Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
09/2003
09/10/2003EP1257839B1 Electromechanical apparatus for testing ic chips using first and second sets of substrates which are pressed together
09/10/2003CN1441254A Orbit detector
09/09/2003US6618850 Inspection method and inspection system using charged particle beam
09/09/2003US6617867 Mechanism for clamping device interface board to peripheral
09/09/2003US6617866 Apparatus and method of protecting a probe card during a sort sequence
09/09/2003US6617865 Compliant probe apparatus
09/09/2003US6617864 High frequency probe for examining electric characteristics of devices
09/09/2003US6617863 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof
09/09/2003US6617687 Method of forming a test insert for interfacing a device containing contact bumps with a test substrate
09/09/2003US6616966 Method of making lithographic contact springs
09/09/2003US6615485 Probe card assembly and kit, and methods of making same
09/04/2003WO2003073493A1 Probe area setting method and probe device
09/04/2003WO2003065443A3 Probe station
09/04/2003WO2002075783A3 Wafer level interposer
09/04/2003US20030164717 Tooling plate adapted to facilitate rapid and precise attachment into a probing station
09/04/2003US20030164716 Alignment apparatus for an IC test handler
09/03/2003EP1340091A2 Mechanism for clamping device interface board to peripheral
09/03/2003CN2570794Y Locating device for circuit base board
09/03/2003CN1440508A Load board feeder
09/03/2003CN1440091A System for actuating electronic component contactor containing contact force controlling mechanism
09/03/2003CN1120547C Socket for electrical components
09/03/2003CN1120501C Test head positioner for semiconductor device testing apparatus
09/02/2003US6614250 Sensor probe for use in board inspection and manufacturing method thereof
09/02/2003US6614249 Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate
09/02/2003US6614248 Tester apparatus for electronic components
09/02/2003US6614247 Socket apparatus and method for removably mounting an electronic package
09/02/2003US6614246 Probe structure
09/02/2003US6614245 Probe for bumps between printed wiring board and circuit component
09/02/2003US6614244 Semiconductor device inspecting apparatus
09/02/2003US6614243 Measurement probe for detecting electrical signals in an integrated semiconductor circuit
09/02/2003US6614221 Deskew fixture
09/02/2003US6614003 Method and process of contact to a heat softened solder ball array
09/02/2003US6612861 Forming reliable semiconductor testing device having high frequency bandwidth
09/02/2003US6612021 Apparatus for a wire mount control
09/02/2003US6612015 Method for making a galvanometer with axial symmetry
08/2003
08/28/2003WO2003071652A2 Battery monitoring method and apparatus
08/28/2003WO2003071289A1 Contact structure having silicon finger contactor
08/28/2003WO2003071288A1 Contact actuator with contact force control
08/28/2003WO2002095429A3 Electrical component measuring instrument
08/28/2003US20030160626 Probe card and method of testing wafer having a plurality of semiconductor devices
08/28/2003US20030160625 Capturing both digital and analog forms of a signal through the same probing path
08/28/2003US20030160624 Probe card, and testing apparatus having the same
08/28/2003DE10201491C1 Meßspitzensystem und Verfahren zu dessen Herstellung Meßspitzensystem and process for its preparation
08/27/2003CN2569153Y Digital multimeter with anti-misoperation function
08/27/2003CN2569147Y Magnetic sensing type meter head with shock-proof effect
08/27/2003CN2569146Y Clamp for detecting lithium ion cell
08/26/2003US6611152 Test adapter for configuring the electrical communication between a unit under test and an electronic test station and associated separator plate
08/26/2003US6611053 Protective structure for bond wires
08/21/2003WO2003069734A1 Intermediate board
08/21/2003WO2003069356A1 Method and apparatus for testing electronic devices
08/21/2003WO2003031994B1 Socket and contact of semiconductor package
08/21/2003US20030157845 Terminal connector
08/21/2003US20030156748 Adaptive threshold determination for ball grid array component modeling
08/21/2003US20030155940 Method for forming cantilever beam probe card and probe card formed
08/21/2003US20030155934 Apertured probes for localized measurements of a material's complex permittivity and fabrication method
08/21/2003US20030155907 Test method and test device for integrated circuits
08/20/2003EP1337007A1 Intermediate board
08/20/2003EP1336854A1 Hand tool with contactless voltage tester as warning device
08/20/2003EP1336110A2 Oscilloscope panel capture and implementation
08/20/2003CN1437781A 电屏蔽连接器 Electrically shielded connector
08/19/2003US6608496 Reference transmission line junction for probing device
08/19/2003US6608495 Eddy-optic sensor for object inspection
08/19/2003US6608385 Contact structure and production method thereof and probe contact assembly using same
08/19/2003US6607929 Device and method for testing sensitive elements on an electronic chip
08/14/2003WO2003067650A1 Method for manufacturing electric contact element for testing electro device and electric contact element thereby
08/14/2003WO2003067271A2 Apparatus and method for dynamic diagnostic testing of integrated circuits
08/14/2003WO2003067268A1 Capacity load type probe, and test jig using the same
08/14/2003WO2003035541A3 Probe needle for testing semiconductor chips and method for producing said probe needle
08/14/2003WO2002064496A3 Method for forming microelectronic spring structures on a substrate
08/14/2003US20030154452 Method and apparatus for the digital and analog triggering of a signal analysis device
08/14/2003US20030153199 IC socket module
08/14/2003US20030151421 Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus
08/14/2003US20030151420 Test fixture for semiconductor package and test method of using the same
08/14/2003US20030151419 Contact probe for a testing head
08/14/2003US20030150640 Silicon space transformer and method of manufacturing same
08/13/2003EP1335209A1 Probe driving method, and probe apparatus
08/13/2003EP1335208A2 Method and apparatus for the digital and analog triggering
08/13/2003EP1335207A2 Method and device for capturing a signal
08/13/2003EP1334369A1 Socket for testing ic and method of ic testing
08/13/2003EP1206704B1 Test needle for a raster-matching adapter and a device for testing printed circuit boards
08/13/2003EP1013157A4 Hands-free signal level meter
08/13/2003CN2566273Y 探针构造 Probe structure
08/13/2003CN1436306A Microcontactor probe and electric probe unit
08/13/2003CN1118112C Socket for electric component
08/13/2003CN1118099C Method for mounting intermediate connecting element to terminal of electronic module
08/12/2003US6605954 Reducing probe card substrate warpage
08/12/2003US6605953 Method and apparatus of interconnecting with a system board
08/12/2003US6605952 Zero connection for on-chip testing
08/12/2003US6605951 Interconnector and method of connecting probes to a die for functional analysis
08/12/2003US6605934 Cartridge system for a probing head for an electrical test probe
08/12/2003US6604953 Anisotropically conductive sheet and connector
08/07/2003WO2003065443A2 Probe station
08/07/2003WO2003065441A1 Prober
08/07/2003WO2003065056A1 Test adapter system for connecting test needles of a test adapter to a control device
08/07/2003WO2003065055A2 Magnetic field detection system for an electricity meter
08/07/2003US20030148650 Socket for electrical parts
08/07/2003US20030146770 High temperature probe card
08/07/2003US20030146769 Nickel alloy probe card frame laminate
08/07/2003US20030146761 Apparatus and method for dynamic diagnostic testing of integrated circuits
08/07/2003US20030146077 Shunt resistance and method of adjusting the shunt resistance
1 ... 181 182 183 184 185 186 187 188 189 190 191 192 193 194 195 196 197 198 199 200 201 ... 273