Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
07/2003
07/09/2003EP1326078A2 Testing fixture
07/09/2003EP1301827A4 Photolithographically-patterned out-of-plane coil structures and method of making
07/08/2003US6590479 Integrated microcontact pin and method for manufacturing the same
07/08/2003US6590406 Apparatus for inspecting display board or circuit board
07/08/2003US6590381 Contactor holding mechanism and automatic change mechanism for contactor
07/08/2003US6590294 Device for bump probing and method of fabrication
07/08/2003US6589819 Microelectronic packages having an array of resilient leads and methods therefor
07/08/2003US6589301 Emulsified fuel of water in organic compound(s); continuous phase is organic; contains less than 20% by volume of water; at least one additive for forming the emulsion; surfactant, homogenizing; storage stable
07/08/2003US6589063 Electric contact device for establishing an improved contact with contactors of other device
07/03/2003WO2003055031A2 System for the remote data acquisition and control of electric energy meters
07/03/2003WO2003054691A1 Programmable delay indexed data path register file for array processing
07/03/2003WO2003054564A2 Probe card covering system and method
07/03/2003WO2002075329A3 Support member assembly for electroconductive contact members
07/03/2003US20030123241 Mount structure
07/03/2003US20030122570 Method to prevent damage to probe card
07/03/2003US20030122569 Probe structure and manufacturing method thereof
07/03/2003US20030122567 Probe card cooling assembly with direct cooling of active electronic components
07/03/2003US20030122566 IC chip tester with heating element for preventing condensation
07/03/2003US20030122565 Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
07/03/2003US20030122564 Apparatus to prevent damage to probe card
07/03/2003US20030122563 Probe card and method for manufacturing the same
07/03/2003US20030122562 Adapting apparatus with detecting and repairing functions and method thereof
07/03/2003US20030122550 Semiconductor device testing apparatus and method for manufacturing the same
07/03/2003US20030122538 Coaxial cable for ATE with overvoltage protection
07/03/2003DE19932849C2 Kontaktiereinrichtung zum Herstellen einer elektrisch leitfähigen Verbindung Contacting device for producing an electrically conductive connection
07/03/2003CA2819916A1 System for the remote data acquisition and control of utility meters
07/03/2003CA2471267A1 System for the remote data acquisition and control of electric energy meters
07/02/2003EP1324055A2 A multi-channel, low input capacitance signal probe and probe head
07/02/2003EP1322971A1 Re-locatable partial discharge transducer head
07/02/2003EP1322967A1 Module for a testing device for testing printed circuit boards
07/02/2003EP1322966A1 Multicontact electric connector
07/02/2003EP1322964A2 Electronic test head positioner
07/02/2003EP1322963A2 High performance tester interface module
07/02/2003EP0883815B1 Apparatus for measuring a.c. current in a cable
07/02/2003CN1113590C 连接插座 Connection socket
07/02/2003CN1113404C Apparatus for automatic test equipment
07/02/2003CN1113246C Capacitive transformer in metal all-closed gas insulating high voltage system
07/01/2003US6586960 Measuring device for testing unpacked chips
07/01/2003US6586956 Probe contract system having planarity adjustment mechanism
07/01/2003US6586955 Methods and structures for electronic probing arrays
07/01/2003US6586954 Probe tile for probing semiconductor wafer
07/01/2003US6586925 Method and apparatus for establishing quick and reliable connection between a semiconductor device handler plate and a semiconductor device test head plate
06/2003
06/26/2003WO2003052437A2 Microprocessor-based probe for integrated circuit testing
06/26/2003WO2003052436A2 Flexible interface for a test head
06/26/2003WO2003052435A1 Membrane probing system
06/26/2003WO2002010783A8 Test systems for wireless-communications devices
06/26/2003US20030117160 Needle load measuring method, needle load setting method and needle load detecting mechanism
06/26/2003US20030117158 Contact spring configuration for contacting a semiconductor wafer and method for producing a contact spring configuration
06/26/2003US20030117157 Low-current pogo probe card
06/26/2003US20030117129 Low-cost tester interface module
