| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 06/05/2003 | WO2003046976A1 Reliability evaluation tester, reliability evaluation test system, contactor, and reliability evaluation test method |
| 06/05/2003 | WO2002061443A9 Nickel alloy probe card frame laminate |
| 06/05/2003 | US20030104655 Semiconductor integrated circuit package, semiconductor apparatus provided with a plurality of semiconductor integrated circuit packages, method of inspecting semiconductor integrated circuit package and method of fabricating semiconductor integrated circuit package |
| 06/05/2003 | US20030104641 Method of manufacturing a semicondutor device |
| 06/05/2003 | US20030102880 Semiconductor-device inspecting apparatus and a method for manufacturing the same |
| 06/05/2003 | US20030102878 Bore probe card and method of testing |
| 06/05/2003 | US20030102877 Electrical test probes and methods of making the same |
| 06/05/2003 | US20030102876 Wide-bandwidth coaxial probe |
| 06/05/2003 | US20030102866 Magnetic resonance apparatus with excitation antennae system |
| 06/05/2003 | US20030102559 Semiconductor substrate with contact pads; testing device |
| 06/05/2003 | US20030101584 Bump and method of forming bump |
| 06/05/2003 | DE10200369C1 Correcting 3-phase current measurement signals involves compensating current measurement device in respect of offset or other error during operation of load |
| 06/04/2003 | EP1316803A2 Lithographic contact elements |
| 06/04/2003 | EP1135693B1 Probe card for probing wafers with raised contact elements |
| 06/04/2003 | EP1135690B1 Lithographic contact elements |
| 06/04/2003 | CN2554634Y Multimeter with indicating lamp |
| 06/04/2003 | CN1421706A Test method and test seat making process for high-power surface mounted integrated circuit |
| 06/04/2003 | CN1110706C Combined tester probe |
| 06/03/2003 | US6573740 Method of forming an apparatus configured to engage an electrically conductive pad on a semiconductive substrate and a method of engaging electrically conductive pads on a semiconductive substrate |
| 06/03/2003 | US6573739 IC testing apparatus |
| 06/03/2003 | US6573738 Multi-layered probe for a probecard |
| 06/03/2003 | US6573723 Current measuring apparatus for battery |
| 06/03/2003 | US6573699 Device for measuring electric current by use of electro-optical crystal |
| 06/03/2003 | US6572389 Contact elements for surface mounting of burn-in socket |
| 06/03/2003 | US6572388 Socket for testing IC package |
| 05/30/2003 | WO2003001223A3 High density planar electrical interface |
| 05/30/2003 | WO2002095798A3 Fibre optic wafer probe |
| 05/30/2003 | CA2366731A1 Power monitoring system |
| 05/30/2003 | CA2366640A1 Electrical monitoring system |
| 05/29/2003 | US20030100201 Socket |
| 05/29/2003 | US20030100139 Semiconductor-package measuring method, measuring socket, and semiconductor package |
| 05/29/2003 | US20030099737 Forming tool for forming a contoured microelectronic spring mold |
| 05/29/2003 | US20030099097 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 05/29/2003 | US20030098703 Methods of testing integrated circuitry |
| 05/29/2003 | US20030098702 Probe card and probe contact method |
| 05/29/2003 | US20030098701 Probe card, semiconductor device testing apparatus, and probe contact method |
| 05/29/2003 | US20030098700 Probe card device and probe for use therein |
| 05/29/2003 | US20030098684 Handler for tape carrier packages and method of traveling tape carrier package tape |
| 05/29/2003 | US20030098681 Meter lead holder device |
| 05/28/2003 | CN1420556A Contactor for semiconductor device, and contacting method |
| 05/27/2003 | US6570399 Test probe and separable mating connector assembly |
| 05/27/2003 | US6570398 Socket apparatus particularly adapted for LGA type semiconductor devices |
| 05/27/2003 | US6570396 Interface structure for contacting probe beams |
| 05/27/2003 | US6570393 Test apparatus improved test connector |
| 05/27/2003 | US6570374 Vacuum chuck with integrated electrical testing points |
| 05/27/2003 | US6568645 Mounting bracket for a utility meter transceiver unit |
| 05/27/2003 | US6568073 Process for the fabrication of wiring board for electrical tests |
| 05/22/2003 | WO2003043133A1 Electric power watthour meter with cover handles |
| 05/22/2003 | WO2003042627A2 Field effect transistor sensor for a screen probe microscope |
