular interface between a device under test and a test head
04/22/2003US6552523 Combination low capacitance probe tip and socket for a measurement probe
04/22/2003US6552522 Wire cutter tool with integral insulation piercing circuit tester
04/22/2003US6551845 Method of temporarily securing a die to a burn-in carrier
04/22/2003US6551844 Test assembly including a test die for testing a semiconductor product die
04/22/2003US6551408 Removal deposits with air vibration
04/22/2003US6551147 Battery terminal provided with a current sensor
04/22/2003US6551126 High bandwidth probe assembly
04/17/2003WO2003031995A1 Coaxial tilt pin fixture for testing high frequency circuit boards
04/17/2003WO2003031994A1 Socket and contact of semiconductor package
04/17/2003US20030073355 Ic socket with two point-contacts
04/17/2003US20030071644 Low-current probe card
04/17/2003US20030071642 High speed pass through test system and test method for electronic modules
04/17/2003US20030071330 Strength and durability of a spring structure is increased by providing a stress-balancing pad formed on the unlifted anchor portion of the spring metal finger
04/16/2003EP1301827A1 Photolithographically-patterned out-of-plane coil structures and method of making
04/15/2003US6549024 Method of interconnecting with a system board
04/15/2003US6549014 Battery monitoring method and apparatus
04/15/2003US6549000 Semiconductor device testing apparatus having timing hold function
04/15/2003US6548756 Packaging and interconnection of contact structure
04/15/2003US6548315 Manufacture method for semiconductor inspection apparatus
04/15/2003US6547837 IC socket
04/15/2003US6547587 Connection interface system
04/10/2003WO2003030604A1 Socket and contact of semiconductor package
04/10/2003WO2003030010A2 Programmable array for efficient computation of convolutions in digital signal processing
04/10/2003US20030068917 Ball grid array connector
04/10/2003US20030067316 Integrated circuit tester with high bandwidth probe assembly
04/10/2003US20030067315 Probe device
04/10/2003US20030067308 Spatially resolved electromagnetic property measurement
04/10/2003US20030067080 Sockets for "springed" semiconductor devices
04/09/2003EP1300685A2 Chemically etched microcontact
04/09/2003EP1299735A2 Self-retained spring probe
04/09/2003EP1299734A2 Load board feeder
04/09/2003CN1409495A 分析传感器 Analytical Sensors
04/09/2003CN1409448A Bead lattice array connector
04/09/2003CN1409120A 电流传感器组件 The current sensor assembly
04/09/2003CN1409119A Probe parts and tis production
04/09/2003CN1105307C Monitoring device secured to power distribution system conductors
04/08/2003US6545498 Includes integrated circuit dice and substrate which are electrically tested via sockets or probes at die-attach station before encapsulation; maintenance
04/08/2003US6545497 Method and apparatus of testing memory device power and ground pins in an array assembly platform
04/08/2003US6545493 High-speed probing apparatus
04/08/2003US6545483 Analyzer sensor
04/08/2003US6545458 Low-temperature test equipment
04/08/2003US6545363 Contactor having conductive particles in a hole as a contact electrode
04/08/2003US6544461 Test carrier with molded interconnect for testing semiconductor components
04/08/2003US6544078 Battery clamp with integrated current sensor
04/08/2003US6544044 Socket for BGA package
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