Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
10/2003
10/15/2003CN2580444Y Matrix keyboard circuit
10/15/2003CN1449498A Test systems for wireless-communications devices
10/15/2003CN1449009A Contactor, method of producing the same, and method of testing using the same
10/14/2003US6633176 Semiconductor device test probe having improved tip portion and manufacturing method thereof
10/14/2003US6633175 Temperature compensated vertical pin probing device
10/14/2003US6631556 Fixture to couple an integrated circuit to a circuit board
10/09/2003WO2003083494A1 Test probe alignment apparatus
10/09/2003WO2003083493A1 Ring type contactor pad of integrated silicone contactor
10/09/2003US20030189440 Method, apparatus and software for testing a device including both electrical and optical portions
10/09/2003US20030189439 Semiconductor inspection apparatus
10/09/2003US20030189438 Electrical test probe wedge tip
10/09/2003US20030189437 Notched electrical test probe tip
10/09/2003US20030189422 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe
10/09/2003US20030189083 Solderless test interface for a semiconductor device package
10/09/2003CA2476389A1 Test probe alignment apparatus
10/08/2003EP1351062A2 Hand-held voltage detection probe
10/08/2003EP1351060A2 Method of manufacturing a test probe for semiconductor devices
10/08/2003EP1350119A1 Low cost, on-line corrosion monitor and smart corrosion probe
10/08/2003EP1350118A1 Voltage detection stick
10/08/2003EP1350096A2 Electro-optic system controller and method of operation
10/08/2003EP1247107B1 Test device for a semiconductor component
10/08/2003CN1447125A Method and appts. of adaptor for face bond of tester and tested device
10/07/2003US6630839 Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor
10/07/2003US6630837 Apparatus for testing bumped die
10/07/2003US6630836 CSP BGA test socket with insert
10/07/2003US6630833 Measurement by concentration of a material within a structure
10/07/2003US6630451 Benzimidazolone peptidometics as thrombin receptor antagonist
10/07/2003US6629638 Electro-optic system controller and method of operation
10/02/2003WO2003081725A2 A miniaturized contact spring
10/02/2003WO2003081262A1 Modular housing for electrical instrument and mounting member therefor
10/02/2003US20030186566 Contactor, method for manufacturing such contactor, and testing method using such contactor
10/02/2003US20030186496 Methods for protecting intermediate conductive elements of semiconductor device assemblies
10/02/2003US20030184332 Probe driving method, and probe apparatus
10/02/2003US20030184331 Electrode and fixture for measuring electronic components
10/02/2003US20030184330 Probe card and method for manufacturing probe card
10/02/2003US20030184280 Power monitoring system
10/02/2003US20030184276 Electrical probe
10/02/2003US20030183948 Golden unit
10/02/2003US20030183931 Semiconductor apparatus, fixture for measuring characteristics therefor, and semiconductor device characteristics measuring apparatus
10/02/2003CA2477570A1 Modular housing for electrical instrument and mounting member therefor
10/01/2003EP1348132A1 Electrical resistance for the measurement of preferably high frequency alternating currents
10/01/2003CN2577290Y Integrated block on-line testing cassete
10/01/2003CN2577289Y Integrated circuit performance measurement and circuit experimental facility
10/01/2003CN2577288Y Electric signal testing device
10/01/2003CN1445833A Detection device, testing device of semiconductor device and testing method
10/01/2003CN1445554A Hand voltage measuring detector
10/01/2003CN1445552A Power supply source for photoelectricity type current transformer
10/01/2003CN1445551A Probe connecting terminal cladded with conducting wire on testing tool of printed circuit distributing board
09/2003
09/30/2003US6629048 Measurement test instrument and associated voltage management system for accessory device
09/30/2003US6628133 Methods of testing integrated circuitry
09/30/2003US6628130 Wireless test fixture for printed circuit board test systems
09/30/2003US6628129 Clamping and unclamping apparatus for a semiconductor test board
09/30/2003US6628128 CSP BGA test socket with insert and method