| 05/22/2003 | US20030096523 Contactor for semiconductor device and contact method |
| 05/22/2003 | US20030096519 Microspring with conductive coating deposited on tip after release |
| 05/22/2003 | US20030096512 Electrical interconnect device incorporating anisotropically conductive elastomer and flexible circuit |
| 05/22/2003 | US20030094964 Dut testing board |
| 05/22/2003 | US20030094962 Dual plane probe card assembly and method of manufacture |
| 05/22/2003 | US20030094960 Low capacitance probe contact |
| 05/21/2003 | EP1313109A2 Surface mount resistor |
| 05/21/2003 | CN1419276A Contact spring installed on chip |
| 05/20/2003 | US6566899 Tester for semiconductor device |
| 05/20/2003 | US6566898 Temperature compensated vertical pin probing device |
| 05/20/2003 | US6566896 Semiconductor testing apparatus |
| 05/20/2003 | US6566751 Carrier module for holding a μ-BGU type device for testing |
| 05/20/2003 | US6566245 Method of manufacturing probe unit and probe unit manufactured using this method |
| 05/20/2003 | US6566150 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step |
| 05/20/2003 | US6565364 Wafer formed with CSP device and test socket of BGA device |
| 05/20/2003 | US6564455 Socket test probe and method of making |
| 05/15/2003 | WO2003041212A2 Non-linear transmission line using varactors and non-parallel waveguide |
| 05/15/2003 | WO2003040734A2 Method and system for compensating thermally induced motion of probe cards |
| 05/15/2003 | US20030092294 Connector structure for connecting electronic parts |
| 05/15/2003 | US20030092206 Method of manufacturing semiconductor apparatus |
| 05/15/2003 | US20030090938 Nonvolatile semiconductor memory device and method of retrieving faulty in the same |
| 05/15/2003 | US20030090288 Method of testing semiconductor integrated circuits and testing board for use therein |
| 05/15/2003 | US20030090283 Test socket and system |
| 05/15/2003 | US20030090281 Device testing contactor, method of producing the same, and device testing carrier |
| 05/15/2003 | US20030090280 Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter |
| 05/15/2003 | US20030090279 Roller contact with conductive brushes |
| 05/15/2003 | US20030090278 Membrane probing system |
| 05/15/2003 | US20030090259 Universal test interface between a device under test and a test head |
| 05/15/2003 | US20030089635 Latch locking mechanism of a KGD carrier |
| 05/15/2003 | US20030089384 Base sheet with a foamed layer having dispersed abrading particles on it and a polishing layer on top of it |
| 05/15/2003 | US20030088975 Semiconductor test structure having a laser defined current carrying structure |
| 05/14/2003 | EP1038185B1 Wideband isolation system |
| 05/14/2003 | CN2550772Y Detection device for ball check array integrated circuit element |
| 05/14/2003 | CN2550766Y 手机式万用表 Phone multimeter |
| 05/14/2003 | CN1418312A 电压传感器 Voltage sensor |
| 05/14/2003 | CN1417589A Probe card for LCD detection |
| 05/13/2003 | US6563332 Checker head |
| 05/13/2003 | US6563331 Test and burn-in apparatus, in-line system using the test and burn-in apparatus, and test method using the in-line system |
| 05/13/2003 | US6563330 Probe card and method of testing wafer having a plurality of semiconductor devices |
| 05/13/2003 | US6563321 Method and apparatus for detecting line-shorts by potential and temperature distribution |
| 05/13/2003 | US6563299 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |
| 05/13/2003 | US6563215 Silicon carbide interconnect for semiconductor components and method of fabrication |
| 05/13/2003 | US6563114 Substrate inspecting system using electron beam and substrate inspecting method using electron beam |
| 05/13/2003 | US6562637 Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer |
| 05/13/2003 | US6560861 Microspring with conductive coating deposited on tip after release |
| 05/08/2003 | WO2002044742A3 Mechanism for clamping device interface board to peripheral |
| 05/08/2003 | US20030088379 Electron beam test system and electron beam test method |
| 05/08/2003 | US20030085724 Method and system for compensating thermally induced motion of probe cards |
| 05/08/2003 | US20030085723 Method and system for compensating thermally induced motion of probe cards |
| 05/08/2003 | US20030085722 Chip-mounted contact springs |
| 05/08/2003 | US20030085721 Method and system for compensating thermally induced motion of probe cards |