06/26/2003US20030116346 Low cost area array probe for circuits having solder-ball contacts are manufactured using a wire bonding machine
06/26/2003US20030115752 Method of making an interposer with contact structures
06/25/2003EP1321978A2 Contact structure
06/25/2003CN2557953Y Pointer type multimeter with cold light no-reflection indication circuit
06/24/2003US6583636 BGA on-board tester
06/24/2003US6583635 Semiconductor die test carrier having conductive elastomeric interposer
06/24/2003US6583414 Method of inspecting pattern and inspecting instrument
06/19/2003WO2003050866A1 Probe device
06/19/2003US20030115517 Microprocessor-based probe for integrated circuit testing
06/19/2003US20030115008 Test fixture with adjustable pitch for network measurement
06/19/2003US20030113990 Microelectronic spring contact repair
06/19/2003US20030113944 Semiconductor device and a manufacturing method thereof
06/19/2003US20030112614 Ball grid array chip packages having improved testing and stacking characteristics
06/19/2003US20030112026 Contact pin for testing microelectronic components having substantially spherical contacts
06/19/2003US20030112024 Resilient and rugged probe
06/19/2003US20030112002 Probe system
06/19/2003US20030112001 Probe card covering system and method
06/19/2003US20030111264 Electromagnetic emissions shielded test contactor
06/18/2003EP1097619B1 Integrated circuit module having springy contacts of at least two different types for reduced stress
06/18/2003CN1111742C Method of cleaning probe tips of probe cards and apparatus for impelementing method
06/18/2003CN1111725C Measurement sensor device based on strain gauge, and modulation amplifier for such measurement device
06/17/2003US6580282 Machine for testing electronic chips
06/17/2003US6580276 Tap switch for frequency response and partial discharge measurement
06/17/2003US6579804 Contact structure and production method thereof and probe contact assembly using same
06/17/2003US6578264 Method for constructing a membrane probe using a depression
06/12/2003WO2003049179A1 Probe device and probe method
06/12/2003WO2003049155A1 System and method for laser micro- machining
06/12/2003WO2003048795A1 Testing method and tester for semiconducor integrated circuit device comprising high-speed input/output element
06/12/2003WO2003048788A1 Contact structure and production method thereof and probe contact assembly using same
06/12/2003WO2003048787A1 Test probe for a finger tester and corresponding finger tester
06/12/2003US20030107389 Adapter for a multi-channel, low input capacitacne signal probe
06/12/2003US20030107388 Multi-channel, low input capacitance signal probe and probe head
06/12/2003US20030107387 Multi-beam probe card
06/12/2003US20030107382 Coaxial radio frequency adapter and method
06/12/2003US20030107363 Low loss links between wafer probes and load pull tuner
06/12/2003US20030107035 Semiconductor chip
06/12/2003US20030106213 Angled flying lead wire bonding process
06/12/2003US20030106209 Method and apparatus for manufacturing known good semiconductor die
06/11/2003EP1318410A1 Apparatus and procedure for testing flat cables
06/11/2003EP1318409A1 "Contact probe for a testing head."
06/11/2003CN2555506Y Safety protecting watt-hour meter
06/11/2003CN1423750A Probe card device and probe for use therein
06/11/2003CN1423466A Loudspeaker telephone device without hand holding for mobile terminal
06/10/2003US6577148 Apparatus, method, and wafer used for testing integrated circuits formed on a product wafer
06/10/2003US6577145 Unit with inspection probe blocks mounted thereon in parallel
06/10/2003US6577115 Apparatus with separated conductors
06/10/2003US6576485 Contact structure and production method thereof and probe contact assembly using same
06/10/2003US6576301 Micromachining tool over the first abrasive layer, irradiating a beam of electrothermal energy to form a deposition pattern thereon, depositing conductive material in the deposition pattern forming a horizontal portion of the contactor
06/10/2003US6575772 Shielded cable terminal with contact pins mounted to printed circuit board
06/10/2003US6575767 Contact pin assembly, contact pin assembly manufacturing method, contact pin assembling structure, contact pin assembling structure manufacturing method, and socket for electrical parts
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