09/30/2003US6628127 Probe card for testing semiconductor integrated circuit and method of manufacturing the same
09/30/2003US6627483 Method for mounting an electronic component
09/30/2003US6626682 Integrated circuit device socket
09/25/2003WO2003079383A2 Contactor assembly for testing ceramic surface mount devices and other electronic components
09/25/2003WO2003010547A3 Programmable test socket
09/25/2003US20030181003 Methods for fabricating protective structures for bond wires
09/25/2003US20030180974 Methods for fabricating semiconductor device test apparatus that include protective structures for intermediate conductive elements
09/25/2003US20030179064 Method of making photolithographically-patterned out-of-plane coil structures
09/25/2003US20030179005 Adapter method and apparatus for interfacing a tester with a device under test
09/25/2003US20030178988 Test probe alignment apparatus
09/25/2003US20030178986 Electrical monitoring system
09/25/2003US20030178983 Highly-sensitive, pyroelectric infrared sensing method and apparatus
09/25/2003US20030178981 Hand-held voltage detection probe
09/23/2003US6624653 Method and system for wafer level testing and burning-in semiconductor components
09/23/2003US6624650 Impedance measuring device for printed wiring board
09/23/2003US6624649 Prober and low-temperature test equipment having same incorporated therein
09/23/2003US6624648 Probe card assembly
09/23/2003US6624647 Test socket for ball grib array electronic module
09/23/2003US6624646 Modular interface between test and application equipment
09/23/2003US6624645 Semiconductor device testing method, using a spring-biased transformable conductive member electrode connection
09/23/2003US6624622 Probe for measuring voltage/current of low voltage power distribution cable
09/18/2003WO2003076957A1 Apparatus for interfacing electronic packages and test equipment
09/18/2003WO2003010813A3 Grid interposer
09/18/2003US20030176984 Signal measurement
09/18/2003US20030173986 Contactor assembly for testing ceramic surface mount devices and other electronic components
09/18/2003US20030173951 Apparatus for measuring properties of probe card and probing method
09/18/2003US20030173948 Measurement method and device, in particular for the high-frequency measurement of electric components
09/18/2003US20030173944 Contact spring and socket combination for high bandwidth probe tips
09/18/2003US20030173661 Contact structure and production method thereof and probe contact assembly using same
09/18/2003US20030173107 Microelectronic packages having an array of resilient leads
09/17/2003EP1345033A1 Electrical transformer for voltage and current measurement based on the electromagnetic waves sensored in dielectric
09/17/2003EP1029386B1 Converter socket terminal
09/16/2003US6622289 Methods for making contact device for making connection to an electronic circuit device and methods of using the same
09/16/2003US6621286 System and method for inspecting a semiconductor device with contact sections that slide over the terminals of the semiconductor device
09/16/2003US6621282 High resolution analytical probe station
09/16/2003US6621262 Method for optimizing probe card analysis and scrub mark analysis data
09/16/2003US6621260 Special contact points for accessing internal circuitry of an integrated circuit
09/12/2003WO2003075409A1 Anisotropic conductive film and method for producing the same
09/12/2003WO2003075408A1 Anisotropic conductive connector and its production method, and circuit device test instrument
09/12/2003WO2003075027A1 Electronic part inspection device
09/12/2003WO2003075026A1 Device with board abnormality detecting circuit
09/12/2003WO2003075024A1 Insert and electronic component handler comprising it
09/12/2003WO2003075020A1 Device for the detection of electromagnetic pulses with short rise times and high voltage amplitudes
09/11/2003US20030169062 Apparatus and method for positioning an integrated circuit for test
09/11/2003US20030169061 Closed-grid bus architecture for wafer interconnect structure
09/10/2003EP1343015A1 Support member assembly for electroconductive contact members
09/10/2003EP1342396A2 Housing for receiving a measuring device